Twin electrons

Twin electrons, Total:94 items.

The international standard classification for "Twin electrons" includes: Semiconducting materials , Glass products , Other standards related to analytical chemistry , Flat steel products and semi-products .

The Chinese standard classification for "Twin electrons" includes: Elemental semiconductor material , Industrial technical glass , Metal physical property test method , Electrochemical, thermochemistry and optical profile type analyzer , Steel sheet and strip , Technical management , Time and Frequency Measurement .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 20724-2006 Method of thickness measurement for thin crystal by convergent beam electron diffraction
GB/T 15020-1994 Quartz crystal units for use in electronic equipment Blank detail specification Resistance welded quartz crystal units Assessment level E
GB/T 20564.10-2017(英文版) Continuously cold rolled high strength steel sheet and strip for automobile—Part 10: Twinning induced plasticity steel
GB/T 13387-1992 Test method for measuring flat length on slices of electronic materials
GB/T 12963-2014 Electronic-grade polycrystalline silicon
GB/T 42666-2023 Electronic dyed liquid crystal dimmable glass
GB/T 12963-2022 Electronic-grade polycrystalline silicon

Group Standards of the People's Republic of China

T/BITS 0017-2023 Execution unit (black box) based on the end-edge cloud-vehicle-road collaborative digital twin system at complex intersections in Xiongan New Area
T/CES 190-2023 Technical guide for the system architecture and data collection of the substation’s digital twin system
T/SAS 0003-2018 Bismuth germanate scintillation crystals for positron emission tomography
T/ZJCX 0021-2022 Quartz crystal resonator for automotive electronics
T/CES 160-2022 Specification for intelligent sensor access technology for digital twin substation
T/JSXH 0001-2020 Electronic liquid crystal regeneration liquid
T/CES 273-2024 Construction process and general technical requirement for digital twin of substation
T/QGCML 1524-2023 Smart microgrid digital twin system application technical specifications
T/CIET 627-2024 Guidelines for the Construction of Digital Twin Systems for Smart Substations
T/ICMTIA SM0028-2022 Electronic grade polysilicon for integrated circuits

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 20564.10-2017 Continuously cold rolled high strength steel sheet and strip for automobile--Part 10: Twinning induced plasticity steel

Jiangsu Provincial Standard of the People's Republic of China

DB32/T 3922-2020 Crystal products e-commerce service specification

Shandong Provincial Standard of the People's Republic of China

DB37/T 2658.75-2015 Lu Cuisine Crystal Knuckle

Professional Standard - Electron

SJ 50033/111-1996 Semiconductor optoelectronic devices - Detail specification for Type GT16 Si. NPN phototransistor

National Metrological Verification Regulations of the People's Republic of China

JJG 180-2002 Verification Regulation of Crystal Oscillator inside the Electrical Measurement Instrument

National Metrological Technical Specifications of the People's Republic of China

JJF 1984-2022 Calibration Specification for Crystal Oscillators inside the Electrical Measurement Instruments

Association Francaise de Normalisation

NF C93-601/AM1:1976 COMPONENTS FOR ELECTRONIC EQUIPMENT. PIEZOELECTRIC DEVICES. CRYSTAL HOLDERS.
NF EN 120007:1992 Particular specification framework: liquid crystal display devices - monochrome LCDs without electronic circuit
NF C93-611:1975 Components for electronic equipment. Piezoelectric devices. Quartz crystal units for oscillators.
NF C93-120-007*NF EN 120007:1992 Blank Detail Specification: Liquid cristal displays - Monochrome LCDs without electronic circuit
NF EN 62435-5:2017 Electronic components - Long-term storage of semiconductor electronic devices - Part 5 - chip devices and wafers
UTE C86-614:1977 Electronic components - Bipolar switching transistors - Collection of special specifications
NF C93-325:1974 COMPONENTS FOR ELECTRONIC EQUIPMENT. INDUCTIVE COMPONENTS. STRIP-WOUND CUT CORES OF GRAIN ORIENTED SILICON-IRON ALLOY.
NF C96-435-5*NF EN 62435-5:2017 Electronic components - Long-term storage of electronic semiconductor devices - Part 5 - die and wafer devices

Spanish Association for Standardization (UNE)

UNE-EN 120007:1992 BDS: LIQUID CRISTAL DISPLAYS. MONOCHROME LCDS WITHOUT ELECTRONIC CIRCUIT. (Endorsed by AENOR in September of 1996.)
UNE-EN 120003:1992 BDS: PHOTOTRANSISTORS, PHOTOCARLINGTON TRANSISTORS, PHOTOTRANSISTOR ARRAYS. (Endorsed by AENOR in September of 1996.)
UNE-EN 62435-5:2017 Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices (Endorsed by Asociación Española de Normalización in May of 2017.)

International Electrotechnical Commission (IEC)

IEC 62435-5:2017 Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices

British Standards Institution (BSI)

BS EN 62435-5:2017 Electronic components - Long-term storage of electronic semiconductor devices. - Part 5: Die and wafer devices
BS EN 120007:1993 Harmonized system of quality assessment for electronic components. Blank detail specification. Liquid crystal displays. Monochrome LCDs without electronic circuit
BS EN 120007:1991 Harmonized system of quality assessment for electronic components - Blank detail specification - Liquid crystal displays - Monochrome LCDs without electronic circuit
BS EN 120003:1986 Specification for harmonized system of quality assessment for electronic components - Blank detail specification - Phototransistors, photodarlington transistors, phototransistor arrays
BS EN 120003:1993 Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Phototransistors, photodarlington transistors, phototransistor arrays
BS EN 62047-9:2011 Semiconductor devices. Micro-electromechanical devices. Wafer to wafer bonding strength measurement for MEMS
BS EN 62047-9:2013 Semiconductor devices. Micro-electromechanical devices. Wafer to wafer bonding strength measurement for MEMS
BS EN 120000:1996 Harmonized system of quality assessment for electronic components. General specification: semiconductor optoelectronic and liquid crystal devices

HU-MSZT

MSZ 9200/34-1984 Electronic signals. Crystalline electrical switches, wires and electromechanical filters

SE-SIS

SIS SEN 43 15-1962 Rotary wafer switches for electronic equipment
SIS SS-CECC 20007-1991 Blank detail specification: Liquid crystal displays Monochrome LCDs without electronic circuit
SIS SS CECC 20003-1988 Blank detail specification: Phototransistors, photodar/ington transistors, phototransistor arrays

JP-JEITA

JEITA RC 5241-2007 Whisker test methods for electronic connectors

YU-JUS

JUS N.R9.077-1986 Piezoelectric vibrators. Quartz crystal units. Two wire crystal holder outline, type 20
JUS N.R9.073-1986 Piezoelectrlc vibrators. Quartz crystal unlts. Two wire crystal holder outline, type 17
JUS N.R9.069-1986 Piezoelectric vibrators. Quartz crystal units. Two piri crystal holder outline, type 07
JUS N.R9.071-1986 Piezoelectric vibrators. Quartz crystal units. Two mre crystal holder outline, type 18
JUS N.R9.072-1986 Piezoe/ectric vibrators. Ctuartz crystal units. Two wfre crystaf holder outline, type 16
JUS N.R9.076-1986 Piezoelectric vibrators. Quartz crystal units. Two pin crystal hotder outllne, type08
JUS N.R9.078-1986 Piezoelectric vibrators. Quartz crystal units. Turo wire crystal holder outline, type 21
JUS N.R9.075-1986 Piezoelectric vibrators. Quartz crystal units. Two pin crystal holder outline, type 10
JUS N.R9.074-1986 Piezoelectric vibrators. Ouartz crystal units. Two wire crystal holder outline, type 19
JUS N.R9.070-1986 Piezoelectric vibrators. Ouartz crystal units. Two pin crystal holder outlfne, type09
JUS N.R9.064-1986 Piezoelectric vibrators. Ctuartz crystal units. Two wire crystal holder outline. Types 11, 14 and 15

RO-ASRO

STAS 9007-1971 ELECTRONIC-NUCLEAR EQUIPMENTS Supply voltages for tranzistorized devices intended for nuclear electronics
STAS 11381/10-1980 Graphical symbols for electrical diagrams PIEZOELECTRIC CRISTALS ELECTRET
STAS 6693/2-1975 Semiconductor devices TRANSISTORS Methods for measuring electrical properties

German Institute for Standardization

DIN EN 120007:1993-06 Blank detail specification: Liquid Crystal Displays; monochrome LCDs without electronic circuit; German version EN 120007:1992
DIN EN 120007:1993 Blank detail specification: Liquid Crystal Displays; monochrome LCDs without electronic circuit; German version EN 120007:1992

Korean Agency for Technology and Standards (KATS)

KS C IEC 60444-9:2016 Measurement of quartz crystal unit parameters ― Part 9: Measurement of spurious resonance of piezoelectric crystal units
KS C IEC 61954-2002(2012) Power electronics for electrical transmission and distribution systems－Testing of thyristor valves for static VAR Compensators
KS C IEC 60444-8:2016 Measurement of quartz crystal unit parameters ― Part 8: Test fixture for surface mounted quartz crystal units

Lithuanian Standards Office

LST EN 120007-2001 Blank detail specification. Liquid crystal displays. Monochrome LCDs without electronic circuit

IECQ - IEC: Quality Assessment System for Electronic Components

PQC 83 ISSUE 1.1-1989 Generic Specification: Quartz Crystal Units for Use in Electronic Equipment
PQC 84 ISSUE 1.1-1989 Blank Detail Specification: Quartz Crystal Units for Use in Electronic Equipment

CU-NC

NC 66-29-1984 Electronics. Bipolar Transistors Measurement Methods
NC 66-25-1987 Electronic and Electrotechnical Industry. High Frequency Bipolar Transistors. Quality Specifications
NC 66-28-1984 Electronics. High-Frequency Bipolar Transistors. Type BF 199. Quality Specifications
NC 66-27-1984 Electronics High-Frequency Bipolar Transistors, Type BF 310 Quality Specifications

United States Navy

NAVY MIL-T-82308 A-1969 TRAINING AID, ELECTRONIC CIRCUIT TRANSISTORIZED RADIO KIT

American Society for Testing and Materials (ASTM)

ASTM RR-E04-1008 2013 E2627-Practice for Determining Average Grain Size Using Electron Backscatter Diffraction (EBSD) in Fully Recrystallized Polycrystalline Materials
ASTM E2627-13(2019) Standard Practice for Determining Average Grain Size Using Electron Backscatter Diffraction (EBSD) in Fully Recrystallized Polycrystalline Materials

U.S. Military Regulations and Norms

ARMY MIL-PRF-3098/95 E VALID NOTICE 2-2013 Crystal Unit, Quartz, CR119/U

European Committee for Electrotechnical Standardization（CENELEC）

EN 120007:1992 Blank Detail Specification: Liquid Crystal Displays Monochrome LCDs without Electronic Circuit
EN 62435-5:2017 Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices

Government Electronic & Information Technology Association

GEIA-GEB-0002-2003 Reducing the Risk of Tin Whisker-Induced Failures in Electronic Equipment

Japanese Industrial Standards Committee (JISC)

JIS C 6705:1984 Quartz crystal units for oscillators (for from 200 to 1000 kHz)
JIS H 7804:2005 Method for particle size determination in metal catalysts by electron microscope

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association

JEDEC JEP160-2011 Long-Term Storage for Electronic Solid-State Wafers, Dice, and Devices

RU-GOST R

GOST R 52336-2005 Grained salmon caviar. Specifications

SAE - SAE International

SAE GEIAGEB0002-2014 Reducing the Risk of Tin Whisker-Induced Failures in Electronic Equipment

American National Standards Institute （ANSI)

ANSI/ASTM D6056:2001 Test Method for Determining Concentration of Airborne Single-Crystal Ceramic Whiskers in the Workplace Environment by Transmission Electron Microscopy
ANSI/ASTM D6059:2001 Test Method for Determining Concentration of Airborne Single-Crystal Ceramic Whiskers in the Workplace Environment by Scanning Electron Microscopy

SCC

DANSK DS/EN 62435-5:2017 Electronic components – Long-term storage of electronic semiconductor devices – Part 5: Die and wafer devices
CEI EN 62435-5:2017 Electronic components - Long-term storage of electronic semiconductor devices Part 5: Die and wafer device
DANSK DS/EN 120007:2016 Blank Detail Specification: Liquid cristal displays – Monochrome LCDs without electronic circuit

GSO

BH GSO IEC 62435-5:2022 Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices
GSO IEC 62435-5:2021 Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices

PH-BPS

PNS IEC 62435-5:2021 Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die and wafer devices