Use PWT to measure crystal molecular forces

Use PWT to measure crystal molecular forces, Total:157 items.

The international standard classification for "Use PWT to measure crystal molecular forces" includes: Nuclear energy in general , Piezoelectric and dielectric devices , Electronic components in general , Test conditions and procedures in general , Solvents , Products of the chemical industry in general , Physics. Chemistry , Other standards related to analytical chemistry .

The Chinese standard classification for "Use PWT to measure crystal molecular forces" includes: Nuclear detector , Mass spectrometer, liquid spectrometer, energy spectrometer and combined devices of them , Quartz crystal and piezoelectric element , Basic standards and general methods , Basic standards and general methods for dye , Technical management , Artificial lens , Electrochemical, thermochemistry and optical profile type analyzer , Broadcasting and television transmission and receiving equipment .

Professional Standard - Building Materials

JC/T 471-1992 Artificial quartz crystal for photosensitive detector
JC/T 439-1991 Zinc sulfide crystal intended to be used in the window of infrared detectors
JC/T 2018-2010 Thallium doped cesium iodide crystal for high-energy particles detection

Group Standards of the People's Republic of China

T/CSTM 00123-2021 Determination of the chloride diffusion coefficient of concrete under applied axial stress
T/CNIA 0017-2019 Determination of Impurity Content in Chlorosilanes for Polysilicon by Inductively Coupled Plasma Mass Spectrometry
T/CSTM 00922-2024 Determination of grain orientation of electrical steel strip ( sheet )for power transformer—Electron backscatter diffraction (EBSD) method
T/XYXCLM 0001-2021 Test Standard for power lithium-ion monomer batteries for electric vehicles
T/CPIA 0012-2019 Guidelines for the Production and Use of Crystalline Silicon Photovoltaic Standard Modules
T/CPIA 0048.1-2022 Guidelines for making crystalline silicon reference photovoltaic cellof production lines-Part 1: Homojunction crystalline siliconphotovoltaic cell
T/SAS 0003-2018 Bismuth germanate scintillation crystals for positron emission tomography
T/ZJCX 0021-2022 Quartz crystal resonator for automotive electronics
T/SAS 0004-2018 Bismuth germinate scintillation crystals for space particle dectection
T/CSTM 00316-2022 Optoelectric single crystals - Lithium tantalate single crystals for pyroelectric infrared detection
T/CPIA 0048.2-2023 Guidelines for Manufacturing Standard Crystalline Silicon Photovoltaic Cells for Production Lines Part 2: Heterogeneous Crystalline Silicon Photovoltaic Cells

National Metrological Verification Regulations of the People's Republic of China

JJG 540-2019 Liquid Manometers for Working

Professional Standard - Education

JY/T 008-1996 General rules for crystal and molecular structure determination of small molecules by four-circle single crystal X-ray diffractometer
JY/T 0588-2020 General rules for crystal and molecular structure determinationof small molecules by single crystal X-ray diffractometer

未注明发布机构

ANSI/HI 5.1-5.6-2016(R2021) Sealless Rotodynamic Pumps for Nomenclature, Definitions, Application, Operation, and Test
DIN EN ISO 11979-7 E:2023-04 Ophthalmic Implants Intraocular Lenses Part 7: Clinical Studies of Intraocular Lenses for the Correction of Aphakia (Draft)
DIN 33411-5 E:2022-09 Physical strength of man - Part 5: Maximal isometric action forces, values
DIN EN ISO 11979-7 E:2017-03 Ophthalmic Implants Intraocular Lenses Part 7: Clinical Studies of Intraocular Lenses for the Correction of Aphakia (Draft)
DIN 33411-5:2023-03 Physical strength of man - Part 5: Maximal isometric action forces, values
DIN EN ISO 11979-7 E:2012-07 Ophthalmic Implants Intraocular Lenses Part 7: Clinical Studies of Intraocular Lenses for the Correction of Aphakia (Draft)
DIN EN ISO 11979-7 E:2013-07 Ophthalmic Implants Intraocular Lenses Part 7: Clinical Studies of Intraocular Lenses for the Correction of Aphakia (Draft)
DIN IEC 679-2:1997 Quartz crystal controlled oscillators; Part 2; Guide to the use of quartz crystal controlled oscillators
DIN EN 60444-8 E:2014-08 Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units
ANSI/HI 12.1-12.6-2021 Rotodynamic Pumps for Nomenclature, Definition, Application, and Operation

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 2385-2007 Dyes intermediates—General method for the determination of crystallizing point
GB/T 15020-1994 Quartz crystal units for use in electronic equipment Blank detail specification Resistance welded quartz crystal units Assessment level E
GB/T 27760-2011 Test method for calibrating the z-magnification of an atomic force microscope at subnanometer displacement levels using Si(111) monatomic step
GB/T 22319.8-2008 Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units
GB/T 2385-1992 Dye intermediates-General method for the determination of crystallizing point
GB/T 16516-1996 Quartz crystal units-A specification in the Quality Assessment System for Electronic Components Part 2: Sectional specification—Capability approval

工业和信息化部

JC/T 439-2021 Zinc sulfide crystals for the window of infrared detector

Professional Standard - Electron

SJ/Z 9155.2-1987 Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators

国家建筑材料工业局

JC 471-1992 Artificial quartz crystal sheet for photosensitive detectors

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 20724-2021 Microbeam analysis—Method of thickness measurement for thin crystals by convergent beam electron diffraction
GB/T 39867-2021 Bismuth germanate scintillation crystal for positron emission tomography

Professional Standard - Radio Television Film

GY/T 66-1989 Measurement Method for Transistor Sound Amplifiers Used for Cable Casting

Japanese Industrial Standards Committee (JISC)

JIS C 6705:1984 Quartz crystal units for oscillators (for from 200 to 1000 kHz)
JIS C 6702:1992 Ovens for quartz crystal units
JIS H 7804:2005 Method for particle size determination in metal catalysts by electron microscope
JIS H 7805:2005 Method for crystallite size determination in metal catalysts by X-ray diffractometry
JIS B 9936:2001 Hydraulic fluid power -- Particulate contamination analysis -- Extraction of fluid samples from lines of an operating system

RU-GOST R

GOST 27264-1987 Power bipolar transistors. Measurement methods
GOST R 8.697-2010 State system for ensuring the uniformity of measurements. Interpenar spacings in crystals. Method for measurement by means of a transmission electron microscope

Korean Agency for Technology and Standards (KATS)

KS C IEC 60444-8:2016 Measurement of quartz crystal unit parameters ― Part 8: Test fixture for surface mounted quartz crystal units
KS C IEC 60444-9:2016 Measurement of quartz crystal unit parameters ― Part 9: Measurement of spurious resonance of piezoelectric crystal units
KS C IEC 60444-7:2016 Measurement of quartz crystal unit parameters ― Part 7: Measurement of activity and frequency dips of quartz crystal units
KS P ISO 11979-7:2021 Ophthalmic implants — Intraocular lenses — Part 7: Clinical investigations of intraocular lenses for the correction of aphakia
KS C IEC 60679-2-2023 Quartz Crystal Oscillator Part 2: A Guide to Using a Quartz Crystal Oscillator
KS C IEC 60679-2:2018 Quartz crystal controlled oscillators — Part 2: Guide to the use of quartz crystal controlled oscillators
KS F ISO 9087:2022 Wood — Determination of nail and screw holding power under axial load application
KS C IEC 61178-2-2023 IEC Electronic Components Quality Assessment System (IECQ) Specification for Quartz Crystal Components Part 2: Sub-Specification Capability Recognition
KS C IEC 61178-2:2018 Quartz crystal units — A specification in the IEC Quality Assessment System for Electronic Components (IECQ) — Part 2: Sectional specification – Capability approval
KS C IEC 60747-7-3-2021 Semiconductor devices－Discrete devices－Part 7：Bipolar transistors－Section three：Blank detail specification for bipolar transistors for switching applications
KS C IEC 60122-2-1-2011(2021) Quartz crystal units for frequency control and selection－Part 2：Guide to the use of quartz crystal units for frequency control and selection－Section one：Quartz crystal units for microprocessor clock s

IECQ - IEC: Quality Assessment System for Electronic Components

PQC 83 ISSUE 1.1-1989 Generic Specification: Quartz Crystal Units for Use in Electronic Equipment
PQC 84 ISSUE 1.1-1989 Blank Detail Specification: Quartz Crystal Units for Use in Electronic Equipment

Danish Standards Foundation

DS/EN 60444-8:2003 Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units
DS/EN 60444-7:2004 Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units
DS/ISO 9087:2000 Wood - Determination of nail and screw holdning power under axial load application

Association Francaise de Normalisation

NF C93-621-8*NF EN 60444-8:2017 Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units
NF C53-700-1/A2:2009 Thyristor valves for high-voltage direct current (HVDC) power transmission - Part 1 : electrical testing.
NF C53-700-1:2002 Thyristor valves for high voltage direct current (HVDC) power transmission - Part 1 : electrical testing.
NF S94-750-7*NF EN ISO 11979-7:2018 Ophthalmic implants - Intraocular lenses - Part 7 : clinical investigations of intraocular lenses for the correction of aphakia
NF C93-621-8:2005 Measurement of quartz crystal unit parameters - Part 8 : test fixture for surface mounted quartz crystal units.
NF C53-225:1985 Testing of semiconductor valves for high-voltage D.C. Power transmission.
NF C93-611:1975 Components for electronic equipment. Piezoelectric devices. Quartz crystal units for oscillators.
NF T51-223:1985 Plastics. Semi-cristalline materials. Determination of the conventional melting temperature by thermal analyse.

American National Standards Institute （ANSI)

ANSI/ASTM D6056:2001 Test Method for Determining Concentration of Airborne Single-Crystal Ceramic Whiskers in the Workplace Environment by Transmission Electron Microscopy
ANSI/ASTM D6059:2001 Test Method for Determining Concentration of Airborne Single-Crystal Ceramic Whiskers in the Workplace Environment by Scanning Electron Microscopy
ANSI/IEEE 1160:1993 Test Procedure for High-Purity Germanium Crystals for Radiation Detectors
ANSI/HI 14.4-2018 Rotodynamic Pumps for Installation, Operation, and Maintenance

HU-MSZT

MSZ 9519-1958 Crystalline sodium acetate for analysis
MSZ 9275-1982 Crystalline sodium sulfate for analysis
MSZ 9274-1957 Cadmium sulfate of crystalline water for analysis
MSZ 3799-1959 Cobalt for analysis. Chloride crystal water
MSZ 9515-1957 Sulfonamino acids for analysis, crystal water
MSZ 9280-1982 Crystalline copper sulfate for analysis (bivalent)
MSZ 8777-1965 Analysis of nickel in crystalline water. Sulfate

IN-BIS

IS 5469 Pt.3-1973 Code of practice for use of semiconductor junction devices Part III Thyristors

German Institute for Standardization

DIN 33411-4:1987-05 Human physical strength; maximum static action forces (isodynes)
DIN 33411-4:1987 Human physical strength; maximum static action forces (isodynes)
DIN 33411-5:1999 Physical strength of man - Part 5: Maximal isometric action forces, values
DIN EN 60444-8:2004 Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units (IEC 60444-8:2003); German version EN 60444-8:2003
DIN 50443-1:1988 Testing of materials for use in semiconductor technology; detection of crystal defects and inhomogeneities in silicon single crystals by X-ray topography
DIN EN ISO 11979-7:2018-08 Ophthalmic implants - Intraocular lenses - Part 7: Clinical investigations of intraocular lenses for the correction of aphakia (ISO 11979-7:2018); German version EN ISO 11979-7:2018
DIN IEC 61178-2:1995 A specification in the IEC quality assessment system for electronic components (IECQ) - Quartz crystal units - Part 2: Sectional specification, capability approval; identical with IEC 61178-2:1993
DIN 33411-3:1986 Human physical strength; maximum static action moments applied by male operators when actuating hand-wheels
DIN IEC 60122-2-1:1992 Quartz crystal units for frequency control and selection; part 2: guide to use of quartz crystal units for frequency control and selection; Section one: quartz crystal units for microprocessor clock supply; identical with IEC 60122-2-1:1991
DIN IEC 60122-2:1993 Quartz crystal units for frequency control and selection; part 2: guide to the use of quartz crystal units for frequency control and selection; identical with IEC 60122-2:1983
DIN IEC 60679-2:1997 Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators (IEC 60679-2:1981)

ES-AENOR

UNE 53-184-1990 The resistance of honeycomb polymer materials to external forces

DIN

DIN 33411-5:2023 Physical strength of man - Part 5: Maximal isometric action forces, values

BE-NBN

NBN T 04-290-1985 Phenoland cresols for industrial use - Determination of crystallizing point after drying with a molecular sieve

CZ-CSN

CSN 10 9102-1987 Unified system of industrial pneumatic components. Single and double acting cylinders. Testing methods
CSN 10 9101-1984 Unified system of industrial pneumatic components. Single and double acting cylinders. Technical requirements

ZA-SANS

SANS 6471:2003 Rubber, vulcanized - Determination of crystallization effects under compression

American Society for Testing and Materials (ASTM)

ASTM E1855-20 Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
ASTM D605-82(1996)e1 Standard Specification for Magnesium Silicate Pigment (Talc)
ASTM D6059-96(2011) Standard Test Method for Determining Concentration of Airborne Single-Crystal Ceramic Whiskers in the Workplace Environment by Scanning Electron Microscopy
ASTM E1855-04 Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
ASTM E1855-04e1 Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
ASTM E1855-96 Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
ASTM E1855-05e1 Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
ASTM E1855-05 Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
ASTM E1855-15 Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
ASTM E1855-10 Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors

SCC

IEC 60122-2:1962 Quartz crystal units for oscillators - Part 2: Guide to the use of quartz oscillator crystals
BS 9618:1988 Specification for capability approval of quartz crystal units: generic data
DIN 33411-5 E:2022 Draft Document - Physical strength of man - Part 5: Maximal isometric action forces, values
UNE-EN 1267:2000 VALVES - TEST OF FLOW RESISTANCE USING WATER AS TEST FLUID.
BS EN 168000:1996 Harmonized system of quality assessment for electronic components. Generic specification: quartz crystal units
IEC 60122-2:1962/AMD1:1969 Amendment 1 - Quartz crystal units for oscillators - Part 2: Guide to the use of quartz oscillator crystals
AWWA MTC69788 Analyzing Fouling Potential of EPS Extracted from MBR with Quartz Crystal Microbalance with Dissipation Monitoring (QCM-D)
HI 14.4-2018 Rotodynamic Pumps - for Installation, Operation, and Maintenance
DANSK DS/ISO 9087:1999 Wood - Determination of nail and screw holdning power under axial load application
DANSK DS/ISO 11979-7:2024 Ophthalmic implants – Intraocular lenses – Part 7: Clinical investigations of intraocular lenses for the correction of aphakia
AWWA WQTC60567 Monitoring Nitrification in Chloraminated Systems Using Molecular Detection Strategies
HOLDEN HN 0201-2012 Crystal Size Determination using Faxfilm Replication
IEC 60122-3:1962 CSV Quartz crystal units for oscillators - Section Four: Standard outlines - Section five: Pin connections - Section six: Article sheets for quartz crystal units for use in crystal filters
DANSK DS/IEC 122-2:1985 Quartz crystal units for frequency control and selection - Part 2: Guide to the use of quartz crystal units for frequency control and selection

YU-JUS

JUS N.R4.446-1978 Electromechanical components for electronic equipment.Test 13c:Operating force
JUS N.R9.005-1977 Piezoelectric vibrators. Quartz crystal units for frequency control and selection
JUS N.R9.031-1986 Piezoelectric vibrators. Measurement of qu'?rtz crystal unit parameters by zero phase technique in a n-network. Phase offsetmethod of measurement of motionaf capacitance of guartz crystal unit
JUS N.R4.446-1991 Electromechanicalcomponents forelectronic eguipment. Test 13c: Operating force (switthes>

International Electrotechnical Commission (IEC)

IEC 60444-8:2016 Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units
IEC 60444-8:2003 Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units
IEC 60679-2:1981 Quartz crystal controlled oscillators. Part 2 : Guide to the use of quartz crystal controlled oscillators
IEC 61178-2:1993 Quartz crystal units; a specification in the IEC quality assessment system for electronic components (IECQ); part 2: sectional specification; capability approval
IEC 60747-8-4:2004 Discrete semiconductor devices - Part 8-4: Metal-oxide-semiconductor field-effect transistors (MOSFETs) for power switching applications
IEC 61435:1996 Nuclear instrumentation - High-purity germanium crystals for radiation detectors
IEC 60122-2-1:1991 Quartz crystal units for frequency control and selection; part 2: guide to the use of quartz crystal units for frequency control and selection; section 1: quartz crystal units for microprocessor clock supply

KR-KS

KS P ISO 11979-7-2021 Ophthalmic implants — Intraocular lenses — Part 7: Clinical investigations of intraocular lenses for the correction of aphakia
KS C IEC 60679-2-2018 Quartz crystal controlled oscillators — Part 2: Guide to the use of quartz crystal controlled oscillators
KS C IEC 60679-2-2018(2023) Quartz crystal controlled oscillators — Part 2: Guide to the use of quartz crystal controlled oscillators
KS F ISO 9087-2022 Wood — Determination of nail and screw holding power under axial load application
KS C IEC 61178-2-2018 Quartz crystal units — A specification in the IEC Quality Assessment System for Electronic Components (IECQ) — Part 2: Sectional specification – Capability approval

RO-ASRO

STAS 9007-1971 ELECTRONIC-NUCLEAR EQUIPMENTS Supply voltages for tranzistorized devices intended for nuclear electronics

International Organization for Standardization (ISO)

ISO 19214:2017 Microbeam analysis - Analytical electron microscopy - Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy

ES-UNE

UNE-EN ISO 11979-7:2018 Ophthalmic implants - Intraocular lenses - Part 7: Clinical investigations of intraocular lenses for the correction of aphakia (ISO 11979-7:2018) (Endorsed by Asociación Española de Normalización in June of 2018.)

European Committee for Standardization (CEN)

EN 1267:2012 Industrial valves - Test of flow resistance using water as test fluid

British Standards Institution (BSI)

BS EN 60444-2:1993 Measurement of quartz crystal unit parameters - Phase offset method for measurement of motional capacitance of quartz crystal units
BS EN 60444-8:2003 Measurement of quartz crystal unit parameters - Test fixture for surface mounted quartz crystal units
BS EN 60444-8:2017 Measurement of quartz crystal unit parameters. Test fixture for surface mounted quartz crystal units
BS EN 62417:2010 Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)

GSO

OS GSO IEC 61178-2:2014 Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification - Capability approval
OS GSO ISO 9087:2015 Wood - Determination of nail and screw holding power under axial load application
BH GSO ISO 9087:2016 Wood - Determination of nail and screw holding power under axial load application
GSO ISO 21018-3:2015 Hydraulic fluid power -- Monitoring the level of particulate contamination of the fluid -- Part 3: Use of the filter blockage technique
OS GSO IEC 60679-2:2014 Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators

US-HI

HI 5.1-5.6-2010 Sealless Rotodynamic Pumps fpr Namenclature, Definitions, Application, Operation, and test

CENELEC - European Committee for Electrotechnical Standardization

EN 61954:1999 Power Electronics for Electrical Transmission and Distribution Systems Testing of Thyristor Valves for Static VAR Compensators
EN 168000:1993 Generic Specification: Quartz Crystal Units (Incorporates Amendments A1: 1993 and A2: 1998)

American Society of Mechanical Engineers (ASME)

ASME SEC II D SB PT 3-2003 Subpart 3 Charts and Tables for Determining Shell Thickness of Components Under External Pressure

Institute of Electrical and Electronics Engineers (IEEE)

IEEE 1160-1993 Standard Test Procedures for High-Purity Germanium Crystals for Radiation Detectors

Others: