Son + mass + spectrometer + instrument
Son + mass + spectrometer + instrument, Total:16 items.
The international standard classification for "Son + mass + spectrometer + instrument" includes: Chemical analysis , Semiconducting materials , Chemical reagents .
The Chinese standard classification for "Son + mass + spectrometer + instrument" includes: Basic standards and general methods , Semimetal and semiconductor material in general , Chemical Measurement .
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 40129-2021 Surface chemical analysis—Secondary ion mass spectrometry—Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 24582-2009 Test method for measuring surface metal contamination of polycrystalline silicon by acid extraction-inductively coupled plasma mass spectrometry
Professional Standard - Medicine
- YY/T 1740.3-2024 Clinical mass spectrometer-Part 3 : Inductively coupled plasma mass spectrometry
National Metrological Technical Specifications of the People's Republic of China
- JJF 1159-2006 Calibration Specification for Quadrupole Inductively Coupled Plasma Mass Spectrometers
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 34826-2017 Method of performance testing for quadrupole inductively coupled plasma mass spectrometer
GSO
- GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
- BH GSO ISO 13084:2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
- OS GSO ISO 13084:2013 Surface chemical analysis -- Secondary-ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
International Organization for Standardization (ISO)
- ISO 13084:2018 Surface chemical analysis — Secondary ion mass spectrometry — Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
- ISO 13084:2011 Surface chemical analysis - Secondary-ion mass spectrometry - Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
Japanese Industrial Standards Committee (JISC)
- JIS K 0157:2021 Surface chemical analysis -- Secondary ion mass spectrometry -- Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
British Standards Institution (BSI)
- BS ISO 13084:2018 Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
SCC
- 10/30199193 DC BS ISO 13084. Surface chemical analysis. Secondary ion mass spectrometry. Calibration of the mass scale for a time of flight secondary ion mass spectrometer
American Society for Testing and Materials (ASTM)
- ASTM F1366-92(1997)e1 Standard Test Method for Measuring Oxygen Concentration in Heavily Doped Silicon Substrates by Secondary Ion Mass Spectrometry
- ASTM C1832-21 Standard Test Method for Determination of Uranium Isotopic Composition by Modified Total Evaporation (MTE) Method Using Thermal Ionization Mass Spectrometer
- ASTM C1832-16 Standard Test Method for Determination of Uranium Isotopic Composition by the Modified Total Evaporation (MTE) Method Using a Thermal Ionization Mass Spectrometer
Mass spectrometer,Mass Spectrometry Precursor Ion + Product Ion,Mass Spec + Product Ions,MS parameter product ion,mass spectrometer,surface mass spectrometer,Mass Spec Precursor Product Ions,mass spectrometer,Mass Spec Precursor Product Ions,Mass spectrometer,Mass spectrometer,mass spectrometer,ray electron spectrometer,ray electron spectrometer,Spectrum Analyzer,Mass Spec Precursor Product Ions,tandem mass spectrometry detection,sub-mass detection,Son + mass + spectrometer + instrument
