Electron beams and wavelengths of visible light

Electron beams and wavelengths of visible light, Total:77 items.

The international standard classification for "Electron beams and wavelengths of visible light" includes: Chemical reagents .

The Chinese standard classification for "Electron beams and wavelengths of visible light" includes: Chemical reagent in general , Optical Measurement .

Professional Standard - Petroleum

SY/T 7704-2023 Natural gas Determination of calorific value Visible light spectrum-ultrasonic correlation method

Professional Standard - Energy

SY/T?7704-2023 Natural gas. Determination of calorific value. Visible light spectrum-ultrasonic correlation method.

Professional Standard - Military and Civilian Products

WJ 2595-2002 Ultrasonic Testing Method of Electron Beam Welding Piston Seam

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB 9721-1988 Molecular Absorption Spectrophotometry of Chemical Reagents General Rules (Ultraviolet and Visible Parts)
GB/T 9721-1988 Chemical reagent-General rules for the molecular absorption spectrophotometry(ultraviolet and visible)

National Metrological Technical Specifications of the People's Republic of China

JJF 1026-1991 Absorbed Dase Determination in Photon and Electron Beams

Association Francaise de Normalisation

FD ISO/TR 20772:2019 Ophthalmic optics - Spectacle lenses - The eye and visible short-wavelength solar radiation
FD S11-490*FD ISO/TR 20772:2019 Ophthalmic optics - Spectacle lenses - Short wavelength visible solar radiation and the eye
NF X21-002:2007 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy.
NF X21-003:2006 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry.
NF X21-013*NF ISO 11938:2012 Microbeam analysis - Electron probe microanalysis - Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy.
NF ISO 11938:2012 Microbeam analysis - Electron microprobe analysis (Castaing microprobe) - Elemental mapping analysis methods using wavelength dispersive spectrometry
NF X21-006:2007 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy.
XP Z42-102:2019 Electronic archiving - Specifications relating to the implementation of the Visible Electronic Seal (CEV) for the purposes of authentication, verification and acquisition of data carried by an object - Data dictionary for French use...
NF A89-234/A1:2004 Welding - Electron and laser beam welded joints - Guidance on quality levels for imperfections - Part 2 : aluminium and its weldable alloys.
XP Z42-103:2019 Electronic archiving - Specifications relating to the implementation of the Visible Electronic Seal (CEV) for the purposes of authentication, verification and acquisition of data carried by an object - Case of a document bearing a CEV with...

GOST

GOST R 71046-2023 Electronic beam memory tubes without visible image. Parameters system

British Standards Institution (BSI)

PD ISO/TR 20772:2018 Ophthalmic optics. Spectacle lenses. Short wavelength visible solar radiation and the eye
BS ISO 14594:2003 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
BS ISO 14594:2014 Microbeam analysis. Electron probe microanalysis. Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
BS ISO 14594:2024 Microbeam analysis. Electron probe microanalysis. Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
BS ISO 11938:2013 Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
BS ISO 11938:2012 Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
23/30425940 DC BS ISO 14594. Microbeam analysis. Electron probe microanalysis. Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
BS ISO 22489:2016 Microbeam analysis. Electron probe microanalysis. Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
BS ISO 22489:2007 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
BS ISO 17470:2014 Microbeam analysis. Electron probe microanalysis. Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry

SCC

BS PD ISO/TR 20772:2018 Ophthalmic optics. Spectacle lenses. Short wavelength visible solar radiation and the eye
BS ISO 17470:2004 Microbeam analysis. Electron probe microanalysis. Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
10/30185165 DC BS ISO 11938. Microbeam analysis. Electron probe microanalysis. Methods of elemental area analysis using wavelength-dispersive spectroscopy
BS ISO 22489:2006 Microbeam analysis. Electron probe microanalysis. Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy

International Organization for Standardization (ISO)

ISO 14594:2014 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
ISO 14594:2003 Microbeam analysis - Electron microprobe analysis (Castaing Microprobe) - Guidelines for determining experimental parameters for wavelength dispersive spectrometry
ISO 17470:2004 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
ISO/DIS 14594 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
ISO 11938:2012 Microbeam analysis - Electron probe microanalysis - Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
ISO 14594:2003/Cor 1:2009 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy; Technical Corrigendum 1
ISO 22489:2016 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
ISO 22489:2006 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
ISO/TR 20772:2018 Ophthalmic optics - Spectacle lenses - Short wavelength visible solar radiation and the eye
ISO 17470:2014 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
ISO 11146:1999 Laser and laser-related equipment - Test methods for laser beam parameters - Beam widths, divergence angle and beam propagation factor

Korean Agency for Technology and Standards (KATS)

KS D ISO 14594:2012 Microbeam analysis－Electron probe microanalysis－Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
KS D ISO 14594:2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
KS D ISO 14594-2023 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
KS D ISO 22489:2012 Microbeam analysis－Electron probe microanalysis－Quantitative point analysis for bulk specimens using wavelength-dispersive x-ray spectroscopy
KS D ISO 22489:2018 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
KS D ISO 22489-2023 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy

Association of German Mechanical Engineers

DVS 3209-2007 Efficiency of electron beam and laser beam welding
DVS 3209-1995 Efficiency of electron beam and laser beam welding
DVS 3210-1995 Test methods for quality assurance of electron beam and laser beam welds
DVS 3204-2013 Electron beam weldability of metallic materials
DVS 3204-1988 Electron beam weldability of metallic materials
DVS 2809-1993 Laser beam welding in electronics and precision engineering
DVS 3211-1998 Cost Considerations for Electronic and Laser Beam Welding Processes
DVS 3208-1994 Quality assurance measures for electronic and laser beam welding
DVS 3211-2012 Cost Considerations for Electronic and Laser Beam Welding Processes

Standard Association of Australia （SAA）

ISO 14594:2024 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy

GSO

BH GSO ISO 14594:2017 Microbeam analysis -- Electron probe microanalysis -- Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
GSO ISO 14594:2015 Microbeam analysis -- Electron probe microanalysis -- Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
BH GSO ISO 17470:2017 Microbeam analysis -- Electron probe microanalysis -- Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
BH GSO ISO 11938:2017 Microbeam analysis -- Electron probe microanalysis -- Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
OS GSO ISO 11938:2015 Microbeam analysis -- Electron probe microanalysis -- Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
BH GSO ISO 22489:2017 Microbeam analysis -- Electron probe microanalysis -- Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy

KR-KS

KS D ISO 14594-2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
KS D ISO 14594-2018(2023) Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
KS D ISO 22489-2018 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
KS D ISO 22489-2018(2023) Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy

Japanese Industrial Standards Committee (JISC)

JIS K 0189:2013 Microbeam analysis.Electron probe microanalysis.Determination of experimental parameters for wavelength dispersive X-ray spectroscopy
JIS K 0190:2010 Microbeam analysis -- Electron probe microanalysis -- Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry

International Telecommunication Union (ITU)

ITU-R QUESTION 214/4-1993 Technical implications of steerable and reconfigurable satellite beams
ITU-R QUESTION 2144-1993 Technical implications of steerable and reconfigurable satellite beams

ITU-R - International Telecommunication Union/ITU Radiocommunication Sector

QUESTION 214/4-1993 Technical implications of steerable and reconfigurable satellite beams

IETF - Internet Engineering Task Force

RFC 7581-2015 Routing and Wavelength Assignment Information Encoding for Wavelength Switched Optical Networks
RFC 7446-2015 Routing and Wavelength Assignment Information Model for Wavelength Switched Optical Networks

American Society for Testing and Materials (ASTM)

ASTM E388-04(2009) Standard Test Method for Wavelength Accuracy and Spectral Bandwidth of Fluorescence Spectrometers ^,

European Committee for Standardization (CEN)

EN ISO 11146:2000 Laser and Laser-Related Equipment - Test Methods for Laser Beam Parameters - Beam Width, Divergence Angle and Beam Propagation Factor ISO 11146: 1999

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