GB/T 43040-2023 in English

Technical background of the standard

This standard was developed by the 771 Institute of China Aerospace Science and Technology Corporation, and for the first time systematically standardized the test methods for 28 core parameters of semiconductor AC/DC converters. Compared with the international IEC62040 series standards, five new Chinese-specific test items such as ripple voltage and cross regulation rate were added.

Comparison of core test indicators

Key Points of Test Environment Control

Typical test case analysis

Output ripple voltage test

Article 5.8 of the standard specifies the test bandwidth limit requirements in detail:

1. Use a 1:10 probe in parallel with a 10μF ceramic capacitor
2. Ground wire length ≤10cm
3. Coaxial cable connection is recommended

Measured data shows that when the switching frequency is greater than 100kHz, the test bandwidth is set to 20MHz to accurately capture the high-frequency ripple components.

Standard Implementation Recommendations

1. Test sequence optimization: It is recommended to perform the test in the order of "input characteristics → efficiency test → dynamic response" to avoid repeated hot-machine

2. Safety protection: The dielectric strength test (Article 5.28) must use an isolation transformer, and the test voltage should start from zero and increase at a rate of 100V/s

3. Data processing: For multi-parameter tests such as cross-regulation rate, it is recommended to use an automated test system to record the data of the entire process