GB/T 35007-2018 in English
VALIDSemiconductor integrated circuits—Measuring method of low voltage differential signaling circuitry
- Issued on:2018-03-15
- Implemented on:2018-08-01
- File Format:PDF
- Delivery:Via email within 5 business days
$534.00
《GB/T 35007-2018半导体集成电路 低电压差分信号电路测试方法》由TC599（全国集成电路标准化技术委员会）归口，主管部门为工业和信息化部（电子）。
Introduction
Interpretation of the core content of the standard
This standard systematically specifies the test methodology system for LVDS circuits, including the test requirements for 5 major categories of static parameters and 6 categories of dynamic parameters. The test environment must meet the benchmark conditions of temperature 15℃~35℃ and air pressure 86kPa~106kPa.
| Test type | Number of parameters | Key indicators | Test accuracy requirements |
|---|---|---|---|
| Static parameters | 18 items | Threshold voltage, common mode output, etc. | Power supply voltage±1% |
| Dynamic parameters | 18 items | Propagation delay, eye diagram indicators, etc. | Time resolution≤10ps |
Key technical points
Threshold voltage test
The input high/low level threshold voltage (VTH/VTL) test requires the differential voltage adjustment method:
- Set the common mode voltage VCM=(VI++VI-)/2
- Adjust the differential voltage VID=VI+-VI-
- Capture the critical point of output state transition
Eye diagram test specifications
The eye diagram test must meet the instrument requirements of Appendix A:
- Bandwidth ≥ 2 times the signal bandwidth (Gaussian response oscilloscope)
- Sampling rate ≥ 4 times the bandwidth
- Example: 3Gbps signal requires an 11.9GHz bandwidth oscilloscope
Implementation Suggestions
Test System Construction
The following instrument combination is recommended:
| Oscilloscope | Bandwidth ≥ 5th harmonic of the measured signal |
| Signal Source | Jitter <1% UI |
| Probe System | Differential impedance matching 100Ω±5% |
Key Points for Quality Control
- Establish an ESD protection system (HBM≥2000V)
- Regularly calibrate the test system (cycle ≤ 3 months)
- Maintain stable ambient temperature and humidity (ΔT ≤ ±1℃/h)
Standard Evolution Analysis
Main improvements of this standard compared with traditional test methods:
- Added eye diagram parameter test system (height/width/jitter)
- Refine multi-channel timing test requirements
- Introduce deterministic jitter and random jitter separation technology
Differences compared with IEEE 1596.3 standard:
| Item | GB/T 35007 | IEEE 1596.3 |
|---|---|---|
| Test temperature range | 15~35℃ | 0~70℃ |
| Eye diagram test | Mandatory requirement | Optional |
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