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Technical Regulations for Resistivity Profile Method

Technical Regulations for Resistivity Profile Method, Total:22 items.

The international standard classification for "Technical Regulations for Resistivity Profile Method" includes: Geology. Meteorology. Hydrology , Mining and quarrying , Exploratory and extraction equipment .

The Chinese standard classification for "Technical Regulations for Resistivity Profile Method" includes: Geological mineral survey and development in general , Metal ore survey , Nontechnical ore survey , Petroleum geology exploration .


Professional Standard - Geology

Professional Standard - Petroleum

  • SY/T 5454-2010 Technical Specification of Vertical Seismic Profiling
  • SY/T 5454-1996 Technical standards of vertical seismic profiling
  • SY/T 5454-2003 Technical specifications of vertical seismic profilling
  • SY/T 6289-2006 Technical Specifications for Continuous Electro Magnetic Profiling
  • SY/T 6080-1994 Xanthan gum profile control technical procedures
  • SY/T 6289-1997 Technical specifications for continuous electromagnetic profiling method
  • SY/T 6689-2007 Technical specifications for complex resistivity method
  • SY 5454-1992 Vertical seismic profile method exploration technical regulations

Henan Provincial Standard of the People's Republic of China

  • DB4101/T 51-2022 Soil profile segmented box-shaped specimen collection technical regulations
  • DB41/T 2839-2025 Technical Regulations for the Collection and Preparation of Soil Profile Horizon Box Specimens
  • DB41/T 2687-2024 Technical regulations for collecting soil whole section specimens

Hebei Provincial Standard of the People's Republic of China

Ningxia Provincial Standard of the People's Republic of China

  • DB64/T 1200-2016 Technical regulations for grassland soil profile survey in arid and sandy area

Professional Standard - Ocean

  • HY/T 0398-2024 Underway conductivity-temperature-depth profiler observation technicalCode of practice

American Society for Testing and Materials (ASTM)

  • ASTM F672-01 Method for measuring resistivity profile perpendicular to silicon wafer surface - Diffusion probe method

Ente Nazionale Italiano di Unificazione

  • UNI 3972-1961 Technical drawings. Conventional representation of material within a section Hatch method
  • UNI 3972-1981 Technical drawings. Hatchings for representation of materials in section.