Film thickness test on silicon substrate
Film thickness test on silicon substrate, Total:2 items.
The international standard classification for "Film thickness test on silicon substrate" includes: Other non-ferrous metals and their alloys , Other standards related to analytical chemistry .
The Chinese standard classification for "Film thickness test on silicon substrate" includes: Precious metals and their alloys , Industrial technical glass .
Professional Standard - Non-ferrous Metal
- YS/T 839-2012 Test Method for Measurement of Insulator Thickness and Refractive Index on Silicon Substrates by Ellipsometry
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 33826-2017 Measurement of nanofilm thickness on glass substrate-Profilometric method
