Magnetic probe
Magnetic probe, Total:12 items.
The international standard classification for "Magnetic probe" includes: .
The Chinese standard classification for "Magnetic probe" includes: .
German Institute for Standardization
- DIN EN 61967-6:2008 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method (IEC 61967-6:2002 + A1:2008); German version EN 61967-6:2002 + A1:2008
- DIN EN 61967-6 Berichtigung 1:2011-02 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method (IEC 61967-6:2002 + A1:2008); German version EN 61967-6:2002 + A1:2008, Corrigendum to DIN EN 61967-6:...
SCC
- DANSK DS/EN 61967-6:2003 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz - 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
- CEI EN 61967-6:2009 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 6: Measurement of conducted emissions - Magnetic probe method
ES-UNE
- UNE-EN 61967-6:2002/A1:2008 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 6: Measurement of conducted emissions - Magnetic probe method (Endorsed by AENOR in September of 2008.)
- UNE-EN 61967-6:2002 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 6: Measurement of conducted emissions - Magnetic probe method (Endorsed by AENOR in November of 2002.)
Association Francaise de Normalisation
- NF EN 61967-6/A1:2008 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: measurement of conducted emissions - Magnetic probe method
- NF EN 61967-6:2003 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: measurement of conducted emissions - Magnetic probe method
International Electrotechnical Commission (IEC)
- IEC 61967-6:2002/AMD1:2008 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
- IEC 61967-6:2002+AMD1:2008 CSV Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
- IEC 61967-6:2008 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
Danish Standards Foundation
- DS/EN 61967-6:2003 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz - 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
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