imaging collector

imaging collector, Total:264 items.

The international standard classification for "imaging collector" includes: Integrated circuits. Microelectronics , Optoelectronics. Laser equipment , Fiber and cables , Other standards related to protection against fire , Protection against crime , Astronomy. Geodesy. Geography , Fiber optic interconnecting devices , Non-destructive testing , Optical equipment , Ophthalmic equipment , Solar energy engineering .

The Chinese standard classification for "imaging collector" includes: Microcircuit in general , Laser device , Special electronic technology material , Optical communication equipment , Semiconductor discrete devices in general , Semiconductor integrated circuit , Fire-fighting in general , Photogrammetry and Remote Sensing , X ray, magnetic powder, fluorescent light and other defectoscope , Optical equipment , Medical optical instrument and endoscope , Solar energy .

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 17940-2000 Semiconductor devices--Integrated circuits--Part 3:Analogue integrated circuits
GB/T 28511.2-2012 Integrated optical path devices based on planar lightwave circuit—Part 2:DWDM filter based on AWG technology
GB/T 43725-2024 Direct writing imaging exposure equipment
GB/T 28511.2-2023 Integrated optical path devices based on planar lightwave circuit—Part 2 ：Dense wavelength division multiplexing(DWDM) filter based on arrayed waveguide grating(AWG) technology
GB/T 44605-2024 Laser and laser-related equipment—Absorption distribution measurement of optical laser components—Photothermal mapping method
GB/T 15651-1995 Semiconductor devices Discrete devices and integrated circuits Part 5: Optoelectronic devices
GB/T 28511.1-2012 Integrated optical path devices based on planar lightwave circuit—Part 1:Optical power splitter based on PLC technology
GB/T 17574-1998 Semiconductor devices --Integrated circuits Part 2:Digital integrated circuits
GB/T 43063-2023 Integrated circuit—Test method for CMOS image sensors
GB/T 17574.9-2006 Semiconductor devices - Integrated circuits - Part 2-9: Digital integrated circuits - Blank detail specification for MOS ultraviolet light erasable electrically programmable read-onl
GB/T 29846-2013 Photoimageable plating and etching resist paste of printed circuit board

工业和信息化部

YD/T 2904.3-2019 Integrated tunable laser assembly-Part 3: Dual-channel assembly
YD/T 3540-2019 Integrated optical power monitor
YD/T 2799.2-2015 Technical specification of integrated intradyne coherent receiver Part 2:100Gbit/s
YD/T 2904.2-2018 Integrated tunable laser assembly-Part 2:micro assembly
YD/T 2799.4-2021 Technical requi rment of LTE digital cellular mobile te lecommuni cation network of enhanced MTC core network equi pment
YD/T 2000.2-2018 Integrated optical path devices based on planar lightwave circuit-Part 2:DWDM filter based on AWG technology
YD/T 2799.1-2015 Technical specification of integrated intradyne coherent receiver Part 1:40Gbit/s

Group Standards of the People's Republic of China

T/SZSMDA 010-2024 Fundus fluorescein angiography collective standard for wide-field digital pediatric retinal imaging system
T/ICMTIA 5.3-2020 Lithography ArF Photo Resist of measurement for Intergraded circuits
T/CFPA 027-2023 Human model system for life detection radar testing
T/CPIA 0009-2019 Electroluminescence Imaging Method for Defect Detection of Crystalline Silicon Photovoltaic Modules
T/QGCML 4496-2024 Electromagnetic interference resistant infrared thermal imaging core components of photoelectric measuring instruments
T/NJAF 001-2020 Infrared thermal imaging method for rapid screening of body temperature in crowded areas
T/NSSQ 064-2023 Technical Specification for Integration of Al Cameras within Smart Screen
T/CAIA YQ007-2021 General test method for photoelectric performance of electron multiplying charge coupled imaging device
T/SDIE 19-2024 General Technological Specification for Underwater Laser Imaging Systems
T/ZZB 1335-2019 Optical low pass filter for high-definition imaging
T/ZZB 2866-2022 Variable frequency controller for integrated stove
T/CADBM 61-2022 Integrated electrical controller for ceiling
T/CIE 079-2020 Evaluation of industrial high-reliability integrated circuits—Part 14:Imaging sensor
T/QGCML 3202-2024 Integrated ceiling heater
T/ICMTIA 5.1-2020 ArF Dry photo resist for Integrated circuits
T/QGCML 4495-2024 Optical Gas Thermal Infrared Thermal Imager Components for Handheld Photoelectric Measurement
T/YNBX 098-2023 Determination of rice seed vigor - Multispectral imaging method
T/SCGS 313003-2023 Standards for image quality evaluation of near-infrared second-zone fluorescence imaging technology

Military Standard of the People's Republic of China-General Armament Department

GJB 4026-2000 General specification for lithium niobate integrated optical devices
GJB 9888-2020 Lithium niobate integrated optical device test method
GJB 5968A-2021 General specifications for charge-coupled imaging devices
GJB 7951-2012 Measuring methods for charge coupled imaging devices
GJB 9631-2019 Specifications for optical imaging sensors for manned spacecraft rendezvous and docking
GJB 4026A-2014 General specification for LiNbO<下标3> integrated optics devices
GJB 5546-2006 General specification for airborne optics imaging reconnaissance
GJB 10036-2021 Cloud and smoke adaptability assessment method for laser imaging system
GJB 9726-2020 Specifications for spaceborne hyperspectral imagers
GJB 5968-2007 General specincation for imaging charge coupled devices

Zhejiang Provincial Standard of the People's Republic of China

DB3304/T 101-2023 Standards for integrated collection and application management of ID photos and portraits

Professional Standard - Electron

SJ 20868-2003 Measuring methods for charge coupled imaging device
SJ/T 11404-2009 General specifications for LiNbO3 integrated optical devices
SJ 20869-2003 Measuring methods for LiNbO3 integrated optical guided-wave modulators

未注明发布机构

JIS Z 2411:2024 General rules for acoustic optical interference imaging analysis

Professional Standard - Public Safety Standards

GA/T 1195-2014 Spectral imaging methods by tunable filter in forensic science

国家市场监督管理总局、中国国家标准化管理委员会

GB/T 36301-2018 Pre-processing product levels for spaceborne hyperspectral imaging data
GB/T 38935-2020 On-orbit radiometric characteristics assessment for optical imaging remote sensor—VIS-SWIR

Professional Standard - Post and Telecommunication

YD/T 2904.1-2015 Integrated tunable laser assemblyPart 1: Butterfly package assembly
YD/T 2000.1-2009 Integrated optical path devices based on planar lightwave ciruit Part 1：Optical power splitter based on PLC technology
YD/T 2000.2-2009 Integrated optical path devices based on planar lightwave circuit Part 2 ：DWDM filter based on AWG technology
YD/T 2799.5-2023 Technical specification of integrated intradyne coherent receiver- Part 5: 800Gb/s
YD/T 2000.1-2014 Integrated optical path devices based on planar lightwave circuit Part 1:Optical power splitter based on PLC technology

Professional Standard - Machinery

JB/T 5453-2011 Non-destructive testing instruments —Industrial X-ray image intensifier imaging system

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会

GB/T 35437-2017 General specification for spaceborne opto-electronic tracking and imaging system

Professional Standard - Medicine

YY/T 1895-2023 Intravascular optical coherence tomograph

Military Standard of the People's Republic of China-Commission of Science,Technology and Industry for National Defence

GJB 5984-2007 Specification for generation Ⅲ image intensiner assembly

Professional Standard - Military and Civilian Products

WJ 2091-1992 Low-light image intensifier test method

Guangdong Provincial Standard of the People's Republic of China

DB44/T 1645-2015 Integrated (COB) White LED Technical Requirements

Professional Standard - Energy

NB/T 11081-2023 Specification for infrared thermal imaging (TIS) inspection of photovoltaic modules

Taiwan Provincial Standard of the People's Republic of China

CNS 13197-1993 Determination of the Image Distortion of Electro - Optical X - Ray Image Intensifiers

Shandong Provincial Standard of the People's Republic of China

DB37/T 2888-2016 Moderate Resolution Imaging Spectrometer (MODIS) Remote Sensing Image Wheat Growth Monitoring Technical Regulations

SCC

NACE AMPP TR21478-2023 3D Optical Imaging Techniques
NS-EN 17501:2022 Non-destructive testing - Thermographic testing - Active thermography with laser excitation
DANSK DS/EN 17501:2022 Non-destructive testing – Thermographic testing – Active thermography with laser excitation
NEMA MITA JSC 51500-2023 Machine Learning Algorithms: Dataset Management Best Practices in Medical Imaging
DIN 54185:2021 Non-destructive testing - Thermographic testing - Lock-In thermography using optical excitation
VDI/VDE 5596 BLATT 2:2022 Production-oriented optics development — Illumination optics, non-imaging optics and free-form optics — Optical surfaces
DIN 54185 E:2018 Draft Document - Non-destructive testing - Thermographic testing - Lock-In thermography using optical excitation
VDI/VDE 5596 BLATT 3:2022 Production-oriented optics development — Illumination optics, non-imaging optics and freeform optics — Optical material parameters
DANSK DS/ISO 18925:2013 Imaging materials - Optical disc media - Storage practices
BS ISO 18925:2008 Imaging materials. Optical disc media. Storage practices
AWWA IMTECH59611 Document Imaging & GIS Integrating with Your Existing Applications
BS ISO 18925:2002 Imaging materials. Optical disk media. Storage practices
CIE 163:2004 The effects of fluorescence in the characterization of imaging media
MIL MIL-PRF-49384B-1997 OPTICAL IMAGER, SU-121/UA (SUPERSEDING MIL-O-49384A)
IEC 60747-5:1984 Semiconductor devices - Discrete devices and integrated circuits - Part 5: Optoelectronic devices
CIE x036:2010 Proceedings of CIE Expert Symposium on Spectral and Imaging Methods for Photometry and Radiometry (30-31 August 2010, Bern, Switzerland)
BS PD IEC TS 63202-2:2021 Photovoltaic cells-Electroluminescence imaging of crystalline silicon solar cells
BS 6493-1-1.5:1985 Semiconductor devices: discrete devices and integrated circuits. Discrete devices.-Recommendations for optoelectronic devices
BS IEC 60748-2-20:2000 Semiconductor devices. Integrated circuits. Digital integrated circuits-Family specification. Low voltage integrated circuits
VDI/VDE 2634 BLATT 2-2012 Optical 3-D measuring systems — imaging systems with area probing
BS ISO 15529:1999 Optics and optical instruments. Optical transfer function. Principles of measurement of modular transfer function (MTF) of sampled imaging systems
DIN 54184:2017 Non-destructive testing - Pulse thermography using optical excitation
DANSK DS/EN 17119:2018 Non-destructive testing – Thermographic testing – Active thermography
NS-EN 17119:2018 Non-destructive testing — Thermographic testing — Active thermography
DANSK DS/EN 60747-5-1:2002 Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General
BS 6493-2-2.2:1986 Semiconductor devices. Integrated circuits-Recommendations for digital integrated circuits
BS 6493-2-2.4:1989 Semiconductor devices. Integrated circuits-Recommendations for interface integrated circuits
DANSK DS/ISO 18938:2014 Imaging materials - Optical discs - Care and handling for extended storage
BS 6801:1986 Method for determination of image distortion of electro-optical X-ray image intensifiers
DIN EN 17501 E:2020 Draft Document - Non-destructive testing - Thermographic testing - Active thermography with laser excitation; German and English version prEN 17501:2020
IEC 60747-5:1992/AMD2:1995 Amendment 2 - Semiconductor devices - Discrete devices and integrated circuits - Part 5: Optoelectronic devices
IEC 60747-5:1992/AMD1:1994 Amendment 1 - Semiconductor devices - Discrete devices and integrated circuits - Part 5: Optoelectronic devices

German Institute for Standardization

DIN EN 17501:2020 Non-destructive testing - Thermographic testing - Active thermography with laser excitation; German and English version prEN 17501:2020
DIN EN 17501:2022-08 Non-destructive testing - Thermographic testing - Active thermography with laser excitation; German version EN 17501:2022
DIN ISO 9358:2021-08 Optics and optical instruments - Veiling glare of image-forming systems - Definitions and methods of measurement (ISO 9358:1994)
DIN 54185:2021-06 Non-destructive testing - Thermographic testing - Lock-In thermography using optical excitation
DIN 54185 E:2018-10 Non-destructive testing - Thermographic testing - Lock-In thermography using optical excitation
DIN ISO 9358:2020 Optics and optical instruments - Veiling glare of image forming systems - Definitions and methods of measurement (ISO 9358:1994); Text in German and English
DIN ISO 9358:2021 Optics and optical instruments - Veiling glare of image-forming systems - Definitions and methods of measurement (ISO 9358:1994)
DIN 54184:2017-10 Non-destructive testing - Pulse thermography using optical excitation
DIN 54184 E:2017-01 Non-destructive testing - Pulse thermography using optical excitation
DIN EN 17119:2018-10 Non-destructive testing - Thermographic testing - Active thermography; German version EN 17119:2018

Association Francaise de Normalisation

NF EN 17501:2022 Essais non destructifs - Analyse thermographique - Thermographie active avec excitation laser
NF S10-043*NF ISO 9358:1998 Optics and optical instruments. Veiling glare of image-forming systems. Definitions and methods of measurement.
NF C96-005:1994 Discrete devices and integrated circuits. Part 5 : optoelectronic devices.
NF ISO 9358:1998 Optics and optical instruments - Diffuse stray light from imaging systems - Definitions and measurement methods
NF S10-045:1999 Optics and optical instruments - General optical test methods - Measurement of relative irradiance in the image field.
NF S10-051*NF ISO 15795:2002 Optics and optical instruments - Quality evaluation of optical systems - Assessing the image quality degradation due to chromatic aberrations
NF EN 17119:2018 Essais non destructifs - Analyse thermographique - Thermographie active
NF C96-005-1/A1*NF EN 60747-5-1/A1:2002 Discrete semiconductor devices and integrated circuits - Part 5-1 : optoelectronic devices - General
NF EN 60747-5-1/A2:2002 Dispositifs discrets à semiconducteurs et circuits intégrés - Partie 5-1 : dispositifs optoélectroniques - Généralités
NF C96-005-1*NF EN 60747-5-1:2001 Discrete semiconductor devices and integrated circuits - Part 5-1 : optoelectronic devices - General
NF EN 60747-5-1/A1:2002 Dispositifs discrets à semiconducteurs et circuits intégrés - Partie 5-1 : dispositifs optoélectroniques - Généralités
NF A09-029*NF EN 17119:2018 Non-destructive testing - Thermographic testing - Active thermography
NF EN 60747-5-1:2001 Dispositifs discrets à semiconducteurs et circuits intégrés - Partie 5-1 : dispositifs optoélectroniques - Généralités
NF C96-005-1/A2*NF EN 60747-5-1/A2:2002 Discrete semiconductor devices and integrated circuits - Partie 5-1 : optoelectronic devices - General

International Organization for Standardization (ISO)

ISO 9358:1994 Optics and optical instruments - Veiling glare of image-forming systems - Definitions and methods of measurement
ISO 18925:2008 Imaging materials - Optical disc media - Storage practices
ISO 15529:1999 Optics and optical instruments - Optical transfer function - Principles of measurement of modulation transfer function (MTF) of sampled imaging systems
ISO 18925:2013 Imaging materials - Optical disc media - Storage practices
ISO 18946:2023 Imaging materials
ISO 18938:2014 Imaging materials - Optical discs - Care and handling for extended storage
ISO 18938:2008 Imaging materials - Optical discs - Care and handling for extended storage

U.S. Military Regulations and Norms

ARMY MIL-PRF-49384B-1997 OPTICAL IMAGER, SU-121/UA
ARMY MIL-PRF-49384 B NOTICE 1-2013 OPTICAL IMAGER, SU-121/UA
ARMY MIL-PRF-49173B-1997 OPTICAL IMAGER, SU-103/UA AND SU-103A/UA
ARMY MIL-PRF-49173 B NOTICE 1-2013 OPTICAL IMAGER, SU-103/UA AND SU-103A/UA
ARMY MIL-PRF-49170 B NOTICE 1-2013 OPTICAL IMAGER, SU-97/UA, SU-97A/UA, AND SU-97B/UA
ARMY MIL-PRF-49170B-1997 OPTICAL IMAGER, SU-97/UA, SU-97A/UA, AND SU-97B/UA

Spanish Association for Standardization (UNE)

UNE-EN 17501:2022 Non-destructive testing - Thermographic testing - Active thermography with laser excitation
IEEE 3333.1.4-2022 IEEE Recommended Practice for the Quality Assessment of Light Field Imaging
UNE-EN 17119:2019 Non-destructive testing - Thermographic testing - Active thermography

Korean Agency for Technology and Standards (KATS)

KS B ISO 9358:2006 Optics and optical instruments Veiling glare of image-forming systems - Definitions and methods of measurement
KS B ISO 9358-2006(2016) Optics and optical instruments -- Veiling glare of image forming systems -- Definitions and methods of measurement
KS B ISO 9358-2006(2021) Optics and optical instruments -- Veiling glare of image forming systems -- Definitions and methods of measurement
KS A ISO 18925-2021 Imaging materials－Optical disc media－Storage practices
KS A ISO 18925-2016(2021) Imaging materials－Optical disc media－Storage practices
KS A ISO 18925:2016 Imaging materials－Optical disc media－Storage practices
KS A ISO 18925:2006 Imaging materials-Optical disc media-Storage practices
KS C IEC 60747-5:2004 Semiconductor devices－Discrete devices－Part 5：Optoelectronic devices
KS C IEC 60747-5-1:2020 Discrete semiconductor devices and integrated circuits —Part 5-1: Optoelectronic devices — General
KS C IEC 60748-3-1:2002 Semiconductor devices－Integrated circuits－Part 3：Analogue integrated circuits－Section 1：Blank detail specification for monolithic integrated operational amplifiers
KS B 5310-2021 Thermographs
KS C IEC 60748-2-8:2002 Semiconductor devices－Integrated circuits－Part 2：Digital integrated circuits－Section 8：Blank detail specification for integrated circuits static read/write memories
KS C IEC 60748-2-2001(2016) Semiconductor devices－integrated circuits－Part 2：Digital integrated circuits
KS C IEC 60748-3:2002 Semiconductor devices－Integrated circuits Part 3：Analogue integrated circuits
KS C IEC 60748-2-2001(2021) Semiconductor devices－integrated circuits－Part 2：Digital integrated circuits
KS C IEC 60748-4-2004(2020) Semiconductor devices－Integrated circuits－Part 4：Interface integrated circuits
KS A ISO 12234-2-2006(2016) Electronic still-picture imaging－Removable memory－Part 2：TIFF/EP image data format
KS A ISO 12234-2-2021 Electronic still-picture imaging－Removable memory－Part 2：TIFF/EP image data format
KS A ISO 12234-2-2006(2021) Electronic still-picture imaging－Removable memory－Part 2：TIFF/EP image data format
KS C IEC 60748-4:2004 Semiconductor devices－Integrated circuits－Part 4：Interface integrated circuits
KS C IEC 60748-3-2002(2022) Semiconductor devices－Integrated circuits Part 3：Analogue integrated circuits
KS C IEC 60748-3-2022 Semiconductor devices－Integrated circuits Part 3：Analogue integrated circuits
KS C IEC 60748-2:2001 Semiconductor devices－integrated circuits－Part 2：Digital integrated circuits
KS C IEC 60748-2-2021 Semiconductor devices－integrated circuits－Part 2：Digital integrated circuits

GSO

OS GSO ISO 9358:2015 Optics and optical instruments -- Veiling glare of image forming systems -- Definitions and methods of measurement
OS GSO ISO 18916:2013 Imaging materials -- Processed imaging materials -- Photographic activity test for enclosure materials
GSO ISO 9358:2015 Optics and optical instruments -- Veiling glare of image forming systems -- Definitions and methods of measurement
OS GSO ISO 18925:2013 Imaging materials -- Optical disc media -- Storage practices
BH GSO ISO 18925:2016 Imaging materials -- Optical disc media -- Storage practices
GSO IEC 60747-5-1:2014 Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General
GSO ISO 18938:2013 Imaging materials -- Optical discs -- Care and handling for extended storage
OS GSO IEC 60747-5-1:2014 Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General
BH GSO IEC 60748-2:2016 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits
OS GSO IEC 60748-3:2014 Semiconductor devices - Integrated circuits - Part 3: Analogue integrated circuits
BH GSO IEC 60748-3:2016 Semiconductor devices - Integrated circuits - Part 3: Analogue integrated circuits
OS GSO IEC 60748-2:2014 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits
GSO IEC 60748-3:2014 Semiconductor devices - Integrated circuits - Part 3: Analogue integrated circuits

British Standards Institution (BSI)

BS ISO 9358:1994(2000) Optics and optical instruments — Veiling glare of image - forming systems — Definitions and methods of measurement
BS EN 17501:2022 Non-destructive testing. Thermographic testing. Active thermography with laser excitation
20/30410182 DC BS EN 17501. Non-destructive testing. Thermographic testing. Active thermography with laser excitation
BS ISO 9358:1995 Optics and optical instruments - Veiling glare of image forming systems - Definitions and methods of measurement
BS ISO 9358:1994 Optics and optical instruments. Veiling glare of image forming systems. Definitions and methods of measurement
BS ISO 13653:1997 Optics and optical instruments - General optical test methods - Measurement of relative irradiance in the image field
BS IEC 60747-5-1:1998 Discrete semiconductor devices and integrated circuits. Optoelectronic devices. General
BS EN 60747-5-1:1998 Discrete semiconductor devices and integrated circuits. Optoelectronic devices. General
BS EN 60747-5-1:2001 Discrete semiconductor devices and integrated circuits - Optoelectronic devices - General
BS IEC 60747-5-3:1998 Discrete semiconductor devices and integrated circuits. Optoelectronic devices. Measuring methods
BS EN 60747-5-3:2001 Discrete semiconductor devices and integrated circuits - Optoelectronic devices - Measuring methods
BS EN 60747-5-3:1998 Discrete semiconductor devices and integrated circuits. Optoelectronic devices. Measuring methods
BS IEC 60748-2:1998 Semiconductor devices. Integrated circuits. Digital integrated circuits
BS IEC 60748-4:1997 Semiconductor devices. Integrated circuits. Interface integrated circuits
BS IEC 60748-2:1997 Semiconductor devices - Integrated circuits - Digital integrated circuits
BS ISO 18925:2013 Imaging materials. Optical disc media. Storage practice
BS IEC 60748-2-20:2008 Semiconductor devices - Integrated circuits - Digital integrated circuits - Family specification - Low voltage integrated circuits
PD IEC TS 63202-2:2021 Photovoltaic cells. Electroluminescence imaging of crystalline silicon solar cells
BS IEC 60748-2-11:1999 Semiconductor devices - Integrated circuits - Digital integrated circuits - Blank detail specification for single supply integrated circuit, electrically erasable, and programmable read-only memory - Blank detail specification for single supply integrated
BS ISO 15529:2010 Optics and photonics. Optical transfer function. Principles of measurement of modulation transfer function (MTF) of sampled imaging systems
BS EN ISO 11807-2:2005 Integrated optics - Vocabulary - Terms used in classification
BS EN ISO 11807-2:2021 Integrated optics. Vocabulary. Terms used in classification
BS EN 17119:2018 Non-destructive testing. Thermographic testing. Active thermography
BS 6493-2.3:1987 Semiconductor devices. Integrated circuits. Recommendations for analogue integrated circuits
BS EN 60747-16-1:2002 Discrete semiconductor devices and integrated circuits - Microwave integrated circuits - Amplifiers
BS EN 60747-5-1:2001(2003) Discretesemiconductor devices and integrated circuits — Part 5 - 1 : Optoelectronic devices — General
BS ISO 18938:2008 Imaging materials - Optical discs - Care and handling for extended storage
BS ISO 18938:2014 Imaging materials. Optical discs. Care and handling for extended storage
BS EN ISO 11807-1:2021 Integrated optics. Vocabulary. Optical waveguide basic terms and symbols
BS EN 60747-5-2:2001 Discrete semiconductor devices and integrated circuits - Optoelectronic devices - Essential ratings and characteristics
BS EN 60747-5-2:1998 Discrete semiconductor devices and integrated circuits. Optoelectronic devices. Essential ratings and characteristics
BS IEC 62679-3-3:2016 Electronic paper displays - Optical measuring methods for displays with integrated lighting units

Society of Automotive Engineers (SAE)

SAE ARP4967C-2023 Night Vision Imaging Systems (NVIS) Integrally Illuminated Information Panels

GB-REG

REG NASA-LLIS-0526-1994 Lessons Learned ?Magnetic Field Distribution in the Magneto-Optic Imaging Instrument
REG NASA-LLIS-0903-2000 Lessons Learned ?High Energy Spectroscopic Imager Test Mishap

GOST

GOST R 71050-2023 Integrated optoelectronic microcircuits and optocouplers. Parameters system

KR-KS

KS B ISO 9358-2023 Optics and optical instruments — Veiling glare of image forming systems — Definitions and methods of measurement
KS A ISO 18925-2016 Imaging materials－Optical disc media－Storage practices
KS C IEC 60747-5-1-2020 Discrete semiconductor devices and integrated circuits —Part 5-1: Optoelectronic devices — General

U.S. Air Force

AIR FORCE MIL-I-25861 D VALID NOTICE 2-2008 Indicator, Pressure, Hydraulic, 0-4,000 PSI, Integrally Lighted

Association of German Mechanical Engineers

VDI VDE 5596 Blatt 3-2022 Optical design for manufacturing Illumination optics, non-imaging and freeform optics Optical material parameters
VDI VDE 5596 Blatt 2-2022 Optische Oberflächen Optical design for manufacturing Illumination optics, non-imaging and freeform optics Optical surfaces
VDI/VDE 3717 Blatt 10-1993 Mask engineering; masks for integrated optics

US-RTCA

RTCA DO-275-2001 Minimum Operational Performance Standards for Integrated Night Vision Imaging System Equipment

ANSI - American National Standards Institute

IT9.25-1998 Imaging Materials - Optical Disc Media - Storage (IS&T)

Danish Standards Foundation

DS/ISO 18925:2013 Imaging materials - Optical disc media - Storage practices
DS/ISO 18918:2001 Imaging materials - Processed photographic plates - Storage practices
DS/EN 60747-5-1/A2:2002 Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General
DS/EN 60747-5-1/A1:2002 Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General
DS/EN 60747-5-1:2002 Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General
DS/IEC 748-3+Amd.1:1993 Semiconductor devices - Integrated circuits - Part 3: analogue integrated circuits
DS/IEC 748-4+Amd.1:1993 Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits

RU-GOST R

GOST R IEC 61223-3-1-2001 Evaluation and routine testing in medical imaging departments. Part 3-1. Imaging performance of X-ray equipment for radiographic and radioscopic systems. Acceptance tests
GOST 29283-1992 Semiconductor devices. Discrete devices and integrated circuits. Part 5. Optoelectronic devices
GOST R ISO 4090-2006 Photography. Medical radiographic cassettes/screens/films and hard-copy imaging films. Dimensions and technical requirements
GOST R IEC 61675-2-2002 Radionuclide imaging devices. Characteristics and test conditions. Part 2. Single photon emission computed tomographs
GOST R IEC 61675-2-2006 Radionuclide imaging devices. Characteristics and test conditions. Part 2. Single photon emission computed tomographs
GOST R IEC 61223-2-10-2001 Evaluation and routine testing in medical imaging departments. Part 2-10. Constancy tests. X-ray equipment for mammography

North Atlantic Treaty Organization Standards Agency

STANAG 4161-1982 THE OPTICAL TRANSFER FUNCTION OF IMAGING SYSTEMS - AISP-01

IET - Institution of Engineering and Technology

INTRO SEN RNG IMG-2009 Introduction to Sensors for Ranging and Imaging

IPC - Association Connecting Electronics Industries

IPC PE-74 SECTION 9- Imaging

American Society for Testing and Materials (ASTM)

ASTM D5767-95(2004) Standard Test Methods for Instrumental Measurement of Distinctness-of-Image Gloss of Coating Surfaces
ASTM F1443-93(2003) Standard Practice for Using 0.008-in. (0.203-mm) Aperture Reflectometers as Test Instruments for Measuring Visual Image Quality of Business Copy Images
ASTM E1260-03(2020) Standard Test Method for Determining Liquid Drop Size Characteristics in a Spray Using Optical Nonimaging Light-Scattering Instruments

ESDU - Engineering Sciences Data Unit

SPA-M10-2-2010 Apr.09: Probing into petroleum heath-exchanger deposits with spectroscopic imaging

International Electrotechnical Commission (IEC)

IEC 60747-5:1992 Semiconductor devices; discrete devices and integrated circuits; part 5: optoelectronic devices
IEC 60748-2:1997 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits
IEC 60747-5-1:2002 Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices; General
IEC 60748-4:1987 Semiconductor devices - Intergrated circuits.. Part 4: Interface integrated circuits.
IEC 60747-5-1:1997+AMD1:2001+AMD2:2002 CSV Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General
IEC 60747-5-1:1997/AMD2:2002 Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices; General; Amendment 2
IEC 60748-3:1986 Semiconductor devices. Integrated circuits.. Part 3 : Analogue integrated circuits
IEC 60858:1986 Determination of the image distortion of electro-optical X-ray image intensifiers

Canadian Standards Association (CSA)

CSA C861-06-2006 Performance of integrated ballast compact fluorescent lamps and second edition ballast adapters

Institute of Electrical and Electronics Engineers (IEEE)

IEEE P3333.1.4/D1.1, July 2022 IEEE Draft Recommended Practice for the Quality Assessment of Light Field Imaging

VDI - Verein Deutscher Ingenieure

VDI/VDE 2634 Blatt 2-2011 Optical 3-D measuring systems - Optical systems based on area scanning
VDI/VDE 5596 BLATT 1-2019 Optical design for manufacturing - Illumination optics@ non-imaging and freeform optics: Optical design process
VDI/VDE 5596 BLATT 1-2018 Optical design for manufacturing - Illumination optics@ non-imaging and freeform optics - Optical design process

Australian/New Zealand Standard (AU-AS/NZS)

AS/NZS 4184.3.4:2002 Evaluation and routine testing in medical imaging departments - Acceptance tests - Imaging performance of dental X-ray equipment
AS/NZS 4184.3.3:1998 Evaluation and routine testing in medical imaging departments - Acceptance tests - Imaging performance of X-ray equipment for digital subtraction angiography (DSA)

European Committee for Electrotechnical Standardization（CENELEC）

HD 515 S1-1989 Determination of the Image Distortion of Electro-Optical X-Ray Image Intensifiers

IN-BIS

IS 13814-1993 Determination of the image distortion of electro-optical X-ray image intensifiers

European Committee for Standardization (CEN)

EN 17119:2018 Non-destructive testing - Thermographic testing - Active thermography

Japanese Industrial Standards Committee (JISC)

JIS Z 4721:2000 Medical X-ray image intensifiers

Electronic Components, Assemblies and Materials Association

ECA CB16-1999 Integrated Passive Device (IPD) Definitions

RO-ASRO

SR CEI 748-3+A1-1991 Semiconductor devices. Integrated circuits. Part 3: Analogue integrated circuits

PL-PKN

PN T01303-03-1991 Semicondutor devices. Integrated circuits. Analogue integrated circuits. Measuring methods

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