dds conductivity measurement circuit

dds conductivity measurement circuit, Total:448 items.

The international standard classification for "dds conductivity measurement circuit" includes: Integrated circuits. Microelectronics , Power transmission and distribution networks in general , Electrical engineering (Vocabularies) , Insulating gases , Power transmission and distribution lines , Electronic tubes , Aerospace electric equipment and systems , Adhesives .

The Chinese standard classification for "dds conductivity measurement circuit" includes: Semiconductor integrated circuit , Microcircuit in general , Electric transmission and transformation equipment in general , Basic standards and general methods , Paper , Power plant and electric power system operating maintenance , Others , , Electric transmission line and equipment , Technical management , Technical management , Technical management , Electronic components , Nonmetallic materials used for aviation and aerospace , Turnout and steel rail expansion piece .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 12657-1990 Determination of conducting path for capacitor paper
GB/T 42970-2023 Semiconductor integrated circuits—Measuring methods of video encoder and decoder circuits
GB 3442-1986 General principles of measuring methods of operational (voltage) amplifiers for semiconductor integrated circuits
GB/T 14030-1992 principles of measuring methods of timer circuits for semiconductor integrated circuits
GB/T 42838-2023 Semiconductor integrated circuits—Measuring method of Holzer circuit
GB/T 18857-2002 Technical guide for live working in distribution line
GB/T 12843-1991 General principle of measuring methods of microprocessors and peripheral interface circuit parameters for semiconductor integrated circuits
GB/T 18857-2008 Technical guide for live working in distribution line
GB/T 20515-2006 Semiconductor devices - Integrated circuits - Part 5: Semicustom integrated circuits
GB/T 14862-1993 Junction-to-case thermal resistance test methods of packages for semiconductor integrated circuits
GB/T 42835-2023 Semiconductor integrated circuits—System on chip(SoC)
GB/T 12084-1989 Series and products for TTL semiconductor integrated circuits--Products of series 54/74F
GB/T 28548-2012(英文版) Guideline of nuclear power plant primary circuit hydraulic tests
GB/T 6798-1996 Semiconductor integrated circuits-General principles of measuring methods of voltage comparators
GB/T 12750-2006 Semiconductor devices―Integrated circuits―Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits
GB/T 14027.5-1992 Series and products of communication circuits for semiconductor integrated circuits-Products of telephone circuits
GB/T 14129-1993 and products for TTL semiconductor integrated circuits－Products of series PAL
GB/T 42836-2023 Microwave semiconductor integrated circuits—Frequency mixer
GB/T 14025-1992 Series and products for semiconductor gate array integrated circuits-Products of series ECL
GB/T 43040-2023 Semiconductor integrated circuits—Test method of AC/DC converters
GB/T 4376-1994 Series and products of voltage regulators for semiconductor integrated circuits
GB/T 11497.1-1989 Series and products for CMOS semiconductor integrated circuits--Products of series 54/74HC
GB/T 14027.7-1992 Series and products of communication circuits for semiconductor integrated circuits-Products of digital switching system interface circuits
GB/T 42837-2023 Microwave semiconductor integrated circuits—Amplifier
GB/T 19403.1-2003 Semiconductor devices—Integrated Circuits—Part 11:Section 1:Internal visual examination for semiconductor integrated circuits (excluding hybrid circuits)
GB/T 36477-2018 Semiconductor integrated circuit—Measuring methods for flash memory
GB/T 14027.4-1992 Series and products of communication circuits for semiconductor integrated circuits-Products of dual-tone multi-frequency circuits
GB/T 6813-1986 Families and variety of semiconductor integrated nonlinear circuits Variety of timers
GB/T 3434-1986 Families and products of ECL circuits for semiconductor integrated circuits
GB 14030-1992 Basic principles of semiconductor integrated circuit time-based circuit testing methods
GB/T 15509-1995 Series and products for semiconductor integrated circuits. Products of robot series for colour TV
GB/T 42975-2023 Semiconductor integrated circuits—Test method of driver device
GB/T 15650-1995 Series and products for semicoductor integrated circuits. Products of series for CMOS gate array
GB/T 12750-1991 Sectional specification for semiconductor integrated circuits, excluding hybrid circuits
GB/T 14114-1993 principles of measuring methods of V/F and F/V converters for semiconductor integrated circuits
GB/T 11497.2-1989 Series and products for CMOS semiconductor integrated circuits--Products of series 54/74HCT
GB/T 2900.66-2004 Electrotechnical terminology - Semiconductor devices and integrated circuits
GB/T 4377-2018 Semiconductor integrated circuits—Measuring method of voltage regulators
GB/T 17574-1998 Semiconductor devices --Integrated circuits Part 2:Digital integrated circuits
GB/T 17940-2000 Semiconductor devices--Integrated circuits--Part 3:Analogue integrated circuits
GB/T 17574.20-2006 Semiconductor devices - Integrated circuits - Part 2-20: Digital integrated circuits - Family specification - Low voltage integrated circuits
GB/T 3432.4-1989 Series and products for TTL semiconductor integrated circuits!*Products of series 54/74 LS
GB/T 4377-1996 Semiconductor integrated circuits-General principles of measuring methods of voltage regulator
GB 35007-2018 Semiconductor integrated circuit low voltage differential signal circuit testing method
GB/T 15136-1994 General principles of measuring methods for quartz clock and watch circuits of semiconductor integrated circuits
GB/T 7092-1993 Outline dimensions of semiconductor integrated circuits
GB/T 43061-2023 Semiconductor integrated circuits—Test methods of PWM controller
GB/T 14113-1993 of packages for semiconductor integrated circuits
GB 12843-1991 Basic principles of electrical parameter testing methods for semiconductor integrated circuit microprocessors and peripheral interface circuits

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 14028-2018 Semiconductor integrated circuits—Measuring method of analogue switch
GB/T 35006-2018 Semiconductor integrated circuits—Measuring method of level converter
GB/T 35007-2018 Semiconductor integrated circuits—Measuring method of low voltage differential signaling circuitry
GB/T 34577-2017 Technical guide for by-pass working on ditsribution line

Professional Standard - Electricity

DL/T 392-2010 Technical guide for live working on 1000kV AC transmission line
DL/T 881-2004 Technical guide for live woking in ±500kV DC transmission line
DL/T 1179-2021 Guide for power frequency parameters measurment of 1000kV AC overhead transmission lines
DL/T 1060-2007 Technical guide for live working in 750kV AC transmission line
DL/T 1367-2014 Guide of Detection Technology for Overhead Transmission Line
DL/T 1566-2016 Guideline for Parameters Testing of DC Transmission Line and Grounding Line
DL/T 1179-2012 Guide for Power Frequency Parameters Measurement of 1000kV AC Overhead Transmission Lines
DL/T 2512-2022 Technical Guidelines for High Altitude Rescue of Transmission Lines
DL/T 2209-2021 Guide for lightning protection of overhead transmission lines
DL/T 1248-2013 Guide for Condition Based Maintenance Strategy of Overhead Transmission Line
DL/T 2124-2020 Bypass valve selection guideline for power station turbine
DL/T 2111-2020 Technical guide of protection for induced voltage and current on overhead transmission lines
DL/T 392-2015 Technical Guide for Live Working on 1000kV AC Transmission Line
DL/T 881-2019 Technical guide for live woking in ±500kV DC transmission line
DL/T 1583-2016 Guide for Frequency Electrical Parameter Measurement of AC Power Lineman
DL/T 5318-2014 Guidance for Construction Technology of Expanded Diameter Conductor Wiring of Overhead Transmission Line
DL/T 1634-2016 Technical guide for live working on transmission line in high altitude area
DL/T 1635-2016 Technical guide for live working on thermal-resistant conductor of transmission line
DL/T 1569-2016 Guidelines for measuring distribution voltage of insulator strings in AC transmission lines of 750kV and above
DL/T 1720-2017 Technical guide for helicopter live working on overheand transmission line
DL/T 966-2005 Technical guider for live working in transmission line
DL/T 1508-2016 Monitoring Devices for Ground Wire Icing of Overhead Transmission Line
DL/T 1069-2016 Repair guideline of conductor and earth wire for overhead transmission line
DL/T 1341-2014 Technical Guidance for Operation on ±660kv Electrified DC Transmission Lines
DL/T 1069-2007 Repair guideline of conductor and earth wire for overhead transmission line

Professional Standard - Electron

SJ/T 10987-1996 Detailed specifications for electronic components - Semiconductor TV integrated circuits - CD5435CP magnetic field sweep circuits
SJ 50597/34-1995 Semiconductor integrated circuits - Detail specification for Types JC4085, JC4086, JC4070, JC4077 CMOS gates
SJ/T 10805-2000 Semiconductor integrated circuits - General principles of measuring methods for voltage comparators
SJ/T 10989-1996 Detailed specifications for electronic components - Semiconductor TV integrated circuits - CD5622CP PAL system chrominance signal processing circuits
SJ/T 11088-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CD7680CP SIF amplifying circuits
SJ/T 10986-1996 Detailed specifications for electronic components - Semiconductor TV integrated circuits - CD5250CP SIF amplifiers
SJ 50597/36-1995 Semiconductor integrated circuits - Detail specification for Type JC54HC08, JC54HC11, JC54HC32, JC54HC86 HCMOS gates
SJ/T 10805-1996 Semiconductor integrated circuits used as interface circuits--General principles of measuring methods of voltage comparators
SJ/T 10335-1993 Series and products of semiconductor integrated circuits for use in TV
SJ/T 11006-1996 Semiconductor TV integrated circuits - General principles of measuring methods for horizontal and vertical sweep circuits
SJ/T 11004-1996 Semiconductor TV integrated circuits - General principles of measuring methods for picture channel circuits
SJ 20298-1993 Detail specification for Types JB555 and JB556 precision timers of semiconductor integrated circuits
SJ/T 10757-1996 Semiconductor integrated circuit audio circuit series and varieties
SJ/T 10401-1993 General principles of measuring methods for motor speed stablizers of semiconductor audio integrated circuits
SJ/T 10741-2000 Semiconductor integrated circuits General principles of measuring methods for CMOS circuits
SJ/T 10400-1993 General principles of measuring methods for graphic equalizers of semiconductor audio integrated circuits
SJ/T 11007-1996 Semiconductor TV integrated circuits - General principles of measuring methods for video signal and chrominance signal processing circuits
SJ/T 10803-1996 Semiconductor integrated circuits used as interface circuits - General principles of measuring methods for line circuits
SJ/T 10738-1996 Semiconductor integrated circuits - General principles of measuring methods for operational (voltage) amplifiers
SJ/T 11514-2015 Thermosetting Conductive Paste for Printed Circuit Board (PCB)
SJ/T 10758-1996 Semiconductor integrated circuit TV circuit series and varieties
SJ/T 10735-1996 Semiconductor integrated circuits General principles of measuring methods for TTL circuits
SJ/T 10741-1996 Semiconductor integrated circuits--General principles of measuring methods for CMOS circuits
SJ/T 10988-1996 Detailed specifications for electronic components - Semiconductor TV integrated circuits - CD5132CP PIF amplifying circuits
SJ/T 10784-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CD7609CP horizontal and vertical sweep circuits (Applicable for certification)
SJ/T 11010-1996 Detailed specifications for electronic components - Semiconductor TV integrated circuits - CD1124ACP SIF amplifying circuits
SJ/T 10737-1996 Semiconductor integrated circuits - General principles of measuring methods for ECL circuits
SJ/T 10736-1996 Semiconductor integrated circuits - General principles of measuring methods for HTL circuits
SJ/T 10832-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CD7611CP PIF amplifying circuits
SJ/T 10804-2000 Semiconductor integrated circuits.General principles of measuring methods for level translator
SJ/T 10881-1996 Semiconductor integrated audio circuits - General principles of measuring methods for stereo decoders
SJ/T 10990-1996 Detailed specifications for electronic components - Semiconductor TV integrated circuits - CD5612CP Picture chrominance signal processing circuits
SJ/T 11087-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CD7698CP horizontal and vertical sweep and chrominance processing circuits
SJ/T 10831-1996 Detailed specifications for electronic components - Semiconductor integrated circuits - CD7193CP chrominance processing circuits
SJ/T 10402-1993 General principles of measuring methods for automatic music selectors of semiconductor audio integrated circuits
SJ/T 11005-1996 Semiconductor TV integrated circuits - General principles of measuring methods for audio channel circuits
SJ/T 11009-1996 Detailed specifications for electronic components - Semiconductor TV integrated circuits - CD11215ACP PIF amplifying circuits
SJ/T 10804-1996 Semiconductor integrated circuits used as interface circuits--General principles of measuring methods for level translator
SJ/T 10427.1-1993 Grneral Principles of measuring methods of FM converter for semiconductor audio integrated circuits
SJ/T 10427.2-1993 General principles of measuring methods of intermediate-frequency amplifier for semiconductor audio integrated circuits
SJ/T 11008-1996 Detailed specifications for electronic components - Semiconductor TV integrated circuits - CD11235CP line and field sweep circuits
SJ/T 10334-1993 Series and products of audio circuits of semiconductor integrated circuits

工业和信息化部

SJ/T 11706-2018 Semiconductor integrated circuit field programmable gate array testing method
SJ/T 11702-2018 Semiconductor integrated circuit serial peripheral interface test method
SJ/T 10805-2018 Semiconductor integrated circuits Measuring methods for voltage comparators

Military Standard of the People's Republic of China-General Armament Department

GJB/Z 42.2-1993 Military microcircuit series type spectrum semiconductor integrated circuit digital integrated circuit
GJB/Z 42.3-1993 Military microcircuit series type spectrum semiconductor integrated circuit microcomputer and memory integrated circuit
GJB 597/3-1990 Detailed specification for voltage comparators for semiconductor integrated circuits
GJB 8701.7-2015 Anti-tank missile test methods Part 7: Circuit resistance (electrical parameters) detection
GJB 9147-2017 Semiconductor integrated circuit operational amplifier test methods
GJB/Z 42.4-1993 Military Microcircuit Series Spectrum Semiconductor Integrated Circuit Interfacer Integrated Circuit
GJB/Z 42.1-1993 Military microcircuit series type spectrum semiconductor integrated circuit analog integrated circuit
GJB 597/12A-1998 Detailed specifications for semiconductor integrated circuit HCMOS gate circuits
GJB 1420A-1999 General Specification for Semiconductor Integrated Circuit Enclosures
GJB 597B-2012 General specification for semiconductor integrated circuits
GJB 597A-1996 General Specification for Semiconductor Integrated Circuits
GJB 8696.7-2015 Terminal guided projectile test method Part 7: Circuit resistance detection

Military Standard of the People's Republic of China-Commission of Science,Technology and Industry for National Defence

GJB 5491.7-2005 Test method of terminally guided projectile Part 7:Circuit resistance detection test and measurement
GJB 5895.7-2006 Test method for anti-tank missile Part 7: Circuit resistance (electric parameters) inspection
GJB 5389.10-2005 Test method of gun-launched missile Part 10:Circuit resistance inspection

Professional Standard - Aerospace

QJ 260-1977 器件
QJ 2212-1991 Semiconductor Integrated Circuit Design Guidelines
QJ 1460-1988 Measuring Methods for Broadband Amplifiers of Semiconductor Integrated Circuits
QJ 257-1977 Semiconductor TTL Integrated Digital Circuit Testing Method
QJ 1528-1988 Semiconductor integrated circuit time base test method
QJ 2660-1994 Test method for pulse width modulator of semiconductor integrated circuit switching power supply
QJ 1523-1988 Test Method for Resistivity of Conducting Resin
QJ 2830-1996 Specification for Guide Rail of Printed-circuit Board
QJ 2491-1993 Test methods for operational amplifiers in semiconductor integrated circuits

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 7092-2021 Outline dimensions of semiconductor integrated circuits
GB/T 18857-2019 Technical guide for live working on distribution line

Professional Standard - Water Conservancy

SL 78-1994 Determination of conductivity (Conductivity instrument method)

Group Standards of the People's Republic of China

T/QGCML 188-2021 High-voltage transmission line conductor connection method
T/CSEE 0084-2018 Technical guidelines for distributed partial discharge detection of high-voltage cross-linked cable lines
T/CSEE 0061-2017 Technical Guidelines for Current Icing of Overhead Lines
T/CEEIA 754-2023 Technical guidelines for satellite monitoring of wild fire on overhead transmission line channel
T/CSTM 00213-2020 Non-destructive testing Method of electromagnetic ultrasonic guided wave detection for overhead transmission lines
T/CEC 526-2021 Technical guidelines for X-ray detection of overhead transmission line clamps
T/CEC 619-2022 Operation guideline for crimping X-ray digital imaging non-destructive testing of conductors of transmission lines
T/CASEI 023-2023 Guideline for lift electrical insulation testing
T/JSEE 007-2023 Guidelines for Infrared Detection Technology of UAVs for Overhead Transmission Lines
T/CEC 702-2022 Guidelines for the Application of Ultrasonic On-Site Testing of Overhead Distribution Lines
T/CIE 120-2021 Semiconductor Integrated Circuit Hardware Trojan Horse Detection Method

电子工业部

SJ/T 10249-1991 Detailed specifications for semiconductor integrated circuit CB555 type time base circuit

Professional Standard - Machinery

JB/T 6264.1-1992 Semiconductor Integrated Circuits. Specification for Special Circuit of SJ213CP Chinese & English Typewriters
JB/T 6264.2-1992 Semiconductor Integrated Circuit. Specification for Special Circuit of SJ5081CP Photocopiers

Henan Provincial Standard of the People's Republic of China

DB41/T 1790-2019 Determination of Conductive Properties of Textile Conductive Yarns

Professional Standard - Chemical Industry

HG 2-1047-1977 Electrophoretic Paint Conductivity Determination Method
HG/T 3335-1977 Electrophoretic Paint Conductivity Determination Method

Professional Standard - Energy

NB/T 10982-2022 Guidelines for the settlement report of cable transmission line project
NB/T 25107-2020 Guidelines for flushing of secondary circuit system in nuclear power plant

Taiwan Provincial Standard of the People's Republic of China

CNS 6802-1980 Standard Test Procedured for Noise Margin Measurements for Semiconductor Logic Gating Microcircuits

Professional Standard - Railway

TB/T 1166-1977 Conductive Pin for Turnout

国家能源局

NB/T 20535-2018 Technical guideline for the passivation of the primary circuit of nuclear power plants

UY-UNIT

UNIT 119-1957 Measurement of circuit conductor resistivity

AR-IRAM

IRAM 2069-1948 Non-conductivity test at breaking voltage

IX-UIC

UIC OR 612-04-2012 Display system in driver cabs (DDS) - Train radio display (TRD)
UIC OR 612-05-2012 Display system in driver cabs (DDS) - Electronic timetable display (ETD)

CL-INN

INDITECNOR 55-15 Rubber covers for circuit conductors: test
INDITECNOR 2.55-24ch-1953 Copper in circuit conductors
INDITECNOR 55-14 Rubber covers for circuit conductors: instructions
INDITECNOR 55-17d-1962 Thermoplastics in Circuit Conductor Covers:

PL-PKN

PN T01303-03-1991 Semicondutor devices. Integrated circuits. Analogue integrated circuits. Measuring methods
PN T01305-1992 Semiconductor devices. Integrated circuits. Sectional specificatiion for semiconductor integrated circuits excluding hybrid circuits
PN T01303-03-A1-1991 Semiconductor devices Integrated circuits Analogue integrated circuits Measuring methods Amendment 1
PN T04850-1974 Transmiliing tubes Elec?rical ?es?s
PN T01505 ArkusZ12-1974 Field-e??ecl transis?ors Measuring method Shorf-circui? inpof conducfance common source 9uss
PN T01505-13-1987 Field-effect transistors Measuring method Short-circuit output admittance y?is and short-circuit output conductance in comrnon source goss

British Standards Institution (BSI)

BS IEC 60748-11:1991 Semiconductor devices. Integrated circuits. Sectional specification for semiconductor integrated circuits excluding hybrid circuits
BS IEC 60748-11:2000 Semiconductor devices - Integrated circuits - Sectional specification for semiconductor integrated circuits excluding hybrid circuits
BS IEC 60748-4:1997 Semiconductor devices. Integrated circuits. Interface integrated circuits
BS IEC 60748-2:1998 Semiconductor devices. Integrated circuits. Digital integrated circuits
BS IEC 60748-2:1997 Semiconductor devices - Integrated circuits - Digital integrated circuits
BS 7865:1997 Specification for steel electrical conductor rail for railway motive power supply
BS IEC 60748-2-20:2008 Semiconductor devices - Integrated circuits - Digital integrated circuits - Family specification - Low voltage integrated circuits
BS EN 60747-5-3:1998 Discrete semiconductor devices and integrated circuits. Optoelectronic devices. Measuring methods
BS IEC 60747-5-3:1998 Discrete semiconductor devices and integrated circuits. Optoelectronic devices. Measuring methods
BS EN 60747-5-3:2001 Discrete semiconductor devices and integrated circuits - Optoelectronic devices - Measuring methods
BS 6493-2.3:1987 Semiconductor devices. Integrated circuits. Recommendations for analogue integrated circuits
BS EN IEC 61967-4:2021 Integrated circuits. Measurement of electromagnetic emissions. Measurement of conducted emissions. 1 O/150 O direct coupling method
BS EN 50702:2021 Railway applications. Rolling stock. Conductor rail current collectors (shoegear): Characteristics and tests
BS 7865:1997+A2:2023 Specification for steel electrical conductor rail for railway motive power supply
BS QC 790101:1992 Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Sectional specification for semiconductor integrated circuits excluding hybrid circuits. Internal visual examination for semiconductor integr...
BS 6493-2.1:1985 Semiconductor devices - Integrated circuits - General
BS IEC 60748-5:1997 Semiconductor devices - Integrated circuits - Semicustom integrated circuits
BS ISO 7637-2:2011 Road vehicles. Electrical disturbances from conduction and coupling. Electrical transient conduction along supply lines only
BS EN 60747-16-3:2002 Discrete semiconductor devices and integrated circuits - Microwave integrated circuits - Frequency converters
BS IEC 60748-1:2002 Semiconductor devices - Integrated circuits - General
BS EN 60747-16-1:2002 Discrete semiconductor devices and integrated circuits - Microwave integrated circuits - Amplifiers
BS EN 61663-2:2001 Lightning protection. Telecommunication lines. Lines using metallic conductors
BS EN 61967-6:2002+A1:2008 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -Part 6: Measurement of conducted emissions - Magnetic probe method
BS IEC 60748-2-11:1999 Semiconductor devices - Integrated circuits - Digital integrated circuits - Blank detail specification for single supply integrated circuit, electrically erasable, and programmable read-only memory - Blank detail specification for single supply integrated
BS EN 60747-5-3:2001(2003) Discretesemiconductor devices and integrated circuits — Part 5 - 3 : Optoelectronic devices — Measuring methods
BS IEC 60747-6:2000 Discrete semiconductor devices and integrated circuits - Thyristors

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association

JEDEC JESD51-1-1995 Integrated Circuit Thermal Measurement Method - Electrical Test Method (Single Semiconductor Device)
JEDEC JEB5-A-1970 Methods of Measurement for Semiconductor Logic Gating Microcircuits
JEDEC JEB15-1969 Terminology and Methods of Measurement for Bistable Semiconductor Microcircuits

IEEE - The Institute of Electrical and Electronics Engineers@ Inc.

IEEE 66-1969 Guide for Determination of SHORT-CIRCUIT CHARACTERISTICS OF DIRECT-CURRENT MACHINERY
IEEE 1870-2019 Guide for the Parameter Measurement of AC Transmission Lines
IEEE 524-2003 Guide to the Installation of Overhead Transmission Line Conductors
IEEE 1893-2015 Guide for the Measurement of DC Transmission Line and Earth Electrode Line Parameters
IEEE 1410-1997 Guide for Improving the Lightning Performance of Electric Power Overhead Distribution Lines
IEEE 1727-2013 Guide for Working Procedures on Underground Transmission Circuits with Induced Voltage
IEEE 1410-2004 Guide for Improving the Lightning Performance of Electric Power Overhead Distribution Lines
IEEE 1410 INT 1-2005 Guide for Improving the Lightning Performance of Electric Power Overhead Distribution Lines
IEEE 1410 INT 1-2-2010 Guide for Improving the Lightning Performance of Electric Power Overhead Distribution Lines
IEEE P751/D2+1-2018 Guide for Wood Structures Used for Overhead Electric Transmission Lines
IEEE 524-1980 GUIDE TO THE INSTALLATION OF OVERHEAD TRANSMISSION LINE CONDUCTORS
IEEE 1441-2004 Guide for Inspection of Overhead Transmission Line Construction
IEEE 1727 CORR-2015 Guide for Working Procedures on Underground Transmission Circuits with Induced Voltage Corrigendum 1

CZ-CSN

CSN 50 0450-1987 Condenser páper. Determination of the number of conducting paths
CSN IEC 748-2:1994 Semiconductor devices.Integrated circuits.Part 2:Digital integrated circuits
CSN IEC 748-4:1994 Semiconductor devices.Integrated circuits.Part 4:Interface integrated circuits
CSN IEC 748-3:1994 Semiconductor devices. Integrated circuits. Part 3: Analogue integrated circuits
CSN 35 8730-1981 Semiconductor devices and integrated cirouits. Mcasuring of electrical parametere. General requirements.
CSN 34 7007-1964 Power conductors and cables. Testing.
CSN 34 7010 Cast.35-1972 Conductor resistance measurement
CSN 22 5960-1953 Circuit measurement

Association Francaise de Normalisation

NF C96-045:1992 Semiconductors devices. Integrated circuits. Part 11 : sectional specification for semiconducteur integrated circuits excluding hybrid circuits
NF C93-716:1983 Electronic components. Printed boards. Conductors continuity and short circuit. Automatic testing. General requirements.
NF F61-349:1990 Railway rolling stock. Cable clamp collars for electric conductors and cables.
NF C96-042:1989 Semiconductor Devices Integrated circuits Part 2:Digital integrated circuits
NF F21-702*NF EN 50702:2021 Railway applications - Rolling stock - Conductor rail current collectors (shoegear) : characteristics and tests
NF F21-001:1990 Railway rolling stock. Pantographs. Characteristics and tests.
NF R13-414:1989 Road vehicles. Electrical conductors. General characteristics.
NF F55-698:1994 Fixed railway equipment. Electric signalling. Cables with pairs or quads of conductors for signalling circuits.
XP F61-015:1998 Railway rolling stock. Identifying of electrical conductors, cables and connection systems.
NF C96-260-6*NF EN 61967-6:2003 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz - 1 GHz - Part 6 : measurement of conducted emissions - Magnetic probe method
NF F55-646:1994 Railway fixed equipment. Electric conductors used for the device and rail connnection in the track circuits fitting the electrified lines.
NF F61-012:1998 Railway rolling stock. Selection criteria for electrical conductors and cables.
NF R13-002-1:1989 Road vehicles. Electrical disturbance by conduction and coupling. Part 1 : vehicules with nominal 12 V supply voltage. Passenger cars and light commercial vehicles. Electrical transient conduction along supply lines only.
NF C96-005-3/A1*NF EN 60747-5-3/A1:2002 Discrete semiconductor devices and integrated circuits - Partie 5-3 : optoelectronic devices - Measuring methods

Korean Agency for Technology and Standards (KATS)

KS C IEC 60748-11:2004 Semiconductor devices－Integrated circuits－Part 11：Sectional specification for semiconductor integrated circuits excluding hybrid circuits
KS C IEC 60748-11:2020 Semiconductor devices — Integrated circuits — Part 11:Sectional specification for semiconductor integrated circuits excluding hybrid circuits
KS R ISO 7637-2-2015(2020) Road vehicles — Electrical disturbances from conduction and coupling — Part 2: Electrical transient conduction along supply lines only
KS C IEC 60748-11-1-2020 Semiconductor devices－Integrated circuits－Part 11－1：Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
KS C IEC 60748-11-1:2004 Semiconductor devices－Integrated circuits－Part 11－1：Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
KS C IEC 60748-11-1-2004(2020) Semiconductor devices－Integrated circuits－Part 11－1：Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
KS C IEC 60748-2-2001(2021) Semiconductor devices－integrated circuits－Part 2：Digital integrated circuits
KS C IEC 60748-4-2004(2020) Semiconductor devices－Integrated circuits－Part 4：Interface integrated circuits
KS C IEC 60748-4-2020 Semiconductor devices－Integrated circuits－Part 4：Interface integrated circuits
KS C IEC 60748-3-2002(2017) Semiconductor devices－Integrated circuits Part 3：Analogue integrated circuits
KS C IEC 60748-3:2002 Semiconductor devices－Integrated circuits Part 3：Analogue integrated circuits
KS C IEC 60748-2-2001(2016) Semiconductor devices－integrated circuits－Part 2：Digital integrated circuits
KS C IEC 60748-2-2021 Semiconductor devices－integrated circuits－Part 2：Digital integrated circuits
KS C IEC 60748-4:2004 Semiconductor devices－Integrated circuits－Part 4：Interface integrated circuits
KS C IEC 60748-3-2022 Semiconductor devices－Integrated circuits Part 3：Analogue integrated circuits
KS C IEC 60748-3-2002(2022) Semiconductor devices－Integrated circuits Part 3：Analogue integrated circuits
KS C IEC 60050-521-2002(2022) Semiconductor devices and integrated circuits
KS C IEC 60748-2:2001 Semiconductor devices－integrated circuits－Part 2：Digital integrated circuits
KS C IEC 60050-521-2002(2017) Semiconductor devices and integrated circuits
KS C IEC 60050-521-2022 Semiconductor devices and integrated circuits
KS C IEC 60748-5:2019 Semiconductor devices — Integrated circuits —Part 5: Semicustom integrated circuits
KS R ISO 7637-2-2020 Road vehicles — Electrical disturbances from conduction and coupling — Part 2: Electrical transient conduction along supply lines only
KS C IEC 60748-5:2021 Semiconductor devices — Integrated circuits —Part 5: Semicustom integrated circuits
KS C IEC 60748-5:2003 Semiconductor devices－Integrated circuits－Part 5：Semicustom integrated circuits
KS C IEC 60748-2-20:2002 Semiconductor devices－Integrated circuits－Part 2－20：Digital integrated circuits－Family specification－Low voltage integrated circuits
KS C IEC 60748-2-20:2021 Semiconductor devices — Integrated circuits — Part 2-20: Digital integrated circuits — Family specification — Low voltage integrated circuits
KS C IEC 60748-20:2021 Semiconductor devices — Integrated circuits —Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits
KS C IEC 60748-2-7:2002 Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits Section 7：Blank detail specification for integrated circuits fusible－link programmable bipolar read－only memories
KS C IEC 60748-20-1:2003 Semiconductor devices－Integrated circuits－Part 20：Generic specification for film integrated circuits and hybrid film integrated circuits－Section 1：Requirements for internal visual examination
KS C IEC 60748-20:2003 Semiconductor devices－Integrated circuits－Part 20：Generic specification for film integrated circuits and hybrid film integrated circuits
KS C IEC 60747-5-3:2020 Discrete semiconductor devices and integrated circuits —Part 5-3: Optoelectronic devices — Measuring methods
KS I 8001-2009 General rules for electrical conductivity measuring method

IECQ - IEC: Quality Assessment System for Electronic Components

PQC 82-1989 Semiconductors for Use in Electronic Equipment: Sectional Specification: Semiconductor Integrated Circuits Excluding Hybrid Circuits
QC 790100-1990 Semiconductor Devices Integrated Circuits Part 11: Sectional Specification for Semiconductor Integrated Circuits Excluding Hybrid Circuits (IEC 748-11 ED 1)

International Electrotechnical Commission (IEC)

IEC 60748-11:1990 Semiconductor devices; integrated circuits; part 11: sectional specification for semiconductor integrated circuits excluding hybrid circuits
IEC 60748-11:1990/AMD2:1999 Semiconductor devices - Integrated circuits - Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits; Amendment 2
IEC 60748-11-1:1992 Semiconductor devices; integrated circuits; part 11; section 1: internal visual examination for semiconductor integrated circuits excluding hybrid circuits
IEC 60748-11:1990/AMD1:1995 Amendment 1 - Semiconductor devices - Integrated circuits - Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits
IEC 60748-3:1986 Semiconductor devices. Integrated circuits.. Part 3 : Analogue integrated circuits
IEC 60748-4:1987 Semiconductor devices - Intergrated circuits.. Part 4: Interface integrated circuits.
IEC 60748-4:1997 Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits
IEC 60748-2:1997 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits
IEC 60748-5:1997 Semiconductor devices - Integrated circuits - Part 5: Semicustom integrated circuits
IEC 61967-4:2006 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions; 1 /150 direct coupling method
IEC 60748-20:1988 Semiconductor devices - Intergrated circuits. Part 20: Generic specification for film integrated circuits and hybrid film intergrated circuits
IEC 61967-6:2002 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions; Magnetic probe method
IEC 60748-2-20:2000 Semicondutor devices - Integrated circuits - Part 2-20: Digital integrated circuits; Family specifications: Low voltage integrated circuits
IEC 60748-2-20:2008 Semicondutor devices - Integrated circuits - Part 2-20: Digital integrated circuits - Family specification - Low voltage integrated circuits
IEC 60748-3:1986/AMD1:1991 Semiconductor devices; integrated circuits; part 3: analogue integrated circuits; amendment 1
IEC 60748-3:1986/AMD2:1994 Semiconductor devices; integrated circuits; part 3: analogue integrated circuits; amendment 2
IEC 61967-6:2002/COR1:2010 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
IEC 60748-3/AMD2/COR1:1996 Semiconductor devices; integrated circuits; part 3: analogue integrated circuits; amendment 2
IEC 60747-5-3:2009 Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods

NZ-SNZ

AS/NZS 1660.5.5:2005 Test Methods for Electric Cables, Cords and Conductors Method 5.5: Fire Tests - Circuit integrity

Danish Standards Foundation

DS/IEC 748-11/A1,2:2001 Semiconductor devices - Integrated circuits - Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits
DS/IEC 748-3+Amd.1:1993 Semiconductor devices - Integrated circuits - Part 3: analogue integrated circuits
DS/IEC 748-2:1993 Semiconductor devices. Integrated circuits. Part 2: Digital integrated circuits
DS/IEC 748-4+Amd.1:1993 Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits
DS/IEC 748-3:1993 Semiconductor devices. Integrated circuits. Part 3: Analogue integrated circuits
DS/IEC 748-4:1993 Semiconductor devices. Integrated circuits. Part 4: Interface integrated circuits
DS/EN 50702:2021 Railway applications – Rolling stock – Conductor rail current collectors (shoegear): Characteristics and tests
DS/IEC 748-11:1992 Semiconductor devices. Integrated circuits. Part 11: Section specification for semiconductor integrated circuits excluding hybrid circuits
DS/EN 60747-5-3/A1:2002 Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
DS/EN 60747-5-3:2002 Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
DS/IEC 748-20:1990 Semiconductor devices. Intergrated circuits. Part 20: Generic specification for film integrated circuits and hybrid film intergrated circuits

GSO

OS GSO IEC 60748-11:2014 Semiconductor devices - Integrated circuits - Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits
GSO IEC 60748-11:2014 Semiconductor devices - Integrated circuits - Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits
GSO IEC 61788-1:2014 Superconductivity - Part 1: Critical current measurement - DC critical current of Cu/Nb-Ti composite superconductors
GSO IEC 60748-11-1:2014 Semiconductor devices - Integrated circuits - Part 11-1: Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
BH GSO IEC 60748-11-1:2016 Semiconductor devices - Integrated circuits - Part 11-1: Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
OS GSO IEC 60748-3:2014 Semiconductor devices - Integrated circuits - Part 3: Analogue integrated circuits
BH GSO IEC 60748-3:2016 Semiconductor devices - Integrated circuits - Part 3: Analogue integrated circuits
OS GSO IEC 60748-4:2013 Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits
GSO IEC 60748-4:2013 Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits
GSO IEC 60748-2:2014 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits
BH GSO IEC 60748-2:2016 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits
GSO IEC 60748-3:2014 Semiconductor devices - Integrated circuits - Part 3: Analogue integrated circuits
OS GSO IEC 60748-2:2014 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits
GSO IEC 60748-5:2015 Semiconductor devices - Integrated circuits - Part 5: Semicustom integrated circuits
GSO ISO 7637-2:2013 Road vehicles -- Electrical disturbances from conduction and coupling -- Part 2: Electrical transient conduction along supply lines only
DL/T 1292-2023 Guidelines for lightning protection of overhead insulated lines in distribution networks
BH GSO ISO 7637-2:2016 Road vehicles -- Electrical disturbances from conduction and coupling -- Part 2: Electrical transient conduction along supply lines only
GSO IEC 60748-2-20:2014 Semiconductor devices - Integrated circuits - Part 2-20: Digital integrated circuits - Family specification - Low voltage integrated circuits
OS GSO IEC 60748-2-20:2014 Semiconductor devices - Integrated circuits - Part 2-20: Digital integrated circuits - Family specification - Low voltage integrated circuits
GSO IEC 60748-20:2014 Semiconductor devices. Integrated circuits. Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits
OS GSO IEC 60748-20:2014 Semiconductor devices. Integrated circuits. Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits
BH GSO IEC 60748-20:2016 Semiconductor devices. Integrated circuits. Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits
OS GSO IEC 60747-5-3:2014 Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
GSO IEC 60747-5-3:2014 Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods

Japanese Industrial Standards Committee (JISC)

JIS E 6302:2015 Rolling stock -- Pantographs
JIS E 6302:2004 Pantographs for rolling stock
JIS E 2209:1989 Wire clips for overhead contact system of electric railway
JIS E 6302:2000 Railway rolling stock -- Pantographs -- Test methods
JIS E 2207:1989 Fittings for feeder in overhead contact system of electric railway
JIS R 1661:2004 Method for conductivity measurement of ion-conductive fine ceramics

VE-FONDONORMA

NORVEN 64-8-1967 Resistance of metallic materials in circuit conductors
NORVRN 553-1971 Glossary for metal wire conductors (used in electronic circuits)

KR-KS

KS C IEC 60748-11-2020 Semiconductor devices — Integrated circuits — Part 11:Sectional specification for semiconductor integrated circuits excluding hybrid circuits
KS C IEC 60748-5-2019 Semiconductor devices — Integrated circuits —Part 5: Semicustom integrated circuits
KS C IEC 60748-5-2021 Semiconductor devices — Integrated circuits —Part 5: Semicustom integrated circuits
KS C IEC 60748-2-20-2021 Semiconductor devices — Integrated circuits — Part 2-20: Digital integrated circuits — Family specification — Low voltage integrated circuits
KS C IEC 60748-20-2021 Semiconductor devices — Integrated circuits —Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits
KS C IEC 60747-5-3-2020 Discrete semiconductor devices and integrated circuits —Part 5-3: Optoelectronic devices — Measuring methods

CO-ICONTEC

ICONTEC 1817-1982 Electronics. Metal wire used as a circuit conductor
ICONTEC 2146-1986 Electronics. Standard method for measuring the lateral area of line conductors

SE-SIS

SIS SS-IEC 748:1991 Semiconductor devices — Integrated circuits
SIS SS 436 01 02-1989 Design of overheadpower lines —Conductors
SIS 02 81 23-1974 Determination of conductivity of water

SCC

BS IEC 60748-2-20:2000 Semiconductor devices. Integrated circuits. Digital integrated circuits-Family specification. Low voltage integrated circuits
BS 6493-2-2.2:1986 Semiconductor devices. Integrated circuits-Recommendations for digital integrated circuits
BS 6493-2-2.4:1989 Semiconductor devices. Integrated circuits-Recommendations for interface integrated circuits
DANSK DS/EN 50702:2021 Railway applications – Rolling stock – Conductor rail current collectors (shoegear): Characteristics and tests
DANSK DS/ISO 7637-2:2021 Road vehicles – Electrical disturbances from conduction and coupling – Part 2: Electrical transient conduction along supply lines only
MIL MIL-PRF-32516-2015 Electronic Test Equipment, Intermittent Fault Detection and Isolation for Chassis and Backplane Conductive Paths
AS/NZS 1660.5.5:1998 Test methods for electric cables, cords and conductors, Method 5.5: Fire tests - Circuit integrity under fire conditions
CEI EN 50702:2022 Railway applications - Rolling stock - Conductor rail current collectors (shoegear): Characteristics and tests
CEI EN IEC 61967-4:2022 Integrated circuits - Measurement of electromagnetic emissions Part 4: Measurement of conducted emissions - 1 Ω /150 Ω direct coupling method
CSA C57-1998(R2015) Electric Power Connectors for Use in Overhead Line Conductors
IEC 60748-2:1985/AMD2:1993 Amendment 2 - Semiconductor devices. Integrated circuits. Part 2: Digital integrated circuits
IEC 60748-4:1987/AMD2:1994 Amendment 2 - Semiconductor devices. Integrated circuits. Part 4: Interface integrated circuits.
IEC 60748-4:1987/AMD1:1991 Amendment 1 - Semiconductor devices. Integrated circuits. Part 4: Interface integrated circuits.
DANSK DS/EN 60747-5-3:2002 Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
CEI EN 60747-5-3:2002 Discrete semiconductor devices and integrated circuits Part 5-3: Optoelectronic devices - Measuring methods
DANSK DS/EN 61967-6:2003 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz - 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
IEC 60748-2:1985/AMD1:1991 Amendment 1 - Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits
DANSK DS/IEC 748-20:1989 Semiconductor devices - Integrated circuits - Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits

RO-ASRO

STAS 684-1975 COPPER CONDUCTORSFOR OVERHEAD TELECOMMUNICATION LINES
SR CEI 748-3+A1-1991 Semiconductor devices. Integrated circuits. Part 3: Analogue integrated circuits
STAS 3032-1990 ALUM1N1UM STRANDKD CONIH'CTORS FOR OYERHEAD POWER TRANSMISSION I.1NES
SR CEI 748-11-1-1992 Semiconductor devices Integrated circuits Part 11: Section 1: Internai visual examination for semiconductor integrated circuits excluding hybrid circuits
STAS SR CEI 748-2/A1-1994 DISPOZITIVE CU SEMICONDUCTOARE Circuite integrate. Partea 2: Circuite integrate digitale
STAS 3734-1971 Ovci'lH'iid power linos ZTNC-COATFD STRFJ. CONDUC- TOR S
STAS 3000-1980 BARE ALUMINIUM-STEEL CONDUCTORS FOR OVERHEAD POWER TRANSMISSION LINES
STAS 7128/11-1985 T.ETTJ?R SYMBOLS FOR EMICONDUCTOR DEVICES ND INTHGRATED CIRCUITS Symbols fur digital integrated eircuits

RU-GOST R

GOST R IEC 60748-11-1-2001 Semiconductor devices integrated circuits. Part 11. Section 1. Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
GOST 29107-1991 Semiconductor devices. Integrated circuits. Part 2. Digital integrated circuits
GOST 29109-1991 Semiconductor devices. Integrated circuits. Part 4. Interface integrated circuits
GOST 29108-1991 Semiconductor devices. Integrated circuits. Part 3. Analog integrated circuits
GOST R IEC 748-11-1-2001 Semiconductor devices integrated circuits. Part 11. Section 1. Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
GOST R 54720-2011 Railway тelecommunications. Suspension rules of self-supporting optical waveguide cable on railway contact-line masts and power lines with voltage over 1000 V

CN-QIYE

Q/GDW 324-2009 Technical Guidelines for Live Work on 1000kV Transmission Lines
Q/GDW 710-2012 Technical guidelines for non-stop operation of 10kV cable lines
Q/GDW 456-2010 Guidelines for Condition Evaluation of Cable Lines
Q/GDW 455-2010 Guidelines for Condition Maintenance of Cable Lines
Q/GDW 174-2008 Guidelines for Condition Maintenance of Overhead Transmission Lines

Defense Logistics Agency

DLA SMD-5962-06239 REV A-2007 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, 16-BIT PARALLEL ERROR DETECTION AND CORRECTION CIRCUIT, WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON
DLA SMD-5962-96742 REV E-2000 MICROCIRCUIT, LINEAR, RADIATION HARDENED, CMOS, MULTIPLEXER WITH OVERVOLTAGE PROTECTION, MONOLITHIC SILICON
DLA SMD-5962-95826 REV C-2003 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, NOR GATE, MONOLITHIC SILICON
DLA SMD-5962-94745-1995 MICROCIRCUIT, MEMORY, DIGITAL, CMOS 256K X 1-BIT SERIAL CONFIGURATION PROM, MONOLITHIC SILICON
DLA SMD-5962-94514 REV B-2004 MICROCIRCUIT, LINEAR, MICROPROCESSOR SUPERVISORY CIRCUIT, MONOLITHIC SILICON
DLA SMD-5962-95834 REV J-2006 MICROCIRCUIT, LINEAR, LVDS QUAD CMOS DIFFERENTIAL LINE RECEIVER, MONOLITHIC SILICON

IN-BIS

IS 12970 Pt.3/Sec.3-1993 Semiconductor devices—Integrated circuits Part 3 Digital integrated circuits—Measurement methods Section 3: Dynamic measurements
IS 12970 Pt.3/Sec.1-1992 Semiconductor devices—Integrated circuits Part 3 Digital integrated circuits—Measurement methods Section 1: General
IS 12970 Pt.6/Sec.1-1992 Semiconductor Devices—Integrated Circuits Part 6 Analog Integrated Circuit Measurement Methods Section 1: General
IS 12641-1989 Environmental testing procedures for semiconductor devices and integrated circuits
IS 12970 Pt.6/Sec.3-1992 Semiconductor Devices—Integrated Circuits Part 6 Analog Integrated Circuit Measurement Methods Section 3: Voltage Regulators
IS 5001 Pt.2-1973 Semiconductor Device and Integrated Circuit Drawing Guide Part II Integrated Circuits
IS 12970 Pt.3/Sec.2-1992 Semiconductor devices. Integrated circuits. Part 2: Digital integrated circuits. Measuring methods. Section 2: Static characteristics
IS 12970 Pt.6/Sec.2-1992 Semiconductor Devices—Integrated Circuits Part 6 Analog Integrated Circuit Measurement Methods Section 2: Linear Amplifiers

ES-UNE

UNE-EN 50702:2021 Railway applications - Rolling stock - Conductor rail current collectors (shoegear): Characteristics and tests
UNE-EN IEC 61967-4:2021 Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 ¿/150 ¿ direct coupling method (Endorsed by Asociación Española de Normalización in June of 2021.)
UNE-EN 61967-6:2002/A1:2008 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 6: Measurement of conducted emissions - Magnetic probe method (Endorsed by AENOR in September of 2008.)
UNE-EN 60747-5-3:2001/A1:2002 Discrete semiconductor devices and integrated circuits -- Part 5-3: Optoelectronic devices - Measuring methods (Endorsed by AENOR in November of 2002.)
UNE-EN 61967-6:2002 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 6: Measurement of conducted emissions - Magnetic probe method (Endorsed by AENOR in November of 2002.)
UNE-EN 60747-5-3:2001 Discrete semiconductor devices and integrated circuits -- Part 5-3: Optoelectronic devices - Measuring methods. (Endorsed by AENOR in October of 2001.)

German Institute for Standardization

DIN EN 61967-5:2003-10 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 5: Measurement of conducted emissions; Workbench Faraday Cage method (IEC 61967-5:2003); German version EN 61967-5:2003 / Note: Applies in conjunction with DIN EN 6...
DIN EN 61967-6 Berichtigung 1:2011-02 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method (IEC 61967-6:2002 + A1:2008); German version EN 61967-6:2002 + A1:2008, Corrigendum to DIN EN 61967-6:...

AENOR

UNE 21101:1973 OVERHEAD TRANSMISSION LINES. METHODS FOR MEASURING IN THE FIELD OF GROUND CABLES OR CONDUCTORS SAGS.
UNE 21045:1974 WOOD COILS FOR OVERHEAD TRANSMISSION LINES CONDUCTORS BARE CABLES.

BE-NBN

NBN I-983-1969 Insulated cables for electrical lines. V-shaped insulated wire. Related properties and tests

Lithuanian Standards Office

LST EN 50702-2021 Railway applications - Rolling stock - Conductor rail current collectors (shoegear): Characteristics and tests

HU-MSZT

MSZ KGST 1622-1979 General provisions for power measurements on semiconductor tools and associated circuit boards

GOST

GOST ISO 7637-2-2015 Road transport Interference is conducted - capacitive and inductive Part 2: Conducted impulse noise in power circuits

GB-REG

REG NASA-LLIS-0297--1993 Lessons Learned ?Integrated Circuit Damage due to Capacitor Residual Charge
REG NASA-LLIS-0448-1996 Lessons Learned - Fusing Element Failure resulting from Test Integration, Test, Pyrotechnic Devices, PYRO, Electrical Explosive Devices, EED, Command Circuit, Drive Circuit

IEC - International Electrotechnical Commission

IEC 60748-2:1985 Semiconductor Devices Integrated Circuits Part 2: Digital Integrated Circuits (Amendment 1-1991) (Amendment 2-1993) (Edition 1.0)

Standard Association of Australia （SAA）

AS 1852.521:1988 International electrotechnical vocabulary - Semiconductor devices and integrated circuits

International Organization for Standardization (ISO)

ISO/TR 7637-1:1984 Road vehicles — Electrical interference by conduction and coupling — Part 1: Vehicles with nominal 12 V supply voltage — Electrical transient conduction along supply lines only
ISO 7637-2:2004 Road vehicles - Electrical disturbances from conduction and coupling - Part 2: Electrical transient conduction along supply lines only
ISO 7637-2:2011 Road vehicles - Electrical disturbances from conduction and coupling - Part 2: Electrical transient conduction along supply lines only

Underwriters Laboratories (UL)

UL 497-2017 Protectors for paired conductor communication circuits
UL 497-1991 Protectors for paired conductor communication circuits

European Committee for Electrotechnical Standardization（CENELEC）

EN IEC 61967-4:2021 Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method
EN 61166:1993 High-Voltage Alternating Current Circuit-Breakers Guide for Seismic Qualification of High- Voltage Alternating Current Circuit- Breakers

CU-NC

NC 66-100-1988 Electronic and Electrotechical Industry. Power Conductors Electric Tests

FI-SFS

SFS 5327-1987 Glossary of electronic technology. Semiconductor components and overall circuits
SFS-IEC 885-1:1989 Test method for electrical conductivity of wires. Not exceeding 450/750V in conductors and wires tested

GOSTR

GOST R ISO 6469-3-2020 Electrically propelled road vehicles. Safety specifications. Part 3. Electrical safety. Electrical circuits of electrical distribution systems and electrically conductive auxiliary electrical systems

ES-AENOR

UNE 21-302 Pt.521-1992 Electrotechnical vocabulary. Semiconductor devices and integrated circuits

International Telecommunication Union (ITU)

ITU-T M.110 FRENCH-1988 CIRCUIT TESTING
ITU-T M.110 SPANISH-1988 CIRCUIT TESTING

United States Navy

NAVY MIL-T-81404 B NOTICE 1-1996 TEST SET, ELECTRICAL CIRCUIT, GUIDED MISSILE LAUNCHER AND AIRCRAFT, AN/ASM-149C
NAVY MIL-T-81404 B (1)-1985 TEST SET, ELECTRICAL CIRCUIT, GUIDED MISSILE LAUNCHER AND AIRCRAFT, AN/ASM-149C
NAVY MIL-T-81404 B-1985 TEST SET, ELECTRICAL CIRCUIT, GUIDED MISSILE LAUNCHER AND AIRCRAFT, AN/ASM-149C

Aerospace Industries Association

AIA NAS 4124-1996 Heat Sink, Electrical- Electronic Component, Semiconductor Devices, Dual Link

AT-ON

ONORM E 4000-1976 Electrical overhead lines; Aluminium and E-AlMgSi wires for stranded conductors

ITU-T - International Telecommunication Union/ITU Telcommunication Sector

ITU-T M.70-1988 GUIDING PRINCIPLES ON THE GENERAL MAINTENANCE ORGANIZATION FOR TELEPHONE - TYPE INTERNATIONAL CIRCUITS

AIA/NAS - Aerospace Industries Association of America Inc.

NAS4124-1996 Heat Sink@ Electrical- Electronic Component@ Semiconductor Devices@ Dual Link

Others: