Electronic Analytical Balance Calibration
Electronic Analytical Balance Calibration, Total:88 items.
The international standard classification for "Electronic Analytical Balance Calibration" includes: Linear and angular measurements , Measurement of volume, mass, density, viscosity , Chemical analysis , Workplace atmospheres , Laboratory medicine .
The Chinese standard classification for "Electronic Analytical Balance Calibration" includes: Length Measurement , Basic laboratory equipment , Basic standards and general methods , Production environment safety and health facilities , Medical laboratory equipment .
National Metrological Technical Specifications of the People's Republic of China
- JJF 1119-2004 Calibration specification for Electronic Level Meter
- JJF 1559-2016 Calibration Specification of Variable Frequency Electric Quantity Analyzer
- JJF 1940-2021 Calibration Specification for Electromagnetic Balances
- JJF 1982-2022 Calibration Specification for Level Oscillators
- JJF 1570-2016 Calibration Specification for Dynamic Balance Measuring Instruments
- JJF 1761-2019 Calibration Specification for Selective Level Meters
- JJF 1455-2014 Calibration specification for TV video signal analyzer
- JJF 1654-2017 Calibration Specification for Plate Electrophoresis Apparatus
Professional Standard - Machinery
- JB/T 5374-1991 Electronic Balance?
National Metrological Verification Regulations of the People's Republic of China
- JJG 1036-2022 Electronic Balance
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 26497-2011 Electronic balance
- GB/T 26497-2022 Electronic balances
- GB/T 29731-2013 Surface chemical analysis—High-resolution Auger electron spectrometers—Calibration of energy scales for elemental and chemical-state analysis
- GB/T 29732-2013 Surface chemical analysis—Medium resolution Auger electron spectrometers—Calibration of energy scales for elemental analysis
- GB/T 22571-2008 Surface chemical analysis ? X-ray photoelectron spectrometers ? Calibration of energy scales
未注明发布机构
- DIN ISO 15472 E:2019-09 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 29732-2021 Surface chemical analysis—Medium resolution auger electron spectrometers—Calibration of energy scales for elemental analysis
- GB/T 37397-2019 Ozone calibrators and analyzers
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 22571-2017 Surface chemical analysis--X-ray photoelectron spectrometers--Calibration of energy scales
国家食品药品监督管理局
- YY/T 1549-2017 Calibrator for Biochemical Analyzer
Society of Automotive Engineers (SAE)
- SAE ARP4162A-2011 Balancing Machine Proving Rotors
GSO
- GSO ISO 24639:2024 Microbeam analysis — Analytical electron microscopy — Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
- OS GSO ISO 17973:2013 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
- BH GSO ISO 17973:2016 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
- GSO ISO 17973:2013 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
- OS GSO 269:1994 ELECTRONIC COMMERCIAL BALANCES
- OS GSO ISO 16592:2015 Microbeam analysis -- Electron probe microanalysis -- Guidelines for determining the carbon content of steels using a calibration curve method
- GSO ISO 16592:2015 Microbeam analysis -- Electron probe microanalysis -- Guidelines for determining the carbon content of steels using a calibration curve method
- BH GSO ISO 16592:2017 Microbeam analysis -- Electron probe microanalysis -- Guidelines for determining the carbon content of steels using a calibration curve method
- BH GSO ISO 15472:2016 Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales
- OS GSO ISO 17974:2014 Surface chemical analysis -- High-resolution Auger electron spectrometers -- Calibration of energy scales for elemental and chemical-state analysis
- BH GSO ISO 17974:2016 Surface chemical analysis -- High-resolution Auger electron spectrometers -- Calibration of energy scales for elemental and chemical-state analysis
British Standards Institution (BSI)
- BS ISO 24639:2022 Microbeam analysis. Analytical electron microscopy. Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
- BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- 21/30404763 DC BS ISO 24639. Microbeam analysis. Analytical electron microscopy. Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
- BS 4289-8:1988 Methods for analysis of oilseeds - Check of the calibration of moisture meters
- BS ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
- BS ISO 17973:2016 Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis
- BS ISO 16700:2016 Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
- BS ISO 16592:2012 Microbeam analysis. Electron probe microanalysis. Guidelines for determining the carbon content of steels using a calibration curve method
- BS ISO 17973:2003 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
- BS ISO 17974:2002(2010) Surface chemical analysis — High - resolution Auger electron spectrometers — Calibration of energy scales for elemental and chemical - state analysis
- 23/30469291 DC BS ISO 17973. Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis
Association Francaise de Normalisation
- NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
- NF ISO 17973:2006 Analyse chimique des surfaces - Spectromètres d'électrons Auger à résolution moyenne - Étalonnage des échelles d'énergie pour l'analyse élémentaire
- NF C93-845:2006 Calibration of optical spectrum analyzers.
- NF X21-054*NF ISO 17973:2006 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis.
- NF X21-007:2008 Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steel using a calibration curve method.
International Organization for Standardization (ISO)
- ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- ISO 24639:2022 Microbeam analysis — Analytical electron microscopy — Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
- ISO/DIS 17973:2023 Surface chemical analysis — Medium-resolution Auger electron spectrometers — Calibration of energy scales for elemental analysis
- ISO/CD 17973 Surface chemical analysis — Medium-resolution Auger electron spectrometers — Calibration of energy scales for elemental analysis
- ISO 17973:2002 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
- ISO 17973:2016 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
- ISO 16592:2006 Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steels using a calibration curve method
- ISO 16592:2012 Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steels using a calibration curve method
Korean Agency for Technology and Standards (KATS)
- KS D ISO 16700:2013 Microbeam analysis-Scanning electron microscopy-Guidelines for calibrating image magnification
- KS D ISO 17973-2021 Surface chemical analysis-Medium-resolution Auger electron spectrometers-Calibration of energy scales for elemental analysis
- KS D ISO 17973-2011(2021) Surface chemical analysis-Medium-resolution Auger electron spectrometers-Calibration of energy scales for elemental analysis
- KS D ISO 17973-2011(2016) Surface chemical analysis-Medium-resolution Auger electron spectrometers-Calibration of energy scales for elemental analysis
- KS D ISO 16700-2013(2018) Microbeam analysis-Scanning electron microscopy-Guidelines for calibrating image magnification
- KS D ISO 16592-2011(2021) Microbeam analysis-Electron probe microanalysis-Guidelines for determining the carbon content of steels using a calibration curve method
- KS D ISO 16592-2021 Microbeam analysis-Electron probe microanalysis-Guidelines for determining the carbon content of steels using a calibration curve method
- KS D ISO 17973:2011 Surface chemical analysis-Medium-resolution Auger electron spectrometers-Calibration of energy scales for elemental analysis
- KS D ISO 16592-2011(2016) Microbeam analysis-Electron probe microanalysis-Guidelines for determining the carbon content of steels using a calibration curve method
- KS D ISO 16592:2011 Microbeam analysis-Electron probe microanalysis-Guidelines for determining the carbon content of steels using a calibration curve method
- KS D ISO 17974-2021 Surface chemical analysis-High-resolution Auger electron spectrometers-Calibration of energy scales for elemental and chemical-state analysis
KR-KS
- KS D ISO 16700-2023 Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification
- KS D ISO 15472-2003(2023) Surface chemical analysis - X-ray photoelectron spectroscopy - Calibration of energy scale
Japanese Industrial Standards Committee (JISC)
- JIS K 0145:2002 Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales
- JIS K 0149-1:2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification
- JIS K 0165:2011 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
- JIS C 6192:2008 Calibration of optical spectrum analyzers
SCC
- BS ISO 17973:2002 Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis
- BS ISO 16592:2006 Microbeam analysis. Electron probe microanalysis. Guidelines for determining the carbon content of steels using a calibration curve method
- BS ISO 15472:2001 Surface chemical analysis. X-ray photoelectron spectrometers. Calibration of energy scales
- BS PD IEC PAS 62129:2004 Calibration of optical spectrum analyzers
- CEI EN 62129:2006 Calibration of optical spectrum analyzers
- DANSK DS/EN 62129:2006 Calibration of optical spectrum analyzers
European Committee for Standardization (CEN)
- CEN EN 62129-2006 Calibration of optical spectrum analyzers
- CEN EN 62129-2006_ Calibration of optical spectrum analyzers
BSI
- BS ISO 17973:2024 Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis
Standard Association of Australia (SAA)
- ISO 17973:2024 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
- AS ISO 15472:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
Danish Standards Foundation
- DS/EN 62129:2006 Calibration of optical spectrum analyzers
- DS/EN 62129/Corr. 1:2007 Calibration of optical spectrum analyzers
American National Standards Institute (ANSI)
- ANSI/UL 466-2004 Electric Scales and Accessories (Proposal Dated 5/16/08)
Electron Microscope Calibration,Scanning Electron Microscope Calibration Standards,Scanning Electron Microscope Magnification Calibration Method,Scanning Electron Microscope Calibration Methods,Electron Microscope Calibration Methods,How to calibrate a scanning electron microscope,Electron Microscope Calibration,Scanning Electron Microscope Calibration,TEM Calibration,calibration electronics,X-ray Photoelectron Spectrometer Calibration,ECal module,ECal module,Calibration of Electron Microscopes,How to Calibrate an Electron Microscope,Calibration method for transmission electron microscope magnification,Which ECal module,How about an ECal module,Electron Microscope Calibration Blocks,Where is the ECal module