What is the carrier concentration

What is the carrier concentration, Total:47 items.

The international standard classification for "What is the carrier concentration" includes: Chemical analysis of metals , Semiconducting materials , Salts , Testing of metals , Testing of metals in general .

Xinjiang Provincial Standard of the People's Republic of China

DB65/T 3485-2013 Measurement method for minority carrier lifetime of solar grade polysilicon block

GB/T 11068-1989 Gallium arsenide epitaxial layer-Determination of carrier concentration-Voltage-capacitance method
GB/T 14146-1993 Silicon epitaxial layers--Determination of carrier concentration--Mercury probe Valtage-capacitance method
GB/T 8757-1988 Determination of carrier concentration in gallium arsenide by the plasma resonance minimum
GB/T 1553-2023 Test methods for minority carrier lifetime in bulk silicon and germanium—Photoconductivity decay method
GB/T 1553-2009 Test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconduetivity decay
GB/T 1553-1997 Standard test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconductivity decay
GB/T 8757-2006 Determination of carrier concentration in galliumarsenide by the plasma resonance minimum
GB/T 11068-2006 Gallium arsenide epitaxial layer - determination of carrier concentration voltage-capacitance method
GB 11068-1989 GaAs Epitaxial Layer Carrier Concentration Capacitance-Voltage Measurement Method
GB/T 36705-2018 王志、李刚、钟圣俊、孟宪卫、王新华、乐有邦、吴晓煜、张倩倩
GB/T 14146-2009 Silicon epitaxial layers-determination of carrier concentration-mercury probe voltages-capacitance method

GB/T 14146-2021 Test method for carrier concentration of silicon epitaxial layers - Capacitance-voltage method

SJ 2757-1987 Method of measurement by infra-red reflection for charge carrier concentraiton of heavily doped semiconductors
SJ 3248-1989 Methods for measuring carrier concentration of readded Gallium arsenide and Indium phosphide by infra-red reflection
SJ 3244.1-1989 Methods of measurement for hall mobility and carrier concentration of Gallium arsenide and Indium phosphide

T/IAWBS 003-2017 Determination of Carrier Concentration in SiC Epitaxial Layer_Mercury Probe Capacitance-Voltage Method
T/CASAS 026-2023 Test method for minority carrier lifetime in silicon carbide—microwave photoconductive decay

YS/T 679-2018 Test methods for minority carrier diffusion length in extrinsic semiconductors. Surface photovoltage method

YS/T 679-2008 Test methods for minority carrier diffusion length in extrinsic semiconductors by measurement of steady-steady-state surface photovoltage

KS D 0265-2019 Measurement of minority carrier life time in germanium by photoconductive decay method
KS A 4048-1995 Measurementing methods of concentration of airborne radioactive particle
KS D 0257-2022 Measuring of minority - carrier lifetime in silicon single crystal by photoconductive decay method
KS D 0265-1989(2019) Measurement of minority carrier life time in germanium by photoconductive decay method
KS D 0257-2002(2022) Measuring of minority - carrier lifetime in silicon single crystal by photoconductive decay method
KS D 0257-2002(2017) Measuring of minority - carrier lifetime in silicon single crystal by photoconductive decay method
KS D 0265-1989 Measurement of minority carrier life time in germanium by photoconductive decay method

ASTM F398-92(1997) Standard Test Method for Majority Carrier Concentration in Semiconductors by Measurement of Wavenumber or Wavelength of the Plasma Resonance Minimum
ASTM F28-91(1997) Standard Test Methods for Minority-Carrier Lifetime in Bulk Germanium and Silicon by Measurement of Photoconductivity Decay

AWWA SOURCES59162 Use of Flow Modulated Pressure Management in York Region, Ontario to Reduce Distribution System Leakage
BS PD IEC TS 62607-5-3:2020 Nanomanufacturing. Key control characteristics-Thin-film organic/nano electronic devices. Measurements of charge carrier concentration
BS PD IEC TS 62607-6-16:2022 Nanomanufacturing. Key control characteristics-Two-dimensional materials. Carrier concentration: Field effect transistor method
DANSK DS/CEN/TS 16976:2016 Ambient air – Determination of the particle number concentration of atmospheric aerosol
SN-CEN/TS 16976:2016 Ambient air - Determination of the particle number concentration of atmospheric aerosol

JIS H 0603:1978 Measurement of minority carrier life time in germanium by photoconductive decay method
JIS H 0604:1995 Measuring of minority-carrier lifetime in silicon single crystal by photoconductive decay method

PD IEC TS 62607-5-3:2020 Nanomanufacturing. Key control characteristics. Thin-film organic/nano electronic devices. Measurements of charge carrier concentration

GSO ISO 4365:2013 Liquid flow in open channels -- Sediment in streams and canals -- Determination of concentration, particle size distribution and relative density

NF F37-026:1968 RAILWAY TRANSPORT EQUIPMENT. TANK WAGONS NITRIC ACID (CONCENTRATION IN EXCESS OF 95 %) TYPE. TWO-SIDED GRAVITY DISCHARGE (50 MM AND 80 MM DIAMETER).
XP CEN/TS 16976:2016 Ambient air - Determination of the particle number concentration of the atmospheric aerosol
XP X43-075*XP CEN/TS 16976:2016 Ambient air - Determination of the particle number concentration of atmospheric aerosol

DANSK DS/EN 16976:2024 Ambient air – Determination of the particle number concentration of atmospheric aerosol
DIN EN 16976:2024 Ambient air - Determination of the particle number concentration of atmospheric aerosol; German version EN 16976:2024

PD CEN/TS 16976:2016 Ambient air - Determination of the particle number concentration of atmospheric aerosol

DIN CEN/TS 16976:2016-11*DIN SPEC 33974:2016-11 Ambient air - Determination of the particle number concentration of atmospheric aerosol; German version CEN/TS 16976:2016
DIN EN 16976:2023-06 Ambient air - Determination of the particle number concentration of atmospheric aerosol; German and English version prEN 16976:2023 / Note: Date of issue 2023-04-28*Intended as replacement for DIN CEN/TS 16976 (2016-11).
DIN CEN/TS 16976:2016*DIN SPEC 33974:2016 Ambient air - Determination of the particle number concentration of atmospheric aerosol