jedec standard digital integrated circuit

jedec standard digital integrated circuit, Total:303 items.

The international standard classification for "jedec standard digital integrated circuit" includes: Electricity. Magnetism. Electrical and magnetic measurements , Integrated circuits. Microelectronics , Electromechanical components for electronic and telecommunications equipment , Aerospace electric equipment and systems .

The Chinese standard classification for "jedec standard digital integrated circuit" includes: Radio Measurement , Microcircuit in general , Semiconductor integrated circuit , Technical management , Electronic components .

National Metrological Verification Regulations of the People's Republic of China

JJG(船舶) 22-1998 SID Large-Scale Digital Integrated Circuit Test System Verification Regulations
JJG(电子) 31009-2007 Verification rules for digital integrated circuit parameter transfer standard set
JJG(电子) 31008-2006 Standard verification practice of parameters of hybrid integrated circuit
JJG(电子) 04035-1989 GR1732M digital integrated circuit test system verification regulations
JJG 1015-2006 Verification Regulation of General Digital Integrated Circuit Testing System

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 42848-2023 Semiconductor intergrated circuits—Test method of direct digital frequency synthesizer
GB/T 17574.20-2006 Semiconductor devices - Integrated circuits - Part 2-20: Digital integrated circuits - Family specification - Low voltage integrated circuits
GB/T 17024-1997 Semiconductor devices Integrated circuits Part2:Digital integrated circuits Section three—Blank detail specification for HCMOS digital integrated circuits series 54/74HC,54/74HCT,54/74HCU
GB/T 17574.10-2003 Semiconductor devices—Integrated circuits—Part 2-10:Digital integrated circuits—Blank detail specification of integrated circuit dynamic read/write memories
GB/T 42973-2023 Semiconductor integrated circuits—Digital-analog（DA）converter
GB/T 17023-1997 Semiconductor devices Integrated circuits - Part 2: Digital integrated circuits Section two - Family specification for HCMOS digital integrated circuits series 54/74HC, 54/74HCT, 54/74
GB/T 5965-2000 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section one - Blank detail specification for bipolar monolithic digital integrated circuit gates (exc
GB/T 17574.11-2006 Semiconductor devices - Integrated circuits - Part 2-11: Digital integrated circuits - Blank detail specification for single supply integrated circuit electrically erasable and programmable read-only memory
GB/T 42839-2023 Semiconductor integrated circuits—Analog digital (AD) converter
GB/T 9424-1998 Semiconductor devices --Integrated circuits --Part 2:Digital integrated circuits --Section five --Blank detail specification for complementary MOS digital integrated circuits，series 4 0
GB/T 17574-1998 Semiconductor devices --Integrated circuits Part 2:Digital integrated circuits
GB/T 17572-1998 Semiconductor devices--Integrated circuits Part 2:Digital integrated circuits Section four--Family specification for complementary MOS digital integrated circuits,series 4 000B and 4 000UB

Military Standard of the People's Republic of China-General Armament Department

GJB/Z 42.2-1993 Military microcircuit series type spectrum semiconductor integrated circuit digital integrated circuit
GJB 9388-2018 Test methods for integrated circuit analog-to-digital and digital-to-analog converters
GJB/J 3524-1999 Calibration regulations for S10 large-scale digital integrated circuit test system

National Metrological Technical Specifications of the People's Republic of China

JJF 1160-2006 Calibration Specification of Small & Medium Scale Digital Integrated Circuit Testing System

Professional Standard - Electron

SJ/T 10196-1991 Measuring methods of MSI and SSI digital IC static parameter testers
SJ 2483-1984 Series and types of A/D converters for hybrid integrated circuits
SJ/T 9534-1993 Grading standard of quality for semiconductor integrated circuits
SJ 20802-2001 Visual inspection criteria for integrated circuits metal packages
SJ 2482-1984 Series and types of D/A converters for hybrid integrated circuits
SJ/T 10734-1996 Letter symbols for semiconductor integrated circuits - Letter symbols for electrical parameters

Professional Standard - Aerospace

QJ 257-1977 Semiconductor TTL Integrated Digital Circuit Testing Method
QJ 2875-1997 Detailed Specification for CMOS Digital Gate Array of Semiconductor Integrated Circuit
QJ/Z 33-1977 Field effect digital integration (P-MOS) circuit test method

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 35004-2018 Logic digital integrated circuits—Specification for I/O interface model for integrated circuit

British Standards Institution (BSI)

BS IEC 60748-2:1997 Semiconductor devices - Integrated circuits - Digital integrated circuits
BS IEC 60748-2:1998 Semiconductor devices. Integrated circuits. Digital integrated circuits
BS IEC 60748-4-3:2007 Semiconductor devices - Integrated circuits - Interface integrated circuits - Dynamic criteria for analogue-digital converters (ADC)
BS IEC 60748-2-20:2008 Semiconductor devices - Integrated circuits - Digital integrated circuits - Family specification - Low voltage integrated circuits
BS IEC 60748-2-11:1999 Semiconductor devices - Integrated circuits - Digital integrated circuits - Blank detail specification for single supply integrated circuit, electrically erasable, and programmable read-only memory - Blank detail specification for single supply integrated
BS IEC 60748-4-3:2006 Semiconductor devices. Integrated circuits - Interface integrated circuits. Dynamic criteria for analogue-digital converters (ADC)
DD IEC/TS 62404:2007 Logic digital integrated circuits. Specification for I/O interface model for integrated circuit (IMIC version 1.3)
BS DD IEC/TS 62404:2007 Logic digital integrated circuits - Specification for I/O interface model for integrated circuit (IMIC version 1.3)
BS IEC 60748-2-12:2001 Semiconductor devices. Integrated circuits. Digital integrated circuits. Blank detail specification for programmable logic devices (PLDs)
PD IEC/TR 63072-1:2017 Photonic integrated circuits. Introduction and roadmap for standardization
BS QC 790107:1995 Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Digital integrated circuits. Blank detail specification. Integrated circuit dynamic read/write memories
BS IEC 63011-1:2018 Integrated circuits. Three dimensional integrated circuits - Terminology
BS EN 165000-5:1998 Film and hybrid integrated circuits - Procedure for qualification approval

ES-UNE

UNE-EN 190116:1993 FS: AC MOS DIGITAL INTEGRATED CIRCUITS. (Endorsed by AENOR in September of 1996.)
UNE-EN 190100:1993 SS: DIGITAL MONOLITHIC INTEGRATED CIRCUITS. (Endorsed by AENOR in December of 1996.)
UNE-EN 190110:1994 BDS: DIGITAL MICROPROCESSOR INTEGRATED CIRCUITS. (Endorsed by AENOR in November of 1996.)
UNE-EN 190107:1994 FS: TTL FAST DIGITAL INTEGRATED CIRCUITS. SERIES 54F, 74F. (Endorsed by AENOR in September of 1996.)
UNE-EN 190109:1994 FS: DIGITAL INTEGRATED HC MOS CIRCUITS. SERIES HC/HCT/HCU. (Endorsed by AENOR in September of 1996.)
UNE-EN 190101:1994 FS: DIGITAL INTEGRATED TTL CIRCUITS. SERIES 54, 64, 74, 84, (Endorsed by AENOR in September of 1996.)
UNE-EN 190108:1994 FS: TTL ADVANCED SCHOTTKY DIGITAL INTEGRATED CIRCUITS. SERIES 54AS, 74AS. (Endorsed by AENOR in September of 1996.)
UNE-EN 190102:1994 FS: TTL-SCHOTTKY DIGITAL INTEGRATED CIRCUITS. SERIES 54S, 64S, 74S, 84S. (Endorsed by AENOR in September of 1996.)
UNE-EN 190106:1994 FS: TTL-ADVANCED LOW POWER SCHOTTKY DIGITAL INTEGRATED CIRCUITS. SERIES 54ALS, 74ALS. (Endorsed by AENOR in September of 1996.)

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association

JEDEC JESD8C-2006 Interface Standard for Nominal 3 V/3.3 V Supply Digital Integrated Circuits
JEDEC JESD8-4-1993 Center-Tap-Terminated (CTT) Low-Level, High- Speed Interface Standard for Digital Integrated Circuits
JEDEC JESD8-3A-2007 Gunning Transceiver Logic (GTL) Low-Level, High Speed Interface Standard for Digital Integrated Circuits
JEDEC JESD8-3-1993 Gunning Transceiver Logic (GTL) Low-Level, High-Speed Interface Standard for Digital Integrated Circuits Errata - December 1994
JEDEC JESD12-6-1991 Interface Standard for Semicustom Integrated Circuits
JEDEC JESD8C.01-2007 Interface Standard for Nominal 3 V/3.3 V Supply Digital Integrated Circuits (Minor Revision of JESD8C, June 2006)
JEDEC JESD12-2-1986 Standard for Cell-Based Integrated Circuit Benchmark Set
JEDEC JESD8-6-1995 High Speed Transceiver Logic (HSTL) A 1.5V Output Buffer Supply Voltage Based Interface Standard for Digital Integrated Circuits
JEDEC JESD8-12A.01-2007 1.2 V +/- 0.1V (Normal Range) and 0.8 - 1.3 V (Wide Range) Power Supply Voltage and Interface Standard for Nonterminated Digital Integrated Circuits
JEDEC JESD8-11A-2005 1.5 V +/- 0.1 V (Normal Range) and 0.9 V 1.6 V (Wide Range) Power Supply Voltage and Interface Standard for Nonterminated Digital integrated Circuits
JEDEC JESD8-5A-2006 2.5 V (PLUS OR MINUS) 0.2 V (Normal Range) and 1.8 V ?2.7 V (Wide Range) Power Supply Voltage and Interface Standard for Nonterminated Digital Integrated Circuits
JEDEC JESD8-7A-2006 1.8 V (PLUS OR MINUS) 0.15 V (Normal Range), and 1.2 - 1.95 V (Wide Range) Power Supply Voltage and Interface Standard for Non-Terminated Digital Integrated Circuit

GSO

GSO IEC 60748-2-5:2014 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section 5: Blank detail specification for complementary MOS digital integrated circuits (series 4000 B and 4000 UB)
OS GSO IEC 60748-2:2014 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits
BH GSO IEC 60748-2:2016 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits
GSO IEC 60748-2:2014 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits
GSO IEC 60748-2-4:2014 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section 4: Family specification for complementary MOS digital integrated circuits, series 4000 B and 4000 UB
GSO IEC 60748-2-20:2014 Semiconductor devices - Integrated circuits - Part 2-20: Digital integrated circuits - Family specification - Low voltage integrated circuits
OS GSO IEC 60748-2-20:2014 Semiconductor devices - Integrated circuits - Part 2-20: Digital integrated circuits - Family specification - Low voltage integrated circuits
GSO IEC 60748-2-8:2014 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section 8t: Blank detail specification for integrated circuit static read/write memories
GSO IEC 60748-2-6:2014 Semiconductor devices. Integrated circuits - Part 2: Digital integrated circuits - Section 6: Blank detail specification for microprocessor integrated circuits
BH GSO IEC 60748-2-4:2016 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section 4: Family specification for complementary MOS digital integrated circuits, series 4000 B and 4000 UB
OS GSO IEC 60748-2-4:2014 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section 4: Family specification for complementary MOS digital integrated circuits, series 4000 B and 4000 UB
GSO IEC 60748-2-3:2014 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section three: Blank detail specification for HCMOS digital integrated circuits (series 54/74 HC, 54/74 HCT, 54/74 HCU)
OS GSO IEC/TS 62404:2014 Logic digital integrated circuits - Specification for I/O interface model for integrated circuit (IMIC version 1.3)
GSO IEC 60748-2-10:2014 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section 10: Blank detail specification for integrated circuit dynamic read/write memories
OS GSO IEC 60748-2-2:2014 Semiconductor devices. Integrated circuits - Part 2: Digital integrated circuits - Section two: Family specification for HCMOS digital integrated circuits, series 54/74 HC, 54/74 HCT, 54/74 HCU
BH GSO IEC 60748-2-2:2016 Semiconductor devices. Integrated circuits - Part 2: Digital integrated circuits - Section two: Family specification for HCMOS digital integrated circuits, series 54/74 HC, 54/74 HCT, 54/74 HCU
GSO IEC 60748-2-2:2014 Semiconductor devices. Integrated circuits - Part 2: Digital integrated circuits - Section two: Family specification for HCMOS digital integrated circuits, series 54/74 HC, 54/74 HCT, 54/74 HCU
GSO IEC 60748-2-1:2014 Semiconductor devices - Integrated circuits - Part 2-1: Digital integrated circuits - Blank detail specification for bipolar monolithic digital integrated circuit gates (excluding uncommitted logic arrays)
OS GSO IEC 60748-2-5:2014 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section 5: Blank detail specification for complementary MOS digital integrated circuits (series 4000 B and 4000 UB)
BH GSO IEC 60748-2-5:2016 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section 5: Blank detail specification for complementary MOS digital integrated circuits (series 4000 B and 4000 UB)
GSO IEC 60748-2-7:2014 Semiconductor devices. Integrated circuits - Part 2: Digital integrated circuits - Section7: Blank detail specification for integrated circuit fusible-link programmable bipolar read-only memories
BH GSO IEC 60748-2-1:2016 Semiconductor devices - Integrated circuits - Part 2-1: Digital integrated circuits - Blank detail specification for bipolar monolithic digital integrated circuit gates (excluding uncommitted logic arrays)
BH GSO IEC 60748-2-6:2016 Semiconductor devices. Integrated circuits - Part 2: Digital integrated circuits - Section 6: Blank detail specification for microprocessor integrated circuits
GSO IEC/TS 62404:2014 Logic digital integrated circuits - Specification for I/O interface model for integrated circuit (IMIC version 1.3)
OS GSO IEC 60748-2-1:2014 Semiconductor devices - Integrated circuits - Part 2-1: Digital integrated circuits - Blank detail specification for bipolar monolithic digital integrated circuit gates (excluding uncommitted logic arrays)
OS GSO IEC 60748-2-3:2014 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section three: Blank detail specification for HCMOS digital integrated circuits (series 54/74 HC, 54/74 HCT, 54/74 HCU)
OS GSO IEC 60748-2-6:2014 Semiconductor devices. Integrated circuits - Part 2: Digital integrated circuits - Section 6: Blank detail specification for microprocessor integrated circuits
BH GSO IEC 60748-2-3:2016 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section three: Blank detail specification for HCMOS digital integrated circuits (series 54/74 HC, 54/74 HCT, 54/74 HCU)
GSO IEC 60748-2-11:2014 Semiconductor devices - Integrated circuits - Part 2-11: Digital integrated circuits - Blank detail specification for single supply integrated circuit, electrically erasable, and programmable read-only memory
GSO IEC 60748-4-3:2014 Semiconductor devices - Integrated circuits - Part 4-3: Interface integrated circuits - Dynamic criteria for analogue-digital converters (ADC)
OS GSO IEC 60748-4-3:2014 Semiconductor devices - Integrated circuits - Part 4-3: Interface integrated circuits - Dynamic criteria for analogue-digital converters (ADC)
BH GSO IEC 60748-4-3:2016 Semiconductor devices - Integrated circuits - Part 4-3: Interface integrated circuits - Dynamic criteria for analogue-digital converters (ADC)
OS GSO IEC 60748-2-10:2014 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section 10: Blank detail specification for integrated circuit dynamic read/write memories
BH GSO IEC 60748-2-10:2016 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section 10: Blank detail specification for integrated circuit dynamic read/write memories
BH GSO IEC 60748-2-8:2016 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section 8t: Blank detail specification for integrated circuit static read/write memories
OS GSO IEC 60748-2-8:2014 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section 8t: Blank detail specification for integrated circuit static read/write memories
GSO IEC 60748-2-12:2014 Semiconductor devices - Integrated circuits - part2-12: Digital integrated circuits - Blank detail specification for programmable logic devices (PLDs)
BH GSO IEC 60748-2-11:2016 Semiconductor devices - Integrated circuits - Part 2-11: Digital integrated circuits - Blank detail specification for single supply integrated circuit, electrically erasable, and programmable read-only memory
OS GSO IEC 60748-2-11:2014 Semiconductor devices - Integrated circuits - Part 2-11: Digital integrated circuits - Blank detail specification for single supply integrated circuit, electrically erasable, and programmable read-only memory
OS GSO IEC 60748-2-7:2014 Semiconductor devices. Integrated circuits - Part 2: Digital integrated circuits - Section7: Blank detail specification for integrated circuit fusible-link programmable bipolar read-only memories
OS GSO IEC 60748-2-12:2014 Semiconductor devices - Integrated circuits - part2-12: Digital integrated circuits - Blank detail specification for programmable logic devices (PLDs)

SCC

BS IEC 60748-2-20:2000 Semiconductor devices. Integrated circuits. Digital integrated circuits-Family specification. Low voltage integrated circuits
BS 6493-2-2.2:1986 Semiconductor devices. Integrated circuits-Recommendations for digital integrated circuits
IEC 60748-2:1985/AMD2:1993 Amendment 2 - Semiconductor devices. Integrated circuits. Part 2: Digital integrated circuits
DANSK DS/EN 190116:2016 Family Specification: AC MOS Digital integrated circuits
IEC 60748-2:1985/AMD1:1991 Amendment 1 - Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits
DANSK DS/EN 190100:2016 Sectional Specification: Digital monolithic integrated circuits
06/30153491 DC EN 60748-2-20. Semiconductor devices. Integrated circuits. Part 2-20. Digital integrated circuits. Family specification. Low voltage integrated circuits
DANSK DS/IEC 748-2-6:1993 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section six: Blank detail specification for microprocessor integrated circuits
MIL MIL-I-48634-1986 INTEGRATED CIRCUIT, DIGITAL, CMOS LOGIC ARRAY MONOLITHIC SILICON
DANSK DS/EN 190110:2016 Blank Detail Specification: Digital microprocessor integrated circuits
DANSK DS/EN 190107:2016 Family Specification: TTL FAST digital integrated circuits – Series 54F, 74F
BS PD IEC/TR 63072-1:2017 Photonic integrated circuits-Introduction and roadmap for standardization
DANSK DS/EN 190109:2016 Family Specification: Digital integrated HC MOS circuits – Series HC/HCT/HCU
MIL MIL-I-48632-1986 INTEGRATED CIRCUIT, DIGITAL, CMOS CONTROL AND TIMING BASE, MONOLITHIC, SILICON
DANSK DS/EN 190101:2016 Family Specification: Digital integrated TTL circuits – Series 54, 64, 74, 84

Korean Agency for Technology and Standards (KATS)

KS C IEC 60748-2-3-2002(2022) Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits－Section 3：Blank detail specification for HCMOS digital integrated circuits(series 54/74 HC, 54/74 HCT, 54/74 HCU)
KS C IEC 60748-2-2001(2021) Semiconductor devices－integrated circuits－Part 2：Digital integrated circuits
KS C IEC 60748-2:2001 Semiconductor devices－integrated circuits－Part 2：Digital integrated circuits
KS C IEC 60748-2-2001(2016) Semiconductor devices－integrated circuits－Part 2：Digital integrated circuits
KS C IEC 60748-2-2021 Semiconductor devices－integrated circuits－Part 2：Digital integrated circuits
KS C IEC 60748-2-4-2002(2017) Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits－Section 4：Family specification for complementary MOS digital integrated circuits, series 4 000 B and 4 000 UB
KS C IEC 60748-2-20:2002 Semiconductor devices－Integrated circuits－Part 2－20：Digital integrated circuits－Family specification－Low voltage integrated circuits
KS C IEC 60748-2-20:2021 Semiconductor devices — Integrated circuits — Part 2-20: Digital integrated circuits — Family specification — Low voltage integrated circuits
KS C IEC 60748-2-12-2002(2017) Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits－Section 12：Digital integrated circuits－Blank detail specification for programmable logic devices(PLDs)
KS C IEC 60748-2-2-2003(2019) Semiconductor devices — Integrated circuits — Part 2: Digital integrated circuits — Section 2: Family specification for HCMOS digital integrated circuits, series 54/74 HC, 54/74 HCT, 54/74 HCU
KS C IEC 60748-2-2:2003 Semiconductor devices-Integrated circuits-Part 2:Digital integrated circuits-Section 2:Family specification for HCMOS digital integrated circuits, series 54/74 HC, 54/74 HCT, 54/74 HCU
KS C IEC 60748-2-4-2002(2022) Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits－Section 4：Family specification for complementary MOS digital integrated circuits, series 4 000 B and 4 000 UB
KS C IEC 60748-2-7:2002 Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits Section 7：Blank detail specification for integrated circuits fusible－link programmable bipolar read－only memories
KS C IEC 60748-2-5-2002(2017) Semiconductor devices－Integrated circuits Part 2：Digital integrated circuits Section 5－Blank detail specification for complementary MOS digital integrated circuits(series 4 000B and 4 000UB)
KS C IEC 60748-2-12-2022 Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits－Section 12：Digital integrated circuits－Blank detail specification for programmable logic devices(PLDs)
KS C IEC 60748-2-12-2002(2022) Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits－Section 12：Digital integrated circuits－Blank detail specification for programmable logic devices(PLDs)
KS C 5113-2002 MEASURING METHODS FOR MOS DIGITAL INTEGRATED CIRCUITS
KS C 5113-1983 MEASURING METHODS FOR MOS DIGITAL INTEGRATED CIRCUITS
KS C 5113-1983(1998) MEASURING METHODS FOR MOS DIGITAL INTEGRATED CIRCUITS
KS C IEC 60748-2-8:2002 Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits－Section 8：Blank detail specification for integrated circuits static read/write memories
KS C IEC 60748-2-5-2002(2022) Semiconductor devices－Integrated circuits Part 2：Digital integrated circuits Section 5－Blank detail specification for complementary MOS digital integrated circuits(series 4 000B and 4 000UB)
KS C IEC 60748-2-5-2022 Semiconductor devices－Integrated circuits Part 2：Digital integrated circuits Section 5－Blank detail specification for complementary MOS digital integrated circuits(series 4 000B and 4 000UB)
KS C IEC 60748-2-2-2019 Semiconductor devices — Integrated circuits — Part 2: Digital integrated circuits — Section 2: Family specification for HCMOS digital integrated circuits, series 54/74 HC, 54/74 HCT, 54/74 HCU
KS C IEC 60748-2-1:2001 Semiconductor integrated circuits－Part 2：Digital integrated circuits Section One：Blank detail specification for bipolar monolithic digital integrated circuit gates (excluding uncommitted logic arrays)
KS C IEC 60748-2-4-2022 Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits－Section 4：Family specification for complementary MOS digital integrated circuits, series 4 000 B and 4 000 UB
KS C 6050-1985(2000) MEASURING METHODS FOR BIPOLAR DIGITAL INTEGRATED CIRCUITS
KS C 6050-1985 MEASURING METHODS FOR BIPOLAR DIGITAL INTEGRATED CIRCUITS
KS C IEC 60748-2-4:2002 Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits－Section 4：Family specification for complementary MOS digital integrated circuits, series 4 000 B and 4 000 UB
KS C IEC 60748-2-3:2002 Semiconductor devices-Integrated circuits-Part 2:Digital integrated circuits-Section 3:Blank detail specification for HCMOS digital integrated circuits(series 54/74 HC, 54/74 HCT, 54/74 HCU)
KS C IEC 60748-2-1-2001(2016) Semiconductor integrated circuits－Part 2：Digital integrated circuits Section One：Blank detail specification for bipolar monolithic digital integrated circuit gates (excluding uncommitted logic arrays)
KS C IEC 60748-2-3-2022 Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits－Section 3：Blank detail specification for HCMOS digital integrated circuits(series 54/74 HC, 54/74 HCT, 54/74 HCU)
KS C IEC 60748-2-3-2002(2017) Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits－Section 3：Blank detail specification for HCMOS digital integrated circuits(series 54/74 HC, 54/74 HCT, 54/74 HCU)
KS C IEC 60748-2-5:2002 Semiconductor devices－Integrated circuits Part 2：Digital integrated circuits Section 5－Blank detail specification for complementary MOS digital integrated circuits(series 4 000B and 4 000UB)
KS C IEC 60748-2-1-2001(2021) Semiconductor integrated circuits－Part 2：Digital integrated circuits Section One：Blank detail specification for bipolar monolithic digital integrated circuit gates (excluding uncommitted logic arrays)
KS C IEC 60748-2-6-2022 Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits Section 6：Blank detail specification for microprocessor integrated circuits
KS C IEC 60748-2-6-2002(2017) Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits Section 6：Blank detail specification for microprocessor integrated circuits
KS C IEC 60748-2-6-2002(2022) Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits Section 6：Blank detail specification for microprocessor integrated circuits
KS C IEC 60748-5:2003 Semiconductor devices－Integrated circuits－Part 5：Semicustom integrated circuits
KS C IEC 60748-2-1-2021 Semiconductor integrated circuits－Part 2：Digital integrated circuits Section One：Blank detail specification for bipolar monolithic digital integrated circuit gates (excluding uncommitted logic arrays)
KS C IEC 60748-2-6:2002 Semiconductor devices-Integrated circuits-Part 2:Digital integrated circuits Section 6:Blank detail specification for microprocessor integrated circuits
KS C IEC 60748-2-8-2002(2022) Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits－Section 8：Blank detail specification for integrated circuits static read/write memories
KS C IEC 60748-2-10:2001 Semiconductor integrated circuits－Part 2：Digital integrated circuits Section 10－Blank detail specification for integrated circuit dynamic read/write memories(excluding uncommitted logic arrays)
KS C IEC 60748-2-8-2002(2017) Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits－Section 8：Blank detail specification for integrated circuits static read/write memories
KS C IEC 60748-2-8-2022 Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits－Section 8：Blank detail specification for integrated circuits static read/write memories
KS C IEC 60748-2-11-2002(2017) Semiconductor devices－Integrated circuits－Part 2－11：Digital integrated circuits－Blank detail specification for single supply integrated circuit,electrically erasable, and programmable read－only memory
KS C 5210-1980(2020) General rules for reliability assured digital semiconductor integrated circuits
KS C IEC 60748-2-11-2002(2022) Semiconductor devices－Integrated circuits－Part 2－11：Digital integrated circuits－Blank detail specification for single supply integrated circuit,electrically erasable, and programmable read－only memory
KS C IEC 60748-2-11-2022 Semiconductor devices－Integrated circuits－Part 2－11：Digital integrated circuits－Blank detail specification for single supply integrated circuit,electrically erasable, and programmable read－only memory
KS C IEC 60748-2-7-2002(2022) Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits Section 7：Blank detail specification for integrated circuits fusible－link programmable bipolar read－only memories
KS C IEC 60748-2-11:2002 Semiconductor devices－Integrated circuits－Part 2－11：Digital integrated circuits－Blank detail specification for single supply integrated circuit,electrically erasable, and programmable read－only memory
KS C IEC 60748-2-10-2001(2016) Semiconductor integrated circuits－Part 2：Digital integrated circuits Section 10－Blank detail specification for integrated circuit dynamic read/write memories(excluding uncommitted logic arrays)
KS C 5218-1983(2013) Reliability assured complementary MOS digital semiconductor integrated circuits(Gates)
KS C IEC 60748-2-10-2001(2021) Semiconductor integrated circuits－Part 2：Digital integrated circuits Section 10－Blank detail specification for integrated circuit dynamic read/write memories(excluding uncommitted logic arrays)
KS C IEC 60748-2-12:2002 Semiconductor devices-Integrated circuits-Part 2:Digital integrated circuits-Section 12:Digital integrated circuits-Blank detail specification for programmable logic devices(PLDs)
KS C IEC 60748-2-7-2002(2017) Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits Section 7：Blank detail specification for integrated circuits fusible－link programmable bipolar read－only memories
KS C IEC 60748-2-7-2022 Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits Section 7：Blank detail specification for integrated circuits fusible－link programmable bipolar read－only memories
KS C IEC 60748-2-10-2021 Semiconductor integrated circuits－Part 2：Digital integrated circuits Section 10－Blank detail specification for integrated circuit dynamic read/write memories(excluding uncommitted logic arrays)

CZ-CSN

CSN IEC 748-2:1994 Semiconductor devices.Integrated circuits.Part 2:Digital integrated circuits
CSN 35 8790 Cast.1-1983 Digital integrated circuits. Measuring methods of electrical parameters

International Electrotechnical Commission (IEC)

IEC 60748-2:1997 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits
IEC 60748-2-4:1992 Semiconductor devices; integrated circuits; part 2: digital integrated circuits; section four: family specification for complementary MOS digital integrated circuits; series 4000 B and 4000 UB
IEC 60748-2-20:2000 Semicondutor devices - Integrated circuits - Part 2-20: Digital integrated circuits; Family specifications: Low voltage integrated circuits
IEC 60748-2-2:1992 Semiconductor devices; integrated circuits; part 2: digital integrated circuits; section 2: familiy specification for HCMOS digital integrated circuits, series 54/74 HC, 54/74 HCT, 54/74 HCU
IEC 60748-2-20:2008 Semicondutor devices - Integrated circuits - Part 2-20: Digital integrated circuits - Family specification - Low voltage integrated circuits
IEC 60748-2-5:1992 Semiconductor devices; integrated circuits; part 2: digital integrated circuits; section five: blank detail specification for complementary MOS digital integrated circuits; series 4000 B and 4000 UB
IEC 60748-4-3:2006 Semiconductor devices - Integrated circuits - Part 4-3: Interface integrated circuits - Dynamic criteria for analogue-digital converters (ADC)
IEC 60748-2-1:1991 Semiconductor devices; integrated circuits; part 2: digital integrated circuits; section 1: blank detail specification for bipolar monolithic digital integrated circuits gates (excluding uncommitted logic arrays)
IEC 60748-2-3:1992 Semiconductor devices; integrated circuits; part 2: digital integrated circuits; section 3: blank detail specification for HCMOS digital integrated circuits (series 54/74 HC, 54/74 HCT, 54/74 HCU)
IEC 60748-2/AMD1:1991 Semiconductor devices; integrated circuits; part 2: digital integrated circuits; amendment 1
IEC 60748-2-11:1999 Semiconductor devices - Integrated circuits - Part 2-11: Digital integrated circuits - Blank detail specification for single supply integrated circuit, electrically erasable, and programmable read-only memory
IEC 60748-2-6:1992 Semiconductor devices; integrated circuits; part 2: digital integrated circuits; section six: blank detail specification for microprocessor integrated circuits
IEC TS 62404:2007 Logic digital integrated circuits - Specification for I/O interface model for integrated circuit (IMIC version 1.3)
IEC 60748-2-2:1992/AMD1:1994 Amendment 1 - Semiconductor devices. Integrated circuits - Part 2: Digital integrated circuits - Section two: Family specification for HCMOS digital integrated circuits, series 54/74 HC, 54/74 HCT, 54
IEC 60748-2-10:1994 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits; section 10: Blank detail specification for integrated circuit dynamic read/write memories
IEC 60748-2-7:1992 Semiconductor devices. Integrated circuits - Part 2: Digital integrated circuits - Section seven: Blank detail specification for integrated circuit fusible-link programmable bipolar read-only memories
IEC 60748-2-12:2001 Semiconductor devices - Integrated circuits - Part 2-12: Digital integrated circuits; Blank detail specification for programmable logic devices (PLDs)

Association Francaise de Normalisation

NF C96-042:1989 Semiconductor Devices Integrated circuits Part 2:Digital integrated circuits
NF C86-200*NF EN 190100:2013 Sectional specification : digital monolithic integrated circuits
NF C86-226*NF EN 190116:2013 Family specification : AC MOS Digital Integrated Circuits
NF EN 190100:2013 Spécification intermédiaire : circuits intégrés digitaux monolithiques
NF C86-213*NF EN 190101:2013 Family Specification : Digital Integrated TTL Circuits - Series 54, 64, 74, 84
NF C86-241*NF EN 190110:2013 Blank Detail Specification : Digital Microprocessor Integrated Circuits
NF C86-218*NF EN 190107:2013 Family Specification : TTL FAST Digital Integrated Circuits - Series 54F, 74F
NF C86-222*NF EN 190109:2013 Family specification : Digital Integrated HC MOS Circuits - Series HC/HCT/HCU
NF EN 190101:2013 Family specification: TTL digital integrated circuits - Series 54, 64, 74, 84
NF C86-218/A3:1989 Components for Electronic Equipment Digital Integrated TTL FAST Circuits Collection of detail specifications within the scope of the French Standard NF C 86-218(CECC 90 107)
NF C86-222/A12:1991 Components for Electronic Equipment Digital Integrated HC MOS Circuits Collection of detail specifications within the scope of the French Standard NF C 86-222(CECC 90 109)
NF C86-212/A1:1986 Components for Electronic Equipment Digital TTL Low Power SCHOTTKY Integrated Circuits Collection of detail specifications within the scope of the French Standard NF C 86-212(CECC 90 103)

Danish Standards Foundation

DS/IEC 748-2:1993 Semiconductor devices. Integrated circuits. Part 2: Digital integrated circuits
DS/IEC 748-2-1:1993 Semiconductor devices. Integrated circuits. Part 2: Digital integrated circuits. Section one: Blank detail specification for bipolar monolithic digital integrated circuit gates (excluding uncommitted logic arrays)
DS/IEC 748-2-6:1993 Semiconductor devices. Integrated circuits. Part 2: Digital integrated circuits. Section six: Blank detail specification for microprocessor integrated circuits

American Society for Testing and Materials (ASTM)

ASTM F1262M-95(2002) Standard Guide for Transient Radiation Upset Threshold of Digital Integrated Circuits
ASTM F1262M-95 Standard Guide for Transient Radiation Upset Threshold of Digital Integrated Circuits
ASTM F1262M-14 Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric)
ASTM F1262M-95(2008) Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric)
ASTM F744M-97(2003) Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits [Metric]
ASTM F744M-16 Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric)
ASTM F744M-97 Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits
ASTM F744M-10 Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits [Metric]
ASTM F375-89(2010) Standard Specification for Integrated Circuit Lead Frame Material
ASTM F375-20 Standard Specification for Integrated Circuit Lead Frame Material
ASTM F375-89(1999) Standard Specification for Integrated Circuit Lead Frame Material

RO-ASRO

STAS 7128/11-1985 T.ETTJ?R SYMBOLS FOR EMICONDUCTOR DEVICES ND INTHGRATED CIRCUITS Symbols fur digital integrated eircuits
STAS SR CEI 748-2/A1-1994 DISPOZITIVE CU SEMICONDUCTOARE Circuite integrate. Partea 2: Circuite integrate digitale
STAS 12161-1984 DIGITAL' INTEGRATED CIRCUITS Measuring methods of main electrical parameters
STAS 10630-1976 DIGITAL INTEGRATED CIRCUITS Measuring methods of outptut quantities
STAS 10350-1983 DIGITAL INTEGRATED CIRCUITS Terminology and classified list of main parameters
STAS 7128/10-1984 LETTER SIMBOLS FOR SEMICON- DUCTOR DEVICES ANI) INTF.GHA- TED CIRCU1TS Sinibols for analoguc inlcgnated circuits

RU-GOST R

GOST 29107-1991 Semiconductor devices. Integrated circuits. Part 2. Digital integrated circuits
GOST 18683.0-1983 Digital integrated circuits. General requirements for measuring electrical parameters
GOST 18683.1-1983 Digital integrated circuits. Methods for measuring static electrical parameters
GOST 18683.2-1983 Digital integrated circuits. Methods of measuring dynamic electrical parameters
GOST 19480-1989 Integrated circuits. Terms, definitions and letter symbols of electrical parameters
GOST R 55893-2013 Integrated microcircuits. Basic parameters
GOST 4.465-1987 Product-quality index system. Integratet circuits. Index nomenclature

IEC - International Electrotechnical Commission

IEC 60748-2:1985 Semiconductor Devices Integrated Circuits Part 2: Digital Integrated Circuits (Amendment 1-1991) (Amendment 2-1993) (Edition 1.0)
TS 62404-2007 Logic digital integrated circuits – Specification for I/O interface model for integrated circuit (IMIC version 1.3) (Edition 1.0)
IEC 60748-2-6:1991 Semiconductor devices Integrated circuits Part 2: Digital integrated circuits Section six - Blank detail specification for microprocessor integrated circuits (Edition 1.0)
IEC 60748-2-8:1993 Dispositifs à semiconducteurs - Circuits intégrés - Partie 2: Circuits intégrés numériques - Section Huit: Spécification particulière cadre pour les mémoires à circuits intégrés à lecture-écriture à fonctionnement statique (Edition 1.0)

KR-KS

KS C IEC 60748-2-20-2021 Semiconductor devices — Integrated circuits — Part 2-20: Digital integrated circuits — Family specification — Low voltage integrated circuits

SE-SIS

SIS SS CECC 90100-1987 Sectional specification: Digital monolithic integrated circuits
SIS SS CECC 90107-1985 Family specification: Digital integrated TTL FASTcircuits
SIS SS CECC 90107-1987 Family specification: TTL FAST digital integrated circuits
SIS SS CECC 90100-1983 Family specification: Digital integrated TTL circuits Series 54, 64, 74, 84
SIS SS CECC 90101-1989 Family specification: Digital integrated TTL circuits Series 54, 64, 74, 84
SIS SS CECC 90110-1987 Blank detail speciflcation: Digital microprocessor integrated circuits
SIS SS CECC 90108-1986 Family specification: Digital integrated TTL advanced Schottky circuits
SIS SS-CECC 90109-1990 Family specification: Digital integrated HC MOS circuits — Series HC/HCT/HCU
SIS SS-CECC 90104-1991 Family specification: C. MOS digital integratedcircuits Series 4000 B and 4000 UB
SIS SS CECC 90104-1982 Family specif/cation: CMOS dig/tat integrated circuits - Series 4000 B and 4000 UB
SIS SS CECC 90106-1987 Family specification: 771 advanced lowpower Schottky digital integrated circuits
SIS SS CECC 90108-1987 Family specification: TTL advanced Schottky digital integrated circuits

German Institute for Standardization

DIN EN 190100:1995-02 Sectional specification: Digital monolithic integrated circuits; German version EN 190100:1993
DIN 4000-50:1986 Tabular layouts of article characteristics for digital integrated circuits
DIN EN 190116:1995-06 Family specification: AC MOS digital integrated circuits; German version EN 190116:1993
DIN EN 190101:1996 Family specification - Digital integrated TTL circuits - Series 54, 64, 74, 84; German version EN 190101:1994
DIN EN 190110:1996 Blank detail specification - Digital microprocessor integrated circuits; German version EN 190110:1994
DIN EN 190110:1996-11 Blank detail specification - Digital microprocessor integrated circuits; German version EN 190110:1994
DIN EN 190107:1996 Family specification - TTL FAST digital integrated circuits - Series 54 F, 74 F; German version EN 190107:1994
DIN EN 190109:1996-11 Family specification - Digital integrated HC MOS circuits - Series HC/HCT/HCU; German version EN 190109:1994
DIN EN 190101:1996-11 Family specification - Digital integrated TTL circuits - Series 54, 64, 74, 84; German version EN 190101:1994
DIN EN 190109:1996 Family specification - Digital integrated HC MOS circuits - Series HC/HCT/HCU; German version EN 190109:1994
DIN EN 190107:1996-11 Family specification - TTL FAST digital integrated circuits - Series 54 F, 74 F; German version EN 190107:1994
DIN EN 190100:1995 Sectional specification: Digital monolithic integrated circuits; German version EN 190100:1993

European Committee for Electrotechnical Standardization（CENELEC）

EN 190116:1993 Family Specification: AC MOS Digital Integrated Circuits
EN 190100:1993 Sectional Specification: Digital Monolithic Integrated Circuits
EN 190109:1994 Family Specification: Digital Integrated HC MOS Circuits Series HC/HCT/HCU
EN 190110:1994 Blank Detail Specification: Digital Microprocessor Integrated Circuits

Japanese Industrial Standards Committee (JISC)

JIS C 7042:1982 Measuring methods for MOS digital integrated circuits
JIS C 7041:1982 Measuring methods for bipolar digital integrated circuits
JIS C 7310:1979 General rules for reliability assured digital semiconductor integrated circuits
JIS C 7040:1969 General rules for mechanical standardization of semiconductor integrated circuits
JIS C 7312:1982 Reliability assured complementary MOS digital semiconductor integrated circuits (gates)

Lithuanian Standards Office

LST EN 190100-2001 Sectional specification. Digital monolithic integrated circuits
LST EN 190116-2001 Family specification. AC MOS digital integrated circuits
LST EN 190110-2001 Blank detail specification. Digital microprocessor integrated circuits
LST EN 190107-2001 Family specification. TTL FAST digital integrated circuits. Series 54F, 74F
LST EN 190101-2001 Family specification. Digital integrated TTL circuits. Series 54, 64, 74, 84
LST EN 190109-2001 Family specification. Digital integrated HC MOS circuits. Series HC/HCT/HCU

ESD - ESD ASSOCIATION

JTR001-01-2012 User Guide of ANSI/ESDA/JEDEC JS-001 Human Body Model Testing of Integrated Circuits

YU-JUS

JUS N.R1.750-1980 Integrated circuits. List of standardized voltages
JUS N.R1.900-1980 Digital integrated circuits. Acceptance and reSability. Ekctrical tests

IN-BIS

IS 12970 Pt.2/Sec.3-1993 Semiconductor devices. Integrated circuits. Part 2: Digital integrated circuits. Essential rating and characteristics. Section 3: Integrated circuit microprocessors
IS 12970 Pt.2/Sec.2-1992 Semiconductor devices—Integrated circuits Part 2 Digital integrated circuits—Basic ratings and characteristics Part 2 Integrated circuits Memory
IS 12970 Pt.3/Sec.1-1992 Semiconductor devices—Integrated circuits Part 3 Digital integrated circuits—Measurement methods Section 1: General
IS 12970 Pt.3/Sec.2-1992 Semiconductor devices. Integrated circuits. Part 2: Digital integrated circuits. Measuring methods. Section 2: Static characteristics
IS 12970 Pt.3/Sec.3-1993 Semiconductor devices—Integrated circuits Part 3 Digital integrated circuits—Measurement methods Section 3: Dynamic measurements
IS 12970 Pt.2/Sec.1-1992 Semiconductor devices—Integrated circuits Part 2 Digital integrated circuits—Basic ratings and characteristics Section 1: General

IECQ - IEC: Quality Assessment System for Electronic Components

QC 790132/SU 0005-1990 Detail Specification for Electronic Components Digital Integrated Circuits KII02AP4 - KII02AP14
QC 790109-1992 Semiconductor Devices Integrated Circuits Part 2: Digital Integrated Circuits Section Two - Family Specification for HCMOS Digital Integrated Circuits@ Series 54/74 HC@ 54/74 HCT@ 54/74 HCU (IEC 748-2-2 ED 1)
QC 790132-1991 Semiconductor Devices Integrated Circuits Part 2: Digital Integrated Circuits Section One - Blank Detail Specification for Bipolar Monolithic Digital Integrated Circuit Gates (Excluding Uncommitted Logic Arrays) (IEC 748-2-1 ED 1)
QC 790107-1994 Semiconductor Devices - Integrated Circuits - Part 2: Digital Integrated Circuits - Section 10: Blank Detail Specification for Integrated Circuit Dynamic Read/Write Memories (IEC 748-2-10 ED 1)

PT-IPQ

NP 2955/8-1985 Electronic component. "TTL Fast" Digital Integrated Circuit, Specification Note
NP 2955/1-1985 Electronic component. Monolithic digital integrated circuits. Midpoint specification
NP 2955/2-1985 Electronic component. TTL54, 64, 74 and 84 series digital integrated circuits. Specifications

GOSTR

GOST R 57441-2017 Integrated circuits. Terms, definitions and letter symbols of electrical parameters

GOST

GOST R 71071-2023 Integrated circuits. Delay circuits. Parameters system
GOST R 71074-2023 Integrated circuits. Magnetic bubble integrated circuits memory. Terms, definitions and letter symbols characteristics
GOST R 70845-2023 Integrated circuits. Terms, definitions and letter symbols of digital-to-analog andanalog-to-digital converters

IEEE - The Institute of Electrical and Electronics Engineers@ Inc.

IEEE 1076.4-2000 Standard for VITAL ASIC (Application Specific Integrated Circuit) Modeling Specification

American National Standards Institute （ANSI)

ANSI/IEEE 1801:2009 Standard for Design and Verification of Low Power Integrated Circuits

Institute of Electrical and Electronics Engineers (IEEE)

IEEE Std 1076.4-1995 IEEE Standard VITAL Application-Specific Integrated Circuit (ASIC) Modeling Specification

Others: jedec standard family