GA/T 1654-2019 in English

VALID

Forensic sciences—Examination methods for paper elements—Wavelength dispersive X-ray fluorescence spectrometry

Issued on:2019-10-14
Implemented on:2019-12-01
File Format:PDF
Delivery:Via email within 1~3 business days

Price(USD)： $100.00
$97.00

Standard No:	GA/T 1654-2019
Document status:	VALID
Title in English:	Forensic sciences—Examination methods for paper elements—Wavelength dispersive X-ray fluorescence spectrometry
Title in Chinese:	法庭科学纸张元素成分检验波长色散X射线荧光光谱法
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 1~3 business days
Issued on:	2019-10-14
Implemented on:	2019-12-01
ICS Classification:	13.310-Protection against crime
Chinese Classification:	A92-Crime judging technology
Professional Classification:	GA-Security
Related Keywords:	dispersive x-ray fluorescence spectrometry dispersive x-ray fluorescence dispersive x-ray fluorescence spectrometry introduction technical principles dispersive x-ray fluorescence spectrometer paper elements wavelength
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本标准规定了法庭科学领域波长色散X射线荧光光谱检验纸张元素成分的方法。
本标准适用于法庭科学领域纸张物证的元素成分分析和比对检验，其他领域亦可参照使用。

Introduction

Technical Principles and Standardization Background

Wavelength dispersive X-ray fluorescence spectrometry (WDXRF) achieves qualitative and quantitative element analysis by measuring the wavelength and intensity of characteristic X-rays produced by samples after being excited by X-rays. The application of this method in forensic paper inspection stems from the differences in elemental characteristics caused by additives such as fillers and pigments in the papermaking process.

Core Inspection Process

Key Steps	Technical Parameters	Quality Control
Sample Preparation	1-40mm Diameter Disc or Grinded Tablet	Stereo Optical Microscope Inspection
Instrument Testing	9F～92U Full Element Scanning	PHA Adjustment/Three Parallel Tests
Data Analysis	Cellulose as the Base Component	Relative Percentage Comparison

Implementation Points and Case Studies

Typical application: In a document identification case, by detecting the characteristic peak intensity ratio of Ca (113.125° LiF1) and Ti (86.110° LiF1) in the paper, different batches of printing paper were successfully distinguished.

Wavelength dispersive X-ray fluorescence spectrometer Special attention should be paid to:

Use a hollow sample cup to avoid interference from thin film samples
Stable control of argon methane gas flow
Perform semi-quantitative analysis under vacuum

Technology evolution analysis

Compared with energy dispersive X-ray fluorescence (EDXRF), WDXRF has the advantages of high resolution (up to 5-20eV) and low detection limit (ppm level). After 2015, the new wavelength dispersive X-ray fluorescence spectrometer uses multilayer crystal technology to increase the sensitivity of light element (Na-Mg) detection by 40%.

Recommendations for the implementation of the standard

Establish a laboratory-specific paper element database
Perform regular scintillation counting detector energy calibration
Complex samples are recommended to be supplemented with SEM-EDS analysis

More samples: GB 18306-2015 JGJ 94-2008 YD/T 3934-2021

Sample only — not a preview of GA/T 1654-2019

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