Analytical MS/MS

Analytical MS/MS, Total:143 items.

The international standard classification for "Analytical MS/MS" includes: Chemical analysis , Organic chemicals in general .

The Chinese standard classification for "Analytical MS/MS" includes: Basic standards and general methods , Organic chemicals in general , chromatograph , Technical Management .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 6041-2020 General rules for mass spectrometric analysis
GB/T 40109-2021 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
GB/T 43663-2024 Surface chemical analysis—Secondary-ion mass spectrometry—Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
GB/T 40129-2021 Surface chemical analysis—Secondary ion mass spectrometry—Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
GB/Z 35959-2018 General rule for liquid chromatography-mass spectrometry
GB/T 6041-2002 General rules for mass spectrometric analysis
GB/T 32495-2016 Surface chemical analysis—Secondary-ion mass spectrometry—Method for depth profiling of arsenic in silicon
GB/T 22572-2008 Surface chemical analysis - Secondary-ion mass spectrometry - Method for estimating depth resolution parameters with multiple delta-layer reference materials

Taiwan Provincial Standard of the People's Republic of China

CNS 12509-1989 General Rules Analytical Methods in Gas Chromatography/Mass Spectrometry
CNS 12511-1989 General Rules for Mass Spectrometric Analysis

Professional Standard - Education

JY/T 003-1996 General principles for organic mass spectrometry
JY/T 0572-2020 General rules for analytical methods for circular dichroism spectroscopy

Professional Standard - Petroleum

SY/T 5258-1991 Chromatography-mass spectrometry identification method for biomarkers
SY/T 7315-2016 Comprehensive two-dimensional gas chromatography component analysis method for condensate oil

Professional Standard - Electron

SJ/T 10551-2021 The measurement of emission spectrum analysis for aluminium oxide used in electronic ceramics
SJ/T 10553-2021 Method of emission specthchemical analysis of impurities in ZrO2 for use in electron ceramics
SJ/T 10553-1994 Method of emission spectrochemical analysis of impurities in ZrO2 for use in electron ceramics
SJ/T 10552-2021 Method of emission specthchemical analysis of impurities in TiO2 for use in electron ceramics
SJ/T 10551-1994 Method of emission spectrochemical analysis of impurities in AL203 for use in electron ceramics
SJ/T 10552-1994 Method of emission specthochemical analysis of impurities in TiO2 for use in electron ceramics

Group Standards of the People's Republic of China

T/ZPP 017-2023 Mass Cytometry Analyzer

Zhejiang Provincial Standard of the People's Republic of China

DB33/T 542-2005 Determination of chloramphenicol residues in aquatic products by gas chromatography-secondary mass spectrometry

Military Standard of the People's Republic of China-General Armament Department

GJB 5168-2003 Lithium isotope abundance mass spectrometry

Professional Standard - Energy

NB/T 11608-2024 Methods for Spectral Analysis of Extracted Materials from Shale

Anhui Provincial Standard of the People's Republic of China

DB34/T 3368.3-2019 Analytical methods of hazardous substances in printed circuit boards - Part 3: Determination of polybrominated biphenyls and polybrominated diphenyl ethers by gas chromatography-mass spectrometry

American Society for Testing and Materials (ASTM)

ASTM C696-11 Standard Test Methods for Chemical, Mass Spectrometric, and Spectrochemical Analysis of Nuclear-Grade Uranium Dioxide Powders and Pellets
ASTM C696-99 Standard Test Methods for Chemical, Mass Spectrometric, and Spectrochemical Analysis of Nuclear-Grade Uranium Dioxide Powders and Pellets
ASTM C696-99(2005) Standard Test Methods for Chemical, Mass Spectrometric, and Spectrochemical Analysis of Nuclear-Grade Uranium Dioxide Powders and Pellets
ASTM C791-83(2000) Standard Test Methods for Chemical, Mass Spectrometric, and Spectrochemical Analysis of Nuclear-Grade Boron Carbide
ASTM C697-98 Standard Test Methods for Chemical, Mass Spectrometric, and Spectrochemical Analysis of Nuclear-Grade Plutonium Dioxide Powders and Pellets
ASTM C696-19 Standard Test Methods for Chemical, Mass Spectrometric, and Spectrochemical Analysis of Nuclear-Grade Uranium Dioxide Powders and Pellets
ASTM C697-24 Standard Test Methods for Chemical, Mass Spectrometric, and Spectrochemical Analysis of Nuclear-Grade Plutonium Dioxide Powders and Pellets
ASTM RR-C26-1000 1976 C0791-Methods for Chemical, Mass Spectrometric, Spectrochemical Analysis of Nuclear-Grade Boron Carbide
ASTM C697-16 Standard Test Methods for Chemical, Mass Spectrometric, and Spectrochemical Analysis of Nuclear-Grade Plutonium Dioxide Powders and Pellets
ASTM E1504-11 Standard Practice for Reporting Mass Spectral Data in Secondary Ion Mass Spectrometry (SIMS)
ASTM C697-10 Standard Test Methods for Chemical, Mass Spectrometric, and Spectrochemical Analysis of Nuclear-Grade Plutonium Dioxide Powders and Pellets
ASTM C697-04 Standard Test Methods for Chemical, Mass Spectrometric, and Spectrochemical Analysis of Nuclear-Grade Plutonium Dioxide Powders and Pellets
ASTM RR-C26-1012 2003 C0791-Standard Test Methods for Chemical, Mass Spectrometric, and Spectrochemical Analysis of Nuclear-Grade Boron Carbide
ASTM C791-19 Standard Test Methods for Chemical, Mass Spectrometric, and Spectrochemical Analysis of Nuclear-Grade Boron Carbide
ASTM C791-24 Standard Test Methods for Chemical, Mass Spectrometric, and Spectrochemical Analysis of Nuclear-Grade Boron Carbide
ASTM C791-12 Standard Test Methods for Chemical, Mass Spectrometric, and Spectrochemical Analysis of Nuclear-Grade Boron Carbide
ASTM C809-94(2000) Standard Test Methods for Chemical, Mass Spectrometric, and Spectrochemical Analysis of Nuclear-Grade Aluminum Oxide and Aluminum Oxide-Boron Carbide Composite Pellets
ASTM C791-04 Standard Test Methods for Chemical, Mass Spectrometric, and Spectrochemical Analysis of Nuclear-Grade Boron Carbide
ASTM E1881-12 Standard Guide for Cell Culture Analysis with SIMS
ASTM C759-10 Standard Test Methods for Chemical, Mass Spectrometric, Spectrochemical, Nuclear, and Radiochemical Analysis of Nuclear-Grade Plutonium Nitrate Solutions
ASTM C698-16 Standard Test Methods for Chemical, Mass Spectrometric, and Spectrochemical Analysis of Nuclear-Grade Mixed Oxides ((U, Pu)O 2 )
ASTM C791-11 Standard Test Methods for Chemical, Mass Spectrometric, and Spectrochemical Analysis of Nuclear-Grade Boron Carbide
ASTM UOP1015-17 Determination of Trace Oxygenates in Polymer Grade Ethylene & Propylene by Gas Chromatography Mass Spectrometry
ASTM E1881-06 Standard Guide for Cell Culture Analysis with SIMS
ASTM C698-04 Standard Test Methods for Chemical, Mass Spectrometric, and Spectrochemical Analysis of Nuclear-Grade Mixed Oxides ((U, Pu)O ₂ )
ASTM C799-19 Standard Test Methods for Chemical, Mass Spectrometric, Spectrochemical, Nuclear, and Radiochemical Analysis of Nuclear-Grade Uranyl Nitrate Solutions
ASTM C758-18 Standard Test Methods for Chemical, Mass Spectrometric, Spectrochemical, Nuclear, and Radiochemical Analysis of Nuclear-Grade Plutonium Metal
ASTM C758-04(2010) Standard Test Methods for Chemical, Mass Spectrometric, Spectrochemical, Nuclear, and Radiochemical Analysis of Nuclear-Grade Plutonium Metal
ASTM C698-98 Standard Test Methods for Chemical, Mass Spectrometric, and Spectrochemical Analysis of Nuclear-Grade Mixed Oxides ((U, Pu)O ₂ )
ASTM C698-24 Standard Test Methods for Chemical, Mass Spectrometric, and Spectrochemical Analysis of Nuclear-Grade Mixed Oxides ((U, Pu)O＜inf＞2＜/inf＞)

British Standards Institution (BSI)

BS ISO 13084:2018 Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
BS ISO 20411:2018 Surface chemical analysis. Secondary ion mass spectrometry. Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
BS ISO 13084:2011 Surface chemical analysis. Secondary-ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
BS ISO 12406:2010 Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of arsenic in silicon
25/30500395 DC BS ISO 13084 Surface chemical analysis — Secondary ion mass spectrometry — Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
10/30199193 DC BS ISO 13084. Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time of flight secondary ion mass spectrometer
BS ISO 17858:2007 Water quality - Determination of dioxin-like polychlorinated Biphenyls - Method using gas-chromatography/mass spectrometry
BS ISO 22048:2004 Surface chemical analysis. Information format for static secondary-ion mass spectrometry
BS ISO 17862:2022 Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
BS ISO 22048:2004(2005) Surface chemical analysis — Information format for static secondary - ion mass spectrometry
20/30409963 DC BS ISO 17862. Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
10/30199169 DC BS ISO 12406. Surface chemical analysis. Secondary ion mass spectrometry. Method for depth profiling of arsenic in silicon
BS ISO 17862:2013 Surface chemical analysis. Secondary ion mass spectrometry. Linearity of intensity scale in single ion counting time-of-flight mass analysers
BS ISO 23812:2009 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth calibration for silicon using multiple delta-layer reference materials
07/30138812 DC BS ISO 23830. Surface chemical analysis. Secondary-ion mass spectrometry. Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
BS ISO 23830:2008 Surface chemical analysis - Secondary-ion mass spectrometry - Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
BS ISO 22415:2019 Surface chemical analysis. Secondary ion mass spectrometry. Method for determining yield volume in argon cluster sputter depth profiling of organic materials

International Organization for Standardization (ISO)

ISO 13084:2011 Surface chemical analysis - Secondary-ion mass spectrometry - Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
ISO 13084:2018 Surface chemical analysis — Secondary ion mass spectrometry — Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
ISO 12406:2010 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of arsenic in silicon
ISO/TS 22933:2022 Surface chemical analysis — Secondary ion mass spectrometry — Method for the measurement of mass resolution in SIMS
ISO 17560:2014 Surface chemical analysis — Secondary-ion mass spectrometry — Method for depth profiling of boron in silicon
ISO 22048:2004 Surface chemical analysis — Information format for static secondary-ion mass spectrometry
ISO 178:1975 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
ISO 17862:2022 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
ISO 17862:2013 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
ISO 178:2019 Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
ISO 23830:2008 Surface chemical analysis - Secondary-ion mass spectrometry - Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
ISO 20411:2018 Surface chemical analysis - Secondary ion mass spectrometry - Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
ISO 14237:2000 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of boron atomic concentration in silicon using uniformly doped materials

AT-ON

ONORM M 6238 Teil.1-1986 Water analysis; determination ofnitrate; 2,6-dimethylphenol spectrometric method

GCC Standardization Organization

GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
GSO ISO 22048:2013 Surface chemical analysis -- Information format for static secondary-ion mass spectrometry
GSO ISO 23830:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
GSO ISO 18114:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Determination of relative sensitivity factors from ion-implanted reference materials
GSO ISO 12406:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of arsenic in silicon
GSO ISO 17560:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon

The Directorate General of Specifications and Metrology (DGSM)

OS GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
OS GSO ISO 12406:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of arsenic in silicon
OS GSO ISO 22048:2013 Surface chemical analysis -- Information format for static secondary-ion mass spectrometry
OS GSO ISO 23830:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry

RO-ASRO

STAS SR 12271-18-1996 Uranium dioxide. Uranium isotopic analysis by mass spectrometry

Kingdom of Bahrain Testing and Metrology Directorate

BH GSO ISO 13084:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
BH GSO ISO 17560:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon
BH GSO ISO 23830:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
BH GSO ISO 22048:2016 Surface chemical analysis -- Information format for static secondary-ion mass spectrometry

Japanese Industrial Standards Committee (JISC)

JIS K 0164:2023 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon
JIS K 0157:2021 Surface chemical analysis -- Secondary ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
JIS K 0168:2011 Surface chemical analysis -- Information format for static secondary-ion mass spectrometry
JIS K 0158:2021 Surface chemical analysis -- Secondary ion mass spectrometry -- Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry
JIS K 0153:2015 Surface chemical analysis -- Secondary-ion mass spectrometry -- Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
JIS K 0118:1979 General rules for mass spectrometric analysis
JIS K 0123:1995 General rules for analytical methods in gas chromatography mass spectrometry
JIS K 0155:2018 Surface chemical analysis -- Secondary ion mass spectrometry -- Linearity of intensity scale in single ion counting time-flight mass analysers
JIS K 0133:2022 General rules for ICP-mass spectrometry

Korean Agency for Technology and Standards (KATS)

KS D ISO 17560-2025 Surface chemical analysis — Secondary ion mass spectrometry — Method for depth profiling of boron in silicon
KS M 0025-2008(2023) General rules for mass spectrometric analysis
KS D ISO 17560-2003(2023) Surface chemical analysis - Secondary ion mass spectrometry - Boron depth distribution measurement method in silicon
KS D ISO 22048-2020 Surface chemical analysis - Information format for static secondary-ion mass spectrometry
KS D ISO 22048-2005(2020) Surface chemical analysis - Information format for static secondary-ion mass spectrometry
KS M 0025-2008(2018) General rules for mass spectrometric analysis
KS M 0027-1993 General Rules for Analytical Methods in Gas Chromatography Mass Spectrometry
KS M 0027-2023 General rules for analytical methods in gas chromatography mass spectrometry
KS M 0027-2008(2023) General rules for analytical methods in gas chromatography mass spectrometry
KS M 0025-2023 General rules for mass spectrometric analysis
KS M 0025-1993 General rules for mass spectrometric analysis
KS D ISO 14237-2003(2023) Surface geometry analysis - Secondary ion mass spectrometry - Method for measuring the concentration of boron atoms uniformly added in silicon
KS M 0027-2008(2018) General rules for analytical methods in gas chromatography mass spectrometry
KS M 0027-2008 General rules for analytical methods in gas chromatography mass spectrometry

Association Francaise de Normalisation

NF ISO 17560:2006 Chemical analysis of surfaces - Mass spectrometry of secondary ions - Determination of boron in silicon by thickness profiling
NF ISO 23830:2009 Chemical analysis of surfaces - Mass spectrometry of secondary ions - Repeatability and constancy of the scale of relative intensities in static mass spectrometry of secondary ions
NF EN 62321-8:2017 Determination of certain substances in electrotechnical products - Part 8: Analysis of phthalates in polymers by gas chromatography-mass spectrometry (GC-MS), gas chromatography-mass spectrometry ...
NF M60-404:1998 Determination of plutonium content in plutonium dioxide (PuO2) of nuclear grade quality. Gravimetric method.
NF X21-066*NF ISO 23812:2009 Surface chemical analysis - Secondary ion mass spectrometry - Method for depth calibration for silicon using multiple delta-layer reference materials
NF ISO 14237:2010 Chemical analysis of surfaces - Mass spectrometry of secondary ions - Determination of boron atoms in silicon using uniformly doped materials
NF X21-064*NF ISO 23830:2009 Surface chemical analysis - Secondary-ion mass spectrometry - Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry.

Standard Association of Australia （SAA）

AS ISO 17560:2006 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
AS ISO 22048:2006 Surface chemical analysis - Information format for static secondary-ion mass spectrometry
AS ISO 22048:2006(R2016) Surface chemical analysis - Information format for static secondary-ion mass spectrometry

Gosstandart of Russia

GOST R 56240-2014 Copper. Spectral methods of impurity analysis
GOST ISO/TR 18818-2020 Perfumery and cosmetic products. Analytical methods. Detection and quantitative determination of diethanolamine by GC/MS

Defense Logistics Agency

DLA QPL-8971-10-2004 ELECTRODES, GRAPHITE, SPECTROMETRIC GRADE

Ente Nazionale Italiano di Unificazione

UNI EN 16215:2020 Animal feeding stuffs: Methods of sampling and analysis - Determination of dioxins and dioxin-like PCBs by GC/HRMS and of indicator PCBs by GC/HRMS

Swedish Institute for Standards

SS-EN 16215:2020 Animal feeding stuffs: Methods of sampling and analysis - Determination of dioxins and dioxin-like PCBs by GC/HRMS and of indicator PCBs by GC/HRMS

German Institute for Standardization

DIN 55689:2006 Solvents for paints and varnishes - Propylene glycol ethers - Gas chromatographic determination of the degree of purity
DIN 55688:2006 Solvents for paints and varnishes - Ethylene glycol ethers - Gas chromatographic determination of the degree of purity
DIN 10063 E:2021-03 Fertilizers – Determination of selected elements by inductively-coupled plasma mass spectrometry (ICP-MS)

European Committee for Standardization (CEN)

EN 16521:2014 Cosmetics - Analytical methods - GC/MS method for the identification and assay of 12 phthalates in cosmetic samples ready for analytical injection