Circuit Test Method

Circuit Test Method, Total:24 items.

The international standard classification for "Circuit Test Method" includes: Semiconductor devices in general , Integrated circuits. Microelectronics .

The Chinese standard classification for "Circuit Test Method" includes: Technical management , Microcircuit in general , Semiconductor integrated circuit .

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Professional Standard - Aerospace

• QJ 257-1977 Semiconductor TTL Integrated Digital Circuit Testing Method
• QJ/Z 33-1977 Field effect digital integration (P-MOS) circuit test method
• QJ 260-1977 器件

Professional Standard - Electron

• SJ/T 10741-1996 Semiconductor integrated circuits--General principles of measuring methods for CMOS circuits
• SJ/T 10735-1996 Semiconductor integrated circuits General principles of measuring methods for TTL circuits
• SJ/T 10736-1996 Semiconductor integrated circuits - General principles of measuring methods for HTL circuits
• SJ/T 10741-2000 Semiconductor integrated circuits General principles of measuring methods for CMOS circuits
• SJ/T 10402-1993 General principles of measuring methods for automatic music selectors of semiconductor audio integrated circuits
• SJ/T 10401-1993 General principles of measuring methods for motor speed stablizers of semiconductor audio integrated circuits
• SJ/T 10400-1993 General principles of measuring methods for graphic equalizers of semiconductor audio integrated circuits
• SJ 20938-2005 Microwave circuits - Measuring methods for frequency converters
• SJ/T 10737-1996 Semiconductor integrated circuits - General principles of measuring methods for ECL circuits
• SJ/T 10803-1996 Semiconductor integrated circuits used as interface circuits - General principles of measuring methods for line circuits

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

• GB 35007-2018 Semiconductor integrated circuit low voltage differential signal circuit testing method
• GB/T 42838-2023 Semiconductor integrated circuits—Measuring method of Holzer circuit
• GB/T 14030-1992 principles of measuring methods of timer circuits for semiconductor integrated circuits
• GB/T 42970-2023 Semiconductor integrated circuits—Measuring methods of video encoder and decoder circuits
• GB/T 15136-1994 General principles of measuring methods for quartz clock and watch circuits of semiconductor integrated circuits

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

• GB/T 35007-2018 Semiconductor integrated circuits—Measuring method of low voltage differential signaling circuitry

SCC

• AENOR UNE 20621-2/2C:1985 Printed circuits. Test methods.
• AENOR UNE 20621-2:1980 Printed circuits. Test methods.
• AENOR UNE 20621-2/1C:1982 Printed circuits. Test methods. Essays 3c, 10c, 14a and 20a.

CZ-CSN

• CSN 35 9004 Z1-1998 Circuit board. Test Methods
• CSN 35 9004 ZZ2-2000 Circuit board. Test Methods

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