Principle of minority carrier life tester
Principle of minority carrier life tester, Total:49 items.
The international standard classification for "Principle of minority carrier life tester" includes: Equipment for petroleum and natural gas industries , Exploratory and extraction equipment , Semiconducting materials , Testing of metals in general , Testing of metals , Non-destructive testing .
The Chinese standard classification for "Principle of minority carrier life tester" includes: Petroleum exploration, development, gathering and transportation equipment in general , Petroleum exploration logging equipment and instrument , Semimetal and semiconductor material in general , Metal physical property test method , X ray, magnetic powder, fluorescent light and other defectoscope , Technical Management .
Professional Standard - Petroleum
- SY/T 7078-2016 The calibration for neutron lifetime logging tool
- SY/T 6144-1995 Standard orifice measurement method for natural gas flow
- SY/T 6144-2008 Technical specifications of meutron lifetime logging tool
- SY 6144-2008 Annual neutron lifetime logging tool technical conditions
Xinjiang Provincial Standard of the People's Republic of China
- DB65/T 3485-2013 Measurement method for minority carrier lifetime of solar grade polysilicon block
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 1553-2023 Test methods for minority carrier lifetime in bulk silicon and germanium—Photoconductivity decay method
- GB/T 1553-1997 Standard test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconductivity decay
- GB/T 1553-2009 Test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconduetivity decay
Group Standards of the People's Republic of China
- T/CASAS 026-2023 Test method for minority carrier lifetime in silicon carbide—microwave photoconductive decay
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 37929-2019 Non-destructive testing instruments—Testing methods for life of X-ray tubes
未注明发布机构
- ANSI/IES LM-40-20 LIFE TESTING OF FLUORESCENT LAMPS
- ANSI/IES LM-49-20 LIFE TESTING OF INCANDESCENT FILAMENT LAMPS
- ANSI/IES LM-65-20 LIFE TESTING OF SINGLE-BASED FLUORESCENT LAMPS
Professional Standard - Electron
- SJ 26-1979 Method of life test for low power electronic tubes
CZ-CSN
- CSN 35 8549-1969 Life testing of electronic tubes
Korean Agency for Technology and Standards (KATS)
- KS D 0265-2019 Measurement of minority carrier life time in germanium by photoconductive decay method
- KS D 0257-2022 Measuring of minority - carrier lifetime in silicon single crystal by photoconductive decay method
- KS D 0265-1989(2019) Measurement of minority carrier life time in germanium by photoconductive decay method
- KS D 0257-2002(2022) Measuring of minority - carrier lifetime in silicon single crystal by photoconductive decay method
- KS D 0265-1989 Measurement of minority carrier life time in germanium by photoconductive decay method
- KS D 0257-2002 Measuring of minority - carrier lifetime in silicon single crystal by photoconductive decay method
- KS D 0257-2002(2017) Measuring of minority - carrier lifetime in silicon single crystal by photoconductive decay method
- KS C 7107-2020 Plasma display panels - Accelerated life tests
- KS C 7107-2007(2017) Plasma display panels - Accelerated life tests
- KS C 7107-2007 Plasma display panels - Accelerated life tests
- KS C IEC PAS 62164-2013 Guidelines for GaAs MMIC and FET life testing
- KS C IEC PAS 62164-2003(2008) Guidelines for GaAs MMIC and FET life testing
Japanese Industrial Standards Committee (JISC)
- JIS H 0603:1978 Measurement of minority carrier life time in germanium by photoconductive decay method
- JIS H 0604:1995 Measuring of minority-carrier lifetime in silicon single crystal by photoconductive decay method
- JIS C 5037:1975 Endurance (mechanical) testing method for electronic components
- JIS C 5036:1975 Endurance (electrical) testing method for electronic components
- JIS Q 14040:1997 Environmental management -- Life cycle assessment -- Principles and framework
American Society for Testing and Materials (ASTM)
- ASTM F28-91(1997) Standard Test Methods for Minority-Carrier Lifetime in Bulk Germanium and Silicon by Measurement of Photoconductivity Decay
RO-ASRO
- STAS 12046/2-1984 CUTTING LIFE TESTING Tool-life ttsting methods of turning tools
Electronic Components, Assemblies and Materials Association
- ECA 186-12E-1978 Passive Electronic Component Parts, Test Methods for; Method 12: Heat-Life Test
ECIA - Electronic Components Industry Association
- 186-12E-1978 Passive Electronic Component Parts@ Test Methods for; Method 12: Heat-Life Test
ZA-SANS
- SANS 14040:2006 Environmental management - Life cycle assessment - Principles and framework
RU-GOST R
- GOST 3839-1970 Low-power electronic tubes. Test methods for life cycle
IN-BIS
- IS 9807-1981 Digital Microcircuit Life Test
- IS 7412-1974 Life test of semiconductor devices
SAE - SAE International
- SAE J240-1982 Life Test for Automotive Storage Batteries
- SAE J240-1971 LIFE TEST FOR AUTOMOTIVE STORAGE BATTERIES
- SAE J240-1993 Life Test for Automotive Storage Batteries (June 1993)
- SAE J240-2007 Life Test for Automotive Storage Batteries
Society of Automotive Engineers (SAE)
- SAE J240-2002 Life Test for Automotive Storage Batteries
British Standards Institution (BSI)
- BS EN ISO 14040:2006 Environmental management - Life cycle assessment - Principles and framework
Electronic Industrial Alliance (U.S.)
- EIA RS-186-12E-1978 STANDARD TEST METHODS FOR PASSIVE ELECTRONIC COMPONENT PARTS METHOD 12: HEAT-LIFE TEST
German Institute for Standardization
- DIN 53533-1:1988 Testing of elastomeres; testing of heat generation and service life during the fatigue test (flexometer test); bases principles
KR-KS
- KS B ISO 3685-2023 Tool-life testing with single-point turning tools
