Semiconductor Temperature and Humidity International

Semiconductor Temperature and Humidity International, Total:91 items.

The international standard classification for "Semiconductor Temperature and Humidity International" includes: Semiconductor devices in general , Therapy equipment .

The Chinese standard classification for "Semiconductor Temperature and Humidity International" includes: Semiconductor discrete devices in general , Thermal Measurement .

Group Standards of the People's Republic of China

T/QGCML 3956-2024 Semiconductor laboratory constant humidity and temperature test management platform

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 4937.42-2023 Semiconductor devices—Mechanical and climatic test methods—Part 42:Temperature and humidity storage

未注明发布机构

DIN EN 60749-5 E:2016-12 Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
DIN EN 60749-42 E:2012-07 Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage

Taiwan Provincial Standard of the People's Republic of China

CNS 5071-1988 Environmental Testing Methods and Endurance Testing Methods for Discrete Semiconductor Devices (Cycle Test for Temperature & Humidity)

Professional Standard - Medicine

YY/T 0998-2015 Semiconductor heating and/or cooling therapy equipment

National Metrological Verification Regulations of the People's Republic of China

JJG 363-1984 Semiconductor Themistor Themometer

British Standards Institution (BSI)

BS EN 60749-42:2014 Semiconductor devices. Mechanical and climatic test methods. Temperature and humidity storage
BS IEC 60747-14-5:2010 Semiconductor devices - Semiconductor sensors - PN-junction semiconductor temperature sensor
BS EN 60749-5:2017 Semiconductor devices. Mechanical and climatic test methods. Steady-state temperature humidity bias life test
BS EN 60749-5:2003 Semiconductor devices - Mechanical and climatic test methods - Steady-state temperature humidity bias life test
BS EN IEC 60749-5:2024 Semiconductor devices. Mechanical and climatic test methods - Steady-state temperature humidity bias life test
13/30264591 DC BS EN 60747-14-6. Semiconductor devices. Part 14-6. Semiconductor sensor. Humidity sensor
BS EN 60749-25:2003 Semiconductor devices - Mechanical and climatic test methods - Temperature cycling
BS IEC 60747-14-11:2021 Semiconductor devices - Semiconductor sensors. Test method of surface acoustic wave-based integrated sensors for measuring ultraviolet, illumination and temperature
BS IEC 62373-1:2020 Semiconductor devices. Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) - Fast BTI test for MOSFET

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association

JEDEC JEP140-2002 Beaded Thermocouple Temperature Measurement of Semiconductor Packages

GSO

GSO IEC 60747-14-5:2015 Semiconductor devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor
OS GSO IEC 60749-42:2017 Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage
GSO IEC 60749-42:2017 Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage
GSO IEC 60749-5:2014 Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

SCC

12/30263960 DC BS EN 60749-42. Semiconductor devices. Mechanical and climatic test methods. Temperature humidity storage
CEI EN 60749-42:2016 Semiconductor devices - Mechanical and climatic test methods Part 42: Temperature and humidity storage
DANSK DS/EN 60749-42:2014 Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage
DIN IEC 60747-14-5 E:2008 Draft Document - Semiconductor devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor (IEC 47E/353/CD:2007)
07/30164953 DC IEC 60747-14-5. Semiconductor devices. Discrete devices. Part 14-5. Semiconductor sensors. PN-junction semiconductor temperature sensor
DANSK DS/EN IEC 60749-5:2024 Semiconductor devices – Mechanical and climatic test methods – Part 5: Steady-state temperature humidity bias life test
CEI EN IEC 60749-5:2024 Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
CEI EN 60749-5:2017 Semiconductor devices - Mechanical and climatic test methods Part 5: Steady-state temperature humidity bias life test
DANSK DS/EN 60749-5:2003 Semiconductor devices – Mechanical and climatic test methods – Part 5: Steady-state temperature humidity bias life test
DIN EN 60749-42 E:2012 Draft Document - Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature humidity storage (IEC 47/2131/CD:2012)
IEC 60050-521:1984 International Electrotechnical Vocabulary (IEV) - Part 521: Semiconductor devices and integrated circuits
DIN EN 60749-5:2018 Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (IEC 60749-5:2017); German version EN 60749-5:2017
MIL MIL-S-19500/335-1965 SEMICONDUCTOR DEVICE, SILICON, VOLTAGE REFERENCE (TEMPERATURE-STABLE) TYPE 1N430A, 1N430B
SAE EIA4900-2016 Use of Semiconductor Devices Outside Manufacturers' Specified Temperature Ranges
DIN EN 60749-5 E:2016 Draft Document - Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (IEC 47/2311/CDV:2016); German version prEN 60749-5:2016
DIN EN IEC 60749-5 E:2024 Draft Document - Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (IEC 47/2770/CDV:2022); German and English version prEN IEC 60749-5:2022
BS PD IEC/PAS 62240:2001 Use of semiconductor devices outside manufacturer's specified temperature ranges

Standard Association of Australia （SAA）

AS 1852.521:1988 International electrotechnical vocabulary - Semiconductor devices and integrated circuits

Association Francaise de Normalisation

NF C96-022-42*NF EN 60749-42:2015 Semiconductor devices - Mechanical and climatic test methods - Part 42 : temperature humidity storage
NF EN 60749-42:2015 Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 42 : stockage température et d'humidité
NF C01-521:2002 International Electrotechnical Vocabulary - Part 521 : semiconductor devices and integrated circuits.
NF C96-022-5*NF EN 60749-5:2017 Semiconductor devices - Mechanical and climatic test methods - Part 5 : steady-state temperature humidity bias life test
NF C96-022-5:2003 Semiconductor devices - Mechanical and climatic test methods - Part 5 : steady-state temperature humidity bias life test.
NF EN IEC 60749-5:2024 Semiconductor devices - Mechanical and climatic test methods - Part 5: continuous life test under temperature and humidity with bias
NF EN 60749-5:2017 Semiconductor devices - Mechanical and climatic test methods - Part 5: continuous life test under temperature and humidity with bias

German Institute for Standardization

DIN EN 60749-42:2015-05 Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage (IEC 60749-42:2014); German version EN 60749-42:2014
DIN EN 60749-5:2018-01 Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (IEC 60749-5:2017); German version EN 60749-5:2017 / Note: DIN EN 60749-5 (2003-09) remains valid alongside this standard until 2020...
DIN EN 60749-5:2003 Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (IEC 60749-5:2003); German version EN 60749-5:2003
DIN EN IEC 60749-5:2024-04 Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (IEC 47/2770/CDV:2022); German and English version prEN IEC 60749-5:2022
DIN EN 60749-42:2015 Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage (IEC 60749-42:2014); German version EN 60749-42:2014

International Electrotechnical Commission (IEC)

IEC 60747-14-5:2010 Semiconductor devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor
IEC 60749-42:2014 Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage
IEC 60050-521:2002 International Electrotechnical Vocabulary - Part 521: Semiconductor devices and integrated circuits
IEC 60749-5:2023 Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
IEC 60749-5:2023 RLV Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
IEC 60749-5:2017 Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
IEC 60749-5:2003 Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
IEC 60050-521:2002/AMD1:2017 Amendment 1 - International Electrotechnical Vocabulary - Part 521: Semiconductor devices and integrated circuits
IEC 60050-521:2002/AMD2:2018 Amendment 2 – International Electrotechnical Vocabulary (IEV) – Part 521: Semiconductor devices and integrated circuits
IEC PAS 62240:2001 Use of semiconductor devices outside manufacturer's specified temperature ranges

Korean Agency for Technology and Standards (KATS)

KS C IEC 60749-42-2021 Semiconductor devices ― Mechanical and climatic test methods ― Part 42: Temperature and humidity storage
KS C IEC 60749-42-2016(2021) Semiconductor devices ― Mechanical and climatic test methods ― Part 42: Temperature and humidity storage
KS C IEC 60749-42:2016 Semiconductor devices ― Mechanical and climatic test methods ― Part 42: Temperature and humidity storage
KS C IEC 60050-521:2002 Semiconductor devices and integrated circuits
KS B 5218-1983 Etched-Stem liquid-in-glass wet & dry thermometer
KS C IEC PAS 62240-2008(2018) Use of semiconductor devices outside manufacturers specified temperature range
KS C IEC PAS 62240-2023 Use of semiconductor devices outside manufacturers specified temperature range

KR-KS

KS C IEC 60749-42-2016 Semiconductor devices ― Mechanical and climatic test methods ― Part 42: Temperature and humidity storage
KS C IEC PAS 62240-2008(2023) Use of semiconductor devices outside manufacturers specified temperature range

ES-UNE

UNE-EN 60749-42:2014 Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage (Endorsed by AENOR in November of 2014.)

PH-BPS

PNS IEC 60749-42:2021 Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage

European Committee for Electrotechnical Standardization（CENELEC）

EN 60749-42:2014 Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage
EN IEC 60749-5:2024 Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
EN 60749-4:2017 Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
EN 60749-5:2017 Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
EN 60749-5:2003 Semiconductor devices Mechanical and climatic test methods Part 5: Steady-state temperature humidity bias life test

PT-IPQ

NP 2626-521-2001 International Electrotechnical Vocabulary Chapter 521: Semiconductor devices and integrated circuits

IEC - International Electrotechnical Commission

IEC 60050 CHAP 521:1984 Vocabulaire Electrotechnique International Chapitre 521 : Dispositifs semi-conducteurs et des circuits intégrés

Danish Standards Foundation

DS/EN 60749-5:2003 Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

AENOR

UNE-EN 60749-5:2003 Semiconductor devices. Mechanical and climatic test methods. Part 5: Steady-state temperature humidity bias life test

RU-GOST R

GOST 8.157-1975 State system for ensuring the uniformity of measurements. The temperature practical scales
GOST 18986.17-1973 Reference diodes. Method of measuring of temperature coefficient of working voltage

CZ-CSN

CSN 35 8760-1973 Seraiconductors. Stabilizing diodes. Measurement of voltage temperature coefficient

Lithuanian Standards Office

LST EN 60749-5-2004 Semiconductor devices - Mechanical and climatic test methods. Part 5: Steady-state temperature humidity bias life test (IEC 60749-5:2003)

ASHRAE - American Society of Heating@ Refrigerating and Air-Conditioning Engineers@ Inc.

ASHRAE DA-07-046-2007 Monitored Indoor Moisture and Temperature Conditions in Humid-Climate US Residences

SE-SIS

SIS SEN 43 32 00-1973 Semiconductor devices. Survey of standards. International recommendations' validity as Swedish standard

Defense Logistics Agency

DLA MIL-S-19500/335 VALID NOTICE 4-2011 Semiconductor Device, Silicon, Voltage Reference (Temperature- Stable) Type 1N430A, 1N430B

HU-MSZT

MNOSZ 700-10.lap-1955 STMicroelectronics is a very high temperature distillation

Government Electronic & Information Technology Association

GEIA SP4900-2002 Use of Semiconductor Devices Outside Manufacturers?Specified Temperature Ranges Comment Period Expires: May 27, 2002; ANSI/EIA-4900

SAE - SAE International

SAE EIA-4900-2016 Use of Semiconductor Devices Outside Manufacturers' Specified Temperature Ranges

Others: Semiconductor International