GB/T 14619-1993 in English
SUPERSEDEDceramic substrates for thick film integrated circuits
- Issued on:1993-09-03
- Implemented on:1993-01-02
- File Format:PDF
- Delivery:Via email within 1~3 business days
$97.00
《GB/T 14619-1993厚膜集成电路用氧化铝陶瓷基片》由339-1(工业和信息化部(电子))归口,主管部门为工业和信息化部(电子)。
本标准规定了厚膜集成电路用氧化铝陶瓷基片的结构尺寸、技术要求、试验方法、检验规则、标志、包装、运输、贮存。本标准适用于厚膜集成电路用氧化铝陶瓷基片,片状件用氧化铝陶瓷基片亦可参照使用。
Scope
This standard specifies the structural dimensions, technical requirements, test methods, inspection rules, marks, packaging, transportation, and storage of alumina ceramic substrates for thick film integrated circuits. This standard applies to alumina ceramic substrates for thick film integrated circuits, and alumina ceramic substrates for chip components can also be used as a reference. (hereinafter referred to as substrate).

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