Early failure of electronic components
Early failure of electronic components, Total:20 items.
The international standard classification for "Early failure of electronic components" includes: Electronic components in general , Quality in general , Character sets and information coding , Aerospace electric equipment and systems , Semiconductor devices .
The Chinese standard classification for "Early failure of electronic components" includes: Electronic element in general , Reliability and maintainability , Computer application , Electronic components , Basic standards and general methods .
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 1772-1979 Determination of failure rate of electronic elements and components
- GB/T 36467-2018 Reliability growth—Stress testing for early failures in unique complex systems
Professional Standard - Aerospace
- QJ 2663-1994 Collection Card and Filling Requirements for Failure Data of Aerospace Electronic Devices
- QJ 1317-1987 Electronic component failure classification and code
- QJ 3065.5-1998 Management Requirements for Device Failure Analysis
- QJ 1317A-2005 Classification and Coding for Electronic Components Failure
未注明发布机构
- GJB 8897-2017 Failure analysis requirements and methods for military electronic components
Military Standard of the People's Republic of China-General Armament Department
- GJB/Z 123-1999 Guidelines for effective storage period and re-inspection of aerospace electronic components
- GJB 2649A-2011 Failure rate sampling plans and procedures for military electronic component parts
- GJB 2649-1996 Military Electronic Component Failure Rate Sampling Plans and Procedures
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
- GB/T 7289-2017 Electric components-Reliability-Reference conditions for failure rates and stress models for conversion
Group Standards of the People's Republic of China
- T/CIE 115-2021 General method and procedure of failure mechanism,mode and effects analysis(FMMEA) for electronic components
Korean Agency for Technology and Standards (KATS)
- KS C 6032-1981 General test procedure of failure rate for electronic components
- KS C 6032-2021 General test procedure of failure rate for electronic components
Japanese Industrial Standards Committee (JISC)
- JIS C 5003:1974 General test procedure of failure rate for electronic components
International Electrotechnical Commission (IEC)
- IEC 61709:1996 Electronic components - Reliability - Reference conditions for failure rates and stress models for conversion
British Standards Institution (BSI)
- DD IEC/PAS 62435:2005 Electronic components. Long duration storage of electronic components. Guidance for implementation
- BS EN IEC 62435-8:2020 Electronic components. Long-term storage of electronic semiconductor devices - Passive electronic devices
SCC
- BS DD IEC/PAS 62435:2005 Electronic components. Long duration storage of electronic components. Guidance for implementation
European Committee for Standardization (CEN)
- EN 62429:2008 Reliability growth — Stress testing for early failures in unique complex systems
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