YS/T 24-1992 in English

SUPERSEDED

Test method for defects of extended nails

Issued on:1992-03-09
Implemented on:1993-01-01
File Format:PDF
Delivery:Via email within 1~3 business days

Price(USD)： $30.00
$30.00

Standard No:	YS/T 24-1992
Document status:	SUPERSEDED
Superseded by:	YS/T 24-2016 Test methods for spike of epitaxial layers
Superseded on:	2016-09-01
Title in English:	Test method for defects of extended nails
Title in Chinese:	外延钉缺陷的检验方法
Language:	English
File Format:	Electronic (PDF)
Delivery:	Via email within 1~3 business days
Issued on:	1992-03-09
Implemented on:	1993-01-01
ICS Classification:	29.045-Semiconducting materials
Chinese Classification:	H80-Semimetal and semiconductor material in general
Professional Classification:	YS-Non-ferrous Metal
Related Keywords:	test method test method nails defects
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