iec no

iec no, Total:21 items.

The international standard classification for "iec no" includes: .

The Chinese standard classification for "iec no" includes: .

Danish Standards Foundation

DS/IEC 192:1992 Low pressure sodium vapour lamps
DS/IEC 287:1992 Calculation of the continuous current rating of cables (100% load factor)
DS/IEC 183:1992 Guide to the selection of high-voltage cables
DS/IEC 793-1:1992 Optical fibres. Part 1: Generic specification
DS/IEC 793-2:1992 Optical fibres. Part 2: Product specifications
DS/IEC 529:1992 Degrees of protection provided by enclosures (IP code)
DS/IEC 748-1:1992 Semiconductor devices. Integrated circuits.Part 1: General
DS/IEC 68-2-32:1992 Environmental testing. Part 2: Tests. Test Ed: Free fall
DS/IEC 881-1-3:1992 Common test methods for insulating and sheathing materials of electric cables Part 1: Methods for general application. Section three: Methods for determining the density. Water absorption tests. Shrinkage test
DS/IEC 811-1-2:1992 Common test methods for insulating and sheathing materials of electric cables. Part 1: Methods for general application. Section two: Thermal ageing methods
DS/IEC 747-7:1992 Semiconductor devices. Discrete devices. Part 7: Bipolar transistors
DS/IEC 896-1:1992 Stationary lead-acid batteries. General requirements and methods of test. Part 1: Vented types
DS/IEC 747-4:1992 Semiconductor devices. Discrete devices. Part 4: Microwave diodes and transistors
DS/IEC 747-8:1992 Semiconductor devices. Discrete devices. Part 8: Field-effect transistors
DS/IEC CISPR 23:1989 International Electrotechnical Commission IEC Publication No. CISPR 23 First edition 1987 Determination of limits for industrial, scientific and medical equipment
DS/IEC 68-2-1:1991 Environmental testing. Part 2: Tests. Test A: Cold
DS/IEC 122-3:1992 Quartz crystal units for frequency control and selection. Part 3: Standard outlines and lead connections
DS/IEC 811-1-1:1992 Common test methods for insulating and sheathing materials of electric cables. Part 1: Methods for general application. Section One: Measurement of thickness and overall dimensions. Tests for determining the mechanical properties
DS/IEC 747-7:1990 International Electrotechnical Commission IEC Publication No. 747-7:1988 Semiconductor devices - Discrete devices -Part 7: Bipolar transistors
DS/IEC 747-6-2:1992 Semiconductor devices. Discrete devices. Part 6:Thyristors. Section two. Blank detail specification for bidirectional triode thyristors (triacs), ambient or case-rated, up to 100 A
DS/IEC 68-2-21:1992 Basic environmental testing procedures. Part 2: Test. Test U: Robustness of terminations and integral mounting devices

Others: iec 60917 and iec 60297,iec 61158 iec 61784,iec60060 and iec,iec60255iec60255iec60255iec60255iec60255iec60255-8,iec 93-iec 93,iec no,iec 8824,iec 62660 iec62660,iec 61158/iec 61784,iec+ +iec60265,iec 61280 iec 61280iec 61280 iec 61280iec 61280iec 61280iec 61280-4-1,iec+iec+60721,iec60945iec60945,iec62055iec,iec 60721 and iec 60068,iec60439 and iec,ms iec and iec,iec.iec+60034