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Database: 365,228(8 Aug 2026)

low-dimensional conductor

low-dimensional conductor, Total:303 items.

The international standard classification for "low-dimensional conductor" includes: Transport by water , Fuses and other overcurrent protection devices , Cables , Integrated circuits. Microelectronics , Man-made fibres .

The Chinese standard classification for "low-dimensional conductor" includes: Technical management , Semiconductor discrete devices in general , Ship maintenance and service in general , Low-voltage distribution electrical equipment , Cable and its accessory , Low voltage apparatus in general , Semiconductor integrated circuit , Artificial board , Chemical fibre , Medical optical instrument and endoscope .


Professional Standard - Electron

  • SJ 2002-1981 Detail specification for N channel junction pair field-effect transistors,Type CS32
  • SJ 2001-1981 Detail specification for N channel junction pair field-effect transistors,Type CS31
  • SJ 50033/134-1997 Semiconductor discrete devices - Detail specification for Type 3DD167 low-frequency and high-power transistor
  • SJ 1989-1981 Detail specification for Nchannel junction pair field-effect transistors,Type CS19
  • SJ 50033/129-1997 Semiconductor discrete devices-Detail specification for Type 3DD155 low-frequency and high-power transistor
  • SJ 50033/64-1995 Semiconductor discrete device-Detail specification for Type 3CD010 low-frequency and high-power transistor
  • SJ 1997-1981 Detail specification for N channel junction pair field-effect transistors,Type CS27
  • SJ 50033/154-2002 Semiconductor discrete devices Detail specification for type 3DG251 silicon UHF low-noise transistor
  • SJ 1988-1981 Detail specification for low frequency low noise field-effect transistors,Type CS15
  • SJ 1993-1981 Detail specification for N channel junction pair field-effect transistors,Type CS23
  • SJ 1985-1981 Detail specification for low frequency low noise field-effect transistors,Type CS12
  • SJ 2003-1981 Detail specification for N channel junction pair field-effect transistors,Type CS33
  • SJ 50033/92-1995 Semiconductor discrete devices-Detail specification for Type 3CD100 low-frequency and high-power transistor
  • SJ 50033/158-2002 Semiconductor discrete devices Detail specification for type 3DG44 silicon UHF low-noise transistor
  • SJ 50033/159-2002 Semiconductor discrete devices Detail specification for type 3DG142 silicon UHF low-noise transistor
  • SJ 1974-1981 Detail specification for low frequency field-effect transistors,Type CS1
  • SJ 50033/131-1997 Semiconductor discrete devices - Detail specification for Type 3DD157 low-frequency and high-power transistor
  • SJ 2000-1981 Detail specification for N channel junction pair field-effect transistors,Type CS30
  • SJ 1992-1981 Detail specification for N channel junction pair field-effect transistors,Type CS22
  • SJ 50033/65-1995 Semiconductor discrete device - Detail specification for Type 3DD175 low-frequency and high-power transistor
  • SJ 50033/130-1997 Semiconductor discrete devices-Detail specification for Type 3DD159 low-frequency and high-power transistor
  • SJ 1975-1981 Detail specification for low frequency field-effect transistors,Type CS2
  • SJ 2004-1981 Detail specification for N channel junction pair field-effect transistors,Type CS34
  • SJ 1984-1981 Detail specification for low frequency low noise field-effect transistors,Type CS11
  • SJ/T 11586-2016 l0keV X-ray total dose radiation testing method of semiconductor devices
  • SJ 1999-1981 Detail specification for N channel junction pair field-effect transistors,Type CS29
  • SJ 50033/66-1995 Semiconductor discrete device-Detail specification for Type 3DD880 low-frequency and high-power transistor
  • SJ 1990-1981 Detail specification for N channel junction pair field-effect transistors,Type CS20
  • SJ 1987-1981 Detail specification for low frequency low noise field-effect transistors,Type CS14
  • SJ 50033/91-1995 Semiconductor discrete devices-Detail specification for Type 3CD030 low-frequency and high-power transistor
  • SJ 1998-1981 Detail specification for N channel junction pair field-effect transistors,Type CS28
  • SJ 1991-1981 Detail specification for N channel junction pair field-effect transistors,Type CS21
  • SJ 50033/67-1995 Semiconductor discrete device - Detail specification for Type 3DD103 high-voltage, low-frequency and high-power transistor
  • SJ 50033/132-1997 Semiconductor discrete devices - Detail specification for Type 3DD260 low-frequency and high-power transistor
  • SJ 1994-1981 Detail specification for N channel junction pair field-effect transistors,Type CS24
  • SJ 1996-1981 Detail specification for N channel junction pair field-effect transistors,Type CS26
  • SJ 50033/76-1995 Semiconductor discrete devices - Detail specification for Type 3DG218 silicon microwave low-noise transistor
  • SJ 1986-1981 Detail specification for low frequency low noise field-effect transistors,Type CS13
  • SJ 1995-1981 Detail specification for N channel junction pair field-effect transistors,Type CS25
  • SJ 50033/63-1995 Semiconductor discrete device - Detail specification for Type 3CD020 low-frequency and high-power transistor
  • SJ 1976-1981 Detail specification for low frequency field-effect transistors,Type CS3
  • SJ 1983-1981 Detail specification for low frequency low noise field-effect transistors,Type CS10

Group Standards of the People's Republic of China

  • T/GVS 014-2024 Evaluation specification for cryogenic vacuum pumps used in semiconductor equipment
  • T/NXCL 010-2021 Low temperature curing silver conductor paste
  • T/CSCM 06-2020 Carbon fiber reinforced resin matrix composite materials cryoresistive dangling ring for nuclear magnetic resonance
  • T/ACEF 031-2022 Quantitative Guidelines for Greenhouse Gas Emission Reduction of Citizens’ Green and Low-Carbon Behaviors
  • T/CCGA 10006-2021 Safety technical regulationfor use and maintenance of cryogenic liquid pumps
  • T/CASME 1574-2024 Guidelines for the evaluation of low-carbon enterprises in quartz crystal components
  • T/CEC 651-2022 Guidelines for overhaul and maintenance of high and low pressure heaters in thermal power plants
  • T/CCGA 20010-2024 Technical specification for helium recovery and purification system for cryogenic superconducting magnets
  • T/CNEA 011-2021 Guidelines for the evaluation of nuclear power plant maintenance supplier quality assurance system effectiveness
  • T/ZJCX 0041-2024 High permeability and low power consumption Mn-Zn ferrite powders
  • T/CEEIA 782-2024 Low-voltage Semiconductor(solidstate) Circuit-Breaker

Hebei Provincial Standard of the People's Republic of China

  • DB13/T 5293-2020 Specifications for Maintenance of Semiconductor Characteristic Tracer
  • DB13/T 6033-2024 Semiconductor Device Low Concentration Hydrogen Effect Test Method

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

  • GB 35007-2018 Semiconductor integrated circuit low voltage differential signal circuit testing method
  • GB/T 23438-2009 Guideline of maintenance system survey for ship
  • GB 14048.8-1998 Low-voltage switchgear and controlgear Ancillary equipment Section 2:Protective conductor terminal blocks for copper conductors
  • GB/T 24468-2025 Measurement Methods for Semiconductor Equipment Reliability, Availability, and Maintainability (RAM)
  • GB/T 9414.1-1988 Guide on maintainability of equipment--Part 1:Introduction to maintainability
  • GB/T 13539.4-2005 Low voltage fuses - Part 4: the requirements of the protection of semiconductor devices fuse supplement
  • GB/T 18213-2025 Guidelines for Calculating DC Resistance of Copper Conductors with and without Coatings in Low-Frequency Cables and Wires
  • GB/T 13539.4-2009 Low-voltage fuses - Part 4: Supplementary requirements for fuse-links for the protection of semiconductor devices
  • GB/T 14048.8-2006 Low-voltage switchgear and controlgear - Part 7-2: Ancillary equipment - Protective conductor terminal blocks for copper conductors
  • GB/T 35007-2018 Semiconductor integrated circuits—Measuring method of low voltage differential signaling circuitry
  • GB/T 18213-2000 Guide to the calculation of resistance of plain and coated copper conductor of low-frequency cables and wires
  • GB/T 14048.8-2016 Low-voltage switchgear and controlgear―Part 7-2:Ancillary equipment―Protective conductor terminal blocks for copper conductors
  • GB 13539.4-1992 Low-voltage fuses Supplementary requirements for fuse-links for the protection of semiconductor devices
  • GB/T 13539.4-2016 Low-voltage fuses―Part 4:Supplementary requirements for fuse-links for the protection of semiconductor devices

Shandong Provincial Standard of the People's Republic of China

  • DB37/T 1715-2010 Guidelines for Operation and Maintenance of Gas Turbines Burning Medium and Low Calorific Value Gas

Military Standard of the People's Republic of China-General Armament Department

  • GJB 10062-2021 Specification for low thermal conductivity fiber reinforced ceramic matrix composite fasteners
  • GJB 33/002-1989 Blank detailed specification for low-frequency high-power transistors for semiconductor discrete devices
  • GJB 3175-1998 Specification for high-strength, high-mode, low-elongation fibers for optical fiber guidance covered wires
  • GJB 33A/14-2003 Semiconductor discrete device 3DG44 type silicon ultra-high frequency low noise transistor detailed specification
  • GJB 33/14A-2021 Semiconductor discrete device 3DG44 type silicon ultra-high frequency low noise transistor detailed specification

Anhui Provincial Standard of the People's Republic of China

  • DB34/T 3425-2019 Liquid Helium Cooling Method for Superconducting Cyclotron Low-Temperature Superconducting Magnet

Professional Standard - Traffic

  • JT/T 729-2008 Directives on Quality Management System for Marine Aids to Navigation Maintenance
  • JT/T 1512-2024 Technical requirements for semiconductor low-voltage power distribution equipment for passenger cars
  • JT/T 336-1997 Directives of maintenance system and survey for ship

Chongqing Provincial Standard of the People's Republic of China

  • DB50/T 930-2019 Two-dimensional code laser etching ontology marking technology application guidelines

Fujian Provincial Standard of the People's Republic of China

Professional Standard - Forestry

  • LY/T 1718-2017 Low density fiberboard and ultra-low density fiberboard

未注明发布机构

  • FORD WSA-M1L130-A-2003 CABLE, LOW TENSION, CROSSLINKED ETFE INSULATED, TINNED SINGLE AND MULTIPLE CONDUCTOR ***TO BE USED WITH FORD WSS-M99P1111-A***

Professional Standard - Energy and Power Planning

  • DL/T 1615-2016 Technical Guide for Operation and Maintenance of Carbon Fibre Composite Cores Overhead Lines

Professional Standard - Aerospace

  • QJ 20027-2011 Test method for thermal conductivity of thermal conductive grease at low temperature

Professional Standard - Energy

Professional Standard - Textile

National Metrological Technical Specifications of the People's Republic of China

  • JJF 1895-2021 Calibration Specification for Semiconductor Devices DC and Low Frequency Parameters Test Equipments

Professional Standard - Medicine

Czech Standards Institute (UNMZ)

  • CSN 34 7713-1969 Low-frequency communications wires with stranded conductors
  • CSN 34 7714-1969 Low-frequency communications acreened wires with stranded conductors
  • CSN 35 4714-1983 Low-voltage fusos for tho protection of semiconductor devices

Association for Electrical, Electronic & Information Technologies (VDE)

U.S. Air Force

Bureau of Indian Standards

  • IS 4685-2-1984 Varnish bonded glass-fibre covered copper conductors: Part 2 Rectangular conductors
  • IS 4685 Pt.2-1984 Specification for varnish-bonded fiberglass-clad copper conductors Part 2 Rectangular conductors
  • IS 10452 Pt.2-1983 Test methods for covered conductors for electrical equipment Part 2 Fiber covered conductors
  • IS 10452-2-1983 Methods of tests for covered conductors for electrical equipment: Part 2 Fibrous covered conductors
  • IS/IEC/TR 60344-2007 Calculation of d.c. Resistance of Plain and Coated Copper Conductors of Low-frequency Cables and Wires — Application Guide
  • IS 6181-1971 Specification for varnish-bonded fiberglass braided rectangular copper conductors
  • IS 6746-1972 Specification for unsaturated polyester resin systems for low-pressure fiber-reinforced plastics
  • IS 4685-1-1968 Varnish bonded glass-fibre covered copper conductors: Part 1 Round wires
  • IS 4685 Pt.1-1968 Specification for varnish-bonded fiberglass-clad copper conductors Part 1 Round wire

Military Standards (MIL-STD)

  • MIL MIL-PRF-83772C-2013 Hose, Assembly, Cryogenic Liquid, Aircraft Servicing
  • MIL MIL-DTL-32630-2019 CONDUCTOR, ELECTRICAL, STRANDED, UNINSULATED CARBON-BASED CONDUCTIVE FIBER, GENERAL SPECIFICATION FOR
  • MIL MIL-PRF-19500/313B-1982 SEMICONDUCTOR DEVICE, TRANSISTOR, NPN, SILICON, LOW POWER (SUPERSEDING MIL-S-19500/313A)
  • MIL MIL-PRF-19500/313C-1997 SEMICONDUCTOR DEVICE, TRANSISTOR, NPN, SILICON, LOW POWER (SUPERSEDING MIL-S-19500/313B)
  • MIL MIL-DTL-13486G-2017 Cables, Special Purpose, Electrical: Low-Tension, Heavy-Duty, Single Conductor and Multiple Conductor, Shielded and Unshielded, General Specification for
  • MIL MIL-S-19500/62B-1968 SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, GERMANIUM, LOW-POWER TYPE 2N501A (SUPERSEDING MIL-S-19500/62A)
  • MIL MIL-S-19500/31C-1972 SEMICONDUCTOR DEVICE, TRANSISTOR, NPN, SILICON, LOW POWER TYPE 2N341 (SUPERSEDING MIL-S-19500/31B)
  • MIL MIL-S-19500/4D-1966 SEMICONDUCTOR, DEVICE TRANSISTOR, PNP, GERMANIUM, LOW POWER TYPE 2N331 (SUPERSEDING MIL-S-19500/4C)
  • MIL MIL-PRF-83772B-1998 HOSE ASSEMBLY, CRYOGENIC LIQUID, AIRCRAFT SERVICING (SUPERSEDING MIL-H-83772A)
  • MIL MIL-S-19500/25B-1968 SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, GERMANIUM, LOW-POWER TYPE 2N240 (SUPERSEDING MIL-S-19500/25A)
  • MIL MIL-S-19500/77C-1968 SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, GERMANIUM, LOW-POWER TYPE 2N393 (SUPERSEDING MIL-S-19500/77B)
  • MIL MIL-S-19500/80E-1972 SEMICONDUCTOR DEVICE, TRANSISTOR, NPN, SILICON, LOW-POWER TYPE 3N35 (SUPERSEDING MIL-S-19500/80D)
  • MIL MIL-S-19500/64D-1967 SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, GERMANIUM, LOW POWER TYPE 2N396A (SUPERSEDING MIL-S-19500/64C)
  • MIL MIL-S-19500/71D-1967 SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, GERMANIUM, LOW-POWER TYPE 2N1195 (SUPERSEDING MIL-S-19500/71C)
  • MIL MIL-PRF-19500/448G-2018 Semiconductor Device, Transistor, PNP, Silicon, Low-Power, Type 2N4405, 2N4405UA, and 2N4405UB, JAN and JANTX
  • MIL MIL-PRF-19500/674-2001 SEMICONDUCTOR DEVICE, TRANSISTOR, PLASTIC, NPN, SILICON, SWITCHING, LOW NOISE TYPE 2N2484UE1 JAN, JANTX, JANJ
  • MIL MIL-DTL-32630/3-2019 CONDUCTOR, ELECTRICAL, STRANDED, UNINSULATED CARBON-BASED CONDUCTIVE FIBER, -200 DEGREES CELSIUS to +200 DEGREES CELSIUS
  • MIL MIL-PRF-19500/448F-2013 Semiconductor Device, Transistor, PNP, Silicon, Low-Power, Type 2N4405, 2N4405UA, and 2N4405UB, JAN and JANTX
  • MIL MIL-S-19500/87A-1966 SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, GERMANIUM LOW POWER TYPE 2N1142 (SUPERSEDING MIL-S-19500/87)
  • MIL MIL-S-19500/174B-1971 SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, GERMANIUM, LOW POWER TYPE JAN-2N398A (SUPERSEDING MIL-S-19500/174A)
  • MIL MIL-PRF-19500/448E-2011 Semiconductor Device, Transistor, PNP, Silicon, Low-Power, Type 2N4405, 2N4405UA, and 2N4405UB, JAN and JANTX
  • MIL MIL-PRF-19500/177G-2009 Semiconductor Device, Transistor, PNP, Silicon Low-Power Types 2N1131, 2N1131L, 2N1132, 2N1132L, JAN, JANTX and JANTXV
  • MIL MIL-PRF-19500/181K-2018 Semiconductor Device, Transistor, NPN, Silicon, Low-Power Types 2N718A, 2N1613 and 2N1613L, JAN, JANTX, and JANTXV
  • MIL MIL-PRF-19500/177J-2020 Semiconductor Device, Transistor, PNP, Silicon Low-Power Types 2N1131, 2N1131L, 2N1132, 2N1132L, JAN, JANTX and JANTXV
  • MIL MIL-PRF-19500/177H-2010 Semiconductor Device, Transistor, PNP, Silicon Low-Power Types 2N1131, 2N1131L, 2N1132, 2N1132L, JAN, JANTX and JANTXV
  • MIL MIL-PRF-19500/181J-2011 Semiconductor Device, Transistor, NPN, Silicon, Low-Power Types 2N718A, 2N1613 and 2N1613L, JAN, JANTX, and JANTXV
  • MIL MIL-PRF-19500/302C-1999 SEMICONDUCTOR DEVICE, TRANSISTOR, NPN, SILICON, LOW-POWER, TYPE 2N2708, JAN (SUPERSEDING MIL-S-19500/302B)
  • MIL MIL-PRF-19500/485P-2018 Semiconductor Device, Transistor, PNP, Silicon, Low-Power Types: 2N5415, 2N5415S, 2N5415UA, 2N5415U4, 2N5416, 2N5416S, 2N5416UA, and 2N5416U4
  • MIL MIL-PRF-19500/485L-2009 Semiconductor Device, Transistor, PNP, Silicon, Low-Power Types: 2N5415, 2N5415S, 2N5415UA, 2N5415U4, 2N5416, 2N5416S, 2N5416UA, and 2N5416U4
  • MIL MIL-S-19500/189B-1972 SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, GERMANIUM, LOW-POWER TYPES 2N1224 AND 2N1225 (SUPERSEDING MIL-S-19500/189A)
  • MIL MIL-PRF-19500/368L-2010 Semiconductor Device, Transistor, NPN, Silicon, Low-Power Types: 2N3439, 2N3439L, 2N3439UA, 2N3439U4, 2N3440, 2N3440L, 2N3440UA, AND 2N3440U4
  • MIL MIL-PRF-19500/485M-2010 Semiconductor Device, Transistor, PNP, Silicon, Low-Power Types: 2N5415, 2N5415S, 2N5415UA, 2N5415U4, 2N5416, 2N5416S, 2N5416UA, and 2N5416U4
  • MIL MIL-PRF-19500/368M-2013 Semiconductor Device, Transistor, NPN, Silicon, Low-Power Types: 2N3439, 2N3439L, 2N3439UA, 2N3439U4, 2N3440, 2N3440L, 2N3440UA, AND 2N3440U4
  • MIL MIL-PRF-19500/485N-2013 Semiconductor Device, Transistor, PNP, Silicon, Low-Power Types: 2N5415, 2N5415S, 2N5415UA, 2N5415U4, 2N5416, 2N5416S, 2N5416UA, and 2N5416U4
  • MIL MIL-S-19500/20C-1971 SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, ERMANIUM, LOW POWER TYPES 2N404 AND 2N40A (SUPERSEDING MIL-S-19500/20B)
  • MIL MIL-PRF-19500/368N-2019 Semiconductor Device, Transistor, NPN, Silicon, Low-Power Types: 2N3439, 2N3439L, 2N3439UA, 2N3439U4, 2N3440, 2N3440L, 2N3440UA, AND 2N3440U4
  • MIL MIL-DTL-13486F-2016 CABLE, SPECIAL PURPOSE, ELECTRICAL: LOW-TENSION, HEAVY-DUTY, SINGLE CONDUCTOR AND MULTIPLE CONDUCTOR, SHIELDED AND UNSHIELDED, GENERAL SPECIFICATION FOR (SUPERSEDING MIL-DTL-13486E)
  • MIL MIL-DTL-13486E-2006 CABLE, SPECIAL PURPOSE, ELECTRICAL: LOW-TENSION, HEAVY-DUTY, SINGLE CONDUCTOR AND MULTIPLE CONDUCTOR, SHIELDED AND UNSHIELDED, GENERAL SPECIFICATION FOR (SUPERSEDING MIL-DTL-13486D)
  • MIL MIL-S-19500/78C-1971 SEMICONDUCTOR DEVICE, TRANSISTOR PNP, SILICON, LOW-POWER TYPES 2N1025, 2N1026 AND 2N1469 (SUPERSEDING MIL-S-19500/78B)
  • MIL MIL-PRF-19500/301J-2007 Semiconductor Device, Transistor, NPN Silicon, Low-Power, Type 2N918 and 2N918UB, JAN, JANTX, JANTXV and JANS, JANHC, and JANKC
  • MIL MIL-PRF-19500/6C-1999 SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, GERMANIUM, LOW-POWER, TYPES 2N43AZ1, 2N43AZ2, 2N44AZ1 AND 2N44AZ2 (SUPERSEDING MIL-S-19500/6B)
  • MIL MIL-S-19500/2B-1968 SEMICONDUCTOR DEVICE, TRANSISTOR, NPN, SILICON, LOW-POWER TYPES 2N117, 2N118 AND 2N119 (SUPERSEDING MIL-S-19500/2A)
  • MIL MIL-S-19500/175C-1968 SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, GERMANIUM, LOW POWER TYPES 2N650A, 2N651A, AND 2N652A (SUPERSEDING MIL-S-19500/175B)

Defense Logistics Agency

The Directorate General of Specifications and Metrology (DGSM)

  • OS GSO 907:1997 Guide to the calculation of resistance of plain and coated copper conductors of low-frequency cables and wires
  • OS GSO IEC 60947-7-2:2014 Low-voltage switchgear and controlgear - Part 7-2: Ancillary equipment - Protective conductor terminal blocks for copper conductors

International Electrotechnical Commission (IEC)

  • IEC 60344:1971 Guide to the calculation of resistance of plain and coated copper conductors of low-frequency cables and wires
  • IEC 60344:1971/AMD2:1978 Amendment 2 - Guide to the calculation of resistance of plain and tinned copper conductors of low-frequency cables and wires
  • IEC 60344:1980/AMD1:1985 Amendment 1 - Guide to the calculation of resistance of plain and coated copper conductors of low-frequency cables and wires
  • IEC 60344:1971/AMD1:1973 Amendment 1 - Guide to the calculation of resistance of plain and coated copper conductors of low-frequency cables and wires
  • IEC TS 62818-2:2024 Conductors for overhead lines - Fiber reinforced composite core used as supporting member material - Part 2: Metallic matrix composite cores
  • IEC 60269-4:1974 Low-voltage fuses Part 4: Supplementary requirements for fuse-links for the protection of semiconductor devices
  • IEC 60269-4:1986 Low-voltage fuses. Part 4 : Supplementary requirements for fuse links for the protection of semiconductor devices
  • IEC 60269-4:2009/AMD1:2012 Low-voltage fuses - Part 4: Supplementary requirements for fuse-links for the protection of semiconductor devices
  • IEC 60269-4:2006 Low-voltage fuses - Part 4: Supplementary requirements for fuse-links for the protection of semiconductor devices
  • IEC 60269-4:2009 Low-voltage fuses - Part 4: Supplementary requirements for fuse-links for the protection of semiconductor devices
  • IEC 60269-4:2016 Low-voltage fuses - Part 4: Supplementary requirements for fuse-links for the protection of semiconductor devices

Institute of Interconnecting and Packaging Electronic Circuits (IPC)

Association Francaise de Normalisation

  • NF UTE C15-106:2003 Low-voltage and high-voltage electrical installations - Practical guide - Sections of protective conductors, earthing conductors and equipotential bonding conductors
  • FD ISO/TR 23304:2021 Food products - Guidance document on how to express the contents of vitamins and their vitamers
  • NF X60-406*NF EN 17975:2025 Maintenance - Risk control processes of energies and fluids risks in maintenance activities - Guidance
  • NF X60-318*NF EN 13269:2016 Maintenance - Guideline on preparation of maintenance contracts
  • NF X60-318:2006 Maintenance - Guideline on preparation of maintenance contracts.
  • NF EN 60947-7-2:2009 Low voltage switchgear - Part 7-2: accessory equipment - Protective conductor terminal blocks for copper conductors
  • NF EN 50540:2011 Overhead Line Conductors - Low Expansion Conductors (ACSS)
  • NF C60-200-4/A1*NF EN 60269-4/A1:2012 Low-voltage fuses - Part 4 : supplementary requirements for fuse-links for the protection of semiconductor deviceS
  • NF C60-200-4*NF EN 60269-4:2010 Low-voltage fuses - Part 4 : supplementary requirements for fuse-links for the protection of semiconductor devices

Society of Automotive Engineers (SAE)

German Institute for Standardization

  • DIN 58141-5:1993 Testing of fibre optic elements; determination of the rate of broken fibres of light and image conductors
  • DIN IEC 60344 E:2005 Draft Document - Guide to the calculation of resistance of plain and coated copper conductors of low-frequency cables and wires (IEC 46C/693/CD:2004)
  • DIN EN 13269:2006 Maintenance - Guideline on preparation of maintenance contracts; English version of DIN EN 13269:2006-10
  • DIN EN 13269 E:2015-06 Maintenance - Guideline on preparation of maintenance contracts
  • DIN EN 60269-4:2008 Low-voltage fuses - Part 4: Supplementary requirements for fuse-links for the protection of semiconductor devices (IEC 60269-4:2006); German version EN 60269-4:2007

Spanish Association for Standardization (UNE)

  • AENOR UNE 20623:1979 GUIDE FOR CALCULATION OF THE RESISTANCE OF BARE OR TINTED COPPER CONDUCTORS IN CABLES AND WIRE FOR LOW FREQUENCIES
  • UNE 20623:2003 Guide to the calculation of resistance of plain and coated copper conductors of low-frequency cables and wires.
  • UNE 81-004-1985 Insulating frame for conductor protection under low voltage lines
  • UNE 20 349 Conductor input plastic gland in low voltage electrical material packaging
  • UNE-EN 60947-7-2:2003 Low-voltage switchgear and controlgear -- Part 7-2: Ancillary equipment - Protective conductor terminal blocks for copper conductors
  • AENOR UNE-EN 60947-7-2:2010 Low-voltage switchgear and controlgear — Part 7-2: Ancillary equipment - Protective conductor terminal blocks for copper conductors
  • UNE-EN 60947-7-2:2010 Low-voltage switchgear and controlgear -- Part 7-2: Ancillary equipment - Protective conductor terminal blocks for copper conductors
  • AENOR UNE-EN 60269-4/A2:2011 Low-voltage fuses — Part 4: Supplementary requirements for fuse-links for the protection of semiconductor devices
  • UNE 20-109 Pt.2-1989 Low voltage control device. Contactors with semiconductors (static contactors)
  • UNE-EN 60269-4:2011 Low-voltage fuses -- Part 4: Supplementary requirements for fuse-links for the protection of semiconductor devices

Gosstandart of Russia

  • GOST 18250-1980 Medical apparatus and devices. Fiber lightguides. Connecting dimensions
  • GOST 31196.4-2012 Lov-voltage fuse-links. Part 4. Supplementary requirements for fuse-links for the protection of semiconductor devices
  • GOST IEC 60947-7-2-2016 Low-voltage switchgear and controlgear. Part 7-2. Ancillary equipment. Protective conductor terminal blocks for copper conductors
  • GOST 9992-1979 Kenaf low fiber. Specifications
  • GOST IEC 60269-4-2016 Low-voltage fuses. Part 4. Supplementary requirements for fuse-links for the protection semiconductor devices

Austrian Standards

  • ONORM B 2609-1997 Equipment for sports halls - Guidelines for planning, execution and maintenance
  • ONORM B 2610-1992 Equipment for sports halls - Guidelines for planning, execution and maintenance

Deutsche Vereinigung des Gas- und Wasserfachs

  • DVGW G 431:1960-05 DVGW Gas Storage Work Instructions: Low-pressure Gas Containers G 431

Canadian Standards Association (CSA)

Underwriters Laboratories (UL)

Australian/New Zealand Standard (AU-AS/NZS)

  • AS/NZS IEC 60947.7.2:2015 Protective conductor terminal blocks for copper conductors in auxiliary equipment for low-voltage switchgear and control equipment

GM Europe

South African Bureau of Standard

  • SANS 60947-7-2:2003 Low-voltage switchgear and controlgear Part 7-2: Ancillary equipment - Protective conductor terminal blocks for copper conductors
  • SANS 60947-7-2:2009 Low-voltage switchgear and controlgear Part 7-2: Ancillary equipment - Protective conductor terminal blocks for copper conductors
  • SANS 60269-4:2009 Low-voltage fuses Part 4: Supplementary requirements for fuse-links for the protection of semiconductor devices

Polski Komitet Normalizacyjny (PKN)

  • PN T90201-1974 General purpose telecommunications cables for permanent connections Fiber insulated assembly cables
  • PN T04803-1966 Low-power electronic tubes Methods of measurement of con- version transductance of grid- control tubes

British Standards Institution (BSI)

  • 04/30126715 DC IEC 60344 ED.3. Guide to the calculation of resistance of plain and coated copper conductors of low frequency cables and wires
  • BS EN 60947-7-2:1996 Specification for low-voltage switchgear and controlgear. Ancillary equipment-Protective conductor terminal blocks for copper conductors
  • BS 9350:1976 Rules for the preparation of detail specifications for semiconductor devices of assessed quality: low noise, low power microwave transistors
  • BS EN 60269-4:2009+A2:2016 Low-voltage fuses. Supplementary requirements for fuse-links for the protection of semiconductor devices
  • BS EN 60269-4:2010 Low-voltage fuses. Supplementary requirements for fuse-links for the protection of semiconductor devices
  • BS EN 60269-4:2009+A1:2012 Low-voltage fuses. Supplementary requirements for fuse-links for the protection of semiconductor devices
  • BS EN 60269-4:2009 Low-voltage fuses - Supplementary requirements for fuse-links for the protection of semiconductor devices
  • BS PD IEC/TR 60344:2007 Calculation of d.c. resistance of plain and coated copper conductors of low-frequency cables and wires. Application guide
  • BS EN 60269-4:2007 Low-voltage fuses - Supplementary requirements for fuse-links for the protection of semiconductor devices
  • BS EN 60269-4:1996 Low-voltage fuses - Supplementary requirements for fuse-links for the protection of semiconductor devices
  • BS EN 60749-2:2002 Semiconductor devices - Mechanical and climatic test methods - Low air pressure
  • BS EN IEC 60269-4:2025 Low-voltage fuses - Supplementary requirements for fuse-links for the protection of semiconductor devices
  • PD IEC/TR 60344:2007 Calculation of d.c. resistance of plain and coated copper conductors of low-frequency cables and wires. Application guide
  • BS 5424-2:1987 Low-voltage controlgear - Specification for semiconductor contactors (solid state contactors)
  • BS 3532:1962 Specification for unsaturated polyester resin systems for low pressure fibre reinforced plastics

Det Norske Veritas (DNV)

  • DNV-CP-0409-2021 Terminal connectors (for aluminum conductors of low voltage power cables)

Compressed Gas Association (U.S.)

  • CGA M-1.1-2019 Training on central supply systems for medical gases and cryogenic liquids
  • CGA P-30-2007 PORTABLE CRYOGENIC LIQUID CONTAINERS- USE, CARE, AND DISPOSAL SECOND EDITION

Portuguese Institute of Quality

  • NP 3664-1988 Low voltage equipment. Terminal cross-section requirements for connecting conductors

Swedish Institute for Standards

Danish Standards Foundation

  • DANSK DS/IEC/TR 60344:2007 Calculation of d.c. resistance of plain and coated copper conductors of low-frequency cables and wires - Application guide
  • DANSK DS/IEC TR 60344/COR1:2022 Calculation of dc resistance of plain and coated copper conductors of low-frequency cables and wires – Application guide
  • DANSK DS/EN 60947-7-2:2009 Low-voltage switchgear and controlgear - Part 7-2: Ancillary equipment - Protective conductor terminal blocks for copper conductors
  • DS/EN 60947-7-2:2009 Low-voltage switchgear and controlgear - Part 7-2: Ancillary equipment - Protective conductor terminal blocks for copper conductors

Belgian Standards Institute

  • NBN C 63-158-2-1989 Low-voltage controlgear Semiconductor contactors (solid state contactors)

International Telecommunication Union (ITU)

  • ITU-T M.70-1984 Guiding principles on the general maintenance organization for telephone-type international circuits
  • ITU-T M.70-1976 Guiding principles on the general maintenance organization for telephone-type international circuits

European Committee for Standardization (CEN)

  • EN 13269:2016 Maintenance - Guideline on preparation of maintenance contracts

Standard Association of Australia (SAA)

  • AS 3947.7.2:1996 Low-voltage switchgear and controlgear Part 7.2: Ancillary equipment - Protective conductor terminal blocks for copper conductors
  • AS 60947.7.2:2004 Low-voltage switchgear and controlgear - Ancillary equipment - Protective conductor terminal blocks for copper conductors
  • AS 60269.4.0:2005 Low-voltage fuses - Supplementary requirements for fuse-links for the protection of semiconductor devices

GCC Standardization Organization

  • GSO IEC 60947-7-2:2014 Low-voltage switchgear and controlgear - Part 7-2: Ancillary equipment - Protective conductor terminal blocks for copper conductors
  • GSO 907:1997 Guide to the calculation of resistance of plain and coated copper conductors of low-frequency cables and wires

Radio Technical Commission for Aeronautics

  • RTCA DO-152-1972 MINIMUM OPERATIONAL CHARACTERISTICS VERTICAL GUIDANCE EQUIPMENT USED IN AIRBORNE VOLUMETRIC NAVIGATION SYSTEMS

Comitato Elettrotecnico Italiano

  • CEI EN 60947-7-2:2010 Low-voltage switchgear and controlgear Part 7-2: Ancillary equipment - Protective conductor terminal blocks for copper conductors
  • CEI EN 60269-4/A2:2016 Low-voltage fuses Part 4: Supplementary requirements for fuse-links for the protection of semiconductor devices
  • CEI EN 60269-4:2016 Low-voltage fuses Part 4: Supplementary requirements for fuse-links for the protection of semiconductor devices

Yugoslav Association for Standardization

  • JUS N.C0.056-1985 Electrical povverand lighting\ Testing of insulatedconductors andcables. Elasticity atlow temperatures

American Society for Testing and Materials (ASTM)

  • ASTM B976-11 Standard Specification for Fiber Reinforced Aluminum Matrix Composite (AMC) Core Wire for Aluminum Conductors, Composite Reinforced (ACCR)

Japanese Industrial Standards Committee (JISC)

Ente Nazionale Italiano di Unificazione

  • UNI ISO 6722-3:1992 Road vehicles. Unshielded low voltage cables. Conductor cross-sections and dimensions

American National Standards Institute (ANSI)

  • ANSI/UL 60947-7-2-2011 Low-Voltage Switchgear and Controlgear - Part 7-2: Ancillary Equipment - Protective Conductor Terminal Blocks for Copper Conductors
  • ANSI/UL 248-13-2005 Standard for Safety for Low-Voltage Fuses – Part 13: Semiconductor Fuses

The Japan Electrical Manufacturers' Association

  • JEM 1122-2011 Conductors for low-voltage circuits of switchgear and controlgear assemblies

Thai Industrial Standards Institute (TISI)

  • TIS 2114-2002 Low.voltage fuses.part 4: supplementary requirements for fuse.links for the protection of semiconductor devices

Korean Agency for Technology and Standards (KATS)

  • KS C IEC 60269-4:2005 Low-voltage fuses - Part 4: Supplementary requirementsfor fuse-links for the protection of semiconductor devices
  • KS C IEC 60269-4-2023 Low voltage fuses Part 4: Supplementary requirements for fuse links for protection of semiconductor devices

Engineering Sciences Data Unit (ESDU)

  • ESDU 99005 A-2003 Thermal conductivity@ viscosity@ isobaric specific heat capacity and Prandtl number of gases at low pressure: inorganic gases.