GB/T 36477-2018 in English

VALID

Semiconductor integrated circuit—Measuring methods for flash memory

Issued on:2018-06-07
Implemented on:2019-01-01
File Format:PDF
Delivery:Via email within 1~3 business days

Price(USD)： $250.00
$243.00

Standard No:	GB/T 36477-2018
Document status:	VALID
Title in English:	Semiconductor integrated circuit—Measuring methods for flash memory
Title in Chinese:	半导体集成电路快闪存储器测试方法
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 1~3 business days
Issued on:	2018-06-07
Implemented on:	2019-01-01
ICS Classification:	31.200-Integrated circuits. Microelectronics
Chinese Classification:	L56-Semiconductor integrated circuit
Professional Classification:	GB-National Standard
Related Keywords:	flash memory flash memory scopethis standard memory cell functions circuit measuring methods memory
Related Topics:	memory testing machine Integration Test Trials semiconductor integrated circuit fast+ flash test memory circuit Ways to Speed Up Testing memory voltage flash new semiconductor integration Semiconductor Test Technology Integrated Circuit Testing Principles and Methods Modern IC Testing Technology flash GBT36477 GB/T 36477-2018 Semiconductor integrated circuit driving test method Test method for semiconductor integrated circuit driver integrated circuit ferroelectric memory Rigid body current collector dds conductivity measurement circuit Memory function test Semiconductor integrated circuit chip general Semiconductor memory country-related How to store mercury Overseas integrated circuit testing Integrated circuit testing related . Platinum electrode storage method How to store sodium How to store conductivity meter electrodes gb/t 36477-2018

《GB/T 36477-2018半导体集成电路快闪存储器测试方法》由TC599（全国集成电路标准化技术委员会）归口，主管部门为工业和信息化部（电子）。

Scope

This standard specifies the basic methods for testing electrical parameters, time parameters and memory cell functions of semiconductor integrated circuit flash memory. This standard applies to the testing of electrical parameters, time parameters and memory cell functions of flash memory in the field of semiconductor integrated circuits.

More samples: GB 18306-2015 QC/T 942-2021 DL/T 5154-2012

Sample only — not a preview of GB/T 36477-2018

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