Particle Noise (PIND) Test
Particle Noise (PIND) Test, Total:18 items.
The international standard classification for "Particle Noise (PIND) Test" includes: Aircraft and space vehicles in general .
The Chinese standard classification for "Particle Noise (PIND) Test" includes: Basic standards and general methods .
Professional Standard - Aerospace
- QJ 2863-1996 Requirements and Method for Particles Impact Noise Detection (PIND) for Aerospace
SCC
- MIL MIL-STD-202/217-2015 Method 217, Particle Impact Noise Detection (PIND)
- DANSK DS/EN 60749-16:2003 Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noice detection (PIND)
IEC - International Electrotechnical Commission
- PAS 62171-2000 Guidelines for Particle Impact Noise Detection (PIND) Testing@ Operator Training and Certification (Edition 1.0)
Korean Agency for Technology and Standards (KATS)
- KS C IEC 60749-16-2006(2016) Semiconductor devices－Mechanical and climatic test methods－Part 16：Particle impact noise detection(PIND)
- KS C IEC 60749-16:2006 Semiconductor devices－Mechanical and climatic test methods－Part 16：Particle impact noise detection(PIND)
- KS C IEC 60749-16-2021 Semiconductor devices－Mechanical and climatic test methods－Part 16：Particle impact noise detection(PIND)
- KS C IEC 60749-16-2006(2021) Semiconductor devices－Mechanical and climatic test methods－Part 16：Particle impact noise detection(PIND)
Danish Standards Foundation
- DS/EN 60749-16:2003 Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noice detection (PIND)
International Electrotechnical Commission (IEC)
- IEC 60749-16:2003 Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection (PIND)
German Institute for Standardization
- DIN EN 60749-16:2003 Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection (PIND) (IEC 60749-16:2003); German version EN 60749-16:2003
- DIN EN 60749-16:2003-09 Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection (PIND) (IEC 60749-16:2003); German version EN 60749-16:2003
European Committee for Electrotechnical Standardization（CENELEC）
- EN 60749-16:2003 Semiconductor devices Mechanical and climatic test methods Part 16: Particle impact noise detection (PIND)
AENOR
- UNE-EN 60749-16:2003 Semiconductor devices. Mechanical and climatic test methods. Part 16: Particle impact noise detection (PIND)
British Standards Institution (BSI)
- BS EN 60749-16:2003 Semiconductor devices - Mechanical and climatic test methods - Particle impact noise detection (PIND)
(U.S.) Joint Electron Device Engineering Council Soild State Technology Association
- JEDEC JEP114.01-2007 Guidelines for Particle Impact Noise Detection (PIND) Testing, Operator Training, and Certification (Minor Revision of JEP114, December 1989)
- JEDEC JEP114-1989 Guidelines for Particle Impact Noise Detection (PIND) Testing, Operator Training and Certification
Association Francaise de Normalisation
- NF C96-022-16*NF EN 60749-16:2003 Semiconductor devices - Mechanical and climatic test methods - Part 16 : particle impact noise dectection (PIND).
