HS/T 63-2019 in English
VALIDOrientation distinguishing of flat-rolled products ofsilicon-electrical steel
- Issued on:2019-12-19
- Implemented on:2020-06-01
- File Format:PDF
- Delivery:Via email within 1~3 business days
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本标准规定了硅电钢平板轧材取向性鉴别的检验步骤和结果判定。
本标准适用于硅电钢平板轧材取向性的定性分析。
Introduction
Standard Technical Background and Industry Value
HS/T 63-2019, as a customs industry standard, fills the gap in the standardization of orientation testing of silicon electric steel materials in my country. This standard establishes a qualitative analysis method system based on X-ray diffraction technology for flat rolled products of silicon electric steel with a silicon content of 0.6-6%.
Analysis of core detection principle
The standard adopts X-ray diffractometer (Cu target light tube) to analyze the crystal structure characteristics:
| Crystal plane | 2θ angle | Orientation characteristics | Non-orientation characteristics |
|---|---|---|---|
| (110) | ≈45° | Strong diffraction peak | Medium intensity |
| (200) | ≈65° | Weak peak or no peak | Medium intensity |
| (211) | ≈82° | Medium intensity | Strong diffraction peak |
Key operation points
Specimen preparation specifications
The standard requires that the sample be processed into a specification of 35mm×25mm, and the long side must be consistent with the rolling direction. The hydrochloric acid immersion treatment must ensure that the surface coating is completely removed to avoid interference with the diffraction signal.
Instrument parameter setting
It is recommended to use a tube voltage of 40kV, a tube current of 30mA, a scanning range of 30°-95° (2θ angle), and a step size of 0.026°. In special cases, the parameters can be adjusted according to JY/T 009.
Implementation and application recommendations
- Laboratory certification: Testing institutions must pass CNAS certification to ensure regular calibration of X-ray diffractometers
- Staff training: Operators should have a basic knowledge of materials science and be familiar with the requirements of JY/T 009 standards
- Quality control: It is recommended to insert standard samples for process monitoring in each batch of tests
Technology evolution analysis
Compared with traditional metallographic methods, the X-ray diffraction technology used in this standard has the advantages of non-destructive and quantitative. With the popularization of array detectors, advanced methods such as three-dimensional orientation distribution analysis (ODF) can be considered in the future.
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