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Database: 365,228(8 Aug 2026)

multiple chromatography

multiple chromatography, Total:12 items.

The international standard classification for "multiple chromatography" includes: .

The Chinese standard classification for "multiple chromatography" includes: .


Shandong Provincial Standard of the People's Republic of China

  • DB37/T 4154-2020 Determination of water quality odor Olfactory hierarchy analysis method (FPA method)

GM North America

GSO

  • OS GSO ISO 23812:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth calibration for silicon using multiple delta-layer reference materials
  • BH GSO ISO 23812:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth calibration for silicon using multiple delta-layer reference materials
  • GSO ISO 23812:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth calibration for silicon using multiple delta-layer reference materials

Association Francaise de Normalisation

  • NF X21-066*NF ISO 23812:2009 Surface chemical analysis - Secondary ion mass spectrometry - Method for depth calibration for silicon using multiple delta-layer reference materials

British Standards Institution (BSI)

  • BS ISO 23812:2009 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth calibration for silicon using multiple delta-layer reference materials
  • BS 3725:1984 Specification for non-returnable multi-ply paper sacks for loose ware potatoes

Korean Agency for Technology and Standards (KATS)

  • KS T 2044-2019 Vertical conveyor for multi-level continuous movement

American Society for Testing and Materials (ASTM)

  • ASTM E1765-16 Standard Practice for Applying Analytical Hierarchy Process (AHP) to Multiattribute Decision Analysis of Investments Related to Projects, Products, and Processes
  • ASTM E1765-16(2023) Standard Practice for Applying Analytical Hierarchy Process (AHP) to Multiattribute Decision Analysis of Investments Related to Projects, Products, and Processes

Japanese Industrial Standards Committee (JISC)

  • JIS K 0156:2018 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth calibration for silicon using multiple delta-layer reference materials