Dispersion Spectrometer
Dispersion Spectrometer, Total:10 items.
The international standard classification for "Dispersion Spectrometer" includes: Other standards related to nuclear energy , Protection against crime .
The Chinese standard classification for "Dispersion Spectrometer" includes: Optical Measurement , Crime judging technology , General nuclear instrument .
National Metrological Verification Regulations of the People's Republic of China
- JJG 810-1993 Wavelength Dispersive X-Ray Fluorescence Spectrometers
Sichuan Provincial Standard of the People's Republic of China
- DB51/T 2181-2016 Determination of Phosphorus in Gasoline by Wavelength Dispersive X-ray Fluorescence Spectrometry
Heilongjiang Provincial Standard of the People's Republic of China
- DB23/T 2489-2019 Determination of Ten Trace Elements in Spheroidized Graphite by Wavelength Dispersive X-ray Fluorescence Spectrometry
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 19267.13-2025 Forensic sciences—Physical and chemical examination of trace evidence—Part 13：Wavelength dispersive X-ray fluorescence spectrometry
- GB/T 31364-2015 Test methods for main performance of energy dispersive X-ray fluorescence spectrometer
Professional Standard - Public Safety Standards
- GA/T 1654-2019 Forensic sciences—Examination methods for paper elements—Wavelength dispersive X-ray fluorescence spectrometry
American Society for Testing and Materials (ASTM)
- ASTM E1172-16 Standard Practice for Describing and Specifying a Wavelength Dispersive X-Ray Spectrometer
- ASTM E1172-22 Standard Practice for Describing and Specifying a Wavelength Dispersive X-Ray Spectrometer
British Standards Institution (BSI)
- BS ISO 15632:2002 Microbeam analysis. Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
German Institute for Standardization
- DIN ISO 15632:2022-09 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA) (ISO 15632:2...
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