GB/T 39482.3-2020 in English
VALIDElectrochemical impedance spectroscopy (EIS) on coated and uncoated metallic specimens—Part 3:Processing and analysis of data from dummy cells
- Issued on:2020-11-19
- Implemented on:2021-10-01
- File Format:PDF
- Delivery:Via email within 1~3 business days
$243.00
《GB/T 39482.3-2020涂漆和未涂漆金属试样的电化学阻抗谱（EIS） 第3部分：从模拟电解池获得数据的处理和分析》由TC5（全国涂料和颜料标准化技术委员会）归口，TC5SC9（全国涂料和颜料标准化技术委员会钢结构防腐涂料体系分会）执行，主管部门为中国石油和化学工业联合会。
Introduction
Analysis of the core content of the standard
| Technical elements | Specific requirements | Implementation points |
|---|---|---|
| Simulated electrolytic cell configuration | 4 equivalent circuit combinations (A/B type) | Resistor accuracy ±2-5%, capacitor ±5% |
| Test environment | Operation in Faraday box | Amplitude 20mV, frequency range 10-2-104Hz |
| Data quality verification | Bode diagram comparison | Phase angle deviation in low frequency zone ≤5° |
Key technical points
The standard adopts the dual equivalent circuit verification system:
- Circuit A: Basic RC series model, used to verify equipment input parameters
- Circuit B: Composite RC network, simulating actual coating stratification characteristics
Typical application case
When a ship coating laboratory used simulated electrolytic cell 3 (R1=1GΩ, C1=0.1nF) for verification, it was found that the impedance value deviation in the low frequency zone was as high as 15%. After investigation, it was found that electromagnetic interference was caused by poor grounding. After rectification, the error was reduced to less than 3%.
Implementation recommendations
- Give priority to the analog electrolytic cell version with a four-electrode connector
- Collect at least 6 data points for each frequency order of magnitude
- Regularly verify the system noise floor with electrolytic cell 1 (pure capacitance circuit)
Standard evolution analysis
Compared with ISO 16773-3:2016, this standard adds:
- Clearly define the minimum density requirement for data collection
- Supplement the electrolytic cell connection diagram
- Strengthen the test specifications for the ＞1GΩ high resistance system
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