double amorphous phase
double amorphous phase, Total:36 items.
The international standard classification for "double amorphous phase" includes: Other iron and steel products , Steels with special magnetic properties , Glass products , Measurement of electrical and magnetic quantities .
The Chinese standard classification for "double amorphous phase" includes: Power semiconductor device and parts , Precision alloy , Industrial technical glass , Metal physical property test method .
Professional Standard - Machinery
- JB/T 6307.5-1994 Power Semiconductor Module Test Methods Bipolar Transistors Single-Phase Bridge and Three-Phase Bridge
- JB/T 8951.1-1999 Insulated Gate Bipolar Transistor
- JB/T 4192-1996 Bi-directional Thyristor
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
- GB/T 19345-2003 Amorphous and nanocrystalline soft magnetic alloy strips
- GB/T 3519-2008(英文版) Amorphous graphite
- GB/T 19345.1-2017 Amorphous and nanocrystalline alloys―Part 1:Fe-based amorphous soft magnetic alloy strips
- GB/T 31958-2023 Substrate glass for amorphous silicon thin film transistor liquid crystal display device
Group Standards of the People's Republic of China
- T/ZZB 2873-2022 Three-phase dry-type amorphous alloy tridimensional wound-core distribution transformers
- T/SBX 043-2021 Determination of Purity of Dicyclohexyl Phenyl Liquid Crystal Monomers by Gas Chromatography
- T/SSEA 0082-2020 Non-quenched and tempered dual-phase cold heading steel wire rod for high-strength fasteners
- T/SBX 042-2021 Determination of Purity of Bicyclohexylbiphenyl Liquid Crystal Monomers by Gas Chromatography
- T/ZZB 2883-2022 Double cap wafer wire wound resistor
- T/ZZB 1872-2020 10 kV and below three-phase oil-immersed amorphous alloy core distribution transformers
国家市场监督管理总局、中国国家标准化管理委员会
- GB/T 19346.3-2021 Methods of measurement of amorphous and nanocrystalline alloys-Part 3:AC magnetic properties of Fe-based amorphous strip using a single sheet specimen
GSO
- OS GSO ISO 14250:2014 Steel -- Metallographic characterization of duplex grain size and distributions
- BH GSO ISO 14250:2016 Steel -- Metallographic characterization of duplex grain size and distributions
- GSO ISO 14250:2014 Steel -- Metallographic characterization of duplex grain size and distributions
Korean Agency for Technology and Standards (KATS)
- KS D ISO 14250-2014 Steel－Metallographic characterization of duplex grian size and distributions
- KS E 3802-1975 Amorphous graphite
- KS E 3802-1974 Amorphous graphite
- KS D 0068-2002 Glossary of terms used in amorphous metals
- KS D 0069-2002 Method of determining the crystallization temperatures of amorphous metals
- KS D 0069-2002(2022) Method of determining the crystallization temperatures of amorphous metals
- KS D 0069-2022 Method of determining the crystallization temperatures of amorphous metals
RU-GOST R
- GOST R ISO 14250-2013 Steel. Metallographic characterization of duplex grain size and distribution
American Society for Testing and Materials (ASTM)
- ASTM E1181-02 Standard Test Methods for Characterizing Duplex Grain Sizes
- ASTM E1181-87(1998)e1 Standard Test Methods for Characterizing Duplex Grain Sizes
Defense Logistics Agency
- DLA SMD-5962-97584 REV B-2006 MICROCIRCUIT, DIGITAL, BIPOLAR, ADVANCED SCHOTTKY TTL, DUAL 4-INPUT POSITIVE-NAND GATE, MONOLITHIC SILICON
- DLA SMD-5962-86833 REV C-2001 MICROCIRCUIT, DIGITAL, BIPOLAR, ADVANCED LOW POWER SCHOTTKY TTL, NAND GATES, MONOLITHIC SILICON
- DLA SMD-5962-86865 REV D-2006 MICROCIRCUIT, DIGITAL, BIPOLAR, ADVANCED LOW POWER SCHOTTKY TTL, NAND GATE, MONOLITHIC SILICON
- DLA SMD-5962-86837 REV C-2006 MICROCIRCUIT, DIGITAL, BIPOLAR ADVANCED LOW POWER, SCHOTTKY TTL, NAND GATES, MONOLITHIC SILICON
- DLA SMD-5962-91627 REV A-2004 MICROCIRCUIT, DIGITAL, BIPOLAR, ADVANCED SCHOTTKY, TTL, QUADRUPLE 2-INPUT NAND DRIVER, MONOLITHIC SILICON
YU-JUS
- JUS N.R1.450-1981 Bipolar transistors. Measuring methods
- JUS N.R9.031-1986 Piezoelectric vibrators. Measurement of qu'?rtz crystal unit parameters by zero phase technique in a n-network. Phase offsetmethod of measurement of motionaf capacitance of guartz crystal unit
GOST
- GOST R 71054-2023 Bipolar transistors. Parameters system
Japanese Industrial Standards Committee (JISC)
- JIS H 7151:1991 Method of determining the crystallization temperatures of amorphous metals
