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Half wave plate preparation

Half wave plate preparation, Total:143 items.

The international standard classification for "Half wave plate preparation" includes: Integrated circuits. Microelectronics , Abrasives , Chemical laboratories. Laboratory equipment , Products in fibre-reinforced cement .

The Chinese standard classification for "Half wave plate preparation" includes: Technical Management , Semiconductor integrated circuit , Grinding material and apparatus , Electrochemical, thermochemistry and optical profile type analyzer , Concrete product .


Taiwan Provincial Standard of the People's Republic of China

Professional Standard - Electron

  • SJ 2433-1984 Bonding sheet for semiconductor tubes
  • SJ/T 11856.3-2022 Technical Specifications for Semiconductor Laser Chips for Optical Fiber Communications Part 3: Electric Absorption Modulated Semiconductor Laser Chips for Light Sources
  • SJ/T 10245-1991 Microwave ceramic dielectric materials-Microwave composite dielectric substrate
  • SJ/T 11742-2019 Thermally conductive non-prepreg prepreg for printed circuit

Group Standards of the People's Republic of China

Professional Standard - Agriculture

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

  • GB/T 20870.10-2023 Semiconductor devices—Part 16-10: Technology Approval Schedule for monolithic microwave integrated circuits
  • GB/T 30244-2013 Oscillographic Polarograph and Its Test Solution
  • GB/T 42836-2023 Microwave semiconductor integrated circuits—Frequency mixer
  • GB/T 42837-2023 Microwave semiconductor integrated circuits—Amplifier
  • GB/T 43136-2023 Superabrasive products—Precision dicing and cutting wheels for semiconductor chips

Xizang Provincial Standard of the People's Republic of China

工业和信息化部/国家能源局

  • JB/T 13535-2018 Electromagnetic shielding一Electromagnetic wave absorbing sheet

Professional Standard - Coal

  • MT 116.3-1986 Preparation method of coal rock analysis sample Part 3 Preparation method of coal rock thin section and light thin section

Professional Standard - Machinery

  • JB/T 11645-2013 Pulverization Equipment of Calcium Carbide Dreg for Semi-dry Flue Gas Desulphurization

工业和信息化部

  • SJ/T 11762-2020 Requirements for semiconductor equipment manufacturing information tagging
  • SJ/T 11763-2020 Specification for human interface for semiconductor manufacturing equipment

Beijing Provincial Standard of the People's Republic of China

  • DB11/ 078-1997 Beijing Industrial Rectification Equipment Harmonic Limitation

Professional Standard - Petrochemical Industry

Professional Standard - Building Materials

  • JC/T 627-2008 Asbestos-cement half-corrugated sheet of asymmetrical section
  • JC/T 627-1996 Asymmetric section asbestos cement half wave board

国家建筑材料工业局

  • JC/T 0627-1996 Asymmetrical cross-section asbestos cement half-wave plate

Fujian Provincial Standard of the People's Republic of China

未注明发布机构

  • SEMI S6-0707-2007 EHS GUIDELINE FOR EXHAUST VENTILATION OF SEMICONDUCTOR MANUFACTURING EQUIPMENT

Defense Logistics Agency

IPC - Association Connecting Electronics Industries

US-ACEI

RO-ASRO

GM Europe

British Standards Institution (BSI)

  • BS EN 60747-16-10:2004 Semiconductor devices - Technology Approval Schedule (TAS) for monolithic microwave integrated circuits
  • BS 7855-1:1996 Metric rivets for the attachment of friction linings - Specification for semi-tubular rivets
  • BS EN 62333-3:2010 Noise suppression sheet for digital devices and equipment - Characterization of parameters of noise suppression sheet

Association Francaise de Normalisation

  • NF S61-706:1966 Fire fighting equipment. Positioning of the lugs or jaws on guillemin-type and self-sealing symmetrical couplings.
  • NF EN IEC 60747-16-8:2023 Dispositifs à semiconducteurs - Partie 16-8 : circuits intégrés hyperfréquences - Limiteurs
  • NF C96-016-10*NF EN 60747-16-10:2005 Semiconductor devices - Part 16-10 : Technology Approval Schedule (TAS) for monolithic microwave integrated circuits
  • NF EN 60747-16-10:2005 Semiconductor devices - Part 16-10: Technology Approval Framework (TAS) format for monolithic microwave integrated circuits

Korean Agency for Technology and Standards (KATS)

AR-IRAM

YU-JUS

SCC

  • BS IEC 60747-4:2007 Semiconductor devices. Discrete devices. Microwave diodes and transistors
  • MIL MIL-W-28839/1-1978 WAVEGUIDES, ELLIPTICAL, SEMIRIGID
  • MIL MIL-DTL-28839/1A-2013 Waveguides, Elliptical, Semirigid
  • BS 1928:1955 Gramophone records , transcription disc recordings and disc reproducing equipment
  • CEI EN IEC 60747-16-8:2023 Semiconductor devices Part 16-8: Microwave integrated circuits – Limiters
  • DANSK DS/EN IEC 60747-16-8:2023 Semiconductor devices – Part 16-8: Microwave integrated circuits – Limiters
  • CEI EN 60747-16-10:2005 Semiconductor devices Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits
  • MIL MIL-M-38510/600-1987 MICROCIRCUITS, DIGITAL, BIPOLAR, SEMICUSTOM (GATE ARRAY) DEVICES, MONOLITHIC SILICON
  • DANSK DS/EN 60747-16-10:2004 Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits
  • BS 1928:1961 Gramophone records and reproducing equipment
  • BS 9325:1977 Rules for the preparation of detail specifications for semiconductor devices of assessed quality: microwave Gunn oscillators (c.w. operation)
  • BS 9327:1977 Rules for the preparation of detail specifications for semiconductor devices of assessed quality: microwave avalanche oscillators (c.w. operation)
  • BS 1928:1960 Gramophone records and reproducing equipment
  • MIL MIL-M-38510/607-1988 MICROCIRCUITS, DIGITAL, CMOS SEMICUSTOM (GATE ARRAY) DEVICES, MONOLITHIC SILICON (S/S BY MIL-M-38510/607A)
  • BS 9320:1971 Rules for the preparation of detail specifications for semiconductor devices of assessed quality: microwave mixer diodes (c.w. operation)
  • BS 2738-5:1992 Spectacle lenses-Specifications for progressive power semi-finished lens blanks

European Committee for Electrotechnical Standardization(CENELEC)

  • EN 62047-7:2011 Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection

Danish Standards Foundation

  • DS/EN 62047-7:2011 Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection
  • DS/EN 60747-16-10:2004 Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits

U.S. Military Regulations and Norms

American National Standards Institute (ANSI)

HU-MSZT

German Institute for Standardization

  • DIN EN 60747-16-10:2005 Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits (IEC 60747-16-10:2004); German version EN 60747-16-10:2004
  • DIN EN 60747-16-10:2005-03 Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits (IEC 60747-16-10:2004); German version EN 60747-16-10:2004

AIA/NAS - Aerospace Industries Association of America Inc.

  • NAS4118-1996 Heat Sink@ Electrical- Electronic Component@ Semiconductor Devices@ Retainer Clip Type

Japanese Industrial Standards Committee (JISC)

  • JIS C 6520:1993 General rules of prepreg for multilayer printed wiring boards
  • JIS C 6521:1996 Test methods of prepreg for multilayer printed wiring boards

International Electrotechnical Commission (IEC)

  • IEC 60747-16-8:2022 Semiconductor devices - Part 16-8: Microwave integrated circuits - Limiters
  • IEC 60747-16-10:2004 Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits

ES-UNE

  • UNE-EN IEC 60747-16-8:2023 Semiconductor devices - Part 16-8: Microwave integrated circuits - Limiters (Endorsed by Asociación Española de Normalización in February of 2023.)
  • UNE-EN 60747-16-10:2004 Semiconductor devices -- Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits (Endorsed by AENOR in November of 2004.)
  • UNE-EN 62333-3:2010 Noise suppression sheet for digital devices and equipment -- Part 3: Characterization of parameters of noise suppression sheet (Endorsed by AENOR in June of 2010.)

IT-UNI

American Society for Testing and Materials (ASTM)

  • ASTM E431-96(2016) Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices

Aerospace Industries Association

  • AIA NAS 4118-1996 Heat Sink, Electrical- Electronic Component, Semiconductor Devices, Retainer Clip Type

GSO

  • OS GSO IEC 60747-16-10:2014 Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits
  • GSO IEC 60747-16-3:2014 Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters

Association of German Mechanical Engineers

  • DVS 2216-5-1995 Production of ultrasonically bonded sonotrodes for molded parts and semi-finished products made of thermoplastics in series production
  • DVS 2216-6-2013 Ultrasonic joining of mouldings and semi-finished products made of amorphous thermoplastics in series fabrication
  • DVS 2216-6-2002 Ultrasonic joining of mouldings and semi-finished products made of amorphous thermoplastics in series fabrication
  • DVS 2216-1-1991 Ultrasonic joining and processing of molded parts and semi-finished products made of thermoplastics for series production; machines and equipment; functional description and requirements
  • DVS 2216-2-1991 Ultrasonic joining and processing of molded parts and semi-finished products made of thermoplastics for series production; ultrasonic welding; procedures and features

RU-GOST R

  • GOST R 56579-2015 Semi-prepared meat-contained ground products for children nutrition. Specifications

Electronic Components, Assemblies and Materials Association

  • ECA 540A000-A-1990 Sectional Specification for Sockets for Chip Carriers for Use in Electronic Equipment

GOST

Institute of Interconnecting and Packaging Electronic Circuits (IPC)

  • IPC TM-650 2.1.1.2-2004 Microsectioning-Semi or Automatic Technique Microsection Equipment (Alternate) Revision A

CZ-CSN