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semiconductor integrated circuit analog switch test methods analog switch channels analogue switch introduction test method semiconductor technology submission version test range resistivity multi-stream packet application
GB/T 14028-2018 in English

GB/T 14028-2018 in English

VALID

Semiconductor integrated circuits—Measuring method of analogue switch

  • Issued on:2018-03-15
  • Implemented on:2018-08-01
  • File Format:PDF
  • Delivery:Via email within 5 business days
Price(USD): $370.00
$359.00
Standard No: GB/T 14028-2018
Document status: VALID
Title in English: Semiconductor integrated circuits—Measuring method of analogue switch
Title in Chinese: 半导体集成电路 模拟开关测试方法
Language: English
File Format: Electronic (PDF)
Delivery: Via email within 5 business days
Issued on: 2018-03-15
Implemented on: 2018-08-01
Superseding: GB/T 14028-1992 principles of measuring methods of analogue switches for semiconductor integrated circuits
ICS Classification: 31.200-Integrated circuits. Microelectronics
Chinese Classification: L56-Semiconductor integrated circuit
Professional Classification: GB-National Standard
Related Keywords: semiconductor integrated circuit analog switch test methods
analog switch channels
analogue switch introduction
test method
semiconductor technology
Related Topics: GB/T 14028-1992
GB/T+14028-1992
test mock test
Semiconductor open circuit voltage
Integration Test Trials
semiconductor integrated circuit
test open circuit
Open circuit voltage half cell
Semiconductor open circuit voltage
imaging simulation
imaging simulation
Semiconductor Test Technology
new semiconductor integration
Semiconductor Test Technology
gb/t14028
Integrated Circuit Testing Principles and Methods
Modern IC Testing Technology
Semiconductor Kelvin Test Principle
Open circuit voltage of the half cell
gb+t14028
Semiconductor Kelvin Test
Semiconductor Kelvin Test Principle
GBT14028
GB/T 14028-1992
GB/T 14028-2018
Semiconductor integrated circuit analog switch
analog switch
Semiconductor integrated circuit driving test method
Test method for semiconductor integrated circuit driver
integrated circuit
Transportation Simulation Test Instructions
dds conductivity measurement circuit
How to measure open circuit potential
Thoughts on material method development
Semiconductor integrated circuit chip general
Related material method development ideas
Overseas integrated circuit testing
Integrated circuit testing related
Open circuit potential test principles and methods
Leakage switch test method

《GB/T 14028-2018半导体集成电路 模拟开关测试方法》由TC599(全国集成电路标准化技术委员会)归口,主管部门为工业和信息化部(电子)。


Introduction

1. Standard Overview

GB/T 14028—2018 "Semiconductor Integrated Circuit Analog Switch Test Methods" comprehensively specifies the parameter test methods for bipolar, MOS, and junction field effect semiconductor integrated circuit analog switches, and is suitable for multiplexer parameter testing.

2. Comparison of standard frameworks

Standard version New content Modified content Scope of application
GB/T 14028—92 - - Basic principles of analog switch test methods
GB/T 14028—2018 Added test methods for parameters such as on-resistance path difference rate and temperature drift rate Modified test environment requirements and table expression format Semiconductor integrated circuit analog switches and multiplexers

3. Background of Standard Formulation and Technological Evolution

With the advancement of semiconductor technology, the application scenarios of analog switches are becoming increasingly extensive. The revision of GB/T 14028 reflects the industry's demand for higher precision and more comprehensive test methods.

This standard is based on the drafting rules of GB/T 1.1-2009 and absorbs the experience of international advanced test methods.

4. Interpretation of Key Parameters and Practical Applications

Case: Measurement of On-Resistance Channel Difference Rate

The On-Resistance Channel Difference Rate reflects the consistency between analog switch channels. In a multiplexer, this parameter directly affects the signal quality.

Test method: By measuring the on-resistance of each channel, and calculating the ratio of the difference between the maximum and minimum values to the average value.

5. Implementation Suggestions

  1. Strictly control the test environment conditions: Ensure that the temperature, humidity and air pressure are within the standard range and avoid external interference.
  2. Choose appropriate test equipment: Including dual-trace oscilloscopes, precision current sources, etc. to ensure measurement accuracy.
  3. Follow the test procedures: Strictly follow the steps specified in the standard, especially in the test of multiplexers, which requires verification one by one.
  4. Record and analyze data: Create a complete test report, and perform statistical analysis on the results to identify potential problems.

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