Titanium silicon etching

Titanium silicon etching, Total:37 items.

The international standard classification for "Titanium silicon etching" includes: Semiconducting materials .

The Chinese standard classification for "Titanium silicon etching" includes: Elemental semiconductor material , Special electronic technology material .

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General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

• GB/T 41652-2022 Silicon electrode and silicon ring for plasma etching machine

未注明发布机构

• SAE AMS2643F-2023 Structural Examination of Titanium Alloys Chemical Etch Inspection Procedure

Group Standards of the People's Republic of China

• T/CEMIA 032-2022 Buffered oxide etchant for display panels
• T/CI 407-2024 Technical requirements for laser etching machines for perovskite batteries
• T/FJAS 003-2024 wet chemicals regeneration aluminum Etch

SAE - SAE International

• SAE AMS2643A-1988 Structural Examination of Titanium Alloys Chemical Etch Inspection Procedure
• SAE AMS2643-1972 Structural Examination of Titanium Alloys Chemical Etch Inspection Procedure
• SAE AMS2643B-1997 Structural Examination of Titanium Alloys Chemical Etch Inspection Procedure
• SAE AMS2642E-2016 Structural Examination of Titanium Alloys Etch-Anodize Inspection Procedure
• SAE AMS2642A-1989 Structural Examination of Titanium Alloys Etch-Anodize Inspection Procedure

Society of Automotive Engineers (SAE)

• SAE AMS2643C-2002 Structural Examination of Titanium Alloys, Chemical Etch Inspection Procedure
• SAE AMS2642-1972 STRUCTURAL EXAMINATION OF TITANIUM ALLOYS Etch-Anodize Inspection Procedure
• SAE AMS2642A-1994 STRUCTURAL EXAMINATION OF TITANIUM ALLOYS Etch-Anodize Inspection Procedure
• SAE AMS2642F-2021 Structural Examination of Titanium Alloys Etch-Anodize Inspection Procedure
• SAE AMS2642B-2003 (R) Structural Examination of Titanium Alloys Etch-Anodize Inspection Procedure R(1994)
• SAE AMS-C-81769-1998 Chemical Milling of Metals, Specification for
• SAE AMS2642D-2010 Structural Examination of Titanium Alloys Etch-Anodize Inspection Procedure
• SAE AMS7292A-1998 Labels, Aluminum Foil-Etched, Anodized, and Dyed
• SAE AMS7292-1992 LABELS, ALUMINUM FOIL Etched, Anodized, and Dyed

IPC - Association Connecting Electronics Industries

• IPC TM-650 2.3.7.1A-1994 Cupric Chloride Etching Method
• IPC TM-650 2.3.7A-1975 Etching Ferric Chloride Method
• IPC PE-74 SECTION 11- Etching
• IPC TM-650 2.3.7.2A-1994 Alkaline Etching Method

DIN

• DIN 50453-2:2023 Testing of materials for semiconductor technology - Determination of etch rates of etching mixtures - Part 2: Silicon-dioxide coating, optical method
• DIN 50453-1:2023 Testing of materials for semiconductor technology - Determination of etch rates of etching mixtures - Part 1: Silicium monocrystals, gravimetric method

German Institute for Standardization

• DIN 50453-2:2023-08 Testing of materials for semiconductor technology - Determination of etch rates of etching mixtures - Part 2: Silicon-dioxide coating, optical method
• DIN 50453-1:2023-08 Testing of materials for semiconductor technology - Determination of etch rates of etching mixtures - Part 1: Silicium monocrystals, gravimetric method

Institute of Interconnecting and Packaging Electronic Circuits (IPC)

• IPC PE-740A SECTION 11-1997 Etching
• IPC MI-660 11.2-1984 Peroxide-Sulfuric Etchant Analysis

SCC

• DIN 50453-2 E:2023 Draft Document - Testing of materials for semiconductor technology - Determination of etch rates of etching mixtures - Part 2: Silicium-dioxid coating, optical method
• DIN 50453-1 E:2023 Draft Document - Testing of materials for semiconductor technology - Determination of etch rates of etching mixtures - Part 1: Silicium monocrystals, gravimetric method

Korean Agency for Technology and Standards (KATS)

• KS M 5337-2004 ETCHING PRIMER
• KS D 6725-2022 Aluminum etching foil
• KS D 0258-2012(2022) Test methods of crystalline defects in silicon by preferential etch techniques
• KS D 6725-1987(2017) Aluminum etching foil
• KS D 6725-1987(2022) Aluminum etching foil
• KS D 0258-2012(2017) Test methods of crystalline defects in silicon by preferential etch techniques

Others: Titanium silicon carbide,Titanium silicon carbide,Titanium reacts with silicon carbide,Silicon Titanium and Silicon Carbide,Titanium silicon carbide,Titanium + silicon carbide +,Titanium-containing silicon carbide,The hardness of silicon titanium oxide,Silicon carbide