GB/T 32651-2016 in English

VALID

Test method for measuring trace elements in photovoltaic-grade silicon by high-mass resolution glow discharge mass spectrometry

Issued on:2016-04-25
Implemented on:2016-11-01
File Format:PDF
Delivery:Via email within 1~3 business days

Price(USD)： $160.00
$156.00

Standard No:	GB/T 32651-2016
Document status:	VALID
Title in English:	Test method for measuring trace elements in photovoltaic-grade silicon by high-mass resolution glow discharge mass spectrometry
Title in Chinese:	采用高质量分辨率辉光放电质谱法测量太阳能级硅中痕量元素的测试方法
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 1~3 business days
Issued on:	2016-04-25
Implemented on:	2016-11-01
Professional Classification:	GB-National Standard
Related Keywords:	high-mass resolution glow discharge mass spectrometry introduction standard overview glow discharge mass spectrometry trace elements multiple trace elements sensitive trace element analysis technology
Related Topics:	Mass spectral peak resolution Resolution of Mass Spectrometry Resolution of mass spectral peaks Mass spectral peak resolution MS resolution How does mass spectrometry resolve Mass spectrometer resolution High Mass Resolution for Mass Spectrometry High Quality Used Mass Spectrometry high performance mass spectrometry Quadrupole Resolution Resolution of mass spectrometry Quadrupole resolution Quadrupole MS Resolution First-order mass spectrometry resolution Glow mass spectrometer Mass spectrum peak resolution; Medium Resolution Mass Spectrometry Mass Spectrometry Resolution mass resolution High Resolution Mass Spectrometry Angstrom resolution Spectral resolution detection high resolution mass spectrometry secondary mass spectrometry First-order spectral resolution mass spectrometric resolution Quadrupole MS Resolution How to measure spectral resolution Determination method of silicon element Why Quadrupole Mass Resolution Elemental Test Method high resolution mass spectrum peaks Determination method of silicon element low resolution mass spectrometry Quadrupole MS Resolution Resolution Mass Quadrupole The resolution of the first order spectrum MS low resolution Mass Spectrometry Silicon Quadrupole resolution Mass Spectrometry Secondary Resolution quadrupole high-resolution mass spectrometry Quadrupole mass spectrometer resolution Spectral Resolution Measurements What is the resolution of mass spectrometry? Mass Spectrometry Secondary Mass Spectrometry Resolution Silicon Spectrum The higher the resolution of the mass spectrometer Macroelement Test Methods mass resolution High resolution mass spectrometry High Quality Spectral Measurements Determination method of silicon element resolution in mass spectrometry Mass Quadrupole Resolution Optical Resolution Measurement Spectral measurement resolution Spectral resolution detection Spectral collection method Elemental silicon determination method Element matter energy Spectral resolution detection low resolution mass spectrometry from low-resolution mass spectrometry How to determine the resolution of mass spectrometry How to Determine the Resolution of a Mass Spectrometer element test Silicon spectrum Mass Spectrometry Resolution Resolution Spectral Resolution Measurements Test Center Spectral Measurement The higher the resolution of the mass spectrometer Mass spectral resolution half peak high resolution mass spectrometry primary mass spectrometry secondary mass spectrometry element resolution Silicon element Resolution of Quadrupole Mass Spectrometry What is the resolution of a quadrupole mass spectrometer? Resolution in Mass Spectrometry high resolution electron energy Measurement of Spectral Resolution Energy resolution of peaks even mass spectral resolution Angstrom+ resolution Element Energy Spectrum Secondary Spectral Resolution Silicon Polarogram high resolution mass spectrometry Low Resolution of Mass Spectrometry Mass peak + resolution trace trace elements Measurement of Trace Elements by Mass Spectrometry Mass spectrometer resolution glow discharge method mass spectrometry high resolution Measure element method high performance mass spectrometry Trace technetium measurement method High Resolution Mass Spectrometry High Resolution Measurement Method MS resolution Glow Mass Spectrometry Applications Measurement of the solar spectrum How to Determine Mass Spectrometry Resolution The core level of rubidium Applications of Glow Discharge Mass Spectrometry The resolution of these peaks by mass spectrometry high resolution mass spectrometry First-order resolution and second-order resolution of mass spectrometry Quadruple mass spectrometer element test high resolution quadruple mass spectrometry high resolution mass spectrometry secondary mass spectrometry Determination method of silicon element rod mass resolution High Molecular Weight Mass Spectrometry Energy and spectral peaks of elements How to test silicon element high resolution mass spectrometry Spectral collection method Methods used for quality analysis Quadrupole mass spectrometer resolution Glow Mass Spectrometry Elements Mass Spectrometry Primary and Secondary Resolution Element Energy Spectrum Solar Spectrum Measurements How to use quadruple mass spectrometry Three Elements of Resolution Quadrupole High Resolution Mass Spectrometer Glow Discharge MS Resolution How to measure spectral resolution GBT32651 GB/T 32651-2016 High resolution mass spectrometry quality Mass spectrometry sensitivity and resolution Advantages of high mass spectrometry resolution The composition of the elemental standard spectrum used in iron spectroscopy Spectrometer measures sunlight Guangzhou high-resolution mass spectrometry won the bid Main functions of high-resolution mass spectrometer What is the stability of high-resolution mass spectrometry mass analysis methods? What is the constant, micro and trace analysis method? Trace Element Detection Methods Mass Spectrometry Pharmacopoeia Spectral resolution test method Testing of silicon element in traditional Chinese medicine Methods for measuring trace impurity elements Too many quality control methods Spectrometer resolution test method Large/Trace Lipid Quantification Methods Center resolution test Standard resolution mass axis How to express mass spectrometry resolution High Resolution Mass Spectrometry Processing Methods

《GB/T 32651-2016采用高质量分辨率辉光放电质谱法测量太阳能级硅中痕量元素的测试方法》由TC203（全国半导体设备和材料标准化技术委员会）归口，主管部门为国家标准化管理委员会。

Introduction

1. Standard Overview

Glow Discharge Mass Spectrometry (GDMS) is a highly sensitive trace element analysis technology, especially suitable for the detection of trace elements in semiconductor materials and solar-grade silicon. GB/T 32651-2016 standard specifies in detail the technical requirements and experimental steps for the determination of multiple trace elements in solar-grade silicon using this method.

2. Technical Background

With the rapid development of the photovoltaic industry, the demand for solar-grade silicon materials has increased dramatically. However, trace impurities in silicon materials can seriously affect the conversion efficiency and long-term stability of solar cells. Therefore, it is particularly important to establish a set of accurate and reliable trace element analysis methods. GB/T 32651-2016 standard is based on this demand, combined with the high sensitivity and high resolution characteristics of GDMS technology, to develop a test method suitable for a variety of silicon morphology samples.

3. Comparison of standard frameworks

Standard dimensions	GB/T 32651-2016	International similar standards	Advantage analysis
Scope of application	Quantitative analysis of multiple trace elements in solar-grade silicon	Mainly for semiconductor materials	Extended to photovoltaic industry
Detection limit	5μg/kg ~50mg/kg	Usually 1-10μg/kg	Wider dynamic range
Analysis equipment	Mass resolution>3500	Usually required>2000	Higher detection accuracy

4. Implementation suggestions

4.1 Precautions for sample preparation

During the sample processing, special attention should be paid to the following points:
- Ensure that the sample surface is smooth and free of impurities
- Use special cleaning agents (such as deionized water and isopropyl alcohol) to clean the sample
- Avoid any possible secondary contamination

4.2 Quantitative analysis steps

In order to ensure the accuracy of the analysis results, it is recommended to follow the following steps:
1. Use high-purity silicon standard samples to establish the relative sensitivity factor (RSF)
2. Determine the trace element content in the sample under the same conditions
3. Calculate and record the mass fraction of each element

4.3 Quality Control Measures

To ensure long-term accuracy, it is recommended that:
- Use standard samples for instrument calibration regularly
- Analyze at least one blank sample and one control sample in each batch of samples
- Trace back abnormal results and record the reasons

More samples: JJG 21-2008 QC/T 942-2021 YD/T 3934-2021

Sample only — not a preview of GB/T 32651-2016

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