GB/T 42839-2023 in English
VALIDSemiconductor integrated circuits—Analog digital (AD) converter
- Issued on:2023-08-06
- Implemented on:2023-12-01
- File Format:PDF
- Delivery:Via email within 5 business days
$476.00
《GB/T 42839-2023半导体集成电路 模拟数字（AD）转换器》由TC599（全国集成电路标准化技术委员会）归口，主管部门为工业和信息化部（电子）。
Introduction
Analysis of the core content of the standard
| Technical dimensions | Standard requirements | Industry significance |
|---|---|---|
| Temperature classification | Class A (0-70℃) to Class F (wider range) | Clearly define the applicable boundaries of industrial/military-grade devices |
| Static characteristics | DNL/INL≤±0.9LSB | Guarantee high-precision system linearity |
| Dynamic characteristics | ENOB≥12bit@100MSPS | Meet the sampling needs of 5G communications |
Analysis of ADC technology evolution
The standard for the first time includes Σ-Δ modulation type and pipeline type ADC into the specification, reflecting the technological breakthroughs of domestic chips in the field of high speed and high precision.
- Σ-Δ type: 24bit+ resolution achieved through oversampling and noise shaping
- Pipeline type: Multi-stage sub-ADC is used to achieve sampling rate above 1GSPS
Key test methods
Dynamic characteristics test case
Standard 6.3.2 stipulates that FFT spectrum analysis method is used to measure ENOB:
- Input -0.5dBFS sinusoidal signal
- Collect 8192 points of conversion data
- Calculate SINAD=1.76+6.02×ENOB
Quality inspection system
Three types of quality assessment requirements:
| Category | Aging time | ESD requirements |
|---|---|---|
| Class I | 168h | 2kV HBM |
| Class III | 4000h | 4kV HBM |
Implementation suggestions
- Medical equipment should give priority to Σ-Δ type ADC to ensure signal-to-noise ratio
- Military systems must pass the 240h aging screening in Clause 7.8
- During dynamic testing, pay attention to the clock jitter should be <1ps RMS
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