Sign In |Help & Support
ALL SECTORS
  • ALL SECTORS
  • GB(National Standard)
  • CB(Shipping)
  • CECS(Engineering Construction)
  • CJ(Urban Construction)
  • CY(News and Publication)
  • DB(Provincial Standard)
  • DL(Electricity & Power)
  • DZ(Geology & Mineralogy)
  • FZ(Spinning & Textile)
  • GA(Public Security)
  • HB(Aviation)
  • HG(Chemical Industry)
  • HJ(Environmental Protection)
  • JB(Machinery)
  • JC(Building Materials)
  • JG(Building & Construction)
  • JJ(Metering)
  • JT(Highway & Transportation)
  • LY(Forestry)
  • MT(Coal)
  • NB(Energy)
  • NY(Agriculture)
  • QB(Light Industry)
  • QC(Automobile & Vehicle)
  • QJ(Aerospace)
  • SH(Petrochemical)
  • SJ(Electronics)
  • SL(Water Resources)
  • SN(Commodity Inspection)
  • SY(Oil & Gas)
  • TB(Railway & Train)
  • YB(Ferrous Metallurgy)
  • YC(Tobacco)
  • YD(Telecommunication)
  • YY(Medical Device)
Database: 365,228(8 Aug 2026)
semiconductor device integrated circuits part interface integrated circuits part ii blank detail specification blank detailed specification linear analogue magnetic devices isolationcd level rural area
GB/T 18500.2-2001 in English

GB/T 18500.2-2001 in English

VALID

Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits - Section 2: Blank detail specification for linear analogue - To - Digital converters(ADC)

  • Issued on:2001-01-01
  • Implemented on:2002-06-01
  • File Format:PDF
  • Delivery:Via email within 1~3 business days
Price(USD): $240.00
$233.00
Standard No: GB/T 18500.2-2001
Document status: VALID
Title in English: Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits - Section 2: Blank detail specification for linear analogue - To - Digital converters(ADC)
Title in Chinese: 半导体器件 集成电路 第4部分:接口集成电路 第二篇:线性模拟/数字转换器(ADC)空白详细规范
Language: English
File Format: Electronic (PDF)
Delivery: Via email within 1~3 business days
Issued on: 2001-01-01
Implemented on: 2002-06-01
ICS Classification: 31.200-Integrated circuits. Microelectronics
Chinese Classification: L56-Semiconductor integrated circuit
Professional Classification: GB-National Standard
Related Keywords: semiconductor device integrated circuits part
interface integrated circuits part ii
blank detail specification
blank detailed specification
linear analogue
Related Topics: linear number
adc integrated circuit
GBT18500.2
GB/T 18500.2-2001
integrated circuit
Semiconductor integrated interface circuit line circuit

《GB/T 18500.2-2001半导体器件 集成电路 第4部分:接口集成电路 第二篇:线性模拟/数字转换器(ADC)空白详细规范》由TC78(全国半导体器件标准化技术委员会)归口,主管部门为工业和信息化部(电子)。
本标准等同采用国际电工委员会(IEC)标准IEC 748-4-2:1993《半导体器件 集成电路 第4部分:接口集成电路 第二篇:线性模拟/数字转换器(ADC)空白详细标准》,以促进我国该类产品的国际贸易、技术和经济交流。本标准可作为编制线性ADC详细规范的依据。IEC电子器件质量评定体系遵循IEC的章程并在IEC授权下进行工作。该体系的目的是确定质量评定程序,以这种方式使一个参加国按有关规范要求放行的电子器件无需进一步试验而为其所有参加国同样接受。本空白详细规范是半导体器件的一系列空白详细规范之一,并且与下列IEC标准一起使用。IEC 747-10/QC 700000 半导体器件 第10部分:分立器件和集成电路总规范IEC 748-11/QC 790100 半导体器件 集成电路 第11部分:半导体集成电路(不包括混合电路)分规范


Scope

This standard is equivalent to the International Electrotechnical Commission (IEC) standard IEC 748-4-2: 1993 "Semiconductor Device Integrated Circuits Part 4: Interface Integrated Circuits Part II: Linear Analog/Digital Converter (ADC) Blank Detailed Specification", with Promote the international trade, technology and economic exchange of such products in our country. This standard can be used as the basis for the preparation of detailed specifications for linear ADCs.

Sample only — not a preview of GB/T 18500.2-2001
Page: 1 / 0
100%

Loading PDF document...

Error loading PDF. Please make sure the file is valid and try again.

We also recommend

  • GB/T 44777-2024 in English

    GB/T 44777-2024 in English

    Guideline for intellectual property(IP) core protection

    2024-10-26
  • GB/T 44937.5-2025 in English

    GB/T 44937.5-2025 in English

    Integrated circuits—Measurement of electromagnetic emissions—Part 5: Measurement of conducted emissions—Workbench Faraday Cage method

    2025-12-31
  • GB/T 33657-2017 in English

    GB/T 33657-2017 in English

    Nanotechnologies―Electrical operating parameter test specification of wafer level nano-scale phase change memory cells

    2017-05-12
  • GB/T 9424-1998 in English

    GB/T 9424-1998 in English

    Semiconductor devices --Integrated circuits --Part 2:Digital integrated circuits --Section five --Blank detail specification for complementary MOS digital integrated circuits,series 4 0

    1988-06-02
  • GB/T 18500.1-2001 in English

    GB/T 18500.1-2001 in English

    Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits - Section 1: Bland detail specification for linear digital - To-analogue converters (DAC)

    2001-01-01
  • GB/T 42744-2023 in English

    GB/T 42744-2023 in English

    Microwave circuit—Measuring methods for electrically controlled attenuator

    2023-08-06