GB/T 35006-2018 in English

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Standard No:	GB/T 35006-2018
Document status:	VALID
Title in English:	Semiconductor integrated circuits—Measuring method of level converter
Title in Chinese:	半导体集成电路电平转换器测试方法
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 5 business days
Issued on:	2018-03-15
Implemented on:	2018-08-01
ICS Classification:	31.200-Integrated circuits. Microelectronics
Chinese Classification:	L56-Semiconductor integrated circuit
Professional Classification:	GB-National Standard
Related Keywords:	level converter level converter method circuits
Related Topics:	converter test Integration Test Trials new semiconductor integration Semiconductor Test Technology Integrated Circuit Testing Principles and Methods Modern IC Testing Technology Gas phase method transfer GBT35006 GB/T 35006-2018 Semiconductor integrated circuit driving test method Test method for semiconductor integrated circuit driver Rigid body current collector Semi-dry short circuit dds conductivity measurement circuit Level converter test national standard number Semiconductor integrated circuit chip general Integrated circuit flatness Overseas integrated circuit testing Liquid replacement method of solid moisture testing instrument Integrated circuit testing related Transfer Conductance Test Method Methods for identifying transformation combined with transduction

《GB/T 35006-2018半导体集成电路电平转换器测试方法》由TC599（全国集成电路标准化技术委员会）归口，主管部门为工业和信息化部（电子）。

More samples: QC/T 942-2021 JC/T 2453-2018 JGJ 94-2008

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