Carrier Concentration Test Method
Carrier Concentration Test Method, Total:4 items.
The international standard classification for "Carrier Concentration Test Method" includes: Testing of metals .
The Chinese standard classification for "Carrier Concentration Test Method" includes: Technical Management , Metal physical property test method .
Professional Standard - Electron
- SJ 2757-1987 Method of measurement by infra-red reflection for charge carrier concentraiton of heavily doped semiconductors
- SJ 3248-1989 Methods for measuring carrier concentration of readded Gallium arsenide and Indium phosphide by infra-red reflection
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 14146-2021 Test method for carrier concentration of silicon epitaxial layers - Capacitance-voltage method
American Society for Testing and Materials (ASTM)
- ASTM F398-92(2002) Standard Test Method for Majority Carrier Concentration in Semiconductors by Measurement of Wavenumber or Wavelength of the Plasma Resonance Minimum
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