SJ/T 11586-2016 in English

This standard provides a methodology for conducting total dose irradiation tests on semiconductor devices using low-energy X-rays with an energy level of 10KeV. It outlines the procedures, equipment requirements, and test conditions necessary to assess the impact of radiation on the performance and reliability of semiconductor components. The standard specifies the irradiation process, measurement techniques, and data analysis methods to ensure consistency and reproducibility in testing. It also defines the parameters and conditions under which the tests should be performed to obtain reliable results. The document serves as a reference for manufacturers, researchers, and testing laboratories involved in the evaluation of semiconductor devices exposed to radiation environments.