integrated circuit
integrated circuit, Total:360 items.
The international standard classification for "integrated circuit" includes: Integrated circuits. Microelectronics , Electromechanical components for electronic and telecommunications equipment , Copper products , Identification cards and related devices , Optoelectronics. Laser equipment , Components for aerospace construction , Electrical engineering (Vocabularies) , IT applications in industry , Semiconductor devices in general , Space systems and operations , Plugs, socket-outlets, couplers , Information technology (IT) in general , Aerospace electric equipment and systems , IT applications in transport and trade , Nickel and chromium products , Energy and heat transfer engineering in general , Electricity. Magnetism. Electrical and magnetic measurements , Flat steel products and semi-products , IT applications in banking .
The Chinese standard classification for "integrated circuit" includes: Microcircuit in general , Semiconductor integrated circuit , Heavy metals and their alloys , Electronic industry production equipment in general , Film integrated circuit , Data medium , Dedicated processing equipment , Aerospace hydraulic elements and accessories , Special electronic technology material , Information processing technology in general , Basic standards and general methods , Computer application , Electronic components , Computer application , Technical management , Technical management , Technical Management , Technical management , Technical management , Hybrid integrated circuit , Technical management , Marking, packaging, transport and storage , Electrical system and equipment , Computer application , Technical management , Radio Measurement , Steel sheet and strip , Finance and Insurance .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 42973-2023 Semiconductor integrated circuits—Digital-analog(DA)converter
- GB/T 43041-2023 Hybrid integrated circuits—DC/DC converter
- GB/T 31441-2015 Electronic toll collection―Technical specification of IC card reader
- GB/T 15138-1994 Case outlines for film integrated circuits and hybrid integrated circuits
- GB/T 14620-1993 ceramic substrates for thin film integrated circuits
- GB/T 39842-2021 Itegrated circuit (IC)card packaging framework
- GB 35007-2018 Semiconductor integrated circuit low voltage differential signal circuit testing method
- GB/T 17553.1-1998 Identification cards--Contactless integrated circuit(s) cards--Part 1:Physical characteristics
- GB/T 17574.10-2003 Semiconductor devices—Integrated circuits—Part 2-10:Digital integrated circuits—Blank detail specification of integrated circuit dynamic read/write memories
- GB/T 39159-2020 High purity copper alloy target for integrated circuit
- GB/T 14620-2013 Alumina Ceramic Substrates for Thin Film Integrated Circuits
- GB/T 43061-2023 Semiconductor integrated circuits—Test methods of PWM controller
- GB/T 35005-2018 Test methods for flip chip integrated circuits
- GB/T 18500.2-2001 Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits - Section 2: Blank detail specification for linear analogue - To - Digital converters(ADC)
- GB/T 5965-2000 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section one - Blank detail specification for bipolar monolithic digital integrated circuit gates (exc
- GB/T 42975-2023 Semiconductor integrated circuits—Test method of driver device
- GB/T 12750-2006 Semiconductor devices―Integrated circuits―Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits
- GB/T 17574.9-2006 Semiconductor devices - Integrated circuits - Part 2-9: Digital integrated circuits - Blank detail specification for MOS ultraviolet light erasable electrically programmable read-onl
- GB/T 36479-2018 Integrated circuits—Test methods for column grid array
- GB/T 15878-2015 Semiconductor integrated circuits―Specification of leadframes for small outline package
- GB/T 14030-1992 principles of measuring methods of timer circuits for semiconductor integrated circuits
- GB/T 40577-2021 Terminology for integrated circuit(IC) manufacturing equipment
- GB/T 43796-2024 Remote operation and maintenance of integrated circuit packaging equipment—Data acquisition
- GB/T 33140-2016 Phosphorized copper anode used for integrated circuit
- GB/T 43538-2023 Quality and technical requirements for metal packages used for integrated circuits
- GB/T 42837-2023 Microwave semiconductor integrated circuits—Amplifier
- GB/T 4376-1994 Series and products of voltage regulators for semiconductor integrated circuits
- GB/T 11498-2018 Semiconductor devices—Integrated circuits—Part 21:Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the qualification approval procedures
- GB/T 42836-2023 Microwave semiconductor integrated circuits—Frequency mixer
- GB/T 17572-1998 Semiconductor devices--Integrated circuits Part 2:Digital integrated circuits Section four--Family specification for complementary MOS digital integrated circuits,series 4 000B and 4 000UB
- GB/T 42835-2023 Semiconductor integrated circuits—System on chip(SoC)
- GB/T 7092-1993 Outline dimensions of semiconductor integrated circuits
- GB/T 13062-1991 Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of the qualification approval procedure
- GB/T 2900.66-2004 Electrotechnical terminology - Semiconductor devices and integrated circuits
- GB/T 20870.4-2024 Semiconductor devices—Part 16-4:Microwave intergrated circuits—Switches
- GB/T 17024-1997 Semiconductor devices Integrated circuits Part2:Digital integrated circuits Section three—Blank detail specification for HCMOS digital integrated circuits series 54/74HC,54/74HCT,54/74HCU
- GB/T 19403.1-2003 Semiconductor devices—Integrated Circuits—Part 11:Section 1:Internal visual examination for semiconductor integrated circuits (excluding hybrid circuits)
- GB/T 14619-1993 ceramic substrates for thick film integrated circuits
- GB/T 7092-2021 Outline dimensions of semiconductor integrated circuits
- GB/T 8976-1996 Generic specification for film integrated circuits and hybrid film integrated circuits
- GB/T 30962-2014 Identification cards—Integrated circuit cards—High capacity cards
- GB/T 11498-1989 Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the qualification approval procedure
- GB/T 42970-2023 Semiconductor integrated circuits—Measuring methods of video encoder and decoder circuits
- GB/T 16465-1996 Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures
- GB/T 41213-2021 Integrated circuit full automatic die bonder
- GB/T 42838-2023 Semiconductor integrated circuits—Measuring method of Holzer circuit
- GB/T 9178-1988 Terminology for integrated circuits
- GB/T 43228-2023 Design requirements for space radiation-hardened integrated circuit standard cell library
- GB/T 14028-2018 Semiconductor integrated circuits—Measuring method of analogue switch
- GB/T 20296-2006 Mnemonics and symbols for integrated circuits
- GB/T 36477-2018 Semiconductor integrated circuit—Measuring methods for flash memory
- GB/T 17574.11-2006 Semiconductor devices - Integrated circuits - Part 2-11: Digital integrated circuits - Blank detail specification for single supply integrated circuit electrically erasable and programmable read-only memory
- GB/T 18500.1-2001 Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits - Section 1: Bland detail specification for linear digital - To-analogue converters (DAC)
- GB/T 36614-2018 Integrated circuits—Memory devices pin configuration
- GB/T 36636-2018 Identification cards—Specification for dual-interface integrated circuit card module
- GB/T 41033-2021 Design requirements of radiation hardening for CMOS IC
- GB/T 12750-1991 Sectional specification for semiconductor integrated circuits, excluding hybrid circuits
- GB/T 17023-1997 Semiconductor devices Integrated circuits - Part 2: Digital integrated circuits Section two - Family specification for HCMOS digital integrated circuits series 54/74HC, 54/74HCT, 54/74
- GB/T 3430-1989 The rule of type designation for semiconductor integrated circuits
- GB/T 17940-2000 Semiconductor devices--Integrated circuits--Part 3:Analogue integrated circuits
- GB/T 9424-1998 Semiconductor devices --Integrated circuits --Part 2:Digital integrated circuits --Section five --Blank detail specification for complementary MOS digital integrated circuits,series 4 0
- GB/T 43040-2023 Semiconductor integrated circuits—Test method of AC/DC converters
- GB/T 44798-2024 Design assurance guidelines for complex integrated circuits
- GB/T 14113-1993 of packages for semiconductor integrated circuits
- GB/T 14619-2013 Alumina Ceramic Substrates for Thick Film Integrated Circuits
- GB/T 4377-2018 Semiconductor integrated circuits—Measuring method of voltage regulators
- GB/T 12842-1991 Terminology for film integrated circuits and hybrid film integrated circuits
- GB/T 20296-2012 Mnemonics and symbols for integrated circuits
- GB/T 43931-2024 General specification for microwave integrated circuit chip for aerospace
- GB/T 20515-2006 Semiconductor devices - Integrated circuits - Part 5: Semicustom integrated circuits
- GB/T 43972-2024 Remote operation and maintenance of integrated circuit packaging equipment—Status monitoring
- GB/T 17574-1998 Semiconductor devices --Integrated circuits Part 2:Digital integrated circuits
- GB/T 16464-1996 Semiconductor devices Integrated circuits Part 1: General
- GB/T 42839-2023 Semiconductor integrated circuits—Analog digital (AD) converter
- GB/T 17574.20-2006 Semiconductor devices - Integrated circuits - Part 2-20: Digital integrated circuits - Family specification - Low voltage integrated circuits
- GB/T 43454-2023 Design requirements of integrated circuit intellectual property (IP) core
- GB/T 42974-2023 Semiconductor integrated circuits—Flash memory(FLASH)
- GB/T 16466-1996 Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures
- GB/T 44797-2025 Microwave hybrid integrated circuits—Synthesized frequency sources
- GB/T 37959-2019 Information model for containing process chamber IC equipment design
- GB/T 38345-2019 General design requirements of semiconductor integrate circuit for space application
Professional Standard - Electron
- SJ/Z 2926-1988 Test methods for properties of mask-making equipment for manufacturing of ICs
- SJ/T 11166-1998 Generic specification for sockets for integrated circuit (s ) card (IC card )
- SJ 52440/1-1996 Detail specification of type M metal DIP for hybrid integrated circuits
- SJ 52438/10-2001 Hybrid integrated circuits detail specification for type HMSF - 600 power filters
- SJ/Z 11353-2006 Integrated circuit IP core transfer specification
- SJ/T 11220-2000 General specification for Integrated Cards.Part 1:Basic specification for Cards
- SJ 52438/4-1997 Hybrid integrated circuits - Detail specification for Type B - DTV3 temperature-voltage convertor
- SJ 20295-1993 Detail specification for Type JT4344 phase-frequency detector of semiconductor integrated circuits
- SJ 52438/1-1997 Hybrid integrated circuit-Detail specification for Type HDC28D15/1000 DC/DC converter
- SJ 2521-1984 Sockets for dual in-line integrated circuits, Type CJZ
- SJ/Z 11360-2006 Integrated circuit IP core signal integrity specification
- SJ/T 10456-1993 Porcelain enameled steel substrate for hybrid integrated circuits
- SJ 50597/23-1994 Semiconductor integrated circuits-Detail specification for type JJ710 voltage comparator
- SJ 51420/3-2003 Detail specification of ceramic PGA for semiconductor integrated circuits
- SJ/T 9534-1993 Grading standard of quality for semiconductor integrated circuits
- SJ 52438/3-1997 Hybrid integrated circuits - Detail specification for Type B-LB18 low pass active filter
- SJ/T 10334-1993 Series and products of audio circuits of semiconductor integrated circuits
- SJ 20163-1992 Detail specification of Ju8086 microprocessor for semiconductor integrated circuits
- SJ/T 10111-1991 Automatic measuring instruments for integrated circuits for Type GH3123
- SJ/Z 11361-2006 Integrated circuit intellectual property core protection:schemes alternatives and discussion
- SJ 51420/1-1996 Detail specification of type D ceramic DIP for semiconductor integrated circuits
- SJ/T 10455-1993 Copper conductor paste for thick film hybrid integrated circuits
- SJ 50597/36-1995 Semiconductor integrated circuits - Detail specification for Type JC54HC08, JC54HC11, JC54HC32, JC54HC86 HCMOS gates
- SJ/T 10147-1991 Package tubes against static for integrated circuits
- SJ 52438/8-2001 Hybrid integrated circuits Detail specification for type HCA2 charge amplifiers
- SJ 50597/56-2002 Semiconductor integrated circuits - Detail specification for type JW920 PIN driver
- SJ/T 10805-2018 Semiconductor integrated circuits Measuring methods for voltage comparators
- SJ/Z 11359-2006 Taxonomy of functional verification for integrated circuit IP core development and integration
- SJ 50597/49-1997 Hybrid integrated circuits-Detail specification for Type HCHF01 frequency differencing and channel seperation
- SJ/T 10741-1996 Semiconductor integrated circuits--General principles of measuring methods for CMOS circuits
- SJ 20298-1993 Detail specification for Types JB555 and JB556 precision timers of semiconductor integrated circuits
- SJ/T 10152-1991 Terms relating to main equipment for integrated circuit technologies
- SJ 20874-2003 General specification for sockets for test for surface mounting integrated circuits
- SJ 20802-2001 Visual inspection criteria for integrated circuits metal packages
- SJ 50597.11-1994 Detail specification for type Jμ82289 bus arbiter of semiconductor integrated circuits
- SJ 51420/2-1998 Detail specification of Type F ceramic FP for semiconductor integrated circuits
- SJ 3181-1989 Graphic base of electronic elements - IC Graphic
- SJ 20157-1992 Detail specification for types JT54LS32 and JT54LS86 OR GATES of LS-TTL semiconductor integrated circuits
- SJ/T 10831-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CD7193CP chrominance processing circuits
- SJ/T 10308-1992 Detail specification of ceramic flat package for semiconductor integrated circuits
- SJ 50597/34-1995 Semiconductor integrated circuits - Detail specification for Types JC4085, JC4086, JC4070, JC4077 CMOS gates
- SJ 52438/6-2000 Hybrid integrated circuits - Detail specification for type HDCD2815S15 DC/DC converter
- SJ/T 11512-2015 Test methods of electronic pastes for integrated circuit performent
- SJ 20142-1992 Microcrystalline glass substrate for military integrated circuit
- SJ 2522-1984 Sockets for integrated circuits, Type LJZ
- SJ 20237-1993 Verification regulation of model GH3123 IC automatic tester
- SJ 2231-1982 Series and types of direct current voltage regulators for thick-film and thin-film integrated circuits
- SJ/T 11702-2018 Semiconductor integrated circuit serial peripheral interface test method
- SJ 2905-1988 Detail specification for electronic components--Voltage established circuits for type CHM9102 of hybrid thick-film integrated circuits
- SJ 52438/9-2001 Hybrid integrated circuits detail specification for type HDCD2812D15 DC/DC converters
- SJ 50597/48-1997 Hybrid integrated circuits-Detail specification for Type HMF01 double channel pulse signal isolation and amplification
- SJ/T 10607-1994 Gate array design generals for semiconductor integrated circuits
- SJ 2232-1982 Specification for metal packages of thick-film and thin-film integrated circuits
- SJ/T 10741-2000 Semiconductor integrated circuits General principles of measuring methods for CMOS circuits
- SJ/Z 11354-2006 Integrated circuit analog/mixed-signal IP core specification
- SJ/T 10734-1996 Letter symbols for semiconductor integrated circuits - Letter symbols for electrical parameters
- SJ/Z 11358-2006 Integrated circuit IP core model taxonomy
- SJ/Z 11355-2006 Specification for integrated circuit IP/SoC functional verification
- SJ 20646-1997 The measuring methods of DC/DC converters for hybrid integrated circuits
- SJ 2520-1984 General specification for sockets for integrated circuits
- SJ 20954-2006 Integrated circuits latch-up test
- SJ 52438/14-2004 Hybrid integrated circuits detail specification for type HPA501J power amplifiers
- SJ/T 11232-2001 General specification for integrated circuit cards Part 6:Security specification
- SJ 52438/7-2000 Hybrid integrated circuits - Detail specification for Type HRV013 voltage reference, multichannel
- SJ 50597.2-1994 Detail specification for types JH2014 HTL flip-flop of semiconductor integrated circuits
- SJ/Z 2927-1988 Terminology for mask-making equipment for integrated circuits manufacturing
- SJ/T 10176-1991 Detail specification of metal rhomb package for semiconductor integrated circuits
- SJ 20875-2003 General specification for sockets for flat package integrated circuits
- SJ/T 11508-2015 Positive Photoresist developer for Integrated Circuit
- SJ 20758-1999 Semiconductor integrated circuits - Specification for CMOS gate array devices
- SJ 50597/46-1997 Hybrid integrated circuits - Detail specification for Type HFB01 transformation circuit of amplitude modulation to phase modulation
- SJ 2154-1982 Miorocrystal glass substrates for use in thick film integrated circuits
- SJ/T 10335-1993 Series and products of semiconductor integrated circuits for use in TV
- SJ/T 10745-1996 Mechanical and climatic test methods for semiconductor integrated circuits
- SJ 50597/47-1997 Hybrid integrated circuits-Detail specification for Type HSXB01 phase locked loop with frequency doubler
Professional Standard - Aerospace
- QJ 1528-1988 Semiconductor integrated circuit time base test method
- QJ 3211-2005 Detail specification for hybrid integrated circuits type HB2824S12、HB2815D45 DC/DC converters
- QJ 3067-1998 Detail Specification for JHB114 High Precision Temperature Control Circuit of Hybrid Integrated Circuit
- QJ 1995A-1998 Specification for Acceptance of Integrated Circuit
- QJ 3092-1999 Detailed Specifications for Semiconductor Integrated Circuit HCT or Gate or Not Gate
- QJ 1971-1990 Graphical Symbols for Complex Function Integrated Circuits
- QJ 2775-1995 Code for Package of Integrated Circuit
- QJ 3066-1998 Detail Specification for JHB076 High-Power Bridge H Circuit of Hybrid Integrated Circuit
- QJ 2922-1997 Detail Specification for JHB029 Low-pass Filter of Hybrid Integrated Circuit
- QJ 2875-1997 Detailed Specification for CMOS Digital Gate Array of Semiconductor Integrated Circuit
- QJ 786-1983 Semiconductor Integrated Circuits - Specifications for Screening
- QJ 10006-2008 General Specification for Semiconductor Integrated Circuits for Aerospace
- QJ 1995-1990 Specification for Acceptance of Integrated Circuits
- QJ/Z 153-1985 Specification for MOS Integrated Circuit Mounting Process
- QJ 2494-1993 Detailed specification for semiconductor integrated circuit drivers QZ2501, QZ2502 and QZ2503
- QJ 1460-1988 Measuring Methods for Broadband Amplifiers of Semiconductor Integrated Circuits
Military Standard of the People's Republic of China-General Armament Department
- GJB 9147-2017 Semiconductor integrated circuit operational amplifier test methods
- GJB 2438/18-2011 Hybrid integrated circuits .Detail specification for type HMM201 voltage modulator
- GJB 3233-1998 Semiconductor integrated circuit failure analysis procedures and methods
- GJB 7715-2012 General requirements for military integrated circuit IP core
- GJB 2438B-2017 General Specification for Hybrid Integrated Circuits
- GJB 2438/15-2011 Hybrid integrated circuits .Detail specification for type HHJ28T515 DC/DC converter
- GJB 2438/3-2011 Hybrid integrated circuits.Detail specification for B-DTV3 temperature-voltage converter
- GJB 2438/14-2011 Hybrid integrated circuits .Detail specification for type HSR28S5F DC/DC converter
- GJB 2438/16-2011 Hybrid integrated circuits .Detail specification for type HTC202 terminal control circuit
- GJB 2438-1995 General Specification for Hybrid Integrated Circuits
- GJB 1420B-2011 General specification for packages of semiconductor integrated circuits
- GJB 2438/19-2011 Hybrid integrated circuits .Detail specification for type ZF2B20 V/I converter
- GJB 2438/5-2011 Hybrid integrated circuits.Detail specification for type LB8061A moment current generator
- GJB 2438/12-2011 Hybrid integrated circuits .Detail specification for type HDA502J DC/AC converter
- GJB 2440A-2006 General specification for packages of hybrid integrated circuits
- GJB/Z 42.2-1993 Military microcircuit series type spectrum semiconductor integrated circuit digital integrated circuit
- GJB 1420-1992 General specification for packages of semiconductor integrated circuits
- GJB 597B-2012 General specification for semiconductor integrated circuits
- GJB/Z 42.4-1993 Military Microcircuit Series Spectrum Semiconductor Integrated Circuit Interfacer Integrated Circuit
- GJB 2438/17-2011 Hybrid integrated circuits .Detail specification for type HFM203 current modulator
- GJB 2438/9-2011 Hybrid integrated circuits.Detail specification for type HCA2 charge amplifier
- GJB 2438/7-2011 Hybrid integrated circuits.Detail specification for STS-1(TH07)transverter of rotating speed
- GJB/Z 42.1-1993 Military microcircuit series type spectrum semiconductor integrated circuit analog integrated circuit
- GJB 10163-2021 Test method for moisture sensitivity classification of plastic packaged integrated circuits
- GJB 2438/2-2011 Hybrid integrated circuits.Detail specifications for type YH112 of frequency converter
- GJB 2438/4-2011 Hybrid integrated circuits Detail specification for type LB8338 outer synchronizing temperature controller
- GJB 9389-2018 Integrated circuit lock test method
- GJB 2438/11-2011 Hybrid integrated circuits.Detail specification for type HDA501J DC/AC converter
Professional Standard - Energy
- DL/T 2813-2024 Evaluation Methods for Electromagnetic Compatibility of Power Integrated Circuits
Group Standards of the People's Republic of China
- T/ZZB 2085-2021 Gravity integrated circuit handlers
- T/ICMTIA pc008-2021 Nitric acid for integrated circuits
- T/SICA 001-2020 Waste sulfuric acid in titanium dioxide manufacturing industry
- T/QGCML 256-2022 Integrated circuit design engineering experiment box
- T/ICMTIA BS0029-2022 Classification and definition of IC material product maturity level
- T/ICMTIA BS0030-2022 IC material product classification
Beijing Provincial Standard of the People's Republic of China
- DB11/T 1544-2018 Cleaner Production Evaluation Index System Integrated Circuit Manufacturing Industry
- DB11/T 1764.8-2021 Water Ratings Part 8: Integrated Circuits
Ministry of Housing and Urban-Rural Development of the People's Replublic of China
- GB 50809-2012 Code for design of silicon integrated circuits wafer fab
- GB 51122-2015 Code for design of integrated circuit assembly and test factory
Professional Standard - Aviation
- HB 5834-1983 Technical Specifications of TTL Integrated Circuit Screening for Aviation
National Metrological Verification Regulations of the People's Republic of China
- JJG(电子) 04033-1989 BJ3123 type bipolar logic integrated circuit tester verification regulations
- JJG(电子) 04035-1989 GR1732M digital integrated circuit test system verification regulations
- JJG(电子) 04032-1989 BJ3122 (QL11) logic integrated circuit tester verification regulations
- JJG(电子) 04031-1989 9200 Large-Scale Integrated Circuit Test System Verification Regulations
- JJG(电子) 04021-1989 Specification for verification of BJ3110 model MOS integrated circuit testers
- JJG(电子) 04034-1989 GR1731M type analog integrated circuit test system verification regulations
- JJG(电子) 04039-1991 GH3112 Integrated Circuit Dynamic Logic Function Detector Verification Regulations
Professional Standard - Urban Construction
- CJ/T 243-2007 Test methods for construction cause IC card
- CJ/T 166-2014 Integrated circuit card application technology of construction cause
- CJ/T 334-2010 Integrated circuit(IC) card gas flow-meter
Professional Standard - Non-ferrous Metal
- YS/T 936-2013 Sputtering nickel vanadium alloy target used in integrated circuit device
Sichuan Provincial Standard of the People's Republic of China
- DB51/T 3207-2024 Microwave Probes Application Specifications for Integrated Circuit Testing
Shanghai Provincial Standard of the People's Republic of China
- DB31/ 506-2020 The norm of energy consumption per unit product of wafer fabrication in integrated circuits
- DB31/ 738-2020 The norm of energy consumption per unit product of integrated circuit packaging
National Metrological Technical Specifications of the People's Republic of China
- JJF 1179-2007 Calibration Specification of High Temperature Dynamic IC Burn-in System
- JJF 1269-2010 Calibration Specification for IEPE Amplifiers
Professional Standard - Ferrous Metallurgy
- YB/T 100-1997 Cold-rolled strips alloy 4J42K for IC leadframes
Professional Standard - Finance
- JR/T 0045.1-2008 China Financial Integrated Circuit Card Test Specifications-Part 1
- JR/T 0045.2-2008 China Financial Integrated Circuit Card Test Specifications-Part 2
- JR/T 0025.1-2018 China financial integrated circuit card specifications - Part 1 : General principles
British Standards Institution (BSI)
- BS IEC 63011-1:2018 Integrated circuits. Three dimensional integrated circuits - Terminology
- BS IEC 60748-2-20:2008 Semiconductor devices - Integrated circuits - Digital integrated circuits - Family specification - Low voltage integrated circuits
- BS IEC 60748-2-20:2000 Semiconductor devices. Integrated circuits. Digital integrated circuits-Family specification. Low voltage integrated circuits
- BS IEC 60748-4:1997 Semiconductor devices. Integrated circuits. Interface integrated circuits
- BS IEC 60748-2:1998 Semiconductor devices. Integrated circuits. Digital integrated circuits
- BS IEC 60748-2:1997 Semiconductor devices - Integrated circuits - Digital integrated circuits
- BS 6493-2-2.4:1989 Semiconductor devices. Integrated circuits-Recommendations for interface integrated circuits
- BS 6493-2.3:1987 Semiconductor devices. Integrated circuits. Recommendations for analogue integrated circuits
- BS 6493-2-2.2:1986 Semiconductor devices. Integrated circuits-Recommendations for digital integrated circuits
- BS IEC 60748-2-11:1999 Semiconductor devices - Integrated circuits - Digital integrated circuits - Blank detail specification for single supply integrated circuit, electrically erasable, and programmable read-only memory - Blank detail specification for single supply integrated
- BS IEC 63011-3:2018 Integrated circuits. Three dimensional integrated circuits - Model and measurement conditions of through-silicon via
- 06/30153491 DC EN 60748-2-20. Semiconductor devices. Integrated circuits. Part 2-20. Digital integrated circuits. Family specification. Low voltage integrated circuits
- BS EN 165000-5:1998 Film and hybrid integrated circuits - Procedure for qualification approval
- BS IEC 60748-5:1997 Semiconductor devices - Integrated circuits - Semicustom integrated circuits
- BS EN 60747-16-3:2002 Discrete semiconductor devices and integrated circuits - Microwave integrated circuits - Frequency converters
- BS EN 60747-16-1:2002 Discrete semiconductor devices and integrated circuits - Microwave integrated circuits - Amplifiers
Bureau of Indian Standards
- IS/QC 760000-1994 Semiconductor Devices - Integrated Circuits - Generic Film Integrated Circuits and Hybrid Film Integrated Circuits
- IS 12970-2-2021 Semiconductor Devices -Integrated Circuits - Part 2 Digital Integrated Circuits
- IS/QC 760200-1995 Semiconductor Devices - Integrated Circuits - Sectional Film Integrated Circuits and Hybrid Film Integrated Circuits on the Basis of the Capability Approval Procedures
- IS/QC 760101-1995 Semiconductor Devices - Integrated Circuits - Blank Detail Film Integrated Circuits and Hybrid Film Integrated Circuits on the Basis of Qualification Approval Procedure
- IS/QC 790131-1995 Semiconductor Devices - Integrated Circuits - Digital Integrated Circuits - Blank Detail Complementary MOS Digital Integrated Circuits (Series 4000 Band 4000 UB)
- IS/QC 760201-1995 Semiconductor Devices - Integrated Circuits - Blank Detail Film Integrated Circuits and Hybrid Film Integrated Circuits on the Basis of the Capability Approval Procedures
- IS/QC 760100-1995 Semiconductor Devices-Integrated Circuits Sectional Specification for film interated Circuits and Hybrid Film Interated Circuits on The Bassis Of Qualificationapproval Procedure
- IS 5001 Pt.2-1973 Semiconductor Device and Integrated Circuit Drawing Guide Part II Integrated Circuits
- IS/QC 790130-1995 Semiconductor Devices - Integrated Circuits - Digital Integrated Circuits - Blank Detail HCMOS Digital Integrated Circuits (Series 54/74 HC, 54/74 HCT, 54/74 HCU)
European Standard for Electrical and Electronic Components
- EN 163100:1991 Sectional specification: film and hybrid integrated circuits
- EN 163101:1991 Blank detail specification: film and hybrid integrated circuits
International Electrotechnical Commission (IEC)
- IEC 63011-1:2018 Integrated circuits - Three dimensional integrated circuits - Part 1: Terminology
- IEC 60748-2-20:2000 Semicondutor devices - Integrated circuits - Part 2-20: Digital integrated circuits; Family specifications: Low voltage integrated circuits
- IEC 60748-20:1988 Semiconductor devices - Intergrated circuits. Part 20: Generic specification for film integrated circuits and hybrid film intergrated circuits
- IEC 60748-2-20:2008 Semicondutor devices - Integrated circuits - Part 2-20: Digital integrated circuits - Family specification - Low voltage integrated circuits
- IEC 60748-4:1997 Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits
- IEC 60748-3:1986 Semiconductor devices. Integrated circuits.. Part 3 : Analogue integrated circuits
- IEC 60748-2:1997 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits
- IEC 60748-2-11:1999 Semiconductor devices - Integrated circuits - Part 2-11: Digital integrated circuits - Blank detail specification for single supply integrated circuit, electrically erasable, and programmable read-only memory
- IEC 60748-4:1987 Semiconductor devices - Intergrated circuits.. Part 4: Interface integrated circuits.
- IEC 60748-5:1997 Semiconductor devices - Integrated circuits - Part 5: Semicustom integrated circuits
- IEC 60748-2:1985 Semiconductor Devices Integrated Circuits Part 2: Digital Integrated Circuits (Amendment 1-1991) (Amendment 2-1993) (Edition 1.0)
- IEC 60748-20:1988/AMD1:1995 Amendment 1 - Semiconductor devices. Integrated circuits. Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits
- IEC 60748-2-6:1992 Semiconductor devices; integrated circuits; part 2: digital integrated circuits; section six: blank detail specification for microprocessor integrated circuits
- IEC 60748-3:1986/AMD2:1994 Semiconductor devices; integrated circuits; part 3: analogue integrated circuits; amendment 2
- IEC 60748-3:1986/AMD1:1991 Semiconductor devices; integrated circuits; part 3: analogue integrated circuits; amendment 1
- IEC 60748-2-4:1992 Semiconductor devices; integrated circuits; part 2: digital integrated circuits; section four: family specification for complementary MOS digital integrated circuits; series 4000 B and 4000 UB
Korean Agency for Technology and Standards (KATS)
- KS C IEC 63011-1:2022 Integrated circuits — Three dimensional integrated circuits — Part 1: Terminology
- KS C IEC 63011-1-2022 Integrated circuits — Three dimensional integrated circuits — Part 1: Terminology
- KS C IEC 60748-2-20:2002 Semiconductor devices - Integrated circuits - Part 2 - 20: Digital integrated circuits - Family specification - Low voltage integrated circuits
- KS C IEC 60748-2-20-2021 Semiconductor devices — Integrated circuits — Part 2-20: Digital integrated circuits — Family specification — Low voltage integrated circuits
- KS C IEC 60748-2-20:2021 Semiconductor devices — Integrated circuits — Part 2-20: Digital integrated circuits — Family specification — Low voltage integrated circuits
- KS C IEC 60748-20:2021 Semiconductor devices — Integrated circuits —Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits
- KS C IEC 60748-20-2021 Semiconductor devices — Integrated circuits —Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits
- KS C IEC 60748-20-1:2003 Semiconductor devices - Integrated circuits - Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits - Section 1: Requirements for internal visual examination
- KS C IEC 60748-4-2004(2020) Semiconductor devices-Integrated circuits-Part 4:Interface integrated circuits
- KS C IEC 60748-2-2001(2021) Semiconductor devices-integrated circuits-Part 2:Digital integrated circuits
- KS C IEC 60748-4-2020 Semiconductor devices-Integrated circuits-Part 4:Interface integrated circuits
- KS C IEC 60748-2-2001(2016) Semiconductor devices-integrated circuits-Part 2:Digital integrated circuits
- KS C IEC 60748-3:2002 Semiconductor devices - Integrated circuits Part 3: Analogue integrated circuits
- KS C IEC 60748-2:2001 Semiconductor devices - integrated circuits - Part 2: Digital integrated circuits
- KS C IEC 60748-20:2003 Semiconductor devices - Integrated circuits - Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits
- KS C IEC 60748-2-2021 Semiconductor devices - integrated circuits - Part 2: Digital integrated circuits
- KS C IEC 60748-3-2022 Semiconductor devices-Integrated circuits Part 3:Analogue integrated circuits
- KS C IEC 60748-3-2002(2022) Semiconductor devices - Integrated circuits Part 3: Analogue integrated circuits
- KS C IEC 60748-4:2004 Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits
- KS C IEC 60748-3-2002(2017) Semiconductor devices - Integrated circuits Part 3: Analogue integrated circuits
- KS C 6063-1978(2001) GLOSSARY OF TERMS USED IN INTEGRATED CIRCUIT
- KS C IEC 60748-2-20:2019 Semiconductor devices — Integrated circuits —Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits
- KS C IEC 60748-3-1:2002 Semiconductor devices - Integrated circuits - Part 3: Analogue integrated circuits - Section 1: Blank detail specification for monolithic integrated operational amplifiers
- KS C IEC 60748-2-8:2002 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section 8: Blank detail specification for integrated circuits static read/write memories
- KS C IEC 60748-20:2019 Semiconductor devices — Integrated circuits —Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits
- KS C IEC 60748-20-2019 Semiconductor devices — Integrated circuits —Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits
- KS C IEC 60748-2-20-2019 Semiconductor devices — Integrated circuits —Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits
- KS C IEC 60748-5-2019 Semiconductor devices — Integrated circuits —Part 5: Semicustom integrated circuits
- KS C IEC 60748-5:2021 Semiconductor devices — Integrated circuits —Part 5: Semicustom integrated circuits
- KS C IEC 60748-5-2021 Semiconductor devices — Integrated circuits —Part 5: Semicustom integrated circuits
- KS C IEC 60748-5:2019 Semiconductor devices — Integrated circuits —Part 5: Semicustom integrated circuits
- KS C IEC 60748-2-3-2002(2022) Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section 3: Blank detail specification for HCMOS digital integrated circuits(series 54/74 HC, 54/74 HCT, 54/74 HCU)
- KS C IEC 60748-5:2003 Semiconductor devices - Integrated circuits - Part 5: Semicustom integrated circuits
- KS C IEC 60748-2-6-2002(2022) Semiconductor devices-Integrated circuits-Part 2:Digital integrated circuits Section 6:Blank detail specification for microprocessor integrated circuits
- KS C IEC 60748-2-6-2022 Semiconductor devices-Integrated circuits-Part 2:Digital integrated circuits Section 6:Blank detail specification for microprocessor integrated circuits
- KS C IEC 60748-2-6-2002(2017) Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits Section 6: Blank detail specification for microprocessor integrated circuits
GCC Standardization Organization
- GSO IEC 60748-2-20:2014 Semiconductor devices - Integrated circuits - Part 2-20: Digital integrated circuits - Family specification - Low voltage integrated circuits
- GSO IEC 60748-4:2013 Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits
- GSO IEC 60748-20:2014 Semiconductor devices. Integrated circuits. Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits
- GSO IEC 60748-3:2014 Semiconductor devices - Integrated circuits - Part 3: Analogue integrated circuits
- GSO IEC 60748-2:2014 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits
- GSO IEC 60748-5:2015 Semiconductor devices - Integrated circuits - Part 5: Semicustom integrated circuits
- GSO IEC 60748-2-4:2014 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section 4: Family specification for complementary MOS digital integrated circuits, series 4000 B and 4000 UB
The Directorate General of Specifications and Metrology (DGSM)
- OS GSO IEC 60748-2-20:2014 Semiconductor devices - Integrated circuits - Part 2-20: Digital integrated circuits - Family specification - Low voltage integrated circuits
- OS GSO IEC 60748-4:2013 Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits
- OS GSO IEC 60748-2:2014 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits
- OS GSO IEC 60748-3:2014 Semiconductor devices - Integrated circuits - Part 3: Analogue integrated circuits
- OS GSO IEC 60748-20:2014 Semiconductor devices. Integrated circuits. Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits
- OS GSO IEC 60748-2-6:2014 Semiconductor devices. Integrated circuits - Part 2: Digital integrated circuits - Section 6: Blank detail specification for microprocessor integrated circuits
Danish Standards Foundation
- DS/IEC 748-20:1990 Semiconductor devices. Intergrated circuits. Part 20: Generic specification for film integrated circuits and hybrid film intergrated circuits
- DS/IEC 748-4:1993 Semiconductor devices. Integrated circuits. Part 4: Interface integrated circuits
- DANSK DS/IEC 748-20:1989 Semiconductor devices - Integrated circuits - Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits
- DS/IEC 748-3+Amd.1:1993 Semiconductor devices - Integrated circuits - Part 3: analogue integrated circuits
- DS/IEC 748-2:1993 Semiconductor devices. Integrated circuits. Part 2: Digital integrated circuits
- DS/IEC 748-3:1993 Semiconductor devices. Integrated circuits. Part 3: Analogue integrated circuits
- DS/IEC 748-4+Amd.1:1993 Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits
- DANSK DS/IEC 748-2-6:1993 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section six: Blank detail specification for microprocessor integrated circuits
- DS/IEC 748-2-6:1993 Semiconductor devices. Integrated circuits. Part 2: Digital integrated circuits. Section six: Blank detail specification for microprocessor integrated circuits
Association Francaise de Normalisation
- NF C96-042:1989 Semiconductor Devices Integrated circuits Part 2:Digital integrated circuits
German Institute for Standardization
- DIN IEC 748-2:1990 Semiconductor devices integrated circuits Part 2: Digital integrated circuits
- DIN IEC 47 A Sec 356 E:1995-02 Semiconductor Devices, Integrated Circuits — Part 5: Semicustom Integrated Circuits
Czech Standards Institute (UNMZ)
- CSN IEC 748-3:1994 Semiconductor devices. Integrated circuits. Part 3: Analogue integrated circuits
- CSN IEC 748-2:1994 Semiconductor devices.Integrated circuits.Part 2:Digital integrated circuits
- CSN IEC 748-4:1994 Semiconductor devices.Integrated circuits.Part 4:Interface integrated circuits
- CSN 35 8720 Cast.2-1988 Integrated circuits. Dimensions
- CSN IEC 748-20:1993 Semiductors devices. Integrated circuits. Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits
Kingdom of Bahrain Testing and Metrology Directorate
- BH GSO IEC 60748-2:2016 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits
- BH GSO IEC 60748-20:2016 Semiconductor devices. Integrated circuits. Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits
- BH GSO IEC 60748-3:2016 Semiconductor devices - Integrated circuits - Part 3: Analogue integrated circuits
- BH GSO IEC 60748-2-6:2016 Semiconductor devices. Integrated circuits - Part 2: Digital integrated circuits - Section 6: Blank detail specification for microprocessor integrated circuits
Polski Komitet Normalizacyjny (PKN)
- PN T01303-03-1991 Semicondutor devices. Integrated circuits. Analogue integrated circuits. Measuring methods
- PN T01610-1972 Information Processing Project Management Software Requirements
- PN T01303-03-A1-1991 Semiconductor devices Integrated circuits Analogue integrated circuits Measuring methods Amendment 1
National Standardisation Body (ASRO)
- SR CEI 748-3+A1-1991 Semiconductor devices. Integrated circuits. Part 3: Analogue integrated circuits
- STAS SR CEI 748-2/A1-1994 DISPOZITIVE CU SEMICONDUCTOARE Circuite integrate. Partea 2: Circuite integrate digitale
Institute of Interconnecting and Packaging Electronic Circuits (IPC)
- IPC TA-721 EPIC Epic
Standard Association of Australia (SAA)
- AS 2547.2.3:1987 Semiconductor devices Part 2-3: Integrated circuits Analog integrated circuits
Gosstandart of Russia
- GOST 29107-1991 Semiconductor devices. Integrated circuits. Part 2. Digital integrated circuits
- GOST 29109-1991 Semiconductor devices. Integrated circuits. Part 4. Interface integrated circuits
- GOST 29108-1991 Semiconductor devices. Integrated circuits. Part 3. Analog integrated circuits
European Committee for Electrotechnical Standardization(CENELEC)
- EN 165000-3:1996 Film and Hybrid Integrated Circuits Part 3: Self-Audit Checklist and Report for Film and Hybrid Integrated Circuit Manufacturers
- EN 165000-5:1997 Film and Hybrid Integrated Circuits Part 5: Procedure for Qualification Approval
Japanese Industrial Standards Committee (JISC)
- JIS X 6319-1:2023 Specification of implementation for integrated circuit cards -- Part 1: Integrated circuit cards with contacts
- JIS X 6319-1:2005 Specification of implementation for integrated circuit(s) cards -- Part 1: Integrated circuit(s) cards with contacts
- JIS X 6319-1:2010 Specification of implementation for integrated circuit cards -- Part 1: Integrated circuit cards with contacts
IC details,Aerospace IC,IC testing,integrated circuit chip,Integrated circuit measurement,integrated circuit chip,IC parameters,thin film integrated circuit,integrated circuit technology,IC testing,IC Tape,China IC,IC parameters,detection integrated circuit,adc integrated circuit,IC temperature,IC pressure,IEC integrated circuit,Integrated circuit housing,IC card