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Oscillating multiple tubes

Oscillating multiple tubes, Total:297 items.

The international standard classification for "Oscillating multiple tubes" includes: Machines and equipment for leather and fur production , Leather products , Environmental testing , Piezoelectric and dielectric devices , Woodworking tools , Construction equipment .

The Chinese standard classification for "Oscillating multiple tubes" includes: Medical laboratory equipment , Leather processing machinery , Fur, leather and artificial leather products , Technical Management , Technical management , Technical management , Technical management , Basic laboratory equipment , Quartz crystal and piezoelectric element , Woodworking machine and machine tool , Office supplies and office implements , Electromagnetic Measurement , Architectural engineering construction machinery .


Taiwan Provincial Standard of the People's Republic of China

Professional Standard - Nuclear Industry

Professional Standard - Medicine

Professional Standard - Light Industry

Professional Standard - Electron

  • SJ/T 10638-1995 Measurement methods for quartz crystal oscillators
  • SJ/Z 9008.4-1987 Measurement of electrical properties of microwave tubes--Part 5: Low-power oscilator klystrons
  • SJ 51648.4-1995 Oscillator,crystal,type ZC505E,detail specification for
  • SJ 1852-1981 Terms for quartz crystal controlled oscillators
  • SJ 2073-1982 Cores for IF transformers and medium wave oscillator coil of transistor radio receivers
  • SJ/T 10104-1991 Level oscillators for Type YX5071
  • SJ/Z 9155.2-1987 Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators
  • SJ 369-1973 Measurement of oscillation frequency of reflex klystrons
  • SJ 2941-1988 General specification for level oscillators
  • SJ 2762-1987 Terms for surface acoustic wave (SAW) oscillators
  • SJ 2942-1988 Methods of measurement for level oscillators
  • SJ 1719-1981 Measurement of oscillation frequency of power klystrons
  • SJ 51648/2-1994 Oscillator,crystal Type ZD509,detail specification for
  • SJ 2763-1987 Terms for surface acoustic wave (SAW) oscillators
  • SJ 51648/1-1994 Oscillator crystal Type ZF507,detail specification for
  • SJ/Z 9008.7-1987 Measurement of electrical properties of microwave tubes--Part 8: Backward-wave oscillator tubes-"O"type
  • SJ 438-1973 Method of measurement for spurious oscillations signal-to-noise ratio of O-type backwave tubes
  • SJ 51648/5-1997 Type ZC503, oscillators, crystal, Detail specification for

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

  • GB/T 30482-2013 Woodworking Machines - Mortising Machines with Oscillating Tool Action - Nomenclature
  • GB/T 32710.13-2016 Safety requirements for environmental testing and conditioning equipment-Part 13:Shakers,shaking water baths and shaking incubators
  • GB 12274-1990 Quartz orystal controlled oscillators-Generic specification

Professional Standard - Education

工业和信息化部

工业和信息化部/国家能源局

Military Standard of the People's Republic of China-General Armament Department

National Metrological Verification Regulations of the People's Republic of China

Professional Standard - Post and Telecommunication

Professional Standard - Construction Industry

Group Standards of the People's Republic of China

Professional Standard - Electricity

  • DL/T 1988-2019 Determination of density of sulphur hexafluoride oscilating U-tube method

未注明发布机构

  • DIN 1311-2:1955 (Mechanical) vibrations, oscillations and vibration systems - Part 2: Linear vibration systems with single degree of freedom
  • DIN 1311-1:1939 (Mechanical) vibrations, oscillation and vibration systems - Part 1: Basic concepts, survey
  • DIN IEC 679-2:1997 Quartz crystal controlled oscillators; Part 2; Guide to the use of quartz crystal controlled oscillators
  • DIN 1311-1:1974 (Mechanical) vibrations, oscillation and vibration systems - Part 1: Basic concepts, survey

National Metrological Technical Specifications of the People's Republic of China

国家药监局

  • YY/T 1685-2020 Pneumatic impulse oscillation equipment for sputum excretion

Professional Standard - Meteorology

  • QX/T 307-2015 Observation method of atmospheric aerosol mass concentration.Tapered element oscillating microbalance

建设部

Defense Logistics Agency

SCC

  • MIL MIL-O-50665-1971 OSCILLATOR DOPPLER: 10548833 (NO S/S DOCUMENT)
  • VDI 2060-2014 Characteristics and detection of nonlinear oscillatory systems — free, forced and self-excited oscillations
  • MIL MIL-O-48434-1977 OSCILLATOR, DOPPLER, COMPONENT BOARD ASSEMBLY, 10559694 (NO S/S DOCUMENT)
  • MIL MIL-O-14850-1969 OSCILLATOR, HIGH VOLTAGE, 10549785
  • MIL MIL-M-28787/257-1982 MODULES, STANDARD ELECTRONIC MULTIVIBRATOR, MONOSTABLE, DIGITAL, KEY CODE BME
  • MIL MIL-PRF-55310/34-2007 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 500 KHZ THROUGH 150 MHZ, HERMETIC SEAL, CMOS
  • MIL MIL-PRF-55310/33B-2010 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 85 MHz, Hermetic Seal, CMOS
  • MIL MIL-PRF-55310/37-2007 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO), 500 KHZ THROUGH 85 MHZ, HERMETIC SEAL, CMOS
  • MIL MIL-PRF-55310/33-2007 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 500 KHZ THROUGH 85 MHZ, HERMETIC SEAL, CMOS
  • BS 2271-3:1965 Specification for quartz oscillator crystal units-Guide to the use of quartz oscillator crystals
  • MIL MIL-PRF-55310/33D-2018 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 85 MHz, Hermetic Seal, CMOS
  • BS DD IEC/PAS 60679-6:2008 Quartz crystal controlled oscillators of assessed quality-Phase jitter measurement method for quartz crystal oscillators and SAW oscillators. Application guide
  • IEC 60122-2:1962 Quartz crystal units for oscillators - Part 2: Guide to the use of quartz oscillator crystals
  • MIL MIL-PRF-55310/33C-2013 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 85 MHz, Hermetic Seal, CMOS
  • MIL MIL-PRF-55310/37C-2018 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 85 MHz, Hermetic Seal, CMOS
  • MIL MIL-PRF-55310/37B-2013 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 85 MHz, Hermetic Seal, CMOS
  • MIL MIL-PRF-55310/37A-2010 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 85 MHz, Hermetic Seal, CMOS
  • MIL MIL-O-52374E-2013 Oscillator: High Voltage General Specification for
  • DANSK DS/EN ISO 12185:1997 Crude petroleum and petroleum products – Determination of density – Oscillating U-tube method
  • MIL MIL-PRF-55310/21F-2008 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1.0 MHZ Through 60.0 MHZ, Hermetic Seal, Square Wave, TTL
  • MIL MIL-PRF-55310/41-2018 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 500 KHz THROUGH 125 MHz, HERMETIC SEAL, LOW VOLTAGE CMOS
  • MIL MIL-PRF-55310/16K-2017 Oscillator, Crystal Controlled, TYPE 1 (Crystal Oscillator (XO)), 0.1 HZ Through 80 MHZ, Hermetic Seal, Square Wave, TTL
  • MIL MIL-PRF-55310/15G-2009 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 0.01 Hz Through 10 MHz, Hermetic Seal, Square Wave, CMOS
  • CEI EN 60679-6:2015 Quartz crystal controlled oscillators of assessed quality Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
  • DANSK DS/EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
  • MIL MIL-PRF-55310/38B-2013 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 150 MHz, Hermetic Seal, Low Voltage CMOS
  • MIL MIL-PRF-55310/38A-2010 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 150 MHz, Hermetic Seal, Low Voltage CMOS
  • MIL MIL-PRF-55310/20F-2012 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 40.0 KHz through 60.0 MHz, Hermetic Seal, Square Wave, TTL
  • MIL MIL-PRF-55310/30E-2017 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 450 KHz Through 100 MHz, Hermetic Seal, Low Voltage CMOS
  • MIL MIL-PRF-55310/38-2007 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO), 500 KHZ THROUGH 150 MHZ, HERMETIC SEAL, LOW VOLTAGE CMOS
  • MIL MIL-PRF-55310/12H-2009 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 0.05 MHz Through 10 MHz, Hermetic Seal, Square Wave, CMOS
  • MIL MIL-PRF-55310/30D-2008 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 450 KHz Through 100 MHz, Hermetic Seal, Low Voltage CMOS
  • MIL MIL-PRF-55310/16J-2008 Oscillator, Crystal Controlled, TYPE 1 (Crystal Oscillator (XO)), 0.1 HZ Through 80 MHZ, Hermetic Seal, Square Wave, TTL
  • MIL MIL-PRF-55310/9J-2009 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 400 kHz Through 60 MHz, Hermetic Seal, Square Wave, TTL
  • MIL MIL-PRF-55310/13H-2009 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 300 Hz Through 10 MHz, Hermetic Seal, Square Wave, CMOS
  • MIL MIL-PRF-55310/26D-2009 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 10kHz Through 65 MHz, Hermetic Seal, Square Wave, High Speed CMOS
  • MIL MIL-PRF-55310/29C-2011 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 0.2 MHz Through 85 MHz, Hermetic Seal, Square Wave, HCMOS
  • MIL MIL-PRF-55310/21G-2008 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1.0 MHZ Through 60.0 MHZ, Hermetic Seal, Square Wave, TTL
  • MIL MIL-PRF-55310/34B-2010 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 150 MHz, Hermetic Seal, Low Voltage CMOS
  • MIL MIL-PRF-55310/11G-2009 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 0.05 MHz Through 10 MHz, Hermetic Seal, Square Wave, CMOS
  • MIL MIL-PRF-55310/13J-2010 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 300 Hz Through 10 MHz, Hermetic Seal, Square Wave, CMOS
  • MIL MIL-PRF-55310/34D-2018 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 150 MHz, Hermetic Seal, Low Voltage CMOS
  • MIL MIL-PRF-55310/19E-2009 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1.0 MHz Through 60.0 MHz, Hermetic Seal, Square Wave, TTL
  • MIL MIL-PRF-55310/18F-2009 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 0.01 Hz Through 15.0 MHz, Hermetic Seal, Square Wave, CMOS
  • MIL MIL-PRF-55310/8J-2009 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 50 Hz Through 50 MHz, Hermetic Seal, Square Wave, TTL
  • MIL MIL-PRF-55310/28D-2017 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1.0 MHz Through 85 MHz, Hermetic Seal, Square Wave, TTL
  • AWWA C713-2019 Cold-Water Meters - Fluidic-Oscillator Type
  • MIL MIL-PRF-55310/39-2007 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO), 1 MHZ THROUGH 133 MHZ, HERMETIC SEAL, LOW VOLTAGE 2.5V CMOS
  • MIL MIL-PRF-55310/35A-2010 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1 MHz through 133 MHz, Hermetic Seal, Low Voltage 2.5V CMOS
  • MIL MIL-PRF-55310/36A-2010 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1 MHz through 100 MHz, Hermetic Seal, Low Voltage 1.8V CMOS
  • MIL MIL-PRF-55310/10J-2009 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1 kHz Through 60 MHz, Hermetic Seal, Square Wave, TTL
  • MIL MIL-PRF-55310/30C-2008 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 450 KHZ through 100 MHZ, Hermetic Seal, Low Voltage CMOS
  • MIL MIL-PRF-55310/34C-2013 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 150 MHz, Hermetic Seal, Low Voltage CMOS
  • BS 9037:1979 Blank detail specification for oscillator klystrons of assessed quality
  • MIL MIL-PRF-55310/28C-2008 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1.0 MHz Through 85 MHz, Hermetic Seal, Square Wave, TTL
  • MIL MIL-PRF-55310/14H-2009 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 0.1 Hz Through 25 MHz, Hermetic Seal, Square Wave, TTL
  • MIL MIL-PRF-55310/36B-2013 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1 MHz through 100 MHz, Hermetic Seal, Low Voltage 1.8V CMOS
  • MIL MIL-PRF-55310/35-2007 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO), 1 MHZ THROUGH 133 MHZ, HERMETIC SEAL, LOW VOLTAGE 2.5V CMOS
  • MIL MIL-PRF-55310/39B-2013 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1 MHz Through 133 MHz, Hermetic Seal, Low Voltage 2.5V CMOS
  • MIL MIL-PRF-55310/40A-2010 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1 MHz Through 100 MHz, Hermetic Seal, Low Voltage 1.8V CMOS
  • MIL MIL-PRF-55310/35C-2018 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1 MHz through 133 MHz, Hermetic Seal, Low Voltage 2.5V CMOS
  • MIL MIL-PRF-55310/40B-2013 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1 MHz Through 100 MHz, Hermetic Seal, Low Voltage 1.8V CMOS
  • MIL MIL-PRF-55310/39A-2010 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1 MHz Through 133 MHz, Hermetic Seal, Low Voltage 2.5V CMOS
  • MIL MIL-PRF-55310/38C-2018 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 150 MHz, Hermetic Seal, Low Voltage CMOS
  • MIL MIL-PRF-55310/21H-2018 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1.0 MHZ Through 60.0 MHZ, Hermetic Seal, Square Wave, TTL
  • MIL MIL-PRF-55310/40C-2018 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1 MHz Through 100 MHz, Hermetic Seal, Low Voltage 1.8V CMOS
  • MIL MIL-PRF-55310/36C-2018 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1 MHz through 100 MHz, Hermetic Seal, Low Voltage 1.8V CMOS
  • AWWA C713-2005 Cold-Water Meters: Fluidic-Oscillator Type
  • MIL MIL-PRF-55310/40-2007 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 1 MHZ THROUGH 100 MHZ, HERMETIC SEAL, LOW VOLTAGE 1.8V CMOS
  • MIL MIL-PRF-55310/32C-2017 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1.544 MHz through 125 MHz, Hermetic Seal, Square Wave, Advanced CMOS
  • MIL MIL-PRF-55310/31A-2010 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 0.75 MHz Through 200 MHz, Hermetic Seal, Square Wave, Advanced CMOS
  • MIL MIL-PRF-55310/17F-2009 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), Gated, 250 kHz Through 50 MHz, Hermetic Seal, Square Wave, TTL
  • MIL MIL-PRF-55310/27E-2017 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1.0 MHz through 85 MHz, Hermetic Seal, Square Wave, High Speed CMOS
  • MIL MIL-PRF-55310/36-2007 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO), 1 MHZ THROUGH 100 MHZ, HERMETIC SEAL, LOW VOLTAGE 1.8V CMOS
  • MIL MIL-PRF-55310/39C-2018 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1 MHz Through 133 MHz, Hermetic Seal, Low Voltage 2.5V CMOS
  • MIL MIL-PRF-55310/35B-2013 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1 MHz through 133 MHz, Hermetic Seal, Low Voltage 2.5V CMOS
  • MIL MIL-PRF-55310/27C-2008 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1.0 MHZ through 85 MHZ, Hermetic Seal, Square Wave, High Speed CMOS
  • IEC 60122-2:1962/AMD1:1969 Amendment 1 - Quartz crystal units for oscillators - Part 2: Guide to the use of quartz oscillator crystals
  • MIL MIL-PRF-55310/32-2006 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 1.544 MHZ THROUGH 125 MHZ, HERMETIC SEAL, SQUARE WAVE, ADVANCED CMOS
  • MIL MIL-PRF-55310/27D-2008 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1.0 MHz through 85 MHz, Hermetic Seal, Square Wave, High Speed CMOS
  • MIL MIL-PRF-55310/32B-2008 Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 1.544 MHz through 125 MHz, Hermetic Seal, Square Wave, Advanced CMOS
  • MIL MIL-PRF-55310/31-2006 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 0.75 MHZ THROUGH 200 MHZ, HERMETIC SEAL, SQUARE WAVE, ADVANCED CMOS

German Institute for Standardization

  • DIN 4235-1:1978 Compacting of Concrete by Vibrating; Vibrators and Vibration Mechanics
  • DIN 4235-5:1978 Compacting of Concrete by Vibrating; Compacting by Surface Vibrators
  • DIN 4235-4:1978 Compacting of Concrete by Vibrating; Compacting of In-situ by Formwork Vibrators
  • DIN EN ISO 12185:1997 Crude petroleum and petroleum products - Determination of density - Oscillating U-tube method (ISO 12185:1996); German version EN ISO 12185:1996
  • DIN IEC 60679-2:1997 Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators (IEC 60679-2:1981)
  • DIN EN ISO 1797:2017-09 Dentistry - Shanks for rotary and oscillating instruments (ISO 1797:2017); German version EN ISO 1797:2017
  • DIN 1311-1:2000-02 (Mechanical) vibrations, oscillation and vibration systems - Part 1: Basic concepts, survey
  • DIN IEC 60679-2:1997-09 Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators (IEC 60679-2:1981)
  • DIN 1311-2:2002 (Mechanical) vibrations, oscillations and vibration systems - Part 2: Linear vibration systems with single degree of freedom

RU-GOST R

  • GOST 20412-1975 Oscillator, modulator and regulation tube. Terms and definitions
  • GOST 19438.19-1978 Low-power electronic tubes. Measurement of microphone effect by method of shock excitation
  • GOST 22866-1977 Crystal oscillators. Terms and definitions
  • GOST 16165-1980 Transistor ultrasonic osillators for technological installations. General specifications
  • GOST 18604.15-1977 Bipolar microwave oscillator transistors. Techniques for measuring critical current

RO-ASRO

  • STAS 9742-1974 OSCILLATING AND SHAKING CONVEYORS WITH TUBULAR TROUGH Basic parameters
  • STAS 9877-1989 VTBRATING CONVEYORS AND OSCILATING CONVEYERS Safety special specifications

Korean Agency for Technology and Standards (KATS)

  • KS V 8863-1997(2012) Power management system for marine generating plants
  • KS C 6503-1984 Quartz crystal units for oscillators
  • KS C 6503-1999 Quartz crystal units for oscillators
  • KS C IEC 60679-2-2023 Quartz Crystal Oscillator Part 2: A Guide to Using a Quartz Crystal Oscillator
  • KS C IEC 60679-2:2018 Quartz crystal controlled oscillators — Part 2: Guide to the use of quartz crystal controlled oscillators
  • KS C 6508-2013 Quartz Crystal Units for Oscillators (for 200∼1000kHz)
  • KS M ISO 12185:2003 Crude petroleum and petroleum products-Determination of density-Oscillating U-tube method
  • KS C 6509-1991(2011) General Rules of Quartz Crystal Controlled Oscillators
  • KS C 6509-1991 General Rules of Quartz Crystal Controlled Oscillators
  • KS C IEC 62860-1:2018 Test methods for the Characterization of Organic Transistor-Based Ring Oscillators
  • KS C 6508-1990 Quartz Crystal Units for Oscillators (for 200∼1000kHz)
  • KS M ISO 12185-2023 Crude petroleum and petroleum products - Determination of density - Oscillating U-tube method
  • KS C 6504-1987 Ovens for Quartz Crystal Units
  • KS C IEC 60679-6:2018 Quartz crystal controlled oscillators of assessed quality — Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators – Application guidelines
  • KS C IEC 60679-6-2023 Qualified Quartz Crystal Oscillators Part 6: Application Guidelines for Phase Jitter Measurement Methods for Quartz Crystal Oscillators and Surface Acoustic Wave Oscillators
  • KS C IEC 62860-1-2023 Test methods for the Characterization of Organic Transistor-Based Ring Oscillators
  • KS C 6503-1999(2009) QUARTZ CRYSTAL UNITS FOR OSCILLATORS

U.S. Military Regulations and Norms

IN-BIS

  • IS 6134 Pt.2-1973 Measurement methods for microwave tubes Part Ⅱ Oscillator tubes

Electronic Components, Assemblies and Materials Association

TR-TSE

  • TS 2319-1976 Quartz Crystal Units For Oscilators
  • TS 2047-1975 MEASUREMENT OF THE ELECTRICAL PROPERTIES OF MICRO W AVETUBES LOW — POWER OSCILLATOR KLYSTRONS
  • TS 2050-1975 MEASUREMENT OF THE ELECTRICAL PROPERTIES OF MICROWAVE TUBES BACKWARD — WAVE OSCILLATOR TUBES —?0? TYPE

Military Standards (MIL-STD)

United States Navy

AENOR

Japanese Industrial Standards Committee (JISC)

International Electrotechnical Commission (IEC)

  • IEC 60679-2:1981 Quartz crystal controlled oscillators. Part 2 : Guide to the use of quartz crystal controlled oscillators
  • IEC 60235-8:1972 Measurement of the electrical properties of microwave tubes. Part 8 : Backward-wave oscillator tubes - "0" type
  • IEC PAS 60679-6:2008 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guide
  • IEC 60679-6:2011 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guide
  • IEC 60235-5:1972 Measurement of the electrical properties of microwave tubes. Part 5 : Low-power oscillator klystrons
  • IEC 60235-8A:1974 Measurement of the electrical properties of microwave tubes. Part 8 : Backward-wave oscillator tubes - "0" type.

CO-ICONTEC

KR-KS

  • KS C IEC 60679-2-2018(2023) Quartz crystal controlled oscillators — Part 2: Guide to the use of quartz crystal controlled oscillators
  • KS C IEC 60679-2-2018 Quartz crystal controlled oscillators — Part 2: Guide to the use of quartz crystal controlled oscillators
  • KS C IEC 60679-6-2018(2023) Quartz crystal controlled oscillators of assessed quality — Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators – Application guidelines
  • KS M ISO 12185-2003(2023) Crude petroleum and petroleum products - Determination of density - Oscillating U-tube method
  • KS C IEC 60679-6-2018 Quartz crystal controlled oscillators of assessed quality — Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators – Application guidelines
  • KS C IEC 62860-1-2018 Test methods for the Characterization of Organic Transistor-Based Ring Oscillators

International Organization for Standardization (ISO)

  • ISO 787-20:1975 General methods of test for pigments — Part 20: Comparison of ease of dispersion (Oscillatory shaking method)

Association Francaise de Normalisation

  • NF M07-096:2000 Water-in-diesel emulsions - Density determination - Oscillating U-tube method
  • NF EN 60679-6:2011 Quality assured crystal driven oscillators - Part 6: Phase jitter measurement method for crystal oscillators and SAW oscillators - Application guidelines
  • NF C93-620-6*NF EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality - Part 6 : phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
  • NF T60-172*NF EN ISO 12185:1996 Crude petroleum and petroleum products. Determination of density. Oscillating U-tube method.
  • NF EN ISO 12185:1996 Crude oils and petroleum products - Determination of density - Oscillating U-tube method
  • NF EN ISO 1797:2017 Médecine bucco-dentaire - Queues pour instruments rotatifs et oscillants

GSO

  • GSO IEC 60679-6:2014 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
  • BH GSO IEC 60679-6:2016 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
  • OS GSO IEC 60679-2:2014 Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators
  • BH GSO IEC 60679-2:2016 Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators
  • GSO IEC 60679-2:2014 Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators
  • OS GSO IEC 60679-6:2014 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
  • GSO ISO 12185:2013 Crude petroleum and petroleum products – Determination of density - Oscillating U-tube method
  • BH GSO ISO 12185:2015 Crude petroleum and petroleum products – Determination of density - Oscillating U-tube method
  • OS GSO IEC 60235-8:2014 Measurement of the electrical properties of microwave tubes. Part 8: Backward-wave oscillator tubes - '0' type
  • OS GSO IEC 60235-5:2014 Measurement of the electrical properties of microwave tubes. Part 5: Low-power oscillator klystrons
  • GSO IEC 60235-8:2014 Measurement of the electrical properties of microwave tubes. Part 8: Backward-wave oscillator tubes - '0' type
  • BH GSO IEC 60235-8:2016 Measurement of the electrical properties of microwave tubes. Part 8: Backward-wave oscillator tubes - '0' type
  • GSO IEC 60235-5:2014 Measurement of the electrical properties of microwave tubes. Part 5: Low-power oscillator klystrons
  • GSO IEC 60235-8A:2014 Measurement of the electrical properties of microwave tubes - Part 8: Backward-wave oscillator tubes - 'O' type - First supplement

British Standards Institution (BSI)

  • BS EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality. Phase jitter measurement method for quartz crystal oscillators and SAW oscillators. Application guidelines
  • BS EN 61338-2:2004 Waveguide type dielectric resonators - Guidelines for oscillator and filter applications
  • BS IEC 62860-1:2013 Test methods for the characterization of organic transistor-based ring oscillators

American National Standards Institute (ANSI)

VDI - Verein Deutscher Ingenieure

IEC - International Electrotechnical Commission

  • PAS 60679-6-2008 Quartz crystal controlled oscillators of assessed quality – Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators – Application guide (Edition 1.0)

Danish Standards Foundation

  • DS/EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
  • DS/EN ISO 12185:1997 Crude petroleum and petroleum products - Determination of density - Oscillating U-tube method

CENELEC - European Committee for Electrotechnical Standardization

  • EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines

American Water Works Association (AWWA)

SE-SIS

Lithuanian Standards Office

  • LST EN 60679-6-2011 Quartz crystal controlled oscillators of assessed quality -- Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines (IEC 60679-6:2011)

ES-UNE

  • UNE-EN ISO 1797:2017 Dentistry - Shanks for rotary and oscillating instruments (ISO 1797:2017) (Endorsed by Asociación Española de Normalización in July of 2017.)

PL-PKN

IET - Institution of Engineering and Technology