Potential test piece

Potential test piece, Total:442 items.

The international standard classification for "Potential test piece" includes: Other methods of testing of metals , Motion picture films. Cartridges , Cinematography , Cutting tools , Optical equipment , Motion picture equipment , Corrosion of metals , Audio systems , Testing of metals in general .

The Chinese standard classification for "Potential test piece" includes: Separating machinery , Metal physical property test method , Film and Photographic Technology , Cutting tools , Optical instrument in general , Test equipment and test plate instrument , Metal chemical property test method , Broadcasting and television equipment in general , Magnetic measurement instrument , Technical Management .

Group Standards of the People's Republic of China

T/IAWBS 014-2021 Test method for dislocation density of silicon carbide polished wafers
T/IAWBS 018-2022 Test method for dislocation density of diamond single crystal polished wafers
T/CIMA 0138-2024 Test method for thermoelectric power generation device used in space isotope power supply
T/CSAE 405-2025 Automotive Control Chip Electrical Characteristics Testing Method
T/WJDGC 0005-2021 Test method for automatic rice cooker insulation sheet
T/CAMS 32-2019 Indexable inserts grinding center

National Metrological Verification Regulations of the People's Republic of China

JJG(电子) 05011-1988 Trial Verification Regulations for WZC-1A Potentiometer Comprehensive Tester
JJG(民航) 0068-2001 856A1214P03 Generator Variable Stator Vane Transmitter Indicator Test Set

General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China

GB/T 4642-1984 Image produced by 16mm motion-picture camera aperture--Position and dimensions
GB/T 15306.1-1994 Indexable inserts for cutting tools-Ceramic inserts with rounded corners-Dimensions of inserts without fixing hole(Class G)
GB 5298-1985 Image area on 35mm motion - Picture films with masked picture; Positions and dimensions
GB/T 13789-2022 Methods of measurement of the magnetic properties of electrical steel strip and sheet by means of a single sheet tester
GB/T 37617-2019 Test methods for Zeta potential of nanofiltration membrane surface—Streaming potential measurement
GB/T 5300-1994 Splices for use on 70mm, 65mm, 35mm and 16mm motion-picture films--dimensions and locations
GB/T 13789-2008 Methods of measurement of the magnetic properties of magnetic sheet and strip by means of a single sheet tester
GB/T 15306.2-1994 Indexable inserts for cutting tools-Ceramic inserts with rounded corners-Dimensions of inserts with cylindrical fixing hole
GB/T 39042-2020 Measurement of the magnetic properties of electrical steels by means of a single sheet tester—H-coil method
GB/T 4635-2000 Image area produced by camera aperture on 35 mm motion-picture film-Position and dimensions
GB/T 26827-2011 Calibration method for measurement equipment of wave plate phase retardation
GB/T 15306.3-1994 Indexable inserts for cutting tools-Ceramic inserts with rounded corners-Dimensions of inserts without fixing hole(Class U)
GB/T 24196-2009 Corrosion of metals and alloys—Electrochemical test methods—Guidelines for conducting potentiostatic and potentiodynamic polarization measurements
GB/T 3320.3-1982 Wow and flutter test record
GB 3320.3-1982 Wow and flutter test record
GB/T 4643-2002 Cinematography--16mm negative photographic sound record on motion-picture film-Position and dimensions
GB/T 13920-2015 35 mm cinematography―Subjective test film(colour chart)
GB/T 13920-1992 cinematography - Subjective test film (colour chart)
GB/T 5298-1985 Image area on 35mm motion-picture films with masked picture--Positions and dimensions

Professional Standard - Machinery

JB/T 5469-1991 Testing Instrument of Total Loss Ratio of Single Electric Steel Sheet (Strip)
JB/T 9417-1999 Position and size of sound tracks on 35mm film optical sound negatives
JB/T 9413-1999 Sound Track of Optical Sound Negative on 16mm, 32/16mm Motion-picture - Position and Dimensions
JB/T 9413-2014 16mm Negative Photographic Sound Record on Motion-picture Film - Position and Dimensions

Heilongjiang Provincial Standard of the People's Republic of China

DB23/T 2074-2018 Power consumption unit electric energy balance test specification

Professional Standard - Ferrous Metallurgy

YB/T 4292-2012 Methods of Determination of the Geometrical Characteristics of Electric Steel Sheet and Strip
YB/T 4148-2006 Measurement method for magnetic property of small single sheet sample of electrical strip

未注明发布机构

AMPP Paper 16227-2021 In Situ Electrochemical Testing Of Stainless Steel Surfaces
JIS H 0602:1990 Testing Method of Resistivity for Silicon Crystals and Silicon Wafers with Four-Point Probe
FORD FLTM EU-BI 007-1-2001 CHIP RESISTANCE TEST FOR PAINTED PANELS
FORD FLTM BI 007-1-2001 CHIP RESISTANCE TEST FOR PAINTED PANELS

Professional Standard - Electron

SJ/T 11627-2016 On-line testing method of silicon wafer resistivity for solar cells
SJ 2435.3-1984 Bidirectional align bonding sheet
SJ 3260-1989 Methods of measurement for electric properties of resonator with tuning fork and tablet
SJ/T 10866-1996 Measurements of electrical properties of disk-seal tubes - Methods of measurement for frequency position
SJ 2432.3-1984 Single align tooth bonding sheet

Liaoning Provincial Standard of the People's Republic of China

DB21/T 2837-2017 On-site test method for mass per unit area of polymer waterproof material composite sheet (FS2)

Professional Standard - Water Conservancy

SL 94-1994 Determination of oxidation - reduction potential (Electrometric method)

Professional Standard - Aviation

HB 599-1989 Screw-type positioner with tabs
HB 599-1974 Screw-type positioner with tabs

Professional Standard - Energy

NB/T 35102-2017 Specification for Soil Test in Situ in Borehole of H ydropower Projects

Taiwan Provincial Standard of the People's Republic of China

CNS 14502-2001 Steel and steel products-Location and preparation of samples and test pieces for mechanical testing
CNS 5171-1980 35mm Negative Photographic Sound Record on 35mm Motion-Picture Film-Position and Width Dimensions

Professional Standard - Environmental Protection

HJ 746-2015 Soil- Determination of redov potential - Potential method

British Standards Institution (BSI)

BS 2829:1957 Specification for 35-mm magnetic sound recording azimuth alignment test films
BS ISO 1223:1993 Cinematography. Picture areas for motion-picture films and slides for television. Position and dimensions
BS ISO 9361-1:2014 Indexable inserts for cutting tools. Ceramic inserts with rounded corners. Dimensions of inserts without fixing hole
BS ISO 1223:2003 Cinematography - Picture areas for motion-picture films for television - Position and dimensions
BS PD ISO/TS 19979:2014 Ophthalmic optics. Contact lenses. Hygienic management of multipatient use trial contact lenses
BS DD ISO/TS 19979:2005 Ophthalmic optics - Contact lenses - Hygienic management of multipatient use trial contact lenses
BS 1488:1948 Test films for 16 mm cinematograph projectors
BS ISO 17475:2005 Corrosion of metals and alloys. Electrochemical test methods. Guidelines for conducting potentiostatic and potentiodynamic polarization measurements
BS IEC 61196-1-108:2025 Coaxial communication cables - Electrical test methods. Test for phase, phase constant, phase and group delay, propagation velocity, electrical length, and mean characteristic impedance
BS EN IEC 60404-3:2022 Magnetic materials - Methods of measurement of the magnetic properties of electrical steel strip and sheet by means of a single sheet tester
BS 1344-20:1987 Methods of testing vitreous enamel finishes-Low voltage test for detecting and locating defects
BS ISO 5768:1999 Cinematography - Image produced by camera aperture type W on 16 mm motion-picture film - Position and dimensions
BS ISO 1785:1996 Cinematography. Printed 8 mm, Type S, image area on 16 mm motion-picture film perforated 8 mm, Type S (1-4). Position and dimensions
BS ISO 1785:1983 Cinematography - Printed 8 mm, Type S, image area on 16 mm motion-picture film perforated 8 mm, Type S (1-4) - Position and dimensions
BS 5550-5.6.1:1987 Cinematography. Common to more than one film gauge. Splices-Specification for dimensions and locations of splices for use on 70 mm, 65 mm, 35 mm and 16 mm motion picture films
BS ISO 70:1995 Cinematography. Monophonic 35 mm negative photographic sound record on 35 mm motion-picture film. Position and maximum width dimensions
BS ISO 70:1981 Cinematography - Monophonic 35 mm negative photographic sound record on 35 mm motion-picture film - Position and maximum width dimensions
23/30484026 DC BS EN IEC 61196-1-108. Coaxial communication cables. Part 1-108. Electrical test methods. Test for phase, phase constant, phase and group delay, propagation velocity, electrical length, and mean characteristic impedance
12/30260379 DC BS EN 61196-1-111. Coaxial communication cables. Electrical test methods. Stability of phase test methods

Gosstandart of Russia

GOST 10691.4-1984 Photographic films and reversal motion picture films. Method for determination of speed numbers
GOST 18790-1980 Limiting clamps. Design and dimensions
GOST 10691.2-1984 Black-and-white photographic negative films for general use. Method for determination of speed numbers
GOST 6134-1987 Rotodynamic pumps. Methods of testing
GOST 6134-2007 Rotodynamic pumps. Test methods

PL-PKN

PN C99910 ArkusZ03-1972 Film strips 35 mm Dimensions and position of pictures
PN C45051-06-1986 Higher alkohols fats Methods of test Determination of carbonyl value Potentiometric method

German Institute for Standardization

DIN 53531-1:1972 Testing the adhesion of elastomers to metal bonds using a sheet of metal
DIN 15630:1982 Film 16 mm; position of film relative to camera aperture; position of reference perforation hole
DIN 15576-1:1980-09 Designation of cine films and magnetic films; direction of winding and position of the layer on motion-picture films
DIN 30691 E:2024 Draft Document - Lightning current tests - flanges with electrically conductive gaskets
DIN 49580:1985 Electrical communication engineering; jack strip 10 point with four-way jack
DIN 30691 E:2024-06 Draft Document - Lightning current tests - flanges with electrically conductive gaskets
DIN 41450-2:1987-11 Potentiometers; single turn rotary potentiometers, low power; terms and definitions, characteristics, methods of test
DIN EN ISO 17475:2008-07 Corrosion of metals and alloys - Electrochemical test methods - Guidelines for conducting potentiostatic and potentiodynamic polarization measurements (ISO 17475:2005+Cor. 1:2006); German version EN ISO 17475:2008
DIN 8030-1:1984-01 Face milling cutters for indexable inserts
DIN 41632:1982-08 Rotary wafer switches 28 mm Ã— 39 mm; 12 positions; dimensions, ratings, requirements, tests
DIN 16726:2017-08 Plastic sheets - Testing
DIN 28088:2016 Connecting lugs for earthing and potential equalisation on process vessels
DIN 28088 E:2015-03 Connecting lugs for earthing and potential equalisation on process vessels
DIN 58206-3:1977 Calibration test lenses
DIN 15576-6:1977-12 Designation of motion-picture films; position of emulsion for picture and sound
DIN 28088:2016-05 Connecting lugs for earthing and potential equalisation on process vessels
DIN 4967-1:1987 Indexable hard metal cutting disc
DIN 4987-2:1987 Designation and tolerances of indexable inserts; tolerance classes, limit deviations Mit DIN 4987 T 1/03.87
DIN 15630:1982-05 Film 16 mm; position of film relative to camera aperture; position of reference perforation hole
DIN ISO 3310-3:1992-02 Test sieves; technical requirements and testing; test sieves of electroformed sheets; identical with ISO 3310-3:1990
DIN 4526:1979-01 Back window location for roll film cameras
DIN 41450-1:1987-11 Potentiometers; preset potentiometers, lead screw actuated or rotary; terms and definitions, characteristics, methods of test
DIN 41631:1982-08 Rotary wafer switches 41 mm Ã— 54 mm; 13 and 26 positions; dimensions, ratings, requirements, tests
DIN IEC/TS 62804-1:2017-05*VDE V 0126-37-1:2017-05 Photovoltaic (PV) modules – Test methods for the detection of potential-induced degradation
DIN 52913:2002-04 Testing of static gaskets for flange connections - Compression creep testing of gaskets made from sheets

CU-NC

NC 61-24-1985 Television. Picture Areas for Motion-Picture Films and Slides for Televisión. Position and Dimensions
NC 68-05-1985 Industrial Household Apparatus. Flat Solar Collectors for Fluids Testing Methods

RO-ASRO

STAS 9614/2-1984 POTENTIOMETERS Methods of test
STAS R 11682-1983 Mrtals chip removing process RESTS, CENTRING ELEMENTS CLAMPINGS Symbolization
STAS 9130/6-1989 Indexable inserts for culling tools lNDKXABI.K INSERTS Designation
STAS 11029-1987 Cinematography PICTURE AREA FOR 35 mm, 16 mm MOTION PICTURE FILMS AND SLIDES FOR TELEVISION Position and dimensions
SR ISO 4040:1995 Road vehicles-Passengers cars - Location of hand controls, indicators and tell-tales

SCC

SPC GB/T 37617-2019 Test methods for Zeta potential of nanofiltration membrane surface -- Streaming potential measurement (TEXT OF DOCUMENT IS IN CHINESE)

American Society for Testing and Materials (ASTM)

ASTM F951-02 Test method for determining the variation of oxygen content in the radial direction of silicon wafers
ASTM D6470-99 Standard Test Method for Salt in Crude Oils (Potentiometric Method)
ASTM G5-94(1999)e1 Standard Reference Test Method for Making Potentiostatic and Potentiodynamic Anodic Polarization Measurements
ASTM D6470-99(2004) Standard Test Method for Salt in Crude Oils (Potentiometric Method)
ASTM G5-94(2004) Standard Reference Test Method for Making Potentiostatic and Potentiodynamic Anodic Polarization Measurements
ASTM G5-94 Standard Reference Test Method for Making Potentiostatic and Potentiodynamic Anodic Polarization Measurements
ASTM G192-08(2020)e1 Standard Test Method for Determining the Crevice Repassivation Potential of Corrosion-Resistant Alloys Using a Potentiodynamic-Galvanostatic-Potentiostatic Technique
ASTM G5-94(1999) Standard Reference Test Method for Making Potentiostatic and Potentiodynamic Anodic Polarization Measurements
ASTM F2939-13(2019) Standard Specification for High Voltage Phasing Testers
ASTM F2939-13 Standard Specification for High Voltage Phasing Testers
ASTM F2939-13(2025) Standard Specification for High Voltage Phasing Testers
ASTM F2939-13(2019)e1 Standard Specification for High Voltage Phasing Testers
ASTM RR-C26-1005 1994 C1108-Test Method for Plutonium by Controlled-Potential Coulometry
ASTM G59-97(2020) Standard Test Method for Conducting Potentiodynamic Polarization Resistance Measurements
ASTM G59-97(2003) Standard Test Method for Conducting Potentiodynamic Polarization Resistance Measurements
ASTM G5-94(2011)e1 Standard Reference Test Method for Making Potentiostatic and Potentiodynamic Anodic Polarization Measurements
ASTM RR-D02-1458 1998 D6470-Test Method for Salt in Crude Oils (Potentiometric Method)
ASTM F1680-96 Standard Test Method for Determining Circuit Resistance of a Membrane Switch
ASTM D3380-90(2003) Standard Test Method for Relative Permittivity (Dielectric Constant) and Dissipation Factor of Polymer-Based Microwave Circuit Substrates
ASTM F84-02 On-line four-point probe test method for measuring silicon wafer resistivity
ASTM F81-01 Standard test method for measuring radial resistivity variation of silicon wafers

AT-ON

ONORM E 1354-1971 Apparalus for testing the cord anchorage.
ONORM ISO 6987-3:1992 Indexable inserts for cutting tools. Carbide indexable inserts with rounded corners and tapered fixing hole V-shaped indexable inserts
ONORM ISO 5609:1987 Boring bars for indexable inserts; dimensions

Defense Logistics Agency

DLA SMD-5962-86816 REV D-2008 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, 8-BIT SHIFT REGISTER, MONOLITHIC SILICON
DLA MIL-M-38510/440 C VALID NOTICE 4-2012 Microcircuits, Digital, Four Bit Microprocessor Slice Monolithic Silicon
DLA MIL-M-38510/440C-1986 MICROCIRCUITS, DIGITAL, FOUR-BIT MICROPROCESSOR SLICE MONOLITHIC SILICON
DLA SMD-5962-88677 REV C-2009 MICROCIRCUIT, DIGITAL, 4-BIT BIPOLAR MICROPROCESSOR SLICE, MONOLITHIC SILICON
DLA SMD-5962-94591 REV A-2004 MICROCIRCUIT, DIGITAL, ECL, LOW POWER, 8-BIT SHIFT REGISTER, MONOLITHIC SILICON
DLA DSCC-VID-V62/11607 REV B-2011 MICROCIRCUIT, DIGITAL, PHASE DETECTOR/FREQUENCY SYNTHESIZER, MONOLITHIC SILICON
DLA MS18015 REV B-1972 CATCH, CLAMPING AND STRIKE (CONCEALED SPRING TYPE)
DLA MS18015 REV B NOTICE 1-1997 CATCH, CLAMPING AND STRIKE (CONCEALED SPRING TYPE)
DLA SMD-5962-84057 REV E-2005 MICROCIRCUIT, DIGITAL, FOUR-BIT MICROPROCESSOR SLICE, MONOLITHIC SILICON
DLA SMD-5962-86817 REV D-2011 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, 8-BIT SHIFT REGISTER, MONOLITHIC SILICON
DLA SMD-5962-81008 REV B-2008 MICROCIRCUIT, LINEAR, MONOLITHIC AND MULTICHIP, 12-BIT DIGITAL-TO-ANALOG CONVERTERS
DLA DSCC-VID-V62/04689 REV B-2010 MICROCIRCUIT, DIGITAL, 8-BIT PARALLEL LOAD SHIFT REGISTER, MONOLITHIC SILICON
DLA SMD-5962-89717 REV A-1992 MICROCIRCUIT, DIGITAL, 32-BIT CASCADABLE BARREL SHIFTER, MONOLITHIC SILICON
DLA DSCC-VID-V62/06603 REV A-2012 MICROCIRCUIT, DIGITAL, PARALLEL LOAD 8-BIT SHIFT REGISTER, MONOLITHIC SILICON
DLA SMD-5962-87802 REV C-2001 MICROCIRCUIT, LINEAR, 8-BIT QUAD DIGITAL-TO- ANALOG CONVERTER MONOLITHIC SILICON
DLA DSCC-VID-V62/04690 REV A-2010 MICROCIRCUIT, DIGITAL, 8-BIT PARALLEL LOAD SHIFT REGISTER, MONOLITHIC SILICON
DLA SMD-5962-89697 REV C-2013 MICROCIRCUIT, LINEAR, 16-BIT, VOLTAGE OUTPUT DAC, MONOLITHIC SILICON
DLA DSCC-VID-V62/11605 REV A-2013 MICROCIRCUIT, DIGITAL, NONVOLATILE MEMORY, DUAL 1024-POSITION DIGITAL POTENTIOMETER, MONOLITHIC SILICON
DLA DSCC-VID-V62/11605-2010 MICROCIRCUIT, DIGITAL, NONVOLATILE MEMORY, DUAL 1024-POSITION DIGITAL POTENTIOMETER, MONOLITHIC SILICON
DLA SMD-5962-86827 REV D-2013 MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, 4-BIT PARALLEL SHIFT REGISTER, MONOLITHIC SILICON
DLA SMD-5962-88767 REV C-2004 MICROCIRCUIT, LINEAR, MULTIPLYING, 12-BIT, DIGITAL-TO-ANALOG CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-89464 REV B-1994 MICROCIRCUIT, DIGITAL, 32-BIT MICROPROCESSOR, MONOLITHIC SILICON
DLA MIL-M-38510/159 B VALID NOTICE 3-2010 Microcircuits, Digital, TTL, Shift Registers, Monolithic Silicon
DLA SMD-5962-91647 REV B-2012 MICROCIRCUIT, LINEAR, CMOS, DUAL 12-BIT/ 14-BIT SERIAL D/A CONVERTERS, MONOLITHIC SILICON
DLA SMD-5962-95597 REV E-2010 MICROCIRCUIT, LINEAR, VOLTAGE FEEDBACK CLAMP AMPLIFIER, MONOLITHIC SILICON
DLA SMD-5962-88677 REV B-2004 MICROCIRCUIT, DIGITAL, 4-BIT BIPOLAR MICROPROCESSOR SLICE, MONOLITHIC SILICON
DLA SMD-5962-01507-2001 MICROCIRCUIT, DIGITAL, BIPOLAR, HIGH-SPEED LOOK-AHEAD CARRY GENERATOR, MONOLITHIC SILICON
DLA SMD-5962-88508 REV B-2005 MICROCIRCUIT, HYBRID, LINEAR, 12-BIT ANALOG TO DIGITAL CONVERTER
DLA SMD-5962-86717 REV E-2009 MICROCIRCUIT, DIGITAL, LOW POWER SCHOTTKY, TTL, 8-BIT SHIFT REGISTER, MONOLITHIC SILICON
DLA SMD-5962-95583 REV B-2008 MICROCIRCUIT, DIGITAL, BIPOLAR, TTL, PARALLEL-LOAD 8-BIT SHIFT REGISTERS, MONOLITHIC SILICON
DLA SMD-5962-01519 REV A-2006 MICROCIRCUIT, DIGITAL-LINEAR, DUAL CHANNEL, 12-BIT, ANALOG TO DIGITAL CONVERTER, MULTICHIP MICROCIRCUIT, MONOLITHIC SILICON
DLA SMD-5962-07224 REV B-2009 MICROCIRCUIT, DIGITAL, 32-BIT SPARC V8 PROCESSOR, MONOLITHIC SILICON
DLA MIL-M-38510/133 B VALID NOTICE 1-2009 Microcircuits, Linear, 10-BIT Digital-To-Analog Converter, Monolithic Silicon
DLA SMD-5962-87762 REV A-2000 MICROCIRCUIT, LINEAR, 8-BIT, ANALOG-TO-DIGITAL CONVERTER, WITH TRACK/HOLD, MONOLITHIC SILICON
DLA SMD-5962-89959 REV D-2009 MICROCIRCUIT, DIGITAL, CMOS, 16-BIT CASCADABLE ALU, MONOLITHIC SILICON
DLA SMD-5962-90979 REV B-2008 MICROCIRCUIT, LINEAR, HIGH SPEED PHASE / FREQUENCY DISCRIMINATOR, MONOLITHIC SILICON
DLA MIL-M-38510/113 C-2011 MICROCIRCUITS, LINEAR, 8 BIT, DIGITAL-TO-ANALOG CONVERTERS, MONOLITHIC SILICON
DLA SMD-5962-07224 REV C-2010 MICROCIRCUIT, DIGITAL, 32-BIT SPARC V8 PROCESSOR, MONOLITHIC SILICON
DLA SMD-5962-89596 REV E-2009 MICROCIRCUIT, DIGITAL, NMOS, 16-BIT MICROCONTROLLER, MONOLITHIC SILICON
DLA SMD-5962-88501 REV H-2012 MICROCIRCUIT, DIGITAL, CMOS, 16-BIT MICROPROCESSOR, MONOLITHIC SILICON
DLA SMD-5962-07224 REV A-2009 MICROCIRCUIT, DIGITAL, 32-BIT SPARC V8 PROCESSOR, MONOLITHIC SILICON
DLA SMD-5962-89617 REV B-2012 MICROCIRCUIT, LINEAR, 12-BIT DIGITAL-TO-ANALOG CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-88532 REV C-2003 MICROCIRCUITS, LINEAR, 9 BIT A/D CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-94578-1997 MICROCIRCUIT, DIGITAL, 32-BIT MICROPROCESSOR MONOLITHIC SILICON
DLA MIL-M-38510/113 B VALID NOTICE 1-2010 Microcircuits, Linear, 8 Bit, Digital-to-Analog Converters, Monolithic Silicon
DLA SMD-5962-88563-1988 MICROCIRCUITS, LINEAR, 16 BIT D/A CONVERTER MONOLITHIC SILICON
DLA DSCC-VID-V62/04731 REV A-2011 MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, 3.3-V ABT SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTERS, MONOLITHIC SILICON
DLA DSCC-VID-V62/04729 REV A-2011 MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, 3.3-V ABT SCAN TEST DEVICE WITH 18-BIT UNIVERSAL BUS TRANSCEIVER, MONOLITHIC SILICON
DLA DSCC-VID-V62/08603 REV A-2009 MICROCIRCUIT, DIGITAL-LINEAR, SINGLE DIGITAL CONTROLLED POTENTIOMETER, MONOLITHIC SILICON
DLA DSCC-VID-V62/04730 REV A-2011 MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, 3.3-V ABT SCAN TEST DEVICE WITH 18-BIT UNIVERSAL BUS TRANSCEIVER, MONOLITHIC SILICON
DLA DSCC-VID-V62/10612-2010 MICROCIRCUIT, DIGITAL, 8-BIT SHIFT REGISTERS WITH 3-STATE OUTPUT REGISTERS, MONOLITHIC SILICON
DLA SMD-5962-00538 REV G-2009 MICROCIRCUIT, DIGITAL-LINEAR, POWER-ON, MICROPROCESSOR RESET CIRCUIT, MONOLITHIC SILICON
DLA DSCC-DWG-V62/13622-2013 MICROCIRCUIT, DIGITAL-LINEAR, PWM SYSTEM CONTROLLER WITH 4-BIT, 6-BIT, OR 8- BIT VID SUPPORT, MONOLITHIC SILICON
DLA SMD-5962-86051 REV D-2011 MICROCIRCUIT, MEMORY, DIGITAL, BIPOLAR 64-BIT RAM, MONOLITHIC SILICON
DLA MIL-M-38510/665 VALID NOTICE 4-2012 Microcircuits, Digital, High Speed, CMOS, Shift Register, Monolithic Silicon
DLA SMD-5962-90515 REV C-1996 MICROCIRCUIT, DIGITAL, CMOS, 8-BIT PIPELINE REGISTER, MONOLITHIC SILICON
DLA MIL-M-38510/9 E VALID NOTICE 1-2009 Microcircuits, Digital, Bipolar TTL, Shift Registers, Monolithic Silicon
DLA SMD-5962-91740 REV A-2009 MICROCIRCUIT, CMOS, 16 BIT, DIGITAL-TO-ANALOG MULTIPLYING CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-78015 REV J-2010 MICROCIRCUIT, DIGITAL, BIPOLAR, MEMORY, 64-BIT RAM, MONOLITHIC SILICON
DLA SMD-5962-86703 REV F-2011 MICROCIRCUITS, MEMORY, DIGITAL, 32 x 8-BIT PROM, MONOLITHIC SILICON
DLA MIL-M-38510/473 A-1983 MICROCIRCUITS, DIGITAL, CMOS, MONOLITHIC 8-BIT INPUT/OUTPUT PORT
DLA MIL-M-38510/473 A VALID NOTICE 3-2010 Microcircuits, Digital, CMOS, Monolithic 8-Bit Input/Output Port
DLA SMD-5962-89676 REV D-2012 MICROCIRCUIT, LINEAR, CMOS, 16-BIT ANALOG-TO-DIGITAL CONVERTER, MONOLITHIC SILICON
DLA DSCC-VID-V62/12616-2012 MICROCIRCUIT, DIGITAL, 1024-POSITION, DIGITAL POTENTIOMETER WITH MAXIMUM ?% R-TOLERANCE ERROR AND 20-TP MEMORY, MONOLITHIC SILICON
DLA SMD-5962-88560 REV B-2006 MICROCIRCUIT, MEMORY, DIGITAL, ECL, 64-BIT RAM, MONOLITHIC SILICON
DLA SMD-5962-93102 REV A-2010 MICROCIRCUIT, DIGITAL, ECL, 4-BIT D-TYPE FLIP FLOP, MONOLITHIC SILICON
DLA SMD-5962-86023 REV D-2011 MICROCIRCUIT, MEMORY, DIGITAL, BIPOLAR 256-BIT RAM, MONOLITHIC SILICON
DLA MIL-M-38510/474 A VALID NOTICE 3-2010 Microcircuit, Digital, CMOS, Monolithic N-Bit One of Eight Decoder
DLA SMD-5962-88563 REV A-2008 MICROCIRCUITS, LINEAR, 16 BIT D/A CONVERTER MONOLITHIC SILICON
DLA SMD-5962-95613 REV K-2012 MICROCIRCUIT, MEMORY, DIGITAL, SRAM, 512K x 8-BIT, MONOLITHIC SILICON
DLA SMD-5962-11208 REV A-2013 MICROCIRCUIT, CMOS, LINEAR, 11-BIT, DIGITAL TO ANALOG CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-94690 REV A-2009 MICROCIRCUIT, LINEAR, 16-BIT, 50KHZ ANALOG TO DIGITAL CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-77037 REV H-2011 MICROCIRCUIT, DIGITAL, CMOS, 4-BIT MAGNITUDE COMPARATOR, MONOLITHIC SILICON
DLA MIL-M-38510/473A VALID NOTICE 1-2001 MICROCIRCUITS, DIGITAL, CMOS, MONOLITHIC 8-BIT INPUT/OUTPUT PORT
DLA SMD-5962-89616 REV D-2013 MICROCIRCUIT, LINEAR, CMOS 8-BIT A/D CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-88535 REV D-2008 MICROCIRCUIT, DIGITAL, CMOS, 4-BIT SLICE MICROPROCESSOR, MONOLITHIC SILICON
DLA SMD-5962-94550-1995 MICROCIRCUIT, DIGITAL, 32-BIT RISC MICROPROCESSOR, MONOLITHIC SILICON
DLA SMD-5962-93143 REV C-2005 MICROCIRCUIT, DIGITAL, 32-BIT MICROPROCESSOR, MONOLITHIC SILICON
DLA SMD-5962-94662 REV A-2009 MICROCIRCUIT, LINEAR, 10-BIT, VOLTAGE OUTPUT, D/A CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-88776 REV C-2004 MICROCIRCUIT, HYBRID, LINEAR, 8-BIT, FLASH, ANALOG TO DIGITAL CONVERTER
DLA SMD-5962-88516 REV E-2010 MICROCIRCUIT, DIGITAL, HIGH PERFORMANCE CMOS 9-WIDE AND 10-WIDE BUS INTERFACE REGISTER, MONOLITHIC SILICON
DLA SMD-5962-89698 REV B-2013 MICROCIRCUIT, LINEAR, A/D CONVETER, 10-BIT SAMPLING, MONOLITHIC SILICON
DLA SMD-5962-84094 REV C-2012 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, 4-BIT SYNCHRONOUS BCD COUNTER WITH SYCHRONOUS RESET, MONOLITHIC SILICON
DLA SMD-5962-84150 REV F-2009 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, DUAL J-K FLIP-FLOP WITH SET AND RESET, MONOLITHIC SILICON
DLA SMD-5962-77058 REV H-2011 MICROCIRCUIT, DIGITAL, CMOS, 12-BIT BINARY COUNTER, MONOLITHIC SILICON
DLA SMD-5962-88643 REV D-2008 MICROCIRCUIT, DIGITAL, 16-BIT CMOS MICROPROGRAM SEQUENCER, MONOLITHIC SILICON
DLA SMD-5962-93104-1993 MICROCIRCUIT, DIGITAL, ECL, 6-BIT D-TYPE REGISTER, MONOLITHIC SILICON
DLA SMD-5962-87802 REV D-2011 MICROCIRCUIT, LINEAR, 8-BIT QUAD DIGITAL-TO- ANALOG CONVERTER MONOLITHIC SILICON
DLA SMD-5962-92140 REV A-2012 MICROCIRCUIT, MEMORY, DIGITAL, CMOS 128K X 16-BIT UVEPROM, MONOLITHIC SILICON
DLA SMD-5962-93235 REV B-2010 MICROCIRCUIT, MEMORY, DIGITAL, CMOS 256K X 8 BIT EEPROM, MONOLITHIC SILICON
DLA SMD-5962-87789 REV B-2001 MICROCIRCUIT, LINEAR, MICROPROCESSOR COMPATIBLE 8-BIT DIGITAL-TO-ANALOG CONVERTER, MONOLITHIC SILICON
DLA DSCC-VID-V62/04695 REV A-2010 MICROCIRCUIT, DIGITAL, DUAL 4-BIT BINARY COUNTER, MONOLITHIC SILICON
DLA SMD-5962-94557 REV B-2009 MICROCIRCUIT, MEMORY, DIGITAL, CMOS 1MEG X 8 BIT EEPROM, MONOLITHIC SILICON
DLA SMD-5962-89614 REV G-2009 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 128K X 8-BIT UVEPROM, MONOLITHIC SILICON
DLA SMD-5962-88719 REV C-2002 MICROCIRCUIT, LINEAR, 12-BIT, QUAD D/A CONVERTER, MONOLITHIC SILICON
DLA MIL-M-38510/54 D VALID NOTICE 4-2012 MICROCIRCUITS, DIGITAL, CMOS, POSITIVE LOGIC FOUR-BIT FULL ADDER, MONOLITHIC SILICON
DLA SMD-5962-89900 REV A-2009 MICROCIRCUIT, LINEAR, HIGH SPEED 6-BIT A/D CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-94558 REV E-2005 MICROCIRCUIT, DIGITAL, 32-BIT ALU/16-BIT BUS, DIGITAL SIGNAL PROCESSOR, MONOLITHIC SILICON
DLA SMD-5962-92071 REV A-2013 MICROCIRCUIT, MEMORY, DIGITAL, CMOS 64K X 8-BIT UVEPROM, MONOLITHIC SILICON
DLA SMD-5962-00538 REV K-2011 MICROCIRCUIT, LINEAR, CMOS, RADIATION HARDENED, POWER-ON, MICROPROCESSOR RESET CIRCUIT, MONOLITHIC SILICON
DLA SMD-5962-96728 REV A-1996 MICROCIRCUIT, DIGITAL, CMOS, STATIC 16-BIT MICROPROCESSOR, MONOLITHIC SILICON
DLA SMD-5962-95519 REV A-2009 MICROCIRCUIT, LINEAR, 12-BIT 2 MHZ A/D CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-00538 REV F-2008 MICROCIRCUIT, DIGITAL-LINEAR, POWER-ON, MICROPROCESSOR RESET CIRCUIT, MONOLITHIC SILICON
DLA SMD-5962-87514 REV F-2010 MICROCIRCUIT, MEMORY, DIGITAL, CMOS 8K X 8-BIT EEPROM, MONOLITHIC SILICON
DLA SMD-5962-90803 REV D-2012 MICROCIRCUIT, MEMORY, DIGITAL, CMOS 8K X 8-BIT PROM, MONOLITHIC SILICON
DLA SMD-5962-88505 REV A-2001 MICROCIRCUIT, LINEAR, 10-BIT ANALOG-TO-DIGITAL CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-89765 REV E-2013 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, 4-BIT BINARY FULL ADDER WITH FAST CARRY, MONOLITHIC SILICON
DLA SMD-5962-84162 REV E-2009 MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, 8-BIT SERIAL-IN/PARALLEL-OUT SHIFT REGISTER, MONOLITHIC SILICON
DLA SMD-5962-84095 REV D-2009 MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, 8-BIT PARALLEL-IN/SERIAL-OUT SHIFT REGISTER, MONOLITHIC SILICON
DLA SMD-5962-07226 REV A-2009 MICROCIRCUIT, DIGITAL-LINEAR, CMOS, 12 BIT, DIGITAL-TO-ANALOG CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-86713 REV B-2009 MICROCIRCUIT, DIGITAL, BIPOLAR, 8-BIT EQUAL-TO COMPARATOR, MONOLITHIC SILICON
DLA SMD-5962-86818 REV E-2011 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, 8-BIT MAGNITUDE COMPARATOR, MONOLITHIC SILICON
DLA SMD-5962-86013 REV E-2009 MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, 4-BIT MAGNITUDE COMPARATOR, MONOLITHIC SILICON
DLA SMD-5962-89617 REV A-2001 MICROCIRCUIT, LINEAR, 12-BIT DIGITAL-TO-ANALOG CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-03203 REV A-2008 MICROCIRCUIT, MEMORY, DIGITAL, 2048 X 8-BIT BIPOLAR PROM, MONOLITHIC SILICON
DLA SMD-5962-90656-1991 MICROCIRCUITS, DIGITAL, CHMOS, 80-BIT NUMERIC PROCESSOR, MONOLITHIC SILICON
DLA SMD-5962-88541 REV C-2010 MICROCIRCUITS, MEMORY, DIGITAL, BIPOLAR, 512 X 4-BIT PROM, MONOLITHIC SILICON
DLA SMD-5962-89517 REV A-1994 MICROCIRCUIT, DIGITAL, CMOS, 16-BIT SLICE MICROPROCESSOR, MONOLITHIC SILICON
DLA SMD-5962-96692 REV H-2011 MICROCIRCUIT, MEMORY, DIGITAL, FLASH EPROM, 512K x 8-BIT, MONOLITHIC SILICON
DLA SMD-5962-93164 REV A-2002 MICROCIRCUIT, LINEAR, 12-BIT ANALOG TO DIGITAL CONVERTER, MONOLITHIC SILICON
DLA DSCC-VID-V62/05613 REV B-2012 MICROCIRCUIT, DIGITAL, CMOS, 14-BIT, 125 MSPS ANALOG-TO-DIGITAL CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-03202 REV A-2008 MICROCIRCUIT, MEMORY, DIGITAL, 1024 X 8-BIT BIPOLAR PROM, MONOLITHIC SILICON
DLA SMD-5962-97609 REV B-2011 MICROCIRCUIT, MEMORY, DIGITAL, FLASH EPROM, 2M X 8-BIT, MONOLITHIC SILICON
DLA DSCC-VID-V62/12622-2012 MICROCIRCUIT, DIGITAL, 16/32 BIT RISC FLASH MICROCONTROLLER, MONOLITHIC SILICON
DLA MIL-M-38510/520 B VALID NOTICE 4-2012 Microcircuits, Digital, N-Channel, Silicon Gate Monolithic 16- Bit Microprocessor
DLA SMD-5962-07226 REV C-2010 MICROCIRCUIT, DIGITAL-LINEAR, CMOS, 12 BIT, DIGITAL-TO-ANALOG CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-00538 REV E-2007 MICROCIRCUIT, DIGITAL-LINEAR, POWER-ON MICROPROCESSOR RESET CIRCUIT, MONOLITHIC SILICON
DLA DSCC-VID-V62/12661 REV A-2013 MICROCIRCUIT, DIGITAL-LINEAR, 18 BIT, VOLTAGE OUTPUT DIGITAL TO ANALOG CONVERTER, MONOLITHIC SILICON
DLA DSCC-VID-V62/12661-2013 MICROCIRCUIT, DIGITAL-LINEAR, 18 BIT, VOLTAGE OUTPUT DIGITAL TO ANALOG CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-88743 REV C-2008 MICROCIRCUIT, LINEAR, 8-BIT CMOS FLASH A/D CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-89653 REV B-2009 MICROCIRCUIT, LINEAR, CMOS, 8-BIT VIDEO D/A CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-96690 REV J-2011 MICROCIRCUIT, MEMORY, DIGITAL, FLASH EPROM, 128K X 8-BIT, MONOLITHIC SILICON
DLA MIL-M-38510/470 A VALID NOTICE 3-2010 Microcircuits, Digital, CMOS Monolithic 8-Bit Microprocessor (Fixed Instructions)
DLA SMD-5962-93060 REV E-2001 MICROCIRCUIT, LINEAR, A/D CONVERTER, 12-BIT, MONOLITHIC SILICON
DLA DSCC-VID-V62/03609 REV B-2012 MICROCIRCUIT, DIGITAL-LINEAR, CMOS, 12- BIT, ANALOG-TO-DIGITAL CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-07226 REV D-2012 MICROCIRCUIT, DIGITAL-LINEAR, CMOS, 12 BIT, DIGITAL-TO-ANALOG CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-95616 REV A-2010 MICROCIRCUIT, DIGITAL-LINEAR, 16-BIT, DUAL DIGITAL TO ANALOG CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-07226 REV B-2010 MICROCIRCUIT, DIGITAL-LINEAR, CMOS, 12 BIT, DIGITAL-TO-ANALOG CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-88605 REV C-2008 MICROCIRCUIT, DIGITAL, BIPOLAR HIGH PERFORMANCE 10-BIT BUFFER, MONOLITHIC SILICON
DLA SMD-5962-87788 REV E-2013 MICROCIRCUIT, MEMORY, DIGITAL 256 X 4-BIT, BIPOLAR PROM, MONOLITHIC SILICON
DLA MIL-M-38510/540 B VALID NOTICE 4-2012 Microcircuits, Digital, N-Channel, Silicon Gate Monolithic 16- Bit Microprocessor
DLA SMD-5962-87806 REV D-2011 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, 8-BIT UNIVERSAL SHIFT REGISTER WITH THREE-STATE OUTPUTS,MONOLITHIC SILICON

International Organization for Standardization (ISO)

ISO 7456:1984 Cinematography; Sound motion-picture camera cartridge, 8 mm Type S Model II; Film load position
ISO 1223:1993 Cinematography; picture areas for motion-picture films and slides for television; position and dimensions
ISO 1223:1985 Cinematography - Picture areas for motion-picture films for television - Position and dimensions
ISO 1223:1981 Cinematography — Picture areas for motion-picture films and slides for television — Position and dimensions
ISO 1223:2003 Cinematography - Picture areas for motion-picture films for television - Position and dimensions
ISO 466:1976 Cinematography; Image produced by 16 mm motion-picture camera aperture; Position and dimensions
ISO 1780:1984 Cinematography; Motion-picture camera cartridge, 8 mm Type S Model I; Aperture, camera aperture profile, film position, pressure pad and pressure pad flatness; Dimensions and specifications
ISO 5768:1998 Cinematography - Image produced by camera aperture type W on 16 mm motion-picture film - Position and dimensions
ISO 1785:1972 Title missing - Legacy paper document
ISO 1785:1983 Cinematography; Printed 8 mm, Type S, image area on 16 mm motion-picture film perforated 8 mm, Type S (1-4); Position and dimensions
ISO 6038:1993 Cinematography; splices for use on 70 mm, 65 mm, 35 mm and 16 mm motion-picture films; dimensions and locations
ISO 1223 Cinematography - Picture areas for motion-picture films for television - Position and dimensions
ISO 3775:1990 Cinematography; printed 8 mm type S image area on 16 mm motion-picture film perforated 8 mm type S (1-3); position and dimensions
ISO/TS 19979:2014 Ophthalmic optics - Contact lenses - Hygienic management of multipatient use trial contact lenses
ISO/TS 19979:2004 Ophthalmic optics - Contact lenses - Hygienic management of multipatient use trial contact lenses
ISO 71:2014 Cinematography - 16 mm negative photographic sound record on 16 mm, 35/16 mm and 35/32 mm motion-picture film - Positions and dimensions
ISO 71:1977 Cinematography; 16 mm negative photographic sound record on 16 mm, 35/16 mm and 35/32 mm motion-picture film; Positions and dimensions
ISO 5768:1981 Cinematography; Image produced by camera aperture Type W on 16 mm motion-picture film; Position and dimensions
ISO 17475:2005 Corrosion of metals and alloys - Electrochemical test methods - Guidelines for conducting potentiostatic and potentiodynamic polarization measurements
ISO 2906:1984 Cinematography; Image area produced by camera aperture on 35 mm motion-picture film; Position and dimensions
ISO 12611:1997 Cinematography - Audio head tones for use in international exchange of 35 mm magnetic film masters - Specifications and location
ISO 12611:2004 Cinematography - Audio head tones for use in international exchange of 35 mm analogue magnetic film masters - Specifications and location
ISO/TR 10200:1990 Legal admissibility of microforms
ISO 5768:1996 Cinematography - Image produced by camera aperture type W on 16 mm motion-picture film - Position and dimensions
ISO 6038 Cinematography - Splices for use on 70 mm, 65 mm, 35 mm and 16 mm motion-picture films - Dimensions and locations
ISO 5609:1998 Boring bars for indexable inserts - Dimensions

ISA - International Society of Automation

ISA S37.12-1982 Specifications and Tests for Potentiometric Displacement Transducers
ISA S37.12-1977 Specifications and Tests for Potentiometric Displacement Transducers
ISA 37.6-1982 Specifications and Tests for Potentiometric Pressure Transducers
ISA S37.6-1982 Specifications and Tests of Potentiometric Pressure Transducers

Society of Motion Picture and Television Engineers (SMPTE)

SMPTE ST 183M-1996 Motion-Picture Film - Photographic Audio Level Test Films - Measurement of Photoelectric Output Factor
SMPTE 198-2003 Motion-Picture Film (8-mm Type S) - 50-ft Model 1 Sound Camera Cartridge - Aperture, Pressure Pad and Film Position
SMPTE 159.2-2001 Motion-Picture Film (8-mm Type S) - Model 1 Camera Cartridge - Aperture, Profile, Film Position, Pressure Pad and Flatness
SMPTE 83-1996 For Motion-Picture Film (16-mm) - Edge Numbers - Location and Spacing Revision of ANSI/SMPTE 83-1990
SMPTE 183M-1996 Motion-Picture Film - Photographic Audio Level Test Films - Measurement of Photoelectric Output Factor
SMPTE 97-2004 Motion-Picture Film (16-mm) - 200-Mil Edge Position - Magnetic Audio Record
SMPTE RP 78-2002 Specifications for Azimuth Test Film for 16-mm Audio Projectors, Magnetic Type
SMPTE RP 77-2004 Specifications for Azimuth Test Film for 35-mm Studio Audio Reproducers, Magnetic Type
SMPTE RP 77-1994 Specifications for Azimuth Test Film for 35-mm Studio Audio Reproducers, Magnetic Type
SMPTE ST 97-2004 Motion-Picture Film (16-mm) - 200-Mil Edge Position - Magnetic Audio Record
SMPTE 218M-1996 Motion-Picture Film (16-mm) - 200-Mil Center-Position Magnetic Audio Record
SMPTE ST 218M-1996 Motion-Picture Film (16-mm) - 200-Mil Center-Position Magnetic Audio Record
SMPTE 97-1999 Motion-Picture Film (16-mm) - 200-Mil Edge Position - Magnetic Audio Record
SMPTE ST 83-1996 For Motion-Picture Film (16-mm) - Edge Numbers - Location and Spacing

United States Navy

NAVY MS90367 NOTICE 2-1998 INDICATOR, ELECTRICAL, WHEELS& FLAPS POSITION
NAVY MS90367-1965 INDICATOR, ELECTRICAL, WHEELS& FLAPS POSITION
NAVY MS90367 VALID NOTICE 1-1987 INDICATOR, ELECTRICAL, WHEELS& FLAPS POSITION
NAVY MIL-T-81541 (1)-1969 TEST SET, ELECTRONIC CIRCUIT PLUG-IN UNIT AN/ASM-152
NAVY MIL-T-81541-1967 TEST SET, ELECTRONIC CIRCUIT PLUG-IN UNIT AN/ASM-152

Spanish Association for Standardization (UNE)

UNE 20546-1:1976 POTENTIOMETERS. TERMS AND METHODS OF TEST
UNE 20546-1/2C:1980 POTENTIOMETERS. TERMS AND METHODS OF TEST
UNE 20546-1/3C:1982 POTENTIOMETERS. TERMS AND METHODS OF TEST
UNE 80213:1999 EX METHODS OF CEMENT TESTING. POTENTIOMETRIC DETERMINATION OF CHLORIDES.
UNE 80213:2010 Methods of cement testing. Potentiometric determination of chlorides
UNE-EN ISO 17475:2009 Corrosion of metals and alloys - Electrochemical test methods - Guidelines for conducting potentiostatic and potentiodynamic polarization measurements (ISO 17475:2005/Cor 1:2006)
UNE-EN 10280:2001 Magnetic materials - Methods of measurement of the magnetic properties of electrical sheet and strip by means of a single sheet tester.
AENOR UNE 26132:1957 BRAKE PADS. TECHNOLOGICAL TESTS

Japanese Industrial Standards Committee (JISC)

JIS B 4121:2013 Indexable inserts
JIS B 4126:1990 Tool holders for indexable inserts
JIS C 2556:2015 Methods of measurement of the magnetic properties of electrical steel strip and sheet by means of a single sheet tester
JIS B 4121:1998 Indexable hard material inserts
JIS B 4129:1998 Boring bars for indexable inserts -- Dimensions
JIS Z 2359:2021 Principle of strain gauge testing
JIS B 4126-1:2016 Tool holders with rectangular shank for indexable inserts -- Part 1: General survey

Korean Agency for Technology and Standards (KATS)

KS A ISO 6038-2003(2023) Cinematography -- Splices for use on 70 mm, 65 mm, 35 mm and 16 mm motion-picture films -- Dimensions and locations
KS A ISO 71-2018(2023) Cinematography — 16 mm negative photographic Sound record on 16 mm, 35/16 mm and 35/32 mm motion-picture film — Positions and dimensions
KS C 6424-1999(2020) Test methods of potentiometers for use in electronic equipment
KS A ISO 466:2003 Cinematography－Image produced by 16 mm motion－picture camera aperture－Position and dimensions
KS A ISO 8400-2003(2023) Cinematography -- Position of emulsion surface of 16 mm motion-picture prints -- Identification
KS C 2140-2003 Standards of testing method forphase transition temperature of ferroelectrics
KS A ISO 5768:2003 Cinematography－Image produced by camera aperture Type W on 16 mm motion-picture film－Position and dimensions
KS P 4402-2007 Test lens set
KS A ISO 70-2002(2022) Cinematography－Monophonic 35 mm negative photographic sound record on 35 mm motion－picture film－Position and maximum width dimensions
KS P ISO TS 19979:2006 Ophthalmic optics－Contact lenses－Hygienic management of multipatient use trial contact lenses
KS A ISO 1223-2010(2020) Cinematography－Picture areas for motion-picture films for television－Position and dimensions
KS F 2712-2017 Testing method for half－cell potentials of reinforcing steel in concrete
KS D ISO 17475-2017(2022) Corrosion of metals and alloys－Electrochemical test methods－Guidelines for conducting potentiostatic and potentiodynamic polarization measurements
KS D ISO 17475-2017 Corrosion of metals and alloys－Electrochemical test methods－Guidelines for conducting potentiostatic and potentiodynamic polarization measurements
KS B ISO 5609-2002(2012) Boring bars for indexable inserts－Dimensions
KS B 3282-1987 Tool holders for indexable inserts－Designation
KS B 3282-2002(2012) Tool holders for indexable inserts－Designation
KS A ISO 6038:2003 Cinematography－Splices for use on 70 mm, 65 mm, 35 mm and 16 mm motion－picture films－Dimensions and locations
KS A ISO 12611:2002 Cinematography－Audio head tones for use in international exchange of 35 mm magnetic film masters－Specifications and location
KS B 3282-2013 Tool holders for indexable inserts－Designation
KS A ISO 71:2003 Cinematography-16 mm negative photographic sound record on 16 mm, 35/16 mm and 35/32 mm motion-picture film-Positions and dimensions
KS L ISO 8289-2021 Vitreous and porcelain enamels－Low voltage test for detecting and locating defects
KS A ISO 70-2002(2017) Cinematography－Monophonic 35 mm negative photographic sound record on 35 mm motion－picture film－Position and maximum width dimensions
KS A ISO 2939-2023 Cinematography — Picture image area on 35 mm motion-picture release prints — Position and dimensions and analogue and digital photographic sound to picture record displacement

CZ-CSN

CSN ONA 02 8490-1967 Control ca,ble connection. Control cable stepped end piece
CSN 58 8792-1994 Methods of test for fats and oils Determination of hydroxyvalue with potentiometric indication
CSN 58 8764-1994 Methods of test for fats and oils Determination of saponification value with potentiometric indication
CSN 64 0181-1986 Plastics. Methods of thickness determination of films and sheets
CSN 22 3808-1989 Boring bars for indexable inserts. Dimen-sions

IN-BIS

IS 4434-1978 Soil in situ leaf shear test operating procedures
IS 5266-1969 400 Hz signal level test film specifications

SE-SIS

SIS SS 988-1981 Indexable hardmetal inserts — Measuring of the dimension m
SIS SMS 988-1965 Carbide tools. Indexable inserts. Measuring of the dimension m
SIS SS 988-1988 Indexable hardmetal inserts - Measuring of the dimension m
SIS SS-ISO 9361-1:1992 Indexable inserts for cutting tools — Ceramic inserts with rounded corners — Part 1: Dimensions of inserts without fixing hole
SIS SMS 679-1971 Indexable inserts. Designation system

Society of Automotive Engineers (SAE)

SAE J400_201210 Test for Chip Resistance of Surface Coatings
SAE J400_198501 Test for Chip Resistance of Surface Coatings
SAE J400_202208 Test for Chip Resistance of Surface Coatings
SAE J400_198006 Test for Chip Resistance of Surface Coatings
SAE J400_200211 Test for Chip Resistance of Surface Coatings
SAE J400_196807 Test for Chip Resistance of Surface Coatings
SAE J400_200112 Test for Chip Resistance of Surface Coatings

Indonesia Standards

SNI 18-2031-1990 Nuclear Electric Power Plant, Guide for determination of location
SNI 09-1412-1989 Equipment for measuring and defining the seating accomodations of motor vehicles

Electronic Components, Assemblies and Materials Association

ECA 213-1958 Test Point Locations for Printed Wiring Assemblies
ECA EIA-364-99-1999 TP-99 Gage Location and Retention Test Procedure for Electrical Connectors

Association Francaise de Normalisation

NF C28-913:2007 Magnetic materials - Methods of measurement of the magnetic properties of electrical sheet and strip by means of a single sheet tester.
NF T90-008:1953 WATER TESTING. ELECTROMETRIC MEASUREMENT OF PH WITH THE GLASS ELECTRODE.

Institute of Electrical and Electronics Engineers (IEEE)

SMPTE ST 183:1996 ST 183:1996 - SMPTE Standard - For Motion-Picture Film — Photographic Audio Level Test Films – Measurement of Photoelectric Output Factor
IEEE 421.3-2016 High-Potential Test Requirements for Excitation Systems for Synchronous Machines
IEEE 421B-1979 High-Potential-Test Requirements for Excitation Systems for Synchronous Machines

GCC Standardization Organization

GSO ISO 8289:2013 Vitreous and porcelain enamels -- Low voltage test for detecting and locating defects
GSO 258:1994 METHODS OF TEST FOR CORN FLAKES
GSO ASTM D6470:2016 Standard Test Method for Salt in Crude Oils (Potentiometric Method)
GSO ISO 70:2015 Cinematography -- 35 mm negative photographic sound record on 35 mm motion-picture film -- Position and maximum width dimensions
GSO IEC 61196-1-111:2014 Coaxial communication cables - Part 1-111: Electrical test methods - Stability of phase test methods

Military Standards (MIL-STD)

MIL MIL-M-38510/113C-2011 Microcircuits, Linear, 8 Bit, Digital-to-Analog Converters, Monolithic Silicon
DOD A-A-53323-1988 LIDDING SHEET, UNIT DOSE
MIL MIL-M-38510/665-1988 MICROCIRCUITS, DIGITAL, HIGH SPEED, CMOS, SHIFT REGISTER, MONOLITHIC SILICON
DOD A-A-53436-1988 BLISTER SHEET, UNIT DOSE
MIL MIL-M-38510/28B-1974 MICROCIRCUIT, DIGITAL TTL, LOW POWER SHIFT REGISTERS MONOLITHIC SILICON (SUPERSEDING MIL-M-38510/28)
MIL MIL-M-38510/342-1984 MICROCIRCUITS, DIGITAL, ADVANCED SCHOTTKY TTL, 4-BIT BINARY FULL ADDERS WITH FAST CARRY, MONOLITHIC SILICON (S/S BY MIL-M-38510/342A)
MIL MIL-M-38510/121B-2004 MICROCIRCUITS, LINEAR MONOLITHIC AND MULTICHIP, SILICON 12 BIT DIGITAL-TO-ANALOG CONVERTERS (SUPERSEDING MIL-M-38510/121A)
MIL MIL-M-38510/440C-1986 MICROCIRCUIT, DIGITAL, FOUR BIT MICROPROCESSOR SLICE MONOLITHIC SILICON (SUPERSEDING MIL-M-38510/440B)(SEE BASE FOR INACTIVATION NOTICE)
DOD A-A-53836-1989 PHENOL RED PH TEST TABLETS
DOD A-A-54065-1990 SLIDE, MICROSCOPE (BOERNER TEST)

Standard Association of Australia （SAA）

AS 1096.3:1971 Motion picture film, Part 3: Emulsion position in camera for 16 mm silent motion picture film
AS 1096.6:1971 Motion picture film, Part 6: Emulsion position in camera for 8 mm silent motion picture film
AS 2656:1984 Test microfiche
AS 1301.P10RP:1986 Methods of test for pulp and paper (metric units), Method P10RP: Determination of moisture in wood chips - Distillation method
AS 1301.P1S:1979 Methods of test for pulp and paper (metric units) - Basic density of wood chips
AS 1096.2:1971 Motion picture film, Part 2: Emulsion and sound record positions in projector for 35 mm sound motion picture film

Instrument Society of America (ISA)

ISA 37.12-1982(1995) Specifications and Testing of Piezoelectric Displacement Sensors

The Directorate General of Specifications and Metrology (DGSM)

OS GSO ISO 17475:2013 Corrosion of metals and alloys -- Electrochemical test methods -- Guidelines for conducting potentiostatic and potentiodynamic polarization measurements
OS GSO ISO 70:2015 Cinematography -- 35 mm negative photographic sound record on 35 mm motion-picture film -- Position and maximum width dimensions
OS GSO 876:1997 TEST METHODS FOR SOAP FLAKES

Danish Standards Foundation

DANSK DS/EN ISO 17475:2008 Corrosion of metals and alloys - Electrochemical test methods - Guidelines for conducting potentiostatic and potentiodynamic polarization measurements
DANSK DS/IEC 61196-1-111:2014 Coaxial communication cables - Part 1-111: Electrical test methods - Stability of phase test methods

Ente Nazionale Italiano di Unificazione

UNI 6495:1969 Emulsion position in 8mm silent film cameras
UNI EN ISO 17475:2008 Corrosion of metals and alloys - Electrochemical test methods - Guidelines for conducting potentiostatic and potentiodynamic polarization measurements

International Electrotechnical Commission (IEC)

IEC 60393-1:1973 Potentiometers - Part 1: Terms and methods of test
IEC 60404-3:2010 Magnetic materials – Part 3: Methods of measurement of the magnetic properties of electrical steel strip and sheet by means of a single sheet tester (Edition 2.2 Consolidated Reprint)

Magyar Szabványügyi Testület

MSZ 101/20.lap-1964 Test Methods Fabric Wrinkle Resistance Lift Potential Test
MI 9250/2-1981 Insulation coordination guidelines. Test voltage detection
MSZ KGST 2413-1980 Industrial requirements and testing of electric manual sectioning shears

IPC - Association Connecting Electronics Industries

IPC TM-650 5.5.4.8-1998 Test Coupon D - Resistance by Electromigration
IPC TM-650 5.5.4.12-1998 Test Coupon L - Line Resistivity

Kingdom of Bahrain Testing and Metrology Directorate

BH GSO ISO 70:2016 Cinematography -- 35 mm negative photographic sound record on 35 mm motion-picture film -- Position and maximum width dimensions
BH GSO IEC 61196-1-111:2016 Coaxial communication cables - Part 1-111: Electrical test methods - Stability of phase test methods

TR-TSE

TS 1861-1975 CINEMATOGRAPHY — MOTION — PICTURE SAFETY F?LM — DEFINITION, TESTING AND MARKING

IT-UNI

UNI 6497-1969 The size and position of images on movie camera film and projected images. 8mm film

WRC - Welding Research Council

BULLETIN 431-1998 SUMMARY OF GASKET STEAM LEAKAGE TESTS: I) GASKET STEAM LEAKAGE TESTS ; II) LEAK TESTS CONDUCTED ON GRAPHITE GASKETS; III) LONG DURATION AIR AND STEAM SCREENING TESTS ON ELASTOMERIC SHEET GASKET MATERI

Lithuanian Standards Office

LST EN ISO 17475:2008 Corrosion of metals and alloys - Electrochemical test methods - Guidelines for conducting potentiostatic and potentiodynamic polarization measurements (ISO 17475:2005/Cor 1:2006)