GB/T 18500.1-2001 in English
VALIDSemiconductor devices - Integrated circuits - Part 4: Interface integrated circuits - Section 1: Bland detail specification for linear digital - To-analogue converters (DAC)
- Issued on:2001-01-01
- Implemented on:2002-06-01
- File Format:PDF
- Delivery:Via email within 1~3 business days
$233.00
| Standard No: | GB/T 18500.1-2001 |
| Document status: | VALID |
| Title in English: | Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits - Section 1: Bland detail specification for linear digital - To-analogue converters (DAC) |
| Title in Chinese: | 半导体器件 集成电路 第4部分：接口集成电路 第一篇：线性数字/模拟转换器(DAC)空白详细规范 |
| Language: | English |
| File Format: | Electronic (PDF) |
| Delivery: | Via email within 1~3 business days |
| Issued on: | 2001-01-01 |
| Implemented on: | 2002-06-01 |
| ICS Classification: | 31.200-Integrated circuits. Microelectronics |
| Chinese Classification: | L56-Semiconductor integrated circuit |
| Professional Classification: | GB-National Standard |
| Related Keywords: | interface integrated circuits part
semiconductor device integrated circuits part bland detail specification blank detailed specification semiconductor devices |
| Related Topics: | number of articles
GBT18500.1 GB/T 18500.1-2001 integrated circuit Semiconductor integrated interface circuit line circuit |
《GB/T 18500.1-2001半导体器件 集成电路 第4部分:接口集成电路 第一篇:线性数字/模拟转换器（DAC）空白详细规范》由TC78（全国半导体器件标准化技术委员会）归口，主管部门为工业和信息化部（电子）。
IEC电子器件质量评定体系遵循IEC的章程并在IEC授权下进行工作。该体系的目的是确定质量评定程序，以这种方式使一个参加国按有关规范要求放行的电子器件无需进一步试验而为其所有参加国同样接受。本空白详细规范是半导体器件的一系列空白详细规范之一，并且与下列IEC标准一起使用。IEC 747-10/QC 700000 半导体器件 第10部分：分立器件和集成电路总规范IEC 748-11/QC 790100 半导体器件 集成电路 第11部分：半导体集成电路（不包括混合电路）分规范
Scope
This standard is equivalent to the International Electrotechnical Commission (IEC) standard IEC 748-4-1: 1993 "Semiconductor Device Integrated Circuits Part 4: Interface Integrated Circuits Part 1: Linear Digital/Analog Converter (DAC) Blank Detailed Specification", with Promote the international trade, technology and economic exchange of such products in our country. This standard can be used as the basis for the compilation of detailed specifications for linear DACs.
Loading PDF document...
Error loading PDF. Please make sure the file is valid and try again.
We also recommend
-
GB/T 42744-2023 in English
Microwave circuit—Measuring methods for electrically controlled attenuator
2023-08-06 -
GB/T 44777-2024 in English
Guideline for intellectual property(IP) core protection
2024-10-26 -
GB/T 12750-2006 in English
Semiconductor devices―Integrated circuits―Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits
2006-08-23 -
GB/T 5965-2000 in English
Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section one - Blank detail specification for bipolar monolithic digital integrated circuit gates (exc
2000-01-03 -
GB/T 44937.5-2025 in English
Integrated circuits—Measurement of electromagnetic emissions—Part 5: Measurement of conducted emissions—Workbench Faraday Cage method
2025-12-31 -
GB/T 15876-2015 in English
Semiconductor integrated circuits―Specification of leadframes for plastic quad flat package
2015-05-15 -
GB/T 33657-2017 in English
Nanotechnologies―Electrical operating parameter test specification of wafer level nano-scale phase change memory cells
2017-05-12
