Silicon wafer thickness and total thickness variation test method
Silicon wafer thickness and total thickness variation test method, Total:2 items.
The international standard classification for "Silicon wafer thickness and total thickness variation test method" includes: Semiconducting materials .
The Chinese standard classification for "Silicon wafer thickness and total thickness variation test method" includes: Semimetal and semiconductor material in general , Metal physical property test method .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 6618-2009 Test method for thickness and total thickness variation of silicon slices
- GB/T 6618-1995 Test method for thickness and total thickness variation of silicon slices
