Component Electron Microscope
Component Electron Microscope, Total:46 items.
The international standard classification for "Component Electron Microscope" includes: .
The Chinese standard classification for "Component Electron Microscope" includes: Electron optics and other physical optics instrument , Magnifier and microscope .
Professional Standard - Machinery
- JB/T 9352-1999 Test method for the transmission electron microscope
- JB/T 7398.7-1994 Microscope - Revolving Nosepiece
- JB/T 5480-1991 Diaphragm of Electron Microscope
- JB/T 5384-1991 Scanning Electron Microscope - Technical Specification
- JB/T 5383-1991 Specification for Transmission Electron Microscope
- JB/T 6842-1993 Test Method of Scanning Electron Microscope
- JB/T 5481-1991 Lamp Filament of Electron Microscope
Professional Standard - Education
- JY/T 011-1996 General rules for transmission electron microscopy
National Metrological Technical Specifications of the People's Republic of China
- JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)
National Metrological Verification Regulations of the People's Republic of China
- JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
- JJG(地质) 1016-1990 Calibration Regulations for Transmission Electron Microscopy
- JJG(教委) 12-1992 Calibration Regulations for Transmission Electron Microscopy
Group Standards of the People's Republic of China
- T/CSTM 00162-2020 Calibration methods for transmission electron microscope
Institute of Interconnecting and Packaging Electronic Circuits (IPC)
- IPC TM-650 2.6.22-1995 Acoustic Microscopy for Plastic Encapsulated Electronic Components
- IPC J-STD-035-1999 Acoustic Microscopy for Non-Hermetic Encapsulated Electronic Components
- IPC/JEDEC J-STD-035-1999 Acoustic Microscopy for Non-Hermetic Encapsulated Electronic Components [Superseded: IPC TM-650 2.6.22]
International Electrotechnical Commission (IEC)
- IEC PAS 62191:2000 Acoustic microscopy for nonhermetic encapsulated electronic components
(U.S.) Joint Electron Device Engineering Council Soild State Technology Association
- JEDEC J-STD-035-1999 Acoustic Microscopy for Nonhermetic Encapsulated Electronic Components
SCC
- BS 7012-1:1990 Light microscopes-Specification for the magnifying power of microscope imaging components
- BS ISO 22493:2008 Microbeam analysis. Scanning electron microscopy. Vocabulary
- BS 7012-4:1989 Light microscopes-Specification for microscope objective and nosepiece screw threads
International Organization for Standardization (ISO)
- ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
- ISO/DIS 25498:2024 Microbeam analysis-Analytical electron microscopy-Selected area electron diffraction analysis using a transmission electron microscope
- ISO/CD 25498:2023 Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
- ISO 8036:2006 Optics and photonics - Microscopes - Immersion liquids for light microscopy
GSO
- OS GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
- BH GSO ISO 25498:2017 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
- GSO ISO 25498:2015 Microbeam analysis -- Analytical electron microscopy -- Selected-area electron diffraction analysis using a transmission electron microscope
- OS GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
- GSO ISO 15932:2015 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
- BH GSO ISO 22493:2017 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
- BH GSO ISO 15932:2017 Microbeam analysis -- Analytical electron microscopy -- Vocabulary
- GSO ISO 22493:2015 Microbeam analysis -- Scanning electron microscopy -- Vocabulary
British Standards Institution (BSI)
- BS ISO 25498:2018 Microbeam analysis. Analytical electron microscopy. Selected area electron diffraction analysis using a transmission electron microscope
- 18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
- 24/30479937 DC BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
- BS CECC 00013:1985 Harmonized system of quality assessment for electronic components: basic specification: scanning electron microscope inspection of semiconductor dice
Japanese Industrial Standards Committee (JISC)
- JIS K 0132:1997 General rules for scanning electron microscopy
- JIS K 2400 AMD 1:2015 Microscopes -- Immersion liquids for light microscopy (Amendment 1)
German Institute for Standardization
- DIN 58272:2009 Medical instruments - Microscopic forceps, fine pattern
- DIN 58272:2016 Medical instruments - Microscopic forceps, fine pattern
- DIN 58272:1983 Medical instruments; microscopic forceps, fine pattern
Korean Agency for Technology and Standards (KATS)
- KS D ISO 22493:2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
- KS D ISO 22493-2012(2017) Microbeam analysis－Scanning electron microscopy－Vocabulary
Association Francaise de Normalisation
- NF ISO 15932:2014 Analyse par microfaisceaux - Microscopie électronique analytique - Vocabulaire
KR-KS
- KS D ISO 22493-2022 Microbeam analysis —Scanning electron microscopy — Vocabulary
Component Electron Microscope,iec components,Optical components,eia components,Component packaging,Instrument components,components iec,Magnetic components,Sensitive components,Instrument components,Imported components,Components,Crystal components,Crystal components,Component classification,Component grade,Component aging,Spectral components,Component Standards
