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self-healing test destruction test destruction test scopethis part applies ageing test shunt power capacitors narrowband fm control unit radio data transmission units low-temperature test english double centrifuges introductionthis document
GB/T 12747.2-2004 in English

GB/T 12747.2-2004 in English

SUPERSEDED

Shunt power capacitors of the self-healing type for a.c. systems having a rated voltage up to and including 1 000 V—Part 2:Ageing test,self-healing test and destruction test

  • Issued on:2004-02-04
  • Implemented on:2004-08-01
  • File Format:PDF
  • Delivery:Via email within 1~3 business days
Price(USD): $340.00
$330.00
Standard No: GB/T 12747.2-2004
Document status: SUPERSEDED
Superseded by: GB/T 12747.2-2017 Shunt power capacitors of the self-healing type for a. c. systems having a rated voltage up to and including 1 000 V. Part 2: Ageing test,self-healing test and destruction test
Superseded on: 2018-02-01
Title in English: Shunt power capacitors of the self-healing type for a.c. systems having a rated voltage up to and including 1 000 V—Part 2:Ageing test,self-healing test and destruction test
Title in Chinese: 标称电压 1 kV 及以下交流电力系统用自愈式并联电容器 第2部分:老化试验、自愈性试验和破坏试验
Language: English
File Format: Electronic (PDF)
Delivery: Via email within 1~3 business days
Issued on: 2004-02-04
Implemented on: 2004-08-01
ICS Classification: 31.060.70-Power capacitors
Chinese Classification: K42-Power capacitor
Professional Classification: GB-National Standard
Related Keywords: self-healing test
destruction test
destruction test scopethis part applies
ageing test
shunt power capacitors
Related Topics: self-healing
Q
Q
Self-healing 1
GB/T 12747.2
GB/T 12747.2-2004
GB/T 12747.2-2017
Capacitive self-healing property

《GB/T 12747.2-2004标称电压1 kV及以下交流电力系统用自愈式并联电容器 第2部分:老化试验、自愈性试验和破坏试验》由TC45(全国电力电容器标准化技术委员会)归口,主管部门为中国电器工业协会。
本部分适用于符合GB/T12747.1-2004的电容器,并规定了这些电容器的老化试验、自愈性试验和破坏试验的要求。


Scope

This part applies to capacitors conforming to GB/T 12747.1-2004, and specifies the requirements for aging test, self-healing test and destruction test of these capacitors.

Sample only — not a preview of GB/T 12747.2-2004
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