GB/T 27581-2011 in English
VALIDElectromagnetic interference shielding film—Electroless copper plating solution—Method of determining concentration of Ni2+ and Cu2+
- Issued on:2011-12-05
- Implemented on:2012-03-01
- File Format:PDF
- Delivery:Via email within 1~3 business days
$117.00
《GB/T 27581-2011电磁屏蔽膜 化学镀铜溶液 镍离子和铜离子含量测定方法》由TC431(全国光学功能薄膜材料标准化技术委员会)归口,主管部门为中国石油和化学工业联合会。
Scope
Warning: Some chemical reagents used in this test method are toxic and corrosive, and some experimental processes may lead to dangerous situations. Operators should take appropriate safety and health measures. This standard specifies the determination method of nickel ion and copper ion content in electroless copper plating solution for electromagnetic shielding film. This standard is applicable to the test of nickel ion and copper ion content in electroless copper plating solution for electromagnetic shielding film. Measuring range: the concentration of nickel ions in the electroless copper plating solution is calculated as NiSO4.6H2O, and is 0.20g/L~2.00g/L; the concentration of copper ions in the electroless copper plating solution is measured as CuSO2 Subscript 4>.5H2O is calculated as 5.0g/L~60.0g/L.

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