AFM Scanning Tunnel

AFM Scanning Tunnel, Total:10 items.

The international standard classification for "AFM Scanning Tunnel" includes: .

The Chinese standard classification for "AFM Scanning Tunnel" includes: .

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Group Standards of the People's Republic of China

• T/QGCML 1940-2023 Scanning electron microscope in-situ high temperature mechanical testing device

American Society for Testing and Materials (ASTM)

• ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
• ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
• ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy

RU-GOST R

• GOST R 8.593-2009 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for verification

Korean Agency for Technology and Standards (KATS)

• KS D 2714-2016(2021) Scanning probe microscope－Method for lateral force microscope
• KS D 2714-2016 Scanning probe microscope－Method for lateral force microscope
• KS D 2714-2021 Scanning probe microscope－Method for lateral force microscope

International Organization for Standardization (ISO)

• ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements

Japanese Industrial Standards Committee (JISC)

• JIS K 0132:1997 General rules for scanning electron microscopy

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