GB/T 7704-2017 in English
SUPERSEDEDNon-destructive testing―Practice for residual stress measurement by X-ray
- Issued on:2017-10-14
- Implemented on:2018-04-01
- File Format:PDF
- Delivery:Via email within 5 business days
$650.00
《GB/T 7704-2017无损检测 Ｘ射线应力测定方法》由TC56（全国无损检测标准化技术委员会）归口，主管部门为国家标准化管理委员会。
Introduction
Analysis of the core content of the standard
| Version comparison | GB/T 7704-2008 | GB/T 7704-2017 |
|---|---|---|
| Definition of terms | Basic terms | 11 new terms such as diffraction peak and half-width |
| Number of appendices | 3 | 7 (4 new appendices such as penetration depth correction) |
| Three-dimensional stress analysis | Not included | New complete chapter |
Principles of stress determination
Based on Bragg's law, the residual stress is calculated by measuring the lattice strain:
2d·sinθ = nλ
εφψ = (dφψ-d0)/d0 ≈ -cotθ0·Δθ·π/180
Plane stress state calculation formula:
σφ = K·∂(2θ)/∂(sin²ψ)
Wherein the stress constant K = -E/[2(1+ν)]·π/180·cotθ0
Instrument configuration requirements
Key equipment: X-ray stress measuring instrument must meet the following requirements:
- Goniometer 2θ range ≥167°
- Ψ angle setting accuracy ±0.5°
- Detector type: single point/linear array/area array
- Recommended target materials: Cr, Cu, Mn, Co
Actual application case
The wheel axle of a high-speed railway uses CrKα radiation to measure the (211) crystal plane stress:
- Parameters: Ψ=0°~45°, 5 inclination angles
- Result: Surface compressive stress -320±15MPa
- Verification: Equal strength beam method error <7MPa
Test procedure specification
- Sample treatment: Surface roughness Ra≤10μm, electrolytic polishing to remove the processed layer
- Parameter selection:
- Diffraction crystal plane: Select according to material type (see Table 2)
- Ψ angle setting: ≥4, sin²ψ uniformly distributed
- Spot diameter≤curvature radius×0.4
- Data collection: Collect complete diffraction peaks at each ψ angle (range＞3×FWHM)
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